EP0503748A3 - Method and apparatus for generating ions, specially for a mass spectrometer such as a time-of-flight mass spectrometer, from thermally instable, non-volatile, large molecules - Google Patents
Method and apparatus for generating ions, specially for a mass spectrometer such as a time-of-flight mass spectrometer, from thermally instable, non-volatile, large molecules Download PDFInfo
- Publication number
- EP0503748A3 EP0503748A3 EP19920250055 EP92250055A EP0503748A3 EP 0503748 A3 EP0503748 A3 EP 0503748A3 EP 19920250055 EP19920250055 EP 19920250055 EP 92250055 A EP92250055 A EP 92250055A EP 0503748 A3 EP0503748 A3 EP 0503748A3
- Authority
- EP
- European Patent Office
- Prior art keywords
- mass spectrometer
- specially
- volatile
- time
- large molecules
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 150000002500 ions Chemical class 0.000 title 1
- 150000002605 large molecules Chemical class 0.000 title 1
- 229920002521 macromolecule Polymers 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
- H01J49/0459—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for solid samples
- H01J49/0463—Desorption by laser or particle beam, followed by ionisation as a separate step
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
- H01J49/147—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers with electrons, e.g. electron impact ionisation, electron attachment
Landscapes
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Optics & Photonics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Electron Tubes For Measurement (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP95104288A EP0669638A1 (en) | 1991-03-13 | 1992-03-07 | Method and apparatus for generating ions, especially for a mass spectrometer such as a time-of-flight mass spectrometer, from thermally unstable, non-volatile, large molecules |
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE4108462 | 1991-03-13 | ||
DE4108462A DE4108462C2 (en) | 1991-03-13 | 1991-03-13 | Method and device for generating ions from thermally unstable, non-volatile large molecules |
DE4108463 | 1991-03-13 | ||
DE4108463 | 1991-03-13 |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP95104288.6 Division-Into | 1992-03-07 |
Publications (3)
Publication Number | Publication Date |
---|---|
EP0503748A2 EP0503748A2 (en) | 1992-09-16 |
EP0503748A3 true EP0503748A3 (en) | 1993-04-28 |
EP0503748B1 EP0503748B1 (en) | 1996-12-11 |
Family
ID=25901910
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP92250055A Expired - Lifetime EP0503748B1 (en) | 1991-03-13 | 1992-03-07 | Method for generating ions, specially for a mass spectrometer such as a time-of-flight mass spectrometer, from thermally instable, non-volatile, large molecules |
EP95104288A Withdrawn EP0669638A1 (en) | 1991-03-13 | 1992-03-07 | Method and apparatus for generating ions, especially for a mass spectrometer such as a time-of-flight mass spectrometer, from thermally unstable, non-volatile, large molecules |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP95104288A Withdrawn EP0669638A1 (en) | 1991-03-13 | 1992-03-07 | Method and apparatus for generating ions, especially for a mass spectrometer such as a time-of-flight mass spectrometer, from thermally unstable, non-volatile, large molecules |
Country Status (3)
Country | Link |
---|---|
US (1) | US5294797A (en) |
EP (2) | EP0503748B1 (en) |
DE (2) | DE4108462C2 (en) |
Families Citing this family (35)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE4322102C2 (en) * | 1993-07-02 | 1995-08-17 | Bergmann Thorald | Time-of-flight mass spectrometer with gas phase ion source |
DE19608963C2 (en) * | 1995-03-28 | 2001-03-22 | Bruker Daltonik Gmbh | Process for ionizing heavy molecules at atmospheric pressure |
GB2310950A (en) * | 1996-03-08 | 1997-09-10 | Bruker Franzen Analytik Gmbh | Method for the ionization of heavy molecules at atmospheric pressure |
DE19630547C2 (en) * | 1996-07-17 | 1998-05-28 | Forschungsverbund Berlin Ev | Process for matrix-assisted laser desorption and ionization of analyte molecules, especially fragile or unstable molecules |
US5742050A (en) * | 1996-09-30 | 1998-04-21 | Aviv Amirav | Method and apparatus for sample introduction into a mass spectrometer for improving a sample analysis |
DE19649201A1 (en) * | 1996-11-27 | 1998-05-28 | Max Planck Gesellschaft | Electron beam analysis |
DE19705762C2 (en) * | 1997-02-14 | 2001-06-07 | Rainer Edmund Weinkauf | Method and device for generating gas jets |
DE19734460A1 (en) * | 1997-08-11 | 1999-02-18 | Gsf Forschungszentrum Umwelt | Method and device for the analytical detection of traces |
DE19822674A1 (en) * | 1998-05-20 | 1999-12-09 | Gsf Forschungszentrum Umwelt | Gas inlet for an ion source |
DE19822672B4 (en) * | 1998-05-20 | 2005-11-10 | GSF - Forschungszentrum für Umwelt und Gesundheit GmbH | Method and device for producing a directional gas jet |
US7119342B2 (en) * | 1999-02-09 | 2006-10-10 | Syagen Technology | Interfaces for a photoionization mass spectrometer |
US6630664B1 (en) | 1999-02-09 | 2003-10-07 | Syagen Technology | Atmospheric pressure photoionizer for mass spectrometry |
US7109476B2 (en) | 1999-02-09 | 2006-09-19 | Syagen Technology | Multiple ion sources involving atmospheric pressure photoionization |
US6211516B1 (en) * | 1999-02-09 | 2001-04-03 | Syagen Technology | Photoionization mass spectrometer |
DE19911801C1 (en) | 1999-03-17 | 2001-01-11 | Bruker Daltonik Gmbh | Method and device for matrix-assisted laser desorption ionization of substances |
DE10014847A1 (en) * | 2000-03-24 | 2001-10-04 | Gsf Forschungszentrum Umwelt | Method and device for the detection of connections in a gas stream |
DE10042394B4 (en) * | 2000-08-29 | 2006-06-29 | Dräger Safety AG & Co. KGaA | Ion source for ion mobility spectrometer with optical and Teilchenstrahlun gsionisation |
US6737642B2 (en) | 2002-03-18 | 2004-05-18 | Syagen Technology | High dynamic range analog-to-digital converter |
JP4646920B2 (en) * | 2003-12-12 | 2011-03-09 | セメクイップ, インコーポレイテッド | Method and apparatus for extending equipment operational time in ion implantation |
US20080223409A1 (en) * | 2003-12-12 | 2008-09-18 | Horsky Thomas N | Method and apparatus for extending equipment uptime in ion implantation |
DE102004002729B4 (en) * | 2004-01-20 | 2008-11-27 | Bruker Daltonik Gmbh | Ionization of desorbed analyte molecules at atmospheric pressure |
DE102005005333B4 (en) * | 2005-01-28 | 2008-07-31 | Deutsches Zentrum für Luft- und Raumfahrt e.V. | Method for sampling and aerosol analysis |
US7291845B2 (en) * | 2005-04-26 | 2007-11-06 | Varian, Inc. | Method for controlling space charge-driven ion instabilities in electron impact ion sources |
JP4825028B2 (en) | 2006-03-17 | 2011-11-30 | 浜松ホトニクス株式会社 | Ionizer |
JP4958258B2 (en) * | 2006-03-17 | 2012-06-20 | 株式会社リガク | Gas analyzer |
EP2017875A1 (en) * | 2007-07-16 | 2009-01-21 | Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V. | Method and apparatus for providing a sample for a subsequent analysis |
WO2009039382A1 (en) * | 2007-09-21 | 2009-03-26 | Semequip. Inc. | Method for extending equipment uptime in ion implantation |
US7750291B2 (en) * | 2008-02-25 | 2010-07-06 | National Sun Yat-Sen University | Mass spectrometric method and mass spectrometer for analyzing a vaporized sample |
US8742335B2 (en) * | 2009-12-18 | 2014-06-03 | Sri International | Rotator sample introduction interface |
CN102903597A (en) * | 2012-10-19 | 2013-01-30 | 山东省科学院海洋仪器仪表研究所 | Ion source combining thermal desorption with electron bombardment |
GB2518122B (en) * | 2013-02-19 | 2018-08-08 | Markes International Ltd | An electron ionisation apparatus |
EP3690923A1 (en) * | 2013-04-17 | 2020-08-05 | Fluidigm Canada Inc. | Sample analysis for mass cytometry |
GB201721700D0 (en) | 2017-12-22 | 2018-02-07 | Micromass Ltd | Ion source |
JP7039439B2 (en) * | 2018-10-26 | 2022-03-22 | 株式会社堀場製作所 | Gas analyzer and gas analysis method |
CN116031138A (en) * | 2023-01-10 | 2023-04-28 | 中国科学院大学 | Gas-phase pollutant all-species high-sensitivity online mass spectrometer and detection method |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR1024654A (en) * | 1950-09-16 | 1953-04-03 | Csf | Transit time selection mass spectrometer using frequency modulation |
US3182190A (en) * | 1962-07-31 | 1965-05-04 | Gulf Research Development Co | Magnetic field free ion source with adjustable electron gun |
US3296434A (en) * | 1964-05-26 | 1967-01-03 | Martin H Studier | Method of operating an ion source for a time of flight mass spectrometer |
DE3224801C2 (en) * | 1982-07-02 | 1986-04-30 | Edward William Prof. Dr. 8000 München Schlag | Method and device for generating pulsed molecular beams containing large, thermally unstable molecules |
US4740692A (en) * | 1985-06-13 | 1988-04-26 | Mitsubishi Denki Kabushiki Kaisha | Laser mass spectroscopic analyzer and method |
DE3809504C1 (en) * | 1988-03-22 | 1989-09-21 | Bruker - Franzen Analytik Gmbh, 2800 Bremen, De | |
DE3920566A1 (en) * | 1989-06-23 | 1991-01-10 | Bruker Franzen Analytik Gmbh | MS-MS FLIGHT TIME MASS SPECTROMETER |
GB8928917D0 (en) * | 1989-12-21 | 1990-02-28 | Vg Instr Group | Method and apparatus for surface analysis |
-
1991
- 1991-03-13 DE DE4108462A patent/DE4108462C2/en not_active Expired - Fee Related
-
1992
- 1992-03-07 EP EP92250055A patent/EP0503748B1/en not_active Expired - Lifetime
- 1992-03-07 DE DE59207642T patent/DE59207642D1/en not_active Expired - Fee Related
- 1992-03-07 EP EP95104288A patent/EP0669638A1/en not_active Withdrawn
- 1992-03-12 US US07/849,886 patent/US5294797A/en not_active Expired - Fee Related
Non-Patent Citations (4)
Title |
---|
ANALYTICAL INSTRUMENTATION, Band 16, Nr. 1, 1987, Seiten 93-115, New York, US; J.K. OLTHOFF et al.: "Modification of Wiley-McLaren TOF analysers for laser desorption" * |
APPLIED PHYSICS B. PHOTOPHYSICS AND CHEMISTRY, Band B41, Nr. 6, Dezember 1990, Seiten 395-403, Heidelberg, DE; G. MEIJER et al.: "Laser desorption jet-cooling of organic molecules" * |
PHYSICAL REVIEW, B. CONDENSED MATTER, Band 38, Nr. 5, 15. August 1988, Seiten 3517-3520, New York, US; C.W.S. CONOVER et al.: "Laser vaporisation of solids into an inert gas: a measure of high-temperature cluster stability" * |
REVIEW OF SCIENTIFIC INSTRUMENTS, Band 59, Nr. 4, April 1988, Seiten 557-561, New York, US; L. LI et al.: "Pulsed laser desorption method for volatilizing thermally labile molecules for supersonic jet spectroscopy" * |
Also Published As
Publication number | Publication date |
---|---|
US5294797A (en) | 1994-03-15 |
DE4108462C2 (en) | 1994-10-13 |
DE59207642D1 (en) | 1997-01-23 |
EP0669638A1 (en) | 1995-08-30 |
EP0503748A2 (en) | 1992-09-16 |
DE4108462A1 (en) | 1992-09-17 |
EP0503748B1 (en) | 1996-12-11 |
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