EP0542542B1 - Verfahren und Vorrichtung zur Überwachung der Temperatur und Geschwindigkeit von gespritzten Plasmateilchen - Google Patents

Verfahren und Vorrichtung zur Überwachung der Temperatur und Geschwindigkeit von gespritzten Plasmateilchen Download PDF

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Publication number
EP0542542B1
EP0542542B1 EP19920310333 EP92310333A EP0542542B1 EP 0542542 B1 EP0542542 B1 EP 0542542B1 EP 19920310333 EP19920310333 EP 19920310333 EP 92310333 A EP92310333 A EP 92310333A EP 0542542 B1 EP0542542 B1 EP 0542542B1
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Prior art keywords
radiation
particle
fibre
plasma jet
optical
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Expired - Lifetime
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EP19920310333
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English (en)
French (fr)
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EP0542542A1 (de
Inventor
Christian Moreau
Paolo Cielo
Mario Lamontagne
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National Research Council of Canada
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National Research Council of Canada
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    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05HPLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
    • H05H1/00Generating plasma; Handling plasma
    • H05H1/0006Investigating plasma, e.g. measuring the degree of ionisation or the electron temperature
    • H05H1/0012Investigating plasma, e.g. measuring the degree of ionisation or the electron temperature using electromagnetic or particle radiation, e.g. interferometry
    • H05H1/0025Investigating plasma, e.g. measuring the degree of ionisation or the electron temperature using electromagnetic or particle radiation, e.g. interferometry by using photoelectric means

Definitions

  • This invention relates to optical sensors for use in thermal spray processes and in particular, in plasma spray processes.
  • Plasma spraying is a powerful technique used widely to produce protective coatings on a large variety of substrates.
  • thermal barrier coatings are plasma sprayed in producing aircraft engines, and ceramic and metal coatings are plasma sprayed for various purposes. Coating properties depend upon many spraying parameters, some of them being related to the spray gun operation. Consequently spraying process control has been implemented by monitoring and regulating such gun input variables as arc current and power, arc gas flow rates, powder feed rate, and powder carrier gas pressure, to keep them at predetermined optimum values.
  • This control approach has been found to be complex because a large number of interrelated input variables must be monitored, and has been found to be incomplete because some variables, such as electrode wear state, cannot be monitored at all.
  • the present invention has been found to be a more powerful structure and method for controlling the plasma spray process.
  • the direct process parameters are monitored rather than (or in addition to) the indirect gun input variables.
  • the most important parameters that control directly the coating microstructure and properties are the temperature and the velocity of the particles immediately before their impact on the substrate.
  • the temperature and velocity are measured on-line, and provide an efficient feedback signal generator performing feedback for the gun input parameters to maintain optimum spraying conditions, and can be used as an efficient diagnostic tool to detect rapidly any problem during the coating operation. Since the temperature and velocity have a direct influence on the coating quality, the present invention at least in its preferred embodiment, facilitates obtaining a closer control of the spraying process, leading to a better reproductibility of the coating properties than in the prior art.
  • the velocity information is obtained from light impinging upon and reflected by the particles, detected by an appropriate sensor.
  • Laser based techniques such as laser Doppler anemometry and laser dual focus velocimetry, are included in this first type of technique. They use intense laser light beams to form interference fringes, or use two focused light beams in the measurement region. When the particle trajectory intercepts the measurement region, the reflected light intensity is modulated as the particle travels through the intensely illuminated zones and the velocity is computed from the modulation period. Periodic light distributions may also be obtained using a high intensity incandescent source and a Ronchi grating. This technique is inappropriate, being bulky and requiring high intensity light sources.
  • the second type of techniques used to perform the velocity measurement takes advantage of the thermal radiation emitted by the particles heated to a high temperature by the plasma.
  • the radiation emitted by individual particles is detected when the particles pass through the detector field of view of known dimensions.
  • the transit time is evaluated and the velocity is computed knowing the travel length. Since the dimensions of the field of view change with the distance from the optical detection assembly, it is necessary to analyse only particles near the assembly focal plane. To do that, a laser beam or a second detection assembly focused in the appropriate region from a different angle must be used in conjunction with a coincidence detection analysis system. Such a system is complex and difficult to keep well aligned under practical operating conditions.
  • velocity measurements can also be performed using high speed cameras.
  • the present invention in its most general embodiment is a method and an apparatus for monitoring the velocity and in its preferred embodiment simultaneously the temperature and its velocity, of sprayed particles without the limitations and problems described above, for previously developed technology. Temperature measurements are performed using a two-colour pyrometry technique, while the velocity measurements are done using a two-slit or a multiple-slit system that collects radiation emitted by the hot particles.
  • the detection assembly permits the simultaneous determination of the temperature and the velocity of each individually-detected particle.
  • the system is comprised of a sensor head attached to the spray gun, an optical fibre transmitting the collected radiation to detection apparatus, and a protective detection cabinet having the detection apparatus that incorporates two detectors.
  • a two-slit or multiple-slit mask is located in the sensor head at the end of the optical fibre.
  • the result is a rugged optical sensor that monitors the temperature and velocity distributions of plasma-sprayed particles simultaneously, immediately before their impact, in which the optical fibres permit the location of the fragile optical and electronic components away from the aggressive environment around the plasma gun.
  • the sensor head is located in the harsh environment close to the plasma, and indeed is preferably attached to the plasma gun for collecting radiation emitted by the hot particles.
  • the particle emitted radiation collected by the sensor head is transmitted to two photodetectors, filtered by interference filters at two adjacent wavelengths.
  • the particle temperature may be computed from the ratio of the detector outputs.
  • the two-slit system collects radiation emitted by the in-flight particles travelling in the sensor field of view, which generates a double peak light pulse transmitted through the optical fibre. The time delay between these two peaks may be evaluated automatically and the particle velocity computed knowing the distance between the two slit images.
  • the velocity measurement can be performed also with a system of three or more slits.
  • the sensor head can also include a linear fibre bundle that provides a continuous monitoring of the position of the sprayed-particle cone.
  • the light collected by the fibre bundle may be detected by a linear CCD camera. This permits the automatic centering of the sensor head field of view relative to the sprayed-particle cone and the detection of any changes in the particle injection conditions.
  • the above-computation is preferably performed by a processor, e.g. a personal computer, which can be programmed to continuously perform statistical computations to obtain the mean and standard deviation of the temperature and velocity distributions.
  • a processor e.g. a personal computer
  • These values and the particle cone position are directly related to the deposition process and are provided to the control apparatus as feedback signals whereby the main spraying variables of arc current, powder feeding gas pressure, etc. as noted above may be controlled.
  • a method of detecting a characteristic of plasma sprayed particles in a plasma jet during flight between a plasma jet gun and a substrate is comprised of the steps of focusing radiation emitted from a particle on a first photodetector through a slit mask formed of at least two parallel slits, and transmitting signals from the photodetector to a processor for determining the velocity of the particle from the delay between two or more peaks which are detected resulting from said radiation.
  • the invention further includes the step of splitting the radiation, filtering the radiation into separate adjacent wavelengths, passing one wavelength to the first photodector, passing the other wavelength to a second photodetector, and transmitting signals from the second photodetector to the processor for integrating the signals from both photodetectors and determining the temperature of the particle from the ratio of the integrated signals.
  • the focusing step includes carrying the radiation via an optical fibre from a position adjacent the plasma jet to a protected location remote from the plasma jet, and locating the photodetectors in the protected location.
  • an optical sensor for plasma sprayed particles in a plasma jet is comprised of a sensor head mounted rigidly adjacent the plasma jet; the head comprising an optical fibre for carrying radiation emitted by a particle in the jet to a protected location remote from the jet, optical apparatus for focusing the radiation on a first end of the fibre, and a slit mask formed of a pair of parallel slits disposed over the end of the fibre through which the radiation may pass; and at the protected location, a pair of photodetectors, apparatus for splitting into two beams the radiation from a second end of the fibre, apparatus for filtering the split radiation into two separate adjacent wavelenghts, and apparatus for passing each of said filtered beams into respective ones of the photodectors.
  • a substrate 1 is given a coating 2 by means of a plasma spray 3 of hot particles, emitted by a plasma spray gun 4.
  • a sensor head 8 is comprised of a lens 9 that images, after reflection on a flat mirror 10, the first end of an optical fibre 11 into the particle jet of hot particles 3 preferably to a single particle.
  • Ray lines 12 illustrate the reciprocal imaging of a particle onto the end of the optical fibre 11.
  • a substrate 1 is given a coating 2 by means of a plasma spray 3 of hot particles, emitted by a plasma spray gun 4.
  • a sensor head 8 is comprised of a lens 9 that images, after reflection on a flat mirror 10, the first end of an optical fibre 11 into the particle jet of hot particles 3 preferably to a single particle.
  • Ray lines 12 illustrate the reciprocal imaging of a particle onto the end of the optical fibre 11.
  • the first end of the fibre is covered by an optical mask 14 as shown in Figure 1A.
  • the optical mask contains two transparent parallel slits 15.
  • the slits are about 25um wide, 50um long and 50um center to center.
  • the slits formed by the lens 9 are about 75um wide, 150um long and 150um center to center.
  • the slit size and arrangement are important for reliable temperature and velocity measurements even when high particle flow rates are used.
  • the radiation collected by the sensor head i.e. at the output (second end) of the optical fibre 11, is sent to a system which is located away and protected from the harsh environment of the plasma spray gun. It should be well shielded electronically and kept in a quiet environment far from the operating spray gun and torch. Radiation from the optical fibre is imaged via a dichroic mirror 17, via a convex lens 18, on two photodetectors, D 1 and D 2 , through respective interference filters 20 and 21. Output signals from detectors D 1 and D 2 are digitised in analog-to-digital converters (not shown) and may be analysed by a computer 24 which computes the temperature and velocity of in-flight particles from the signals, as described below.
  • Figure 3 illustrates the field of view of the two slits 15 of the sensor head. The depth of field is shown by the width between the horizontal arrow heads. A particle 27 of the mass of hot particles travelling through the focal plane will generate a double peak light (radiation) pulse as it moves from the field of view of the first slit to the field of the view of the second slit.
  • FIG 4 Examples of the light (radiation) pulses are illustrated in Figure 4, which show signals output from both detectors D 1 and D 2 drawn as a function of time during the passage of a few particles in the sensor field of view. From the time delay between the two components of each pulse, the particle velocity can be computed, since the distance between the two slit images in the focal plane is known.
  • the particle temperature may be determined from the ratio of the integrated light pulses at both wavelengths, i.e. from detectors D 1 and D 2 .
  • the slit dimensions should be established such that the radiation is collected from the smallest possible volume in the particle jet, to reduce to a minimum the background signal intensity, but the slit images must be larger than the particle diameter in order to collect intense light signals from each single particle.
  • the computer 24 analyses the detector outputs by performing continuously statistical computation to obtain the means and standard deviation of the temperature and velocity distributions. These values are used toprovide continuous feedback to the plasma torch main spraying variables, i.e. arc current, powder feeding gas pressure, etc.
  • the direct particle localization may permit the measurement of temperature and velocity at many points within the particle jet, permitting obtaining a precise characterisation of the spraying process. It may be seen that this has significant advantages over the indirect measurement techniques of monitoring arc current and power, arc gas flow rates, powder feed rates, and powder carrier gas pressure.
  • An advantage of the present invention over active projection particle velocity measurement techniques lies in the fact that the present invention does not require the use of fragile laser devices or intense light sources. Accordingly a more compact and rugged sensor is obtained that does not require any special eye protection for the operator.
  • the present invention may also be used in conjunction with the two-colour pyrometer described earlier, without the use of any additional detectors or electronics.
  • the use of the two-slit mask permits the particles to be measured directly without the use of a laser beam or a second detection assembly focused in the same region within the particle jet.
  • the distance between the axes of the two focused beams is nearly constant through the depth of field, as shown in Figure 3, while the width of a single beam, proportional to the time of flight in a single-slit configuration, changes very quickly. This requires a second coincidence detection to localise the particle, not required in the present invention.

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Electromagnetism (AREA)
  • General Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Coating By Spraying Or Casting (AREA)
  • Plasma Technology (AREA)

Claims (14)

  1. Verfahren zur Erfassung von Eigenschaften von plasmagesprühten Partikeln (27) in einem Plasmastrahl (3) während des Fluges zwischen einer Plasmasprühpistole (4) und einem Substrat (1), umfassend die folgenden Schritte: Fokussieren der von einem Partikel (17) ausgesandten Strahlung auf einem ersten Fotodetektor (D1) durch eine aus wenigstens zwei parallelen Schlitzen (15) bekannter Trennung gebildeten Schlitzmaske (14), und Übertragen von Signalen von dem Fotodetektor (D1) zu einem Prozessor (24) zur Ermittlung der Geschwindigkeit des Partikels (27) von der Zeitverzögerung zwischen zwei oder mehr Spitzen, die infolge der genannten Strahlung (12) erfaßt wurden.
  2. Verfahren nach Anspruch 1, umfassend die folgenden Schritte: Unterteilen der genannten Strahlung (12) in zwei Strahlen, Filtern der genannten beiden Strahlen in jeweils benachbarte Wellenlängen, Leiten einer Wellenlänge zu dem ersten Fotodetektor (D1), Leiten der anderen Wellenlängen zu einem zweiten Fotodetektor (D2) und Übertragen von Signalen von dem zweiten Fotodetektor (D2) zu dem genannten Prozessor (24) zum Integrieren der genannten Signale von beiden Fotodetektoren (D1, D2) und Ermitteln der Temperatur des Partikels (27) aus dem Verhältnis der integrierten Signale (D1, D2).
  3. Verfahren nach Anpruch 2, bei dem der Fokussierungsschritt das Befördern der genannten Strahlung über einen Lichtwellenleiter (11) von einer Position neben dem genannten Plasmastrahl (3) zu einem geschützten Ort entfernt von dem genannten Plasmastrahl (3) und das Positionieren der genannten Fotodetektoren (D1, D2) an dem genannten geschützten Ort beinhaltet.
  4. Verfahren nach Anspruch 3, bei dem der Fokussierungsschritt das Leiten von Strahlung von dem genannten Lichtwellenleiter (11) durch eine konvexe Linse (18) und über einen dichroitischen Spiegel (17) und durchseparate Filter (20, 21) zu den genannten Fotodetektoren (D1, D2) beinhaltet.
  5. Verfahren nach Anspruch 2, bei dem die genannten Abmessungen der genannten Schlitze (5) klein genug sind, um Strahlung vom kleinstmöglichen Volumen zu vereinigen, aber groß genug, um Bilder bereitzustellen, die jeweils größer sind als der Partikeldurchmesser.
  6. Verfahren nach Anspruch 5, bei dem die Abmessungen der einzelnen Schlitze (15) etwa wie folgt lauten: Breite 25 µm, Länge 50 µm und Mitte zu Mitte 50 µm.
  7. Verfahren nach Anspruch 6, bei dem der Fokussierungsschritt das Befördern der genannten Strahlung (12) über einen Lichtwellenleiter (11) von einer Position neben dem genannten Plasmastrahl (3) zu einem geschützten Ort entfernt von dem genannten Plasmastrahl (3) und das Positionieren der genannten Fotodetektoren (D1, D2) an dem genannten geschützten Ort beinhaltet.
  8. Verfahren nach Anspruch 7, bei dem der Fokussierungsschritt das Leiten von Strahlung (12) von dem genannten Lichtwellenleiter (11) durch eine konvexe Linse (18) und über einen dichroitischen Spiegel (17) und durch separate Filter (20, 21) zu den genannten Fotodetektoren (D 1, D2) beinhaltet.
  9. Verfahren nach Anspruch 3, umfassend den Schritt des Vereinigens von Strahlung (12) von dem genannten Plasmastrahl (3) an einem Ende eines Lichtwellenleiterbündels (11), Empfangen der genannten Strahlung mit einer CCD-Kamera und Bereitstellen eines Signals von der genannten Kamera zum Positionieren des genannten Sensorkopf-Blickfeldes relativ zu dem genannten Plasmastrahl (3) und/oder Erfassen von Änderungen der Partikelinjektionseigenschaften.
  10. Optischer Sensor für plasmagesprühte Parikel (27) in einem Plasmastrahl (3), umfassend:
    (a) einen Sensorkopf (8), der fest neben dem Plasmastrahl (3) montiert ist, wobei der genannte Kopf(8) folgendes umfaßt:
    (i) einen Lichtwellenleiter (11) zum Befördern der von einem Partikel (27) in dem genannten Strahl (3) ausgesandten Strahlung zu einem geschützten Ort entfernt von dem genannten Strahl (3), und
    (ii) ein optisches Mittel (9, 10) zum Fokussieren der genannten Strahlung (12) an einem ersten Ende des genannten Lichtwellenleiters (11), und
    (iii) eine aus einem Paar paralleler Schlitze (15) von bekannter Trennung gebildete Schlitzmaske (14), die über das genannte Ende des genannten Lichtwellenleiters (11) angeordnet ist, durch den die Strahlung (12) passieren kann,
       und an dem genannten geschützten Ort,
    (b) ein Paar Fotodetektoren (D1, D2),
    (c) ein Mittel (20, 21) zum Unterteilen der Strahlung von einem zweiten Ende des genannten Lichtwellenleiters (11) in zwei Strahlen,
    (d) ein Mittel (20, 21) zum Filtern der genannten beiden Strahlen in jeweils benachbarte Wellenlängen, und
    (e) ein Mittel zum Leiten jedes der genannten gefilterten Strahlen zu jeweils einem der genannten Fotodetektoren (D1, D2).
  11. Optischer Sensor nach Anspruch 10, bei dem das genannte Teilungsmittel (17) einen dichroitischen Spiegel (17) umfaßt und ferner eine konvexe Linse (18) aufweist, um die genannte Strahlung von dem zweiten Ende des genannten Lichtwellenleisters (11) über den genannten Spiegel (17) zu den genannten Fotodetektoren (D1, D2) zu fokussieren, und bei dem das genannte Filtermittel (20, 21) ein Paar optischer Filter (20, 21) umfaßt, die jeweils zwischen einem entsprechenden Fotodetektor (D1, D2) und dem genannten Spiegel (17) angeordnet sind, um die unterteilte Strahlung in separaten Wellenlängen zu jeweils einem dergenannten Fotodetektoren (D1, D2) zu leiten.
  12. Optischer Sensor nach Anspruch 11, bei dem das genannte optische Mittel (9, 10) folgendes umfaßt: einen Spiegel (10) zum Reflektieren von Strahlung von dem genannten Partikel und eine konvexe Linse (9) zum Empfangen der genannten reflektierten Strahlung und zum Fokussieren derselben auf das Ende des genannten Lichtwellenleiters (11).
  13. Optischer Sensor nach Anspruch 11, bei dem die genannten parallelen Schlitze (15) etwa folgende Abmessungen besitzen: Breite 25 µm, Länge 50 µm und Mitte zu Mitte 50 µm.
  14. Optischer Sensor nach Anspruch 10, ferner umfassend ein Lichtwellenleiterbündel (11), dessen eines Ende in dem genannten Sensorkopf (8) angeordnet ist, um von dem genannten Plasmastrahl (3) ausgesandte Strahlung zu erfassen, eine CCD-Kamera zum Erfassen der genannten, von dem anderen Ende des genannten Bündels (11) ausgesandten Strahlung, und ein Mittel zum Empfangen eines Signals von der genannten Kamera zum Positionieren des genannten Sensorkopf-Blickfeldes relativ zu dem genannten Plasmastrahl (3) und/oder zum Erfassen von Änderungen der Partikelinjektionsbedingungen.
EP19920310333 1991-11-12 1992-11-12 Verfahren und Vorrichtung zur Überwachung der Temperatur und Geschwindigkeit von gespritzten Plasmateilchen Expired - Lifetime EP0542542B1 (de)

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CA 2055267 CA2055267C (en) 1991-11-12 1991-11-12 Method and apparatus for monitoring the temperature and velocity of plasma sprayed particles
CA2055267 1991-11-12

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EP0542542A1 EP0542542A1 (de) 1993-05-19
EP0542542B1 true EP0542542B1 (de) 1997-05-07

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Cited By (2)

* Cited by examiner, † Cited by third party
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DE10140299A1 (de) * 2001-08-16 2003-03-13 Mtu Aero Engines Gmbh Verfahren zur Überwachung von Plasma- oder Flammspritzverfahren
US7688441B2 (en) 2005-04-08 2010-03-30 Mtu Aero Engines Gmbh Arrangement for monitoring thermal spray processes

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Publication number Priority date Publication date Assignee Title
US7070835B2 (en) * 2003-06-09 2006-07-04 Siemens Power Generation, Inc. Method for applying a coating to a substrate
EP1978790B1 (de) * 2007-03-23 2010-05-19 Siemens Aktiengesellschaft Vorrichtung und Verfahren zum Beschichten eines Bauteils mit Justiereinrichtung
GB0819359D0 (en) * 2008-10-22 2008-11-26 Intrinsiq Materials Ltd Plasma torch
CN111006704B (zh) * 2019-11-29 2021-11-23 江苏智冷物联技术有限公司 一种传感器数据处理方法、管理平台及传感器表头

Family Cites Families (1)

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Publication number Priority date Publication date Assignee Title
US4122351A (en) * 1977-08-30 1978-10-24 The United States Of America As Represented By The United States Department Of Energy Automatic targeting of plasma spray gun

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10140299A1 (de) * 2001-08-16 2003-03-13 Mtu Aero Engines Gmbh Verfahren zur Überwachung von Plasma- oder Flammspritzverfahren
US6797939B2 (en) 2001-08-16 2004-09-28 Mtu Aero Engines Gmbh Method for monitoring plasma or flame-spray processes
DE10140299B4 (de) * 2001-08-16 2004-10-28 Mtu Aero Engines Gmbh Verfahren zur Überwachung und online-Diagnose eines thermischen Spritzprozesses
US7688441B2 (en) 2005-04-08 2010-03-30 Mtu Aero Engines Gmbh Arrangement for monitoring thermal spray processes

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DE69219560T2 (de) 1997-11-13
EP0542542A1 (de) 1993-05-19
DE69219560D1 (de) 1997-06-12
CA2055267C (en) 1999-01-12
CA2055267A1 (en) 1993-05-13

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