EP0691801B1 - X-ray source - Google Patents

X-ray source Download PDF

Info

Publication number
EP0691801B1
EP0691801B1 EP95304735A EP95304735A EP0691801B1 EP 0691801 B1 EP0691801 B1 EP 0691801B1 EP 95304735 A EP95304735 A EP 95304735A EP 95304735 A EP95304735 A EP 95304735A EP 0691801 B1 EP0691801 B1 EP 0691801B1
Authority
EP
European Patent Office
Prior art keywords
voltage
target
generating circuit
ray source
voltage generating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
EP95304735A
Other languages
German (de)
French (fr)
Other versions
EP0691801A1 (en
Inventor
Yutaka Ochiai
Takane Yokoi
Katsuya Inoue
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hamamatsu Photonics KK
Original Assignee
Hamamatsu Photonics KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hamamatsu Photonics KK filed Critical Hamamatsu Photonics KK
Publication of EP0691801A1 publication Critical patent/EP0691801A1/en
Application granted granted Critical
Publication of EP0691801B1 publication Critical patent/EP0691801B1/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05GX-RAY TECHNIQUE
    • H05G1/00X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/02Constructional details
    • H05G1/04Mounting the X-ray tube within a closed housing
    • H05G1/06X-ray tube and at least part of the power supply apparatus being mounted within the same housing
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05GX-RAY TECHNIQUE
    • H05G1/00X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08Electrical details
    • H05G1/10Power supply arrangements for feeding the X-ray tube
    • H05G1/12Power supply arrangements for feeding the X-ray tube with dc or rectified single-phase ac or double-phase
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05GX-RAY TECHNIQUE
    • H05G1/00X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08Electrical details
    • H05G1/26Measuring, controlling or protecting
    • H05G1/30Controlling
    • H05G1/32Supply voltage of the X-ray apparatus or tube

Definitions

  • U.S. Patent No. 5,077,771, U.S. Patent No. 4,646,338, and U.S. Patent No. 4,694,480 describe portable X-ray sources constructed from an X-ray tube and a molded high-voltage source and its control circuitry.
  • the target voltage generating circuit can be cooled naturally without provision of a cooling fan.
  • FIG. 3 is a cross-sectional view showing construction of the microfocus X-ray tube 10.
  • the microfocus X-ray tube 10 includes an assembly of a metal outer envelope 12 and a glass outer envelope 13. A ceramic stem 11 is engaged with one end of the metal outer envelope 12. An X-ray emission window 14 made from beryllium is formed to the side surface of the metal outer envelope 12.
  • An electron gun 15 is positioned interiorly of the metal outer envelope 12.
  • the electron gun 15 includes a heater electrode 15a, a cathode 15b, a grid electrode 15c, and a focus electrode 15d.
  • a tungsten target 16a is brazed to the tip of the target mounting base 16 using silver.
  • the cathode 15b When the cathode 15b is heated up to a prescribed temperature by the heater electrode 15a, electrons are emitted from the surface of the cathode 15b. The emitted electrons are accelerated by the grid electrode 15c and focused by the focus electrode 15d so as to be in bombardment with the tungsten target 16a, resulting in the generation of X-rays and heat. The generated X-rays are emitted outwardly from the X-ray emission window 14. The generated heat is conducted out of the X-ray source through the target mounting base 16.
  • the tungsten target 16a is positioned at a 25° slant to a plane perpendicular to the orbit of the electrons fired at the tungsten target 16a. This slant increases the number of generated X-rays that reach the X-ray emission window 14 and that are emitted outside the microfocus X-ray tube 10 through the X-ray emission window 14.
  • the plurality of diodes and capacitors making up the Cockcroft-Walton multiplier array are soldered to the support plates 20b and also the diodes and capacitors are connected together by wiring 20 b1 formed on the support plate 20b.
  • This stable structure prevents the diodes and capacitors from shifting position when the insulation material is poured over the components of the Cockcroft-Walton multiplier array during molding processes of the mold block 21. Therefore, Cockcroft-Walton multiplier array of the present embodiment can supply a stable high voltage output.
  • FIG. 6 is a block diagram showing components provided in association with the X-ray source of the present embodiment.
  • the block diagram includes an operation block portion 100 for operating the microfocus X-ray tube 10 and a control block portion 200 for controlling the operation block portion 100.
  • FIG. 7 is a block diagram showing detailed configuration of the operation block portion 100.
  • the target control 110 includes a target voltage control 111 controlling target voltage according to the target voltage setting voltage applied thereto from the voltage setting D/A converter 210; and a target high-voltage generator 112 generating a desired target high-voltage according to a signal from the target voltage control 111.
  • the target overcurrent detector 120 includes an overcurrent detector 121 for detecting overcurrent of the target current generated at the target high-voltage generator 112; and an overvoltage detector 122 detecting overvoltage of the target voltage generated at the target high-voltage generator 112.
  • the grid control 130 includes a target current detector 131 for detecting the target current; a target current comparator 132 for comparing the target current detected by the target current detector 131 with the setting voltage signal outputted from the current setting D/A converter 220; and a cut-off voltage control setting portion 133.
  • the grid control portion 130 further includes a grid voltage control 134 for controlling grid voltage based on the results of comparisons made at the target current comparator 132; and a grid voltage generator 135 for generating a desired grid voltage according to signals received from the grid voltage control 134.
  • the cathode control 140 includes a cathode voltage control 141 for controlling cathode voltage according to target voltage setting voltage received from the voltage setting D/A converter 210; and a cathode voltage generator 142 for generating a desired cathode voltage according to signals received from the cathode voltage control 141.
  • the heater control 150 includes a heater voltage control 151 for controlling the heater voltage; and a heater voltage generator 152 for generating a desired heater voltage according to signals received from the heater voltage control 151.
  • the X-ray beam diameter is maintained at a small value even when the target voltage is changed.
  • the target high-voltage generator 112 must generate voltage that changes linearly from low voltage to high voltage.
  • PWM pulse width modulation
  • the target high-voltage generator 112 of the present embodiment uses a double invertor arrangement to control target voltage. That is, a step down type invertor is provided for the low-voltage range and a push-pull invertor is provided for the high-voltage range. With such an arrangement, a variable voltage that changes linearly from low voltage to high voltage can be obtained.
  • FIG. 8 is a graphical representation of the relationship between input voltage and output voltage according to results of measurements of the X-ray source of the present embodiment using a coil of paraffin impregnated 3:600 shunt winding and twenty-stage Cockcroft-Walton voltage multiplier. It can be seen from this graph that the relationship between the input voltage and the output voltage changes linearly between an output voltage of about 10 kV to about 100 kV.
  • FIG. 9 is a circuit diagram showing a detailed circuit configuration of the target high-voltage generator 112.
  • the target high-voltage generator 112 of the present embodiment includes a step-down invertor circuit 410 for the low-voltage range and a push-pull invertor circuit 420 for the high-voltage range.
  • a stably changing voltage can be obtained over a broad range from low to high voltage using these two types of different invertor circuits 410 and 420.
  • a target voltage setting voltage (Vi) is applied to the step-down invertor circuit 410, whereupon a setting voltage signal passes through a buffer IC 1-a and is applied to a comparator IC 1-c through an error amplifier IC 1-b .
  • the error amplifier IC 1-b is also applied with the output from an operational amplifier IC 5-a . Initially a 0 V voltage is developed at the secondary coil of the transformer 430.
  • a detection voltage representative of the voltage developed at the secondary coil of the transformer 430 is obtained from the operational amplifier IC 5-a through a voltage divider 440 connected between the output of the Cockcroft-Walton multiplier array and ground.
  • the detection voltage is also initially a 0 V voltage.
  • the error amplifier IC 1-b is saturated to a +24 V, and this saturation voltage is applied to the comparator IC 1-c .
  • the initial voltage of the capacitor C 1 is also a 0 V voltage.
  • the comparator IC 1-c is saturated to a +24 V voltage as represented by level (c) in FIG. 10. As represented by levels (d) and (e) in FIG.
  • the voltage developed at the secondary coil of the transformer 430 increases to a voltage according to the turns ratio and is further increased to a high voltage by the Cockcroft-Walton multiplier array .
  • the increased output voltage is voltage-divided by the divider 440.
  • the divided voltage passes through the operation amplifier IC 5-a and is applied to the error amplifier IC 1-b as the detection voltage. This operation is represented by level (g) in FIG. 10.
  • the error amplifier IC 1-b compares the detection voltage and the target voltage setting voltage Vi and drives the comparator IC 1-c until the detection voltage and the target voltage setting voltage Vi are in coincidence with each other.
  • the high-voltage output is controllable by operating the double invertor including the step down invertor circuit 410 and the push-pull invertor circuit 420.
  • the characteristic of the circuitry at the primary coil side of the transformer 430, that is, of the step down invertor circuit 410 and the push-pull invertor circuit 420, is that the ON and OFF operation of the transistors Q 1 , Q 2 , and Q 3 , as driven by the comparator IC 1-c , controls the charge current of the capacitor C 1 . For this reason, drive is accomplished using only a minimal amount of power and with a circuit configuration that loses very little power.
  • FIG. 13(a) is a graphical representation of output intensity of a conventional X-ray source provided with a PWM type high-voltage generation circuit.
  • FIG. 13(b) is a graphical representation of output intensity of the X-ray source according to the present embodiment. It can be seen by comparing these graphs that the X-ray source of the present embodiment outputs X-rays with more stable intensity than the conventional X-ray source. In measurements for both of these graphs, both of the X-ray sources had a 40 kV target voltage applied to the target. Target current was 10 ⁇ A.
  • microfocus X-ray tube 10 could be an end window type instead of the side window type shown in FIG. 3.
  • the first voltage generation portion provided with a target voltage generation circuit operates according to ON and OFF switching of switching elements so that input voltage increases up to a predetermined set voltage.
  • the switching operations of the switching elements are controlled by a signal voltage from a second voltage generation portion. For this reason, there is virtually no power loss from the first voltage generation portion. Also, very little heat is generated from this circuitry so that natural cooling without the aid of a cooling fan is sufficient. Because no cooling fan needs to be provided, problems caused by the vibration of a cooling fan, such as, inability to maintain the focus of the X-rays, will not occur.

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • X-Ray Techniques (AREA)

Description

  • The present invention relates to an X-ray source, and more particularly to a high-voltage generating circuitry for generating a high-voltage to be applied to a target of the X-ray source.
  • U.S. Patent No. 5,077,771, U.S. Patent No. 4,646,338, and U.S. Patent No. 4,694,480 describe portable X-ray sources constructed from an X-ray tube and a molded high-voltage source and its control circuitry.
  • When voltage is applied to an X-ray tube, either the cathode is connected to ground, or the target is connected to ground, or the focus voltage is varied. However, none of the above-described patents sufficiently describes voltage control of the X-ray tube in generating microfocused X-rays.
  • Voltage is controlled in the high-voltage generation circuitry using pulse width modulation (PWM) or pulse voltage control. However, the PWM method controls the effective voltage by changing the pulse width of control pulses. Therefore, the high voltage generated at the secondary coil of the high-voltage transformer does not follow changes in pulse width very well, resulting in great fluctuations in strength of the X-rays. With the pulse voltage control method, a switching transistor controls current supplied to the primary coil of the high-voltage generating transformer, resulting in great deal of power loss by heat generation. A cooling fan must therefore be provided to cool the circuitry. The vibration produced by the cooling fan prevents maintenance of a microfocus of the x-rays.
  • A Cockcroft-Walton multiplier array is often used as the source of high voltage for portable x-rays sources. The capacitor and diode array of the Cockcroft-Walton multiplier array are often embedded in an insulating block molded by pouring a silicon or epoxy resin over the capacitors and diodes. The positions of the capacitors and diodes can be shifted when this insulating material is poured over these components. When these components are shifted out of alignment, this can result in a variable and unstable supply of high voltage.
  • The applicant's copending application EP-A-0634885, falling within the terms of Article 54(3) EPC, describes an x-ray apparatus comprising an x-ray tube having a cathode and a target. A target voltage generating circuit generates a target voltage to be applied to the target and includes a first voltage generating circuit connected to a second voltage generating circuit, the first voltage generating circuit generating a first voltage in response to an instruction voltage indicative of a voltage to be applied to the target and the second voltage generating circuit generating an output voltage to be applied to the target. A voltage divider connected to the second voltage generating circuit divides the output voltage of the second voltage generating circuit to produce a detection voltage indicative of the output voltage and the first voltage generating circuit is switched on until the detection voltage reaches the instruction voltage and is alternatively switched ON and OFF after the detection voltage has reached the instruction voltage.
  • To solve the above-described problems, an x-ray source according to the invention comprises an X-ray tube having a cathode and a target; and
    • a target voltage generating circuit for generating a target voltage applied to said target, said target voltage generating circuit comprising:
    • a first voltage generating circuit generating a first voltage in response to an instruction voltage indicative of a voltage to be applied to said target, said first voltage generating circuit including a comparator providing a comparison output, a switching element connected to said comparator to receive the comparison output for controlling said switching element, and a capacitive element connected across a voltage source through said switching element, said capacitive element having a capacitance;
    • a second voltage generating circuit connected to said first voltage generating circuit, said second voltage generating circuit generating said target voltage to be applied to said target; and
    • a voltage divider connected to said second voltage generating circuit, the voltage divider (440) dividing the output voltage from said second voltage generating circuit to produce a detection voltage indicative of a voltage generated by said second voltage generating circuit;
    • wherein said comparator provides the comparison output based on the instruction voltage, the detection voltage and the voltage developed across said capacitive element, wherein said switching element is rendered ON as long as the comparison output indicates that the detection voltage is below the instruction voltage, whereas said switching element is alternately rendered ON and OFF after the comparison output indicated that the detection voltage has exceeded the instruction voltage, said capacitive element being charged when said switching element is ON, and said second voltage generating circuit generating the target voltage based on the voltage developed across said capacitive element, whereby the output voltage generated from said second voltage generating circuit is maintained at substantially the instruction voltage.
  • The first voltage generating circuit may further include an error amplifier having a first input terminal applied with the instruction voltage, a second input terminal applied with the detection voltage, and an output terminal, wherein the comparator has a first input terminal connected to the output terminal of the error amplifier, and a second input terminal supplied with the voltage developed across the capacitive element. The first voltage generating circuit may further include an inductive element, wherein the capacitive element is charged according to a time constant determined by the capacitance of the capacitive element and the inductance of the inductive element.
  • The second voltage generating circuit may be configured by Cockcroft-Walton multiplier array which is composed by a plurality of rectifying elements and a plurality of capacitive elements and a pair of insulation plates for mounting the rectifying elements and the capacitive elements which are connected by wiring formed on each of the pair of insulation plates. The Cockcroft-Walton multiplier array and the pair of insulation plates may be embedded in a mold block made from an insulating material.
  • According to the invention, there is virtually no power loss from the first voltage generating circuit, so that substantially no heat is generated. Therefore, the target voltage generating circuit can be cooled naturally without provision of a cooling fan.
  • The rectification elements and capacitive elements of a Cockcroft-Walton circuitry are wired and connected on an insulation plate. Because these elements are fixed in place by the insulation plates, the elements will not shift in position during molding. Variation in high-voltage output sometimes caused by positional shifting of such elements will not be produced. As such, the second voltage generating circuit outputs a stable high voltage.
  • A preferred embodiment will now be described with reference to the accompanying drawings, in which:-
    • FIG. 1 is a perspective view showing an X-ray source according to an embodiment of the present invention;
    • FIGS. 2(a) and 2(b) are cross-sectional views of the X-ray source according to the embodiment of the present invention;
    • FIG. 3 is a cross-sectional view showing construction of a microfocus X-ray tube of the present X-ray source;
    • FIG. 4 is a perspective view showing external appearance of a mold block of the present X-ray source;
    • FIG. 5(a) is a perspective view showing diodes and capacitors making up a Cockcroft-Walton multiplier array of the present X-ray source and support plates;
    • FIG. 5(b) is an overhead view of the Cockcroft-Walton multiplier array and support plates of FIG. 5(a);
    • Fig 5(c) is a side view showing wiring connecting the Cockcroft-Walton multiplier array of FIG. 5(a) to the support plates;
    • FIG. 6 is a block diagram showing components of the present X-ray source;
    • FIG. 7 is a block diagram showing detailed configuration of an operation block portion shown schematically in FIG. 6;
    • FIG. 8 is a graphical representation of the relationship between input voltage and output voltage of the target high-voltage generating circuit;
    • FIG. 9 is a circuit diagram showing examples of specific components of a target voltage circuit serving as the target high-voltage generating circuit;
    • FIG. 10 is a timing chart for an explanation of principles underlying operation of the target voltage circuit of FIG. 9;
    • FIG. 11 shows a conventional target voltage circuit of an X-ray source;
    • FIG. 12(a) is a graphical representation showing power loss of the target voltage circuit of FIG. 11;
    • FIG. 12(b) is a graphical representation showing power loss of the target voltage circuit of the present X-ray source;
    • FIG. 13(a) is a graphical representation of output strength of a conventional X-ray source provided with a PWM type high-voltage generation circuit; and
    • FIG. 13(b) is a graphical representation of output strength of the present X-ray source;
  • FIG. 1 shows a perspective view of the X-ray source of the present embodiment. FIGS. 2(a) is a cross-sectional view of the X-ray source cut along the line A-A' shown in FIG. 2(b) which is a vertical cross-sectional view of the X-ray source of the present embodiment. The X-ray source of the present embodiment includes a microfocus X-ray tube 10 for emitting X-rays; a Cockcroft-Walton multiplier array for applying a high voltage to the microfocus X-ray tube 10; control circuits 23 and 31 for applying a high voltage to the microfocus X-ray tube 10; and an external controller unit 40 for controlling this circuitry. The Cockcroft-Walton multiplier array includes a pair of support plates 20b made from an insulating material for supporting the array. The Cockcroft-Walton multiplier array and the support plates 20b are integratedly embedded in a mold block 21. An insulating oil reservoir cavity 21a is provided at the front side of the mold block 21. A target high-voltage supply terminal 22 is connected to the microfocus X-ray tube 10 through the oil reservoir cavity 21a.
  • The control circuit 23 and a Cockcroft-Walton circuit 30 are mounted on the upper surface of the mold block 21. The control circuit 23 includes a step down invertor circuit and a push-pull invertor circuit for driving the Cockcroft-Walton multiplier array . The Cockcroft-Walton circuit 30 supplies high voltage to the cathode electrode of the microfocus X-ray tube 10. A connector 25 for connecting a cable of the controller unit 40 to the circuitry of the X-ray source is provided at the rear side of the housing 50.
  • FIG. 3 is a cross-sectional view showing construction of the microfocus X-ray tube 10. The microfocus X-ray tube 10 includes an assembly of a metal outer envelope 12 and a glass outer envelope 13. A ceramic stem 11 is engaged with one end of the metal outer envelope 12. An X-ray emission window 14 made from beryllium is formed to the side surface of the metal outer envelope 12.
  • An electron gun 15 is positioned interiorly of the metal outer envelope 12. A target mounting base 16 made from a material with high thermal conductivity, such as non-oxidized pure copper, is positioned interiorly of the glass outer envelope 13. The electron gun 15 includes a heater electrode 15a, a cathode 15b, a grid electrode 15c, and a focus electrode 15d. A tungsten target 16a is brazed to the tip of the target mounting base 16 using silver.
  • When the cathode 15b is heated up to a prescribed temperature by the heater electrode 15a, electrons are emitted from the surface of the cathode 15b. The emitted electrons are accelerated by the grid electrode 15c and focused by the focus electrode 15d so as to be in bombardment with the tungsten target 16a, resulting in the generation of X-rays and heat. The generated X-rays are emitted outwardly from the X-ray emission window 14. The generated heat is conducted out of the X-ray source through the target mounting base 16.
  • The tungsten target 16a is positioned at a 25° slant to a plane perpendicular to the orbit of the electrons fired at the tungsten target 16a. This slant increases the number of generated X-rays that reach the X-ray emission window 14 and that are emitted outside the microfocus X-ray tube 10 through the X-ray emission window 14.
  • FIG. 4 is a perspective view showing external appearance of the mold block 21. The Cockcroft-Walton multiplier array and the support plates 20b are embedded in the mold block 21. The Cockcroft-Walton multiplier array is a circuit often used as a power source for producing high-voltage of about 70 kV. There is a particular need to mold the Cockcroft-Walton multiplier array in a mold block 21 made from an insulating material in order to reduce influence of the ambient environment on positions where voltage is increased to a high voltage. Conventionally, the positioning of the plurality of diodes and capacitors that make up the Cockcroft-Walton multiplier array shift during molding and hardening of the block. High voltage outputted from a Cockcroft-Walton circuit with position shifts is often unstable so that supplying a stable high voltage has proven difficult.
  • In the present embodiment, as shown in FIGS. 5(a) through 5(c), the plurality of diodes and capacitors making up the Cockcroft-Walton multiplier array are soldered to the support plates 20b and also the diodes and capacitors are connected together by wiring 20b1 formed on the support plate 20b. This stable structure prevents the diodes and capacitors from shifting position when the insulation material is poured over the components of the Cockcroft-Walton multiplier array during molding processes of the mold block 21. Therefore, Cockcroft-Walton multiplier array of the present embodiment can supply a stable high voltage output.
  • Japanese Laid-Open Patent Publication (Kokai) No. SHO-63-186,566 describes a conventional Cockcroft-Walton circuit support plate in which are formed eyelets for fixing the diodes and capacitors. However, this conventional Cockcroft-Walton circuit has insufficient voltage-proof to be used at voltages of between 70 kV and 100 kV. Additionally, the exposed wiring protruding upward from the plates is a source of potential electrical discharges. In contrast, according to the present embodiment, because holes are formed in the print board 20b of Cockcroft-Walton multiplier array in a predetermined pattern and are mutually connected by the wirings formed on the board 20b, the amount that wiring protrudes upward from the support plate 20b is reduced to a minimum and the voltage-proof characteristic of the Cockcroft-Walton multiplier array is greatly improved.
  • FIG. 6 is a block diagram showing components provided in association with the X-ray source of the present embodiment. The block diagram includes an operation block portion 100 for operating the microfocus X-ray tube 10 and a control block portion 200 for controlling the operation block portion 100.
  • The operation block portion 100 includes a target control 110 for controlling target voltage of the X-ray tube 10; an overcurrent detector 120 for detecting excessive current of the tungsten target 16a; and a grid control 130 for controlling the grid voltage of the X-ray tube 10. The operation block portion 100 further includes a cathode control 140 for controlling the cathode voltage of the X-ray tube 10 and a heater control 150 for controlling the heater of the X-ray tube 10.
  • The control block portion 200 includes a voltage setting D/A converter 210 for applying target voltage setting voltage to both the target control 110 and the cathode control 140; a current setting D/A converter 220 for applying target current setting voltage to the grid control 130; and an interlock detector 230 for detecting an interlock. The control block portion 200 further includes an aging portion 240 for warming up the control block portion 200; a key switch 250 for stopping generation of X-rays; and a power source control 260 for controlling change of power source voltage. The control block portion 200 also includes a ROM 270 for storing control programs; a RAM 280; a voltage control 290 for setting voltage; a current control 300 for setting current; and a mode switch 310 for setting an X-ray mode. The control block portion 200 further includes a mode indicator 320 for indicating X-ray mode, target overcurrent, target voltage, and target current; an overcurrent display 330; a target voltage display meter 340; a target current display meter 350; and a CPU 360 controlling each component.
  • FIG. 7 is a block diagram showing detailed configuration of the operation block portion 100. The target control 110 includes a target voltage control 111 controlling target voltage according to the target voltage setting voltage applied thereto from the voltage setting D/A converter 210; and a target high-voltage generator 112 generating a desired target high-voltage according to a signal from the target voltage control 111. The target overcurrent detector 120 includes an overcurrent detector 121 for detecting overcurrent of the target current generated at the target high-voltage generator 112; and an overvoltage detector 122 detecting overvoltage of the target voltage generated at the target high-voltage generator 112.
  • The grid control 130 includes a target current detector 131 for detecting the target current; a target current comparator 132 for comparing the target current detected by the target current detector 131 with the setting voltage signal outputted from the current setting D/A converter 220; and a cut-off voltage control setting portion 133. The grid control portion 130 further includes a grid voltage control 134 for controlling grid voltage based on the results of comparisons made at the target current comparator 132; and a grid voltage generator 135 for generating a desired grid voltage according to signals received from the grid voltage control 134.
  • The cathode control 140 includes a cathode voltage control 141 for controlling cathode voltage according to target voltage setting voltage received from the voltage setting D/A converter 210; and a cathode voltage generator 142 for generating a desired cathode voltage according to signals received from the cathode voltage control 141. The heater control 150 includes a heater voltage control 151 for controlling the heater voltage; and a heater voltage generator 152 for generating a desired heater voltage according to signals received from the heater voltage control 151.
  • In a microfocus X-ray tube 10, the X-ray beam diameter is maintained at a small value even when the target voltage is changed. To precisely control the intensity level of the X-ray beam, the target high-voltage generator 112 must generate voltage that changes linearly from low voltage to high voltage. U. S. Patent Nos. 4,694,480 and 4,646,338 describe a conventional target high-voltage generation unit that uses pulse width modulation (PWM) to control the voltage. The voltage generated in the conventional target high-voltage generation unit fluctuates, especially at low voltage range, and linearly changing the voltage level cannot be achieved.
  • The target high-voltage generator 112 of the present embodiment uses a double invertor arrangement to control target voltage. That is, a step down type invertor is provided for the low-voltage range and a push-pull invertor is provided for the high-voltage range. With such an arrangement, a variable voltage that changes linearly from low voltage to high voltage can be obtained. FIG. 8 is a graphical representation of the relationship between input voltage and output voltage according to results of measurements of the X-ray source of the present embodiment using a coil of paraffin impregnated 3:600 shunt winding and twenty-stage Cockcroft-Walton voltage multiplier. It can be seen from this graph that the relationship between the input voltage and the output voltage changes linearly between an output voltage of about 10 kV to about 100 kV.
  • FIG. 9 is a circuit diagram showing a detailed circuit configuration of the target high-voltage generator 112. The target high-voltage generator 112 of the present embodiment includes a step-down invertor circuit 410 for the low-voltage range and a push-pull invertor circuit 420 for the high-voltage range. A stably changing voltage can be obtained over a broad range from low to high voltage using these two types of different invertor circuits 410 and 420.
  • Next, an explanation of principles underlying operation of the target high-voltage generator 112 will be provided while referring to the circuit diagram of FIG. 9 and the waveform diagram of FIG. 10. First, a target voltage setting voltage (Vi) is applied to the step-down invertor circuit 410, whereupon a setting voltage signal passes through a buffer IC1-a and is applied to a comparator IC1-c through an error amplifier IC1-b. The error amplifier IC1-b is also applied with the output from an operational amplifier IC5-a. Initially a 0 V voltage is developed at the secondary coil of the transformer 430. A detection voltage representative of the voltage developed at the secondary coil of the transformer 430 is obtained from the operational amplifier IC5-a through a voltage divider 440 connected between the output of the Cockcroft-Walton multiplier array and ground. The detection voltage is also initially a 0 V voltage. The error amplifier IC1-b is saturated to a +24 V, and this saturation voltage is applied to the comparator IC1-c. The initial voltage of the capacitor C1 is also a 0 V voltage. The comparator IC1-c is saturated to a +24 V voltage as represented by level (c) in FIG. 10. As represented by levels (d) and (e) in FIG. 10, this results in the transistors Q1, Q2, and Q3 being rendered ON, whereupon the capacitor C1 is charged through a coil L1. The transistor Q1 repeats switching actions and thus allows the capacitor C1 to be continuously charged until the voltage across the capacitor C1 has reached the target voltage setting voltage Vi. The coil L1 is connected between the transistor Q1 and the capacitor C1 for determining a time constant of charging current that flows in the capacitor C1. As represented in level (d) of FIG. 10, when the voltage V2 across the capacitor C1 exceeds the target voltage setting voltage Vi, the output from the comparator IC1-c is zeroed so that the transistors Q1, Q2, and Q3 are rendered OFF. As such, the voltage V2 substantially equal to the target voltage setting voltage Vi is stably obtained.
  • The voltage at the primary coil of the transformer 430 is subjected to ON-OFF switchings by virtue of the transistors Q6 and Q7 according to oscillation frequency of the oscillator IC4. The oscillator IC4 is rendered ON and begins to oscillate when the comparators IC2-a, IC2-b, and IC2-c are applied with an ON voltage from the target voltage ON/OFF terminal.
  • The voltage developed at the secondary coil of the transformer 430 increases to a voltage according to the turns ratio and is further increased to a high voltage by the Cockcroft-Walton multiplier array . The increased output voltage is voltage-divided by the divider 440. The divided voltage passes through the operation amplifier IC5-a and is applied to the error amplifier IC1-b as the detection voltage. This operation is represented by level (g) in FIG. 10. The error amplifier IC1-b compares the detection voltage and the target voltage setting voltage Vi and drives the comparator IC1-c until the detection voltage and the target voltage setting voltage Vi are in coincidence with each other.
  • In this way, the high-voltage output is controllable by operating the double invertor including the step down invertor circuit 410 and the push-pull invertor circuit 420. The characteristic of the circuitry at the primary coil side of the transformer 430, that is, of the step down invertor circuit 410 and the push-pull invertor circuit 420, is that the ON and OFF operation of the transistors Q1, Q2, and Q3, as driven by the comparator IC1-c, controls the charge current of the capacitor C1. For this reason, drive is accomplished using only a minimal amount of power and with a circuit configuration that loses very little power.
  • FIG. 11 shows a target voltage circuit 500 of an X-ray source conceived by the present inventors (not prior art). The target voltage circuit 500 differs from the target high-voltage generator 112 in that the ON and OFF condition of a transistor Q5, which corresponds to the transistor Q1 of the present embodiment, is controlled by output from an error amplifier IC6-1, which corresponds to the error amplifier IC1-b of the present embodiment, and also in that no capacitor, that is, capacitor C1 of the present embodiment, is provided for charging by the output current from the transistor Q5. Not only is the current flowing from the transistor Q5 lost power, but also a source of heat because the lost power is converted into heat. The transistors Q1 and Q2 provided to the invertor circuit are less efficient and produce more heat than the switching transistors Q6 and Q7 for controlling voltage by switching transistors for controlling the current. For this reason, a cooling fan must be provided for cooling the circuitry or else operation will become unstable.
  • FIG. 12(a) is a graphical representation showing power loss in the target voltage circuit 500 with respect to the input power thereto. FIG. 12(b) is a graphical representation showing power loss of the target high-voltage generator 112 of the present embodiment with respect to the input power thereto. It can be seen from these graphs that less power loss is present in the target high-voltage generator 112 throughout the high-voltage output range from 10 to 70 kV. Measurements for these graphs were taken with both the target voltage circuits 112 and 500 provided with a Cockcroft-Walton multiplier array having the same configuration.
  • FIG. 13(a) is a graphical representation of output intensity of a conventional X-ray source provided with a PWM type high-voltage generation circuit. FIG. 13(b) is a graphical representation of output intensity of the X-ray source according to the present embodiment. It can be seen by comparing these graphs that the X-ray source of the present embodiment outputs X-rays with more stable intensity than the conventional X-ray source. In measurements for both of these graphs, both of the X-ray sources had a 40 kV target voltage applied to the target. Target current was 10 µA.
  • While the invention has been described in detail with reference to a specific embodiment thereof, it would be apparent to those skilled in the art that various changes and modifications may be made therein without departing from the scope of the invention, which is defined by the attached claims. For example, the microfocus X-ray tube 10 could be an end window type instead of the side window type shown in FIG. 3.
  • In the X-ray source according to the present invention, the first voltage generation portion provided with a target voltage generation circuit operates according to ON and OFF switching of switching elements so that input voltage increases up to a predetermined set voltage. The switching operations of the switching elements are controlled by a signal voltage from a second voltage generation portion. For this reason, there is virtually no power loss from the first voltage generation portion. Also, very little heat is generated from this circuitry so that natural cooling without the aid of a cooling fan is sufficient. Because no cooling fan needs to be provided, problems caused by the vibration of a cooling fan, such as, inability to maintain the focus of the X-rays, will not occur.
  • Also the Cockcroft-Walton circuitry of the second voltage generation portion has a configuration wherein rectification elements (diodes) and capacitive elements (capacitors) are wired and connected on an insulation board. Therefore, all the elements are fixed in place by the insulation board so that the positions of the elements will not shift during molding to the insulation block. For this reason, no variability in high-voltage output, which can result from rectification elements and capacitive elements shifting in position, will not be generated so that a stable high-voltage output can be obtained from the second voltage generation portion.

Claims (7)

  1. An X-ray source comprising:
    an X-ray tube (10) having a cathode (15) and a target (16); and
    a target voltage generating circuit (112) for generating a target voltage applied to said target (16), said target voltage generating circuit (112) comprising:
    a first voltage generating circuit (410) generating a first voltage in response to an instruction voltage (Vi) indicative of a voltage to be applied to said target (16), said first voltage generating circuit (410) including a comparator (1C1-c) providing a comparison output, a switching element (Q1) connected to said comparator to receive the comparison output for controlling said switching element (Q1), and a capacitive element (C1) connected across a voltage source through said switching element (Q1), said capacitive element (C1) having a capacitance;
    a second voltage generating circuit (420, 21) connected to said first voltage generating circuit (410), said second voltage generating circuit (420, 21) generating said target voltage to be applied to said target (16); and
    a voltage divider (440) connected to said second voltage generating circuit (420, 21), the voltage divider (440) dividing the output voltage from said second voltage generating circuit (420, 21) to produce a detection voltage (VH) indicative of a voltage generated by said second voltage generating circuit (420, 21);
    wherein said comparator provides the comparison output based on the instruction voltage, the detection voltage and the voltage developed across said capacitive element (C1), wherein said switching element (Q1) is rendered ON as long as the comparison output indicates that the detection voltage (VH) is below the instruction voltage (Vi), whereas said switching element (Q1) is alternately rendered ON and OFF after the comparison output indicated that the detection voltage (VH) has exceeded the instruction voltage (Vi), said capacitive element (C1) being charged when said switching element (Q1) is ON, and said second voltage generating circuit (420, 21) generating the target voltage based on the voltage developed across said capacitive element (C1), whereby the output voltage generated from said second voltage generating circuit (420, 21) is maintained at substantially the instruction voltage (Vi).
  2. An X-ray source as claimed in claim 1, wherein the first voltage generating circuit (410) comprises a step down inverter.
  3. An X-ray source as claimed in claims 1 or 2 wherein the second voltage generating circuit (420,21) comprises a push-pull inverter (420).
  4. An X-ray source as claimed in anyone of claims 1 to 3, wherein said first voltage generating circuit (410) further includes an inductive element (L1) having an inductance, and wherein said capacitive element (C1) is charged according to a time constant determined by the capacitance of said capacitive element (C1) and the inductance of said inductive element (L1).
  5. An X-ray source as claimed in any one of claims 1 to 4, wherein said first voltage generating circuit (410) further includes an error amplifier (1C1-b) having a first input terminal applied with the instruction voltage, a second input terminal applied with the detection voltage, and an output terminal, and wherein said comparator (1C1-c) has a first input terminal connected to the output terminal of said error amplifier (1C1-b), and a second input terminal supplied with the voltage developed across said capacitive element (C1).
  6. An X-ray source as claimed in any one of the preceding claims, wherein said second voltage generating circuit (420) comprises a Cockcroft-Walton multiplier array (20a) having a plurality of rectifying elements and a plurality of capacitive elements, and a pair of insulation plates (20b) for mounting said plurality of rectifying elements and said plurality of capacitive elements, said plurality of rectifying elements and said plurality of capacitive elements being connected by wiring (20b1) formed on each of said pair of insulation plates (20b).
  7. An X-ray source as claimed in claim 6, wherein said Cockcroft-Walton multiplier array (20a) and said pair of insulation plates (20b) are embedded in a moulded block (21) made from an insulating material.
EP95304735A 1994-07-08 1995-07-06 X-ray source Expired - Lifetime EP0691801B1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP15766494 1994-07-08
JP6157664A JP2769434B2 (en) 1994-07-08 1994-07-08 X-ray equipment
JP157664/94 1994-07-08

Publications (2)

Publication Number Publication Date
EP0691801A1 EP0691801A1 (en) 1996-01-10
EP0691801B1 true EP0691801B1 (en) 2000-04-05

Family

ID=15654688

Family Applications (1)

Application Number Title Priority Date Filing Date
EP95304735A Expired - Lifetime EP0691801B1 (en) 1994-07-08 1995-07-06 X-ray source

Country Status (3)

Country Link
EP (1) EP0691801B1 (en)
JP (1) JP2769434B2 (en)
DE (1) DE69516052T2 (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4889979B2 (en) * 2005-08-30 2012-03-07 浜松ホトニクス株式会社 X-ray source
JP5201017B2 (en) * 2009-03-10 2013-06-05 株式会社島津製作所 X-ray generator and X-ray imaging apparatus having the same
JP7112234B2 (en) * 2018-04-12 2022-08-03 浜松ホトニクス株式会社 X-ray generator and X-ray utilization system
US11792906B2 (en) 2020-04-10 2023-10-17 Elec-Field Future Corp. X-ray apparatus
JP6966027B1 (en) * 2020-05-27 2021-11-10 株式会社明電舎 High voltage generator and X-ray generator
WO2021241227A1 (en) * 2020-05-27 2021-12-02 株式会社明電舎 High voltage generator and x-ray generator

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0634885A1 (en) * 1993-07-15 1995-01-18 Hamamatsu Photonics K.K. X-ray apparatus

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS579100A (en) * 1980-06-19 1982-01-18 Asahi Roentgen Kogyo Kk High voltage generator for x-ray device
JPS5753100A (en) * 1980-09-13 1982-03-29 Toshiba Corp X-ray equipment
US4504895A (en) * 1982-11-03 1985-03-12 General Electric Company Regulated dc-dc converter using a resonating transformer
US4646338A (en) 1983-08-01 1987-02-24 Kevex Corporation Modular portable X-ray source with integral generator
US4694480A (en) 1985-07-30 1987-09-15 Kevex Corporation Hand held precision X-ray source
JPS6489198A (en) * 1987-09-30 1989-04-03 Toshiba Corp X-ray high-voltage device
JPH0232699U (en) * 1988-08-25 1990-02-28
US5077771A (en) 1989-03-01 1991-12-31 Kevex X-Ray Inc. Hand held high power pulsed precision x-ray source
US5272612A (en) * 1989-06-30 1993-12-21 Kabushiki Kaisha Toshiba X-ray power supply utilizing A.C. frequency conversion to generate a high D.C. voltage
JPH04181698A (en) * 1990-11-14 1992-06-29 Hitachi Medical Corp Resonance inverter type x-ray high-voltage device
CH684377A5 (en) * 1992-10-22 1994-08-31 Stadler Elektronik Ag Power supply for X-ray tubes and to methods for their operation.

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0634885A1 (en) * 1993-07-15 1995-01-18 Hamamatsu Photonics K.K. X-ray apparatus

Also Published As

Publication number Publication date
JP2769434B2 (en) 1998-06-25
DE69516052D1 (en) 2000-05-11
DE69516052T2 (en) 2000-08-31
JPH0822896A (en) 1996-01-23
EP0691801A1 (en) 1996-01-10

Similar Documents

Publication Publication Date Title
US8829817B2 (en) Power supply device and lighting equipment
EP0634885B1 (en) X-ray apparatus
EP0474315A2 (en) Microwave discharge light source apparatus
EP1862879B1 (en) High voltage linear regulator for an electron tube
US20070120498A1 (en) Current driving circuit for inductive loads
EP0137401B1 (en) Heating circuit for a filament of an x-ray tube
EP0691801B1 (en) X-ray source
JP4116092B2 (en) Circuit arrangement for dimmable operation of a fluorescent lamp
US4648093A (en) Power supply for gas discharge lasers
US6531830B2 (en) Discharge-lamp drive apparatus
KR101088974B1 (en) Induction lamp lighting device and inllumination apparatus
EP0075282B1 (en) Gas laser apparatus
US6677717B2 (en) Power supply apparatus of lighting system using microwave
KR101782474B1 (en) Multipolar field emission device having single source and method for driving the field emission device
US5883368A (en) Microwave frequency energy generating apparatus provided with a voltage converting means
US5747949A (en) CRT focusing circuit with individually controlled switches developing an approximate parabolic waveform
US20240334570A1 (en) A lighting circuit
JPS6338875B2 (en)
KR920003569B1 (en) Acting voltage and horizontal deflection current generating circuit
KR200194629Y1 (en) Navigation strobo-light
JPS6150125A (en) Electronic flash device
JPH05152653A (en) Power supply device for laser pumping lamp
GB2040086A (en) D.C. voltage converter
MY112369A (en) Microwave oven equipped with a structurally simple microwave generating apparatus.
KR800001021B1 (en) Circuit in a television display apparatus for producing a sawtooth deflection current through a line deflection coil

Legal Events

Date Code Title Description
PUAI Public reference made under article 153(3) epc to a published international application that has entered the european phase

Free format text: ORIGINAL CODE: 0009012

AK Designated contracting states

Kind code of ref document: A1

Designated state(s): DE FR GB

K1C1 Correction of patent application (title page) published

Effective date: 19960110

17P Request for examination filed

Effective date: 19960315

17Q First examination report despatched

Effective date: 19980527

GRAG Despatch of communication of intention to grant

Free format text: ORIGINAL CODE: EPIDOS AGRA

GRAG Despatch of communication of intention to grant

Free format text: ORIGINAL CODE: EPIDOS AGRA

GRAH Despatch of communication of intention to grant a patent

Free format text: ORIGINAL CODE: EPIDOS IGRA

GRAH Despatch of communication of intention to grant a patent

Free format text: ORIGINAL CODE: EPIDOS IGRA

GRAA (expected) grant

Free format text: ORIGINAL CODE: 0009210

AK Designated contracting states

Kind code of ref document: B1

Designated state(s): DE FR GB

REF Corresponds to:

Ref document number: 69516052

Country of ref document: DE

Date of ref document: 20000511

ET Fr: translation filed
PLBE No opposition filed within time limit

Free format text: ORIGINAL CODE: 0009261

STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: NO OPPOSITION FILED WITHIN TIME LIMIT

26N No opposition filed
REG Reference to a national code

Ref country code: GB

Ref legal event code: IF02

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: GB

Payment date: 20070704

Year of fee payment: 13

GBPC Gb: european patent ceased through non-payment of renewal fee

Effective date: 20080706

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: GB

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20080706

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: FR

Payment date: 20120719

Year of fee payment: 18

Ref country code: DE

Payment date: 20120704

Year of fee payment: 18

REG Reference to a national code

Ref country code: FR

Ref legal event code: ST

Effective date: 20140331

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: DE

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20140201

REG Reference to a national code

Ref country code: DE

Ref legal event code: R119

Ref document number: 69516052

Country of ref document: DE

Effective date: 20140201

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: FR

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20130731