EP0627819A1 - Level conversion circuit for signal of ECL-level - Google Patents

Level conversion circuit for signal of ECL-level Download PDF

Info

Publication number
EP0627819A1
EP0627819A1 EP94106355A EP94106355A EP0627819A1 EP 0627819 A1 EP0627819 A1 EP 0627819A1 EP 94106355 A EP94106355 A EP 94106355A EP 94106355 A EP94106355 A EP 94106355A EP 0627819 A1 EP0627819 A1 EP 0627819A1
Authority
EP
European Patent Office
Prior art keywords
transistor
signal
circuit
voltage line
level
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP94106355A
Other languages
German (de)
French (fr)
Other versions
EP0627819B1 (en
Inventor
Hiroyuki C/O Nec Corporation Takahashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Publication of EP0627819A1 publication Critical patent/EP0627819A1/en
Application granted granted Critical
Publication of EP0627819B1 publication Critical patent/EP0627819B1/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Images

Classifications

    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K19/00Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/0175Coupling arrangements; Interface arrangements
    • H03K19/017509Interface arrangements
    • H03K19/017518Interface arrangements using a combination of bipolar and field effect transistors [BIFET]

Definitions

  • the present invention relates to a level conversion circuit for a signal of an emitter-coupled-logic (ECL) level and ,more particularly, to such a circuit constituted of bipolar transistors and complementary metal-oxide-semiconductor transistors, i.e. a Bi-CMOS circuit, for responding to an input signal of the ECL-level to produce an output signal having an amplitude capable of driving a CMOS circuit.
  • ECL emitter-coupled-logic
  • an ECL circuit performs a signal processing operation at a very high speed but with a relatively large power consumption
  • a CMOS circuit performs a signal processing operation with small power consumption but at a relatively low speed.
  • a logic circuit is widely employed that incorporate both the ECL circuit and the CMOS circuit.
  • a level conversion circuit is required to convert a signal of the ECL-level derived from the ECL circuit into such a signal that drives the CMOS circuit, as well known in the art.
  • FIG. 1 such a level conversion circuit according to a prior art is shown as a typical example.
  • this prior art circuit is composed of an ECL buffer circuit ECL1 and a level converter LC4.
  • the buffer ECL1 includes a bipolar transistor Q1 supplied with an input signal IN of the ECL-level and a bipolar transistor Q2 supplied with a reference voltage VR. These transistors Q1 and Q2 are connected to form a differential circuit together with a current source I1 and load resistors R1 and R2.
  • the true and complementary intermediate signals EO and EOB are derived from the collectors of the transistors Q2 and Q1, respectively, and supplied to emitter follower circuits composed of bipolar transistors Q41 and Q42 and current sources I41 and I42 in the level converter LC4.
  • the emitter output of the transistor Q41 is supplied to the gates of P-channel MOS transistors M41 and M46 and the emitter output of the transistor Q42 is supplied to the gates of P-channel MOS transistors M42 and M45.
  • a current mirror circuit composed of N-channel MOS transistors M43 and M44 is connected between the transistors M41 and M42.
  • a current mirror circuit composed of N-channel MOS transistors M47 and M48 is connected between the transistors M45 and M46.
  • the true and complementary output signals OUT and OUTB are derived from the sources of the transistors M42 and M 46, respectively.
  • the buffer ECL1 amplifies of the amplitude, 0.8 V, of the input signal IN up to the amplitude, 1 to 1.5 V, indicative of the difference between the intermediate signals EO and EOB.
  • the level converter LC4 further amplifies the amplitude of the signal EO (EOB) and produces the output signals OUT and OUTB which in turn drive a CMOS circuit (not shown) connected to this circuit.
  • the level conversion circuit is rehired not only to perform a desired level conversion operation but also to carry out that operation at a high speed. Considering the operation for pulling down the level of the output signal OUT or OUTB, however, it is required that the transistors M41, M43 and M44 or M45, M47 and M48 operate in sequence in that order to pull down the corresponding output signal. The level conversion speed, in particular the pull-down speed of the output signal, is thereby lowered. It is considered to make the transistors M41 to M48 operate in a linear region to enhance the conversion speed, but in that case the power consumption is in turn increased.
  • a level conversion circuit includes a bipolar transistor, a first MOS transistor of a first channel type and a second MOS transistor of a second channel type connected in series in that order between a first voltage line and a second voltage line.
  • the bipolar transistor receives at the base thereof an input signal to be level-converted.
  • the first MOS transistor has a gate supplied with a bias voltage and the second MOS transistor has a gate supplied with an inverted signal of the input signal.
  • An output signal is derived from the connection node of the first and second MOS transistors.
  • the level of the signal changes toward the first voltage level at the first voltage line
  • the effective conductance of the first MOS transistor is increased, whereas that of the second MOS transistor is decreased. Accordingly, the output signal derived from the output terminal is changed in level toward to the first voltage level.
  • the signal changes in level to the second voltage level at the second voltage line on the other hand, the effective conductance of the first MOS transistor is decreased, whereas that of the second MOS transistor is increased, so that the output signal is changed in level toward to the second voltage level.
  • the input signal is level-converted and the output signal having an amplified amplitude is derived.
  • the level conversion operation is carried out at a high speed, because the level changing operation is performed through the minimum number of transistors.
  • each of the pull-up and pull-down operations for the output signal is performed through one MOS transistor and one PN junction representative of the base-emitter junction or diode. Accordingly, the symmetry of the output signal is achieved in both level changing operation and voltage waveform.
  • FIG. 2 therein shown a level conversion circuit according to a first embodiment of the present. invention, in which the same constituents as those shown in Fig. 1 are denoted by the same reference symbols to omit the further description thereof.
  • the present level conversion circuit is different from the prior art in a level converter LC1.
  • This converter LC1 includes two NPN bipolar transistors Q11 and Q12 supplied at the bases thereof with the true and complementary intermediate signals EO and EOB from the ECL buffer ECL1, respectively.
  • the collectors of the transistors Q11 and Q12 are connected to a first voltage line having a level of VCC.
  • the converter LC1 further includes two P-channel MOS transistors M11 and M12, four N-channel MOS transistors M13 to M16 and a diode D11.
  • the transistor M11 is connected between the emitter of the transistor Q11 and a first output terminal from which a true output signal OUT is derived
  • the transistor M12 is connected between the emitter of the transistor Q12 and a second output terminal from which a complementary output signal OUTB is derived.
  • the gates of the transistors M11 and M12 are connected in common to a second voltage line to receive a second voltage level VEEM.
  • This level VEEM takes the ground level. If desired, the level VEEM may take another level that is higher than the ground level.
  • the transistors M13 and M15 are connected in parallel between the first output terminal and the anode of the diode D11 having its cathode connected to the second voltage line, and the transistors M14 and M16 are connected in parallel between the second output terminal and the anode of the diode D11.
  • the diode D11 is made preferably by the base-emitter junction of a bipolar transistor having a collector connected to the base thereof.
  • the gates of the transistors and M13 and M14 are connected respectively to the bases of the transistors Q12 and Q11 to receive the complementary and true intermediate signals OUTB and OUT.
  • the gates of the transistors M15 and M16 are connected to receive the complementary and true output signals OUTB and OUT, respectively.
  • the input signal IN of the ECL-level (having an amplitude of 0.8 V) is first converted by the ECL buffer ECL1 into the intermediate signal EO (EOB) having an amplitude of 1 to 1.8 V, as described in connection with Fig. 1.
  • Each of the signals EO and EOB has the high level equal to the first voltage level VCC.
  • the intermediate signal EO (EOB) follows the change in level of the input signal IN.
  • the signal EOB has a phase that is opposite to the phase of the input signal IN.
  • the emitter levels of the transistors M11 and M12 also follow the changes in level of the signals EO and EOB, respectively, with a difference therefrom by a base-emitter forward voltage drop which is about 0.8 V.
  • the bias voltage between the gate and source of the transistor M11 is made small because the gate thereof is supplied with the second voltage level VEEM and thus constant.
  • the transistor M11 is thereby powered in effective conductance thereof.
  • the bias voltage between the gate and source of the transistor M12 is made large, so that the effective conductance thereof is increased.
  • the signal EO is further supplied to the transistor M14, so that the change thereof from the high level to the low level causes the voltage between the gate and source of the transistor M14 to become small, because the source voltage thereof is fixed at a constant level that is higher than the second voltage level VEEM by the forward voltage drop (about 0.8 V) of the diode D11.
  • the effective conductance of the transistor M14 is thereby made small.
  • the signal EOB made large the voltage between the gate and source of the transistor M13 to increase the effective conductance thereof.
  • the true output signal OUT is changed from the high level to the low level, whereas the complementary output signal OUTB is changed from the low level to the high level.
  • the changes in output signals OUT and OUTB cause the effective conductance of the transistors M16 and M15 to become small and large, respectively. That is, the change in level of the output signal is positively fed back. Accordingly, the change in output signal OUT (OUTB) is accelerated and further a d.c. current following through the transistors M11 to M16 is suppressed.
  • FIG. 8 there is shown a relationship in conversion delay time and power consumption with respect to a ratio in size between the transistors M13 and M15 or M14 and M16.
  • each of the output signals OUT and OUTB takes the high level of about (VCC-VD) and the low level of about (VEEM-VD), where VD represents the base-emitter forward voltage of the transistor Q11 (Q12) and the forward voltage of the diode D11.
  • VCC the base-emitter forward voltage of the transistor Q11 (Q12)
  • VEEM-VD the low level of about
  • the respective signals IN, EO, EOB,OUT and OUTB take voltage waveforms, as shown in Fig. 6.
  • the level VEEM may take the ground level or 0 V.
  • each of the transistors Q11 and Q12 functions as emitter-follower and thus operates at a very high speed, as well known in the art. Moreover, only a MOS transistor is inserted in a signal path for transferring a level change to each of the output signals OUT and OUTB. Accordingly, the change in level of each of the output signals OUT and OUTB is performed at a high speed. Furthermore, the diode D11 presents the symmetry in conversion operation as well as voltage waveform.
  • a level conversion circuit according to a second embodiment of the present invention is slightly different in the converter from that shown in Fig. 2. That is, as shown by LC2 in this drawing, the converter of the present circuit includes two current sources I21 and I22.
  • the current source I21 is connected between the emitter of the transistor Q11 and the second voltage line and the current source I22 is connected between the emitter of the transistor Q12 and the second voltage line.
  • the MOS transistors M15 and M16 shown in Fig, 2 are omitted from the present converter LC2, however.
  • the change in level of each of the emitters of the transistors Q11 and Q12 i.e. each of the sources of the transistors M11 and M12, is attained at a high speed by the currant sources I21 and I22.
  • the level conversion speed is thereby improved as compared to the circuit shown in Fig. 2.
  • Fig. 7 shows a comparison between the circuits of Fig. 2 and Fig. 3 with respect to changes in conversion delay time and power consumption to a power supply voltage represented by (VCC-VEEM).
  • a level conversion circuit according to a third embodiment of the present invention is different from the circuit shown in Fig. 2 in that the transistors M15 and M16 are omitted.
  • the present circuit is therefore inferior to the circuit of Fig. 2 in both of an operation speed and power consumption.
  • the present circuit is superior to the prior art circuit of fig. 1, as described in connection with Fig. 2.
  • this circuit is constructed with a smaller number of transistors than the circuits shown in Figs. 1-3.
  • FIG. 9 there is shown a comparison among the circuits indicated in Figs. 1-4 with respect to the conversion delay time to the d.c. current (i.e, power consumption).
  • a logic circuit having a plurality of level conversion circuit there is shown a logic circuit having a plurality of level conversion circuit according to the present invention.
  • Each of the level conversion circuits is of any type shown in Fig. 2, 3 or 4, However, the diode D11 is omitted from each conversion circuit, and a diode D51 is provide in common to the level conversion circuits, instead. Further, there is provide a voltage generator VEG to supply a stabilized level VEEM to the second voltage line.

Abstract

A level conversion circuit is disclosed for converting a first signal having a first amplitude into a second signal having a second amplitude that is larger than the first amplitude. The conversion circuit includes a bipolar transistor (Q11) supplied at a base thereof with the first signal (EO), a first MOS transistor (M11) of a first channel type having a gate supplied with a bias voltage (VEEM) and a source-drain path connected between the emitter of the bipolar transistor (Q11) and an output node from which the second signal is derived, and a second MOS transistor (M13) of a second channel type having a gate supplied with an inverted signal (EOB) of the first signal (EO) and a source-drain path connected between the output node and a reference potential line. A PN junction diode (D11) is preferably inserted between the third transistor (M13) and the reference potential line.

Description

    BACKGROUND OF THE INVENTION
  • The present invention relates to a level conversion circuit for a signal of an emitter-coupled-logic (ECL) level and ,more particularly, to such a circuit constituted of bipolar transistors and complementary metal-oxide-semiconductor transistors, i.e. a Bi-CMOS circuit, for responding to an input signal of the ECL-level to produce an output signal having an amplitude capable of driving a CMOS circuit.
  • As well known in the art, an ECL circuit performs a signal processing operation at a very high speed but with a relatively large power consumption, and a CMOS circuit performs a signal processing operation with small power consumption but at a relatively low speed. Accordingly, such a logic circuit is widely employed that incorporate both the ECL circuit and the CMOS circuit. In this case, a level conversion circuit is required to convert a signal of the ECL-level derived from the ECL circuit into such a signal that drives the CMOS circuit, as well known in the art.
  • Referring to Fig. 1, such a level conversion circuit according to a prior art is shown as a typical example. Specifically, this prior art circuit is composed of an ECL buffer circuit ECL1 and a level converter LC4. The buffer ECL1 includes a bipolar transistor Q1 supplied with an input signal IN of the ECL-level and a bipolar transistor Q2 supplied with a reference voltage VR. These transistors Q1 and Q2 are connected to form a differential circuit together with a current source I1 and load resistors R1 and R2. The true and complementary intermediate signals EO and EOB are derived from the collectors of the transistors Q2 and Q1, respectively, and supplied to emitter follower circuits composed of bipolar transistors Q41 and Q42 and current sources I41 and I42 in the level converter LC4. The emitter output of the transistor Q41 is supplied to the gates of P-channel MOS transistors M41 and M46 and the emitter output of the transistor Q42 is supplied to the gates of P-channel MOS transistors M42 and M45. A current mirror circuit composed of N-channel MOS transistors M43 and M44 is connected between the transistors M41 and M42. Similarly, a current mirror circuit composed of N-channel MOS transistors M47 and M48 is connected between the transistors M45 and M46. The true and complementary output signals OUT and OUTB are derived from the sources of the transistors M42 and M 46, respectively.
  • With such a circuit as described above, the buffer ECL1 amplifies of the amplitude, 0.8 V, of the input signal IN up to the amplitude, 1 to 1.5 V, indicative of the difference between the intermediate signals EO and EOB. The level converter LC4 further amplifies the amplitude of the signal EO (EOB) and produces the output signals OUT and OUTB which in turn drive a CMOS circuit (not shown) connected to this circuit.
  • The level conversion circuit is rehired not only to perform a desired level conversion operation but also to carry out that operation at a high speed. Considering the operation for pulling down the level of the output signal OUT or OUTB, however, it is required that the transistors M41, M43 and M44 or M45, M47 and M48 operate in sequence in that order to pull down the corresponding output signal. The level conversion speed, in particular the pull-down speed of the output signal, is thereby lowered. It is considered to make the transistors M41 to M48 operate in a linear region to enhance the conversion speed, but in that case the power consumption is in turn increased.
  • SUMMARY OF THE INVENTION
  • It is therefore an object of the present invention to provide an improved level conversion circuit utilizing Bi-CMOS circuit.
  • It is another object of the present invention to provide a level conversion circuit of a Bi-CMOS type which performs a level conversion operation at a high speed with low power consumption.
  • A level conversion circuit according to the present invention includes a bipolar transistor, a first MOS transistor of a first channel type and a second MOS transistor of a second channel type connected in series in that order between a first voltage line and a second voltage line. The bipolar transistor receives at the base thereof an input signal to be level-converted. The first MOS transistor has a gate supplied with a bias voltage and the second MOS transistor has a gate supplied with an inverted signal of the input signal. An output signal is derived from the connection node of the first and second MOS transistors.
  • In operation, when the level of the signal changes toward the first voltage level at the first voltage line, the effective conductance of the first MOS transistor is increased, whereas that of the second MOS transistor is decreased. Accordingly, the output signal derived from the output terminal is changed in level toward to the first voltage level. When the signal changes in level to the second voltage level at the second voltage line, on the other hand, the effective conductance of the first MOS transistor is decreased, whereas that of the second MOS transistor is increased, so that the output signal is changed in level toward to the second voltage level. Thus, the input signal is level-converted and the output signal having an amplified amplitude is derived. Moreover, the level conversion operation is carried out at a high speed, because the level changing operation is performed through the minimum number of transistors.
  • It is preferable to insert a diode relative to the base-emitter PN junction of a bipolar transistor between the second MOS transistor and the second voltage line. In this case, each of the pull-up and pull-down operations for the output signal is performed through one MOS transistor and one PN junction representative of the base-emitter junction or diode. Accordingly, the symmetry of the output signal is achieved in both level changing operation and voltage waveform.
  • BRIEF DESCRIPTION OF THE DRAWINGS
  • The above and other objects, features and advantages of the present invention will be more apparent from the following description taken in conjunction with the accompanying drawings, wherein:
    • Fig. 1 is a circuit diagram illustrative of a level conversion circuit according to the prior art;
    • Fig. 2 is a circuit diagram illustrative of a level conversion circuit according to a first embodiment of the present invention;
    • Fig. 3 is a circuit diagram indicative of a second embodiment of the present invention;
    • Fig. 4 is a circuit diagram indicative of a third embodiment of the present invention;
    • Fig. 5 is a block diagram illustrative of an logic circuit including a level conversion circuit according to the present invention;
    • Fig. 6 is a voltage waveform diagram indicative of respective signals shown in Fig. 2;
    • Fig. 7 is a graph indicative of power supply voltage dependency characteristics of the circuits shown in Figs. 2 and 3 with respect to a conversion delay time and power consumption;
    • Fig. 8 is a graph indicative of transistor size dependency characteristics of the circuit shown Fig. 2 with respect to a conversion delay time and power consumption; and
    • Fig. 9 is a graph indicative of a conversion delay time to power consumption of the circuits shown in Figs. 1-4.
    DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS
  • Referring to Fig. 2, therein shown a level conversion circuit according to a first embodiment of the present. invention, in which the same constituents as those shown in Fig. 1 are denoted by the same reference symbols to omit the further description thereof. As is apparent from the comparison between the circuits shown in Figs. 1 and 2, the present level conversion circuit is different from the prior art in a level converter LC1. This converter LC1 includes two NPN bipolar transistors Q11 and Q12 supplied at the bases thereof with the true and complementary intermediate signals EO and EOB from the ECL buffer ECL1, respectively. The collectors of the transistors Q11 and Q12 are connected to a first voltage line having a level of VCC. The converter LC1 further includes two P-channel MOS transistors M11 and M12, four N-channel MOS transistors M13 to M16 and a diode D11. The transistor M11 is connected between the emitter of the transistor Q11 and a first output terminal from which a true output signal OUT is derived, and the transistor M12 is connected between the emitter of the transistor Q12 and a second output terminal from which a complementary output signal OUTB is derived. The gates of the transistors M11 and M12 are connected in common to a second voltage line to receive a second voltage level VEEM. This level VEEM takes the ground level. If desired, the level VEEM may take another level that is higher than the ground level. The transistors M13 and M15 are connected in parallel between the first output terminal and the anode of the diode D11 having its cathode connected to the second voltage line, and the transistors M14 and M16 are connected in parallel between the second output terminal and the anode of the diode D11. The diode D11 is made preferably by the base-emitter junction of a bipolar transistor having a collector connected to the base thereof. The gates of the transistors and M13 and M14 are connected respectively to the bases of the transistors Q12 and Q11 to receive the complementary and true intermediate signals OUTB and OUT. The gates of the transistors M15 and M16 are connected to receive the complementary and true output signals OUTB and OUT, respectively.
  • In operation, the input signal IN of the ECL-level (having an amplitude of 0.8 V) is first converted by the ECL buffer ECL1 into the intermediate signal EO (EOB) having an amplitude of 1 to 1.8 V, as described in connection with Fig. 1. Each of the signals EO and EOB has the high level equal to the first voltage level VCC. It is matter of course that the intermediate signal EO (EOB) follows the change in level of the input signal IN. However, the signal EOB has a phase that is opposite to the phase of the input signal IN. The emitter levels of the transistors M11 and M12 also follow the changes in level of the signals EO and EOB, respectively, with a difference therefrom by a base-emitter forward voltage drop which is about 0.8 V. When the signal EO is changed from the high level to the low level, the bias voltage between the gate and source of the transistor M11 is made small because the gate thereof is supplied with the second voltage level VEEM and thus constant. The transistor M11 is thereby powered in effective conductance thereof. On the other hand, the bias voltage between the gate and source of the transistor M12 is made large, so that the effective conductance thereof is increased.
  • The signal EO is further supplied to the transistor M14, so that the change thereof from the high level to the low level causes the voltage between the gate and source of the transistor M14 to become small, because the source voltage thereof is fixed at a constant level that is higher than the second voltage level VEEM by the forward voltage drop (about 0.8 V) of the diode D11. The effective conductance of the transistor M14 is thereby made small. On the other hand, the signal EOB made large the voltage between the gate and source of the transistor M13 to increase the effective conductance thereof. As a result, the true output signal OUT is changed from the high level to the low level, whereas the complementary output signal OUTB is changed from the low level to the high level. The changes in output signals OUT and OUTB cause the effective conductance of the transistors M16 and M15 to become small and large, respectively. That is, the change in level of the output signal is positively fed back. Accordingly, the change in output signal OUT (OUTB) is accelerated and further a d.c. current following through the transistors M11 to M16 is suppressed.
  • Referring to Fig. 8, there is shown a relationship in conversion delay time and power consumption with respect to a ratio in size between the transistors M13 and M15 or M14 and M16.
  • Thus, each of the output signals OUT and OUTB takes the high level of about (VCC-VD) and the low level of about (VEEM-VD), where VD represents the base-emitter forward voltage of the transistor Q11 (Q12) and the forward voltage of the diode D11. Assuming that the level VCC is 5 V and the level VEEM is 0.5 V, the respective signals IN, EO, EOB,OUT and OUTB take voltage waveforms, as shown in Fig. 6. If desired, the level VEEM may take the ground level or 0 V.
  • In the circuit as shown in Fig. 2, each of the transistors Q11 and Q12 functions as emitter-follower and thus operates at a very high speed, as well known in the art. Moreover, only a MOS transistor is inserted in a signal path for transferring a level change to each of the output signals OUT and OUTB. Accordingly, the change in level of each of the output signals OUT and OUTB is performed at a high speed. Furthermore, the diode D11 presents the symmetry in conversion operation as well as voltage waveform.
  • Turning to Fig. 3, a level conversion circuit according to a second embodiment of the present invention is slightly different in the converter from that shown in Fig. 2. That is, as shown by LC2 in this drawing, the converter of the present circuit includes two current sources I21 and I22. The current source I21 is connected between the emitter of the transistor Q11 and the second voltage line and the current source I22 is connected between the emitter of the transistor Q12 and the second voltage line. The MOS transistors M15 and M16 shown in Fig, 2 are omitted from the present converter LC2, however.
  • According to this circuit, although a power consumption is increased more or less by the current sources I21 and I22, the change in level of each of the emitters of the transistors Q11 and Q12, i.e. each of the sources of the transistors M11 and M12, is attained at a high speed by the currant sources I21 and I22. The level conversion speed is thereby improved as compared to the circuit shown in Fig. 2.
  • Fig. 7 shows a comparison between the circuits of Fig. 2 and Fig. 3 with respect to changes in conversion delay time and power consumption to a power supply voltage represented by (VCC-VEEM).
  • Referring to Fig. 4, a level conversion circuit according to a third embodiment of the present invention is different from the circuit shown in Fig. 2 in that the transistors M15 and M16 are omitted. The present circuit is therefore inferior to the circuit of Fig. 2 in both of an operation speed and power consumption. However, the present circuit is superior to the prior art circuit of fig. 1, as described in connection with Fig. 2. Moreover, this circuit is constructed with a smaller number of transistors than the circuits shown in Figs. 1-3.
  • Referring to Fig. 9, there is shown a comparison among the circuits indicated in Figs. 1-4 with respect to the conversion delay time to the d.c. current (i.e, power consumption).
  • Turning to Fig. 5, there is shown a logic circuit having a plurality of level conversion circuit according to the present invention. Each of the level conversion circuits is of any type shown in Fig. 2, 3 or 4, However, the diode D11 is omitted from each conversion circuit, and a diode D51 is provide in common to the level conversion circuits, instead. Further, there is provide a voltage generator VEG to supply a stabilized level VEEM to the second voltage line.
  • It is apparent that the present invention is not limited to the above embodiments, but may be modified and changed without departing from the scope and spirit of the invention. For example, when only one output signal OUT or OUTB is required, a circuit portion for deriving the other output signal can be omitted. The conductivity type of each bipolar transistor and the channel type of each MOS transistor can be replaced in accordance with the polarities of the first and second voltage level.

Claims (10)

  1. A level conversion circuit for converting a first signal having a first amplitude into a second signal having a second amplitude that is larger than said first amplitude, said circuit comprising an input node supplied with said first signal, an output node from which said second signal is derived, a first voltage line, a second voltage line, a first transistor of a bipolar type having a base connected to said input node, a collector connected to said first voltage line and an emitter, a second transistor of a field effect type and of a first channel type having a source-drain path connected between the emitter of said first transistor and said output node and a gate supplied with a bias voltage, and a third transistor of a field effect type and of a second channel type opposite to said first channel type having a source-drain path connected between said output node and said second voltage line and a gate supplied with an inverted signal of said first signal.
  2. The circuit as claimed in claim 1, further comprising a PN junction diode inserted between the source-drain path of said third transistor and said second voltage line.
  3. The circuit as claimed in claim 2, further comprising a current source connected between the emitter of said first transistor and said second voltage line.
  4. The circuit as claimed in claim 2, wherein the gate of said second transistor is connected to said second voltage line to receive a voltage level at said second voltage line as said bias voltage.
  5. A level conversion circuit for converting an input signal having a first amplitude into first and second output signals each having a second amplitude that is larger than said first amplitude, said first output signal having a phase opposite to said second output signal, said circuit comprising an input node supplied with said input signal, a buffer connected to said input node to receive said input signal and producing first and second intermediate signals having phases opposite to each other, first and second voltage lines, a first transistor of a bipolar type and of a first conductivity type having a base supplied with said first intermediate signal, a collector connected to said first voltage line and an emitter, a second transistor of a bipolar type and of said first conductivity type having a base supplied with said second intermediate signal, a collector connected to said first voltage line and an emitter, a first output node from which said first output signal is derived, a second output node from which said second output signal is derived, a third transistor of a field effect type and of a first channel type having a source-drain path connected between the emitter of said first transistor and said first output node and a gate supplied with a bias voltage, a fourth transistor of a field effect type and of said first channel type having a source-drain path connected between the emitter of said second transistor and said second output node and a gate supplied with said bias voltage, a fifth transistor of a field effect type and of a second channel type opposite to said first channel type having a source-drain path connected between said first output node and a circuit node and a gate supplied with said second intermediate signal, a sixth transistor of a field effect type and of said second channel type having a source -drain path connected between said second output node and said circuit node and a gate supplied with sad first intermediate signal, means for coupling said circuit node to said second voltage line.
  6. The circuit as claimed in claim 5, wherein said coupling means comprises a PN junction diode.
  7. The circuit as claimed in claim 6, further comprising a seventh transistor of a field effect type and of said second channel type having a source-drain path connected in parallel to the source-drain path of said fifth transistor and a gate connected to said second output node and an eighth transistor of a field effect type and of said second channel type having a source-drain path connected in parallel to the source-drain path of said sixth transistor and a gate connected to said first output node.
  8. The circuit as claimed in claim 6, further comprising a first current source connected between the emitter of said first transistor and said second voltage line and a second current source connected between the emitter of said second transistor and said second voltage line.
  9. The circuit as claimed in claim 6, wherein said buffer includes seventh and eighth transistors each of a bipolar type and of said first conductivity type connected in a differential form to produce said first and second intermediate signals.
  10. The circuit as claimed in claim 6, wherein the gates of said second and third transistors are connected to said second voltage line to receive a voltage level at said second voltage line as said bias voltage.
EP94106355A 1993-04-23 1994-04-22 Level conversion circuit for signal of ECL-level Expired - Lifetime EP0627819B1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP5096360A JP2546489B2 (en) 1993-04-23 1993-04-23 Level conversion circuit
JP96360/93 1993-04-23

Publications (2)

Publication Number Publication Date
EP0627819A1 true EP0627819A1 (en) 1994-12-07
EP0627819B1 EP0627819B1 (en) 1997-11-05

Family

ID=14162831

Family Applications (1)

Application Number Title Priority Date Filing Date
EP94106355A Expired - Lifetime EP0627819B1 (en) 1993-04-23 1994-04-22 Level conversion circuit for signal of ECL-level

Country Status (4)

Country Link
US (1) US5465057A (en)
EP (1) EP0627819B1 (en)
JP (1) JP2546489B2 (en)
DE (1) DE69406589T2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0774836A3 (en) * 1995-11-17 1997-08-06 Nec Corp Latch circuit for receiving small amplitude signals
EP1006658A1 (en) * 1998-12-03 2000-06-07 STMicroelectronics S.r.l. Low dissipation biCMOS ECL/CMOS interface

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR0149653B1 (en) * 1995-03-31 1998-12-15 김광호 Gunned level input circuit
US5682108A (en) * 1995-05-17 1997-10-28 Integrated Device Technology, Inc. High speed level translator
US5939922A (en) * 1995-09-13 1999-08-17 Kabushiki Kaisha Toshiba Input circuit device with low power consumption
US5900746A (en) * 1996-06-13 1999-05-04 Texas Instruments Incorporated Ultra low jitter differential to fullswing BiCMOS comparator with equal rise/fall time and complementary outputs
US6084439A (en) * 1997-07-02 2000-07-04 Cypress Semiconductor Corp. Peak detector circuit with extended input voltage range
US6054874A (en) * 1997-07-02 2000-04-25 Cypress Semiconductor Corp. Output driver circuit with switched current source
US5994923A (en) * 1997-10-08 1999-11-30 Cypress Semiconductor Corp. Correctable output driver and method of using the same
US6175249B1 (en) * 1999-01-29 2001-01-16 Fairchild Semiconductor Corp. High speed low skew CMOS to ECL converter
US6211699B1 (en) * 1999-04-14 2001-04-03 Micro Linear Corporation High performance CML to CMOS converter
US6342793B1 (en) * 1999-11-03 2002-01-29 International Business Machines Corporation Method and system for sending large numbers of CMOS control signals into a separate quiet analog power domain
US6600338B1 (en) * 2001-05-04 2003-07-29 Rambus, Inc. Apparatus and method for level-shifting input receiver circuit from high external voltage to low internal supply voltage
US8264272B2 (en) * 2009-04-22 2012-09-11 Microchip Technology Incorporated Digital control interface in heterogeneous multi-chip module
JP5215356B2 (en) 2010-07-14 2013-06-19 株式会社半導体理工学研究センター Level converter circuit
US10033361B2 (en) * 2015-12-28 2018-07-24 Semiconductor Energy Laboratory Co., Ltd. Level-shift circuit, driver IC, and electronic device

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0146910A2 (en) * 1983-12-20 1985-07-03 Hitachi, Ltd. Level converting circuit
DE4010145C1 (en) * 1990-03-29 1991-01-03 Siemens Ag, 1000 Berlin Und 8000 Muenchen, De
US4992681A (en) * 1988-12-28 1991-02-12 Kabushiki Kaisha Toshiba Logic level converting circuit
EP0417786A2 (en) * 1989-09-13 1991-03-20 Kabushiki Kaisha Toshiba A level shift circuit for achieving a high-speed processing and an improved output current capability
EP0501085A1 (en) * 1991-02-28 1992-09-02 International Business Machines Corporation Level-shifter circuit for high-speed low-power biCMOS ECL to CMOS input buffers

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5103121A (en) * 1990-04-02 1992-04-07 National Semiconductor Corporation Input buffer regenerative latch for ecl levels
US5068551A (en) * 1990-09-21 1991-11-26 National Semiconductor Corporation Apparatus and method for translating ECL signals to CMOS signals
JPH04172713A (en) * 1990-11-06 1992-06-19 Fujitsu Ltd Level conversion circuit

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0146910A2 (en) * 1983-12-20 1985-07-03 Hitachi, Ltd. Level converting circuit
US4992681A (en) * 1988-12-28 1991-02-12 Kabushiki Kaisha Toshiba Logic level converting circuit
EP0417786A2 (en) * 1989-09-13 1991-03-20 Kabushiki Kaisha Toshiba A level shift circuit for achieving a high-speed processing and an improved output current capability
DE4010145C1 (en) * 1990-03-29 1991-01-03 Siemens Ag, 1000 Berlin Und 8000 Muenchen, De
EP0501085A1 (en) * 1991-02-28 1992-09-02 International Business Machines Corporation Level-shifter circuit for high-speed low-power biCMOS ECL to CMOS input buffers

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
S. H. K. EMBABI ET AL:: "Analysis and Optimization of BiCMOS Digital Circuit Structures", IEEE JOURNAL OF SOLID - STATE CIRCUITS, vol. 26, no. 4, April 1991 (1991-04-01), NEW YORK, US, pages 676 - 679, XP000216747, DOI: doi:10.1109/4.75074 *

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0774836A3 (en) * 1995-11-17 1997-08-06 Nec Corp Latch circuit for receiving small amplitude signals
US5877642A (en) * 1995-11-17 1999-03-02 Nec Corporation Latch circuit for receiving small amplitude signals
EP1006658A1 (en) * 1998-12-03 2000-06-07 STMicroelectronics S.r.l. Low dissipation biCMOS ECL/CMOS interface

Also Published As

Publication number Publication date
EP0627819B1 (en) 1997-11-05
DE69406589D1 (en) 1997-12-11
JPH06311014A (en) 1994-11-04
JP2546489B2 (en) 1996-10-23
DE69406589T2 (en) 1998-06-04
US5465057A (en) 1995-11-07

Similar Documents

Publication Publication Date Title
US5465057A (en) Level conversion circuit for signal of ECL-level
KR930000636B1 (en) Logic level conversion circuit
KR940010676B1 (en) Intergrated circuit device
JP2585599B2 (en) Output interface circuit
EP0590818A2 (en) ECL-to-BiCMOS/CMOS translator
EP0317145B1 (en) Ttl-to-ecl input translator/driver circuit
US5068551A (en) Apparatus and method for translating ECL signals to CMOS signals
US5173624A (en) Level-shifter circuit for high-speed low-power bicmos ecl to cmos input buffers
US5015888A (en) Circuit and method of generating logic output signals from an ECL gate to drive a non-ECL gate
KR100246164B1 (en) Semiconductor device including input buffer circuit capable of amplifying input signal with low amplitude in high speed and under low current consumption
EP0441317A1 (en) Bi-CMOS logic gate circuits for low-voltage semiconductor integrated circuits
EP0439158B1 (en) High speed level conversion circuit
US4670673A (en) Multilevel differential ECL/CML gate circuit
US6114874A (en) Complementary MOS level translating apparatus and method
US6340911B1 (en) Level conversion circuit having differential circuit employing MOSFET
US5485106A (en) ECL to CMOS converter
US5254887A (en) ECL to BiCMIS level converter
EP0196616A2 (en) Logic circuit
US5218244A (en) Logic level converter circuit
JP2580250B2 (en) Bipolar CMOS level conversion circuit
JPH05315937A (en) Cmos/ecl level conversion circuit
US5229658A (en) Switching circuit
US5444395A (en) Non-saturating bipolar transistor circuit
US5428302A (en) Logic circuit with controlled current supply output
JPS63299409A (en) Level conversion circuit

Legal Events

Date Code Title Description
PUAI Public reference made under article 153(3) epc to a published international application that has entered the european phase

Free format text: ORIGINAL CODE: 0009012

AK Designated contracting states

Kind code of ref document: A1

Designated state(s): DE FR GB

17P Request for examination filed

Effective date: 19950221

17Q First examination report despatched

Effective date: 19960507

GRAG Despatch of communication of intention to grant

Free format text: ORIGINAL CODE: EPIDOS AGRA

GRAH Despatch of communication of intention to grant a patent

Free format text: ORIGINAL CODE: EPIDOS IGRA

GRAH Despatch of communication of intention to grant a patent

Free format text: ORIGINAL CODE: EPIDOS IGRA

GRAA (expected) grant

Free format text: ORIGINAL CODE: 0009210

AK Designated contracting states

Kind code of ref document: B1

Designated state(s): DE FR GB

REF Corresponds to:

Ref document number: 69406589

Country of ref document: DE

Date of ref document: 19971211

ET Fr: translation filed
PLBE No opposition filed within time limit

Free format text: ORIGINAL CODE: 0009261

STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: NO OPPOSITION FILED WITHIN TIME LIMIT

26N No opposition filed
REG Reference to a national code

Ref country code: GB

Ref legal event code: IF02

REG Reference to a national code

Ref country code: GB

Ref legal event code: 732E

REG Reference to a national code

Ref country code: FR

Ref legal event code: TP

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: FR

Payment date: 20060410

Year of fee payment: 13

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: GB

Payment date: 20060419

Year of fee payment: 13

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: DE

Payment date: 20060420

Year of fee payment: 13

GBPC Gb: european patent ceased through non-payment of renewal fee

Effective date: 20070422

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: DE

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20071101

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: GB

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20070422

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: FR

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20070430