EP0440282A3 - Sensormatrix - Google Patents

Sensormatrix Download PDF

Info

Publication number
EP0440282A3
EP0440282A3 EP19910200104 EP91200104A EP0440282A3 EP 0440282 A3 EP0440282 A3 EP 0440282A3 EP 19910200104 EP19910200104 EP 19910200104 EP 91200104 A EP91200104 A EP 91200104A EP 0440282 A3 EP0440282 A3 EP 0440282A3
Authority
EP
European Patent Office
Prior art keywords
sensormatrix
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP19910200104
Other languages
German (de)
Other versions
EP0440282B1 (en
EP0440282A2 (en
Inventor
Norbert Conrads
Ulrich Dr Schiebel
Herfried Dr Wieczorek
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Philips Intellectual Property and Standards GmbH
Koninklijke Philips NV
Original Assignee
Philips Patentverwaltung GmbH
Philips Gloeilampenfabrieken NV
Koninklijke Philips Electronics NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=6398923&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=EP0440282(A3) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Philips Patentverwaltung GmbH, Philips Gloeilampenfabrieken NV, Koninklijke Philips Electronics NV filed Critical Philips Patentverwaltung GmbH
Publication of EP0440282A2 publication Critical patent/EP0440282A2/en
Publication of EP0440282A3 publication Critical patent/EP0440282A3/en
Application granted granted Critical
Publication of EP0440282B1 publication Critical patent/EP0440282B1/en
Anticipated expiration legal-status Critical
Revoked legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N3/00—Scanning details of television systems; Combination thereof with generation of supply voltages
    • H04N3/10—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical
    • H04N3/14—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical by means of electrically scanned solid-state devices
    • H04N3/15—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical by means of electrically scanned solid-state devices for picture signal generation
    • H04N3/1575—Picture signal readout register, e.g. shift registers, interline shift registers
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/30—Circuitry of solid-state image sensors [SSIS]; Control thereof for transforming X-rays into image signals
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/767—Horizontal readout lines, multiplexers or registers
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/78—Readout circuits for addressed sensors, e.g. output amplifiers or A/D converters
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N3/00—Scanning details of television systems; Combination thereof with generation of supply voltages
    • H04N3/10—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical
    • H04N3/14—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical by means of electrically scanned solid-state devices
    • H04N3/15—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical by means of electrically scanned solid-state devices for picture signal generation
    • H04N3/1506—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical by means of electrically scanned solid-state devices for picture signal generation with addressing of the image-sensor elements
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N5/00—Details of television systems
    • H04N5/30—Transforming light or analogous information into electric information
    • H04N5/32—Transforming X-rays

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
EP91200104A 1990-01-27 1991-01-21 Sensormatrix Revoked EP0440282B1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE4002431A DE4002431A1 (en) 1990-01-27 1990-01-27 SENSOR MATRIX
DE4002431 1990-01-27

Publications (3)

Publication Number Publication Date
EP0440282A2 EP0440282A2 (en) 1991-08-07
EP0440282A3 true EP0440282A3 (en) 1992-04-29
EP0440282B1 EP0440282B1 (en) 1996-04-17

Family

ID=6398923

Family Applications (1)

Application Number Title Priority Date Filing Date
EP91200104A Revoked EP0440282B1 (en) 1990-01-27 1991-01-21 Sensormatrix

Country Status (4)

Country Link
US (1) US5184018A (en)
EP (1) EP0440282B1 (en)
JP (1) JP3141033B2 (en)
DE (2) DE4002431A1 (en)

Families Citing this family (69)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4118154A1 (en) * 1991-06-03 1992-12-10 Philips Patentverwaltung ARRANGEMENT WITH A SENSOR MATRIX AND RESET ARRANGEMENT
FR2679687B1 (en) * 1991-07-26 1997-03-14 Commissariat Energie Atomique LARGE-DIMENSIONAL IMAGE DISPLAY DEVICE OR SOCKET.
JP3006216B2 (en) * 1991-09-05 2000-02-07 富士ゼロックス株式会社 Two-dimensional contact type image sensor and driving method thereof
JP3189990B2 (en) * 1991-09-27 2001-07-16 キヤノン株式会社 Electronic circuit device
GB9202693D0 (en) * 1992-02-08 1992-03-25 Philips Electronics Uk Ltd A method of manufacturing a large area active matrix array
GB9226890D0 (en) * 1992-12-23 1993-02-17 Philips Electronics Uk Ltd An imaging device
US5352884A (en) * 1993-04-14 1994-10-04 General Electric Corporation Method and apparatus for providing offset for light detector
US5336879A (en) * 1993-05-28 1994-08-09 David Sarnoff Research Center, Inc. Pixel array having image forming pixel elements integral with peripheral circuit elements
DE69429142T2 (en) * 1993-09-03 2002-08-22 Koninklijke Philips Electronics N.V., Eindhoven X-ray image
JP2546514B2 (en) * 1993-09-16 1996-10-23 日本電気株式会社 Signal readout circuit and its driving method
DE4332859C2 (en) * 1993-09-27 1998-12-24 Heimann Optoelectronics Gmbh Position transmitter for detecting the position of a light or particle beam
JP3066944B2 (en) 1993-12-27 2000-07-17 キヤノン株式会社 Photoelectric conversion device, driving method thereof, and system having the same
JP3856821B2 (en) * 1994-06-30 2006-12-13 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ Magnetic resonance apparatus having X-ray apparatus
US5556716A (en) * 1994-08-25 1996-09-17 E. I. Du Pont De Nemours And Company X-ray photoconductive compositions for x-ray radiography
US5536932A (en) * 1995-02-10 1996-07-16 Xerox Corporation Polysilicon multiplexer for two-dimensional image sensor arrays
FR2736782B1 (en) * 1995-04-07 1997-11-14 Commissariat Energie Atomique DEVICE AND METHOD FOR READING A MATRIX OF PHOTONIC DETECTORS
US5604347A (en) * 1995-07-13 1997-02-18 General Electric Company Method and means for compensating for row variable offsets in a large area solid state x-ray detector
US6232606B1 (en) 1995-07-31 2001-05-15 Ifire Technology, Inc. Flat panel detector for radiation imaging and pixel for use therein
WO1997023090A2 (en) * 1995-12-18 1997-06-26 Philips Electronics N.V. X-ray examination apparatus including an image sensor matrix with a correction unit
JP4035194B2 (en) 1996-03-13 2008-01-16 キヤノン株式会社 X-ray detection apparatus and X-ray detection system
JP4597171B2 (en) * 1996-03-13 2010-12-15 キヤノン株式会社 Photoelectric conversion apparatus, X-ray imaging apparatus, and system having the apparatus
JP4654321B2 (en) * 1996-03-13 2011-03-16 キヤノン株式会社 Photoelectric conversion apparatus, X-ray imaging apparatus, and system having the apparatus
DE69623659T2 (en) 1996-05-08 2003-05-08 Ifire Technology Inc., Fort Saskatchewan HIGH-RESOLUTION FLAT SENSOR FOR RADIATION IMAGING SYSTEM
US6744912B2 (en) 1996-11-29 2004-06-01 Varian Medical Systems Technologies, Inc. Multiple mode digital X-ray imaging system
US5970115A (en) 1996-11-29 1999-10-19 Varian Medical Systems, Inc. Multiple mode digital X-ray imaging system
EP0883900B1 (en) 1996-12-12 2005-06-08 Commissariat A L'energie Atomique Device and process for reading a photonic detector matrix
US6075247A (en) * 1997-01-06 2000-06-13 U.S. Philips Corporation Device for reading an imaging sensor matrix
DE19705755C1 (en) * 1997-02-14 1998-07-30 Siemens Ag Semiconductor X-ray detector arrangement
US6726812B1 (en) 1997-03-04 2004-04-27 Canon Kabushiki Kaisha Ion beam sputtering apparatus, method for forming a transparent and electrically conductive film, and process for the production of a semiconductor device
JP3667058B2 (en) * 1997-11-19 2005-07-06 キヤノン株式会社 Photoelectric conversion device
DE19754626C2 (en) * 1997-12-09 1999-10-21 Fraunhofer Ges Forschung Programmable, optically sensitive circuit
IL123006A (en) 1998-01-20 2005-12-18 Edge Medical Devices Ltd X-ray imaging system
IL126018A0 (en) 1998-09-01 1999-05-09 Edge Medical Devices Ltd X-ray imaging system
WO2000025151A1 (en) 1998-10-28 2000-05-04 Koninklijke Philips Electronics N.V. Method of manufacturing a layered scintillation detector
US6486470B2 (en) 1998-11-02 2002-11-26 1294339 Ontario, Inc. Compensation circuit for use in a high resolution amplified flat panel for radiation imaging
US6326625B1 (en) 1999-01-20 2001-12-04 Edge Medical Devices Ltd. X-ray imaging system
US6757019B1 (en) * 1999-03-13 2004-06-29 The Board Of Trustees Of The Leland Stanford Junior University Low-power parallel processor and imager having peripheral control circuitry
DE19922650A1 (en) * 1999-05-18 2000-11-23 Philips Corp Intellectual Pty Sensor matrix e.g. for x-ray inspection apparatus, has light or x-ray sensitive sensor elements in matrix with two transistors per sensor connected in series and electrode of further capacitance connected to their junction
US6178225B1 (en) 1999-06-04 2001-01-23 Edge Medical Devices Ltd. System and method for management of X-ray imaging facilities
JP2001056382A (en) * 1999-06-07 2001-02-27 Toshiba Corp Radiation detector and radiation diagnosing device
JP2010246129A (en) * 1999-06-07 2010-10-28 Toshiba Corp Radiation detector
DE19926582A1 (en) * 1999-06-11 2000-12-14 Philips Corp Intellectual Pty sensor
WO2001003418A1 (en) * 1999-07-05 2001-01-11 Koninklijke Philips Electronics N.V. Image detector
JP2001095790A (en) * 1999-09-30 2001-04-10 Shimadzu Corp X-ray fluoroscopy photographing apparatus
DE10025897B4 (en) * 2000-05-25 2004-07-15 Sick Ag Method for operating an optoelectronic sensor arrangement and optoelectronic sensor arrangement
DE10039002A1 (en) 2000-08-10 2002-02-21 Philips Corp Intellectual Pty Image correction method for an X-ray detector
JP5060701B2 (en) * 2000-09-20 2012-10-31 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ X-ray detection apparatus and method for controlling the X-ray detection apparatus
JP2002214040A (en) * 2001-01-16 2002-07-31 Inst Of Space & Astronautical Science Reading method for simultaneous signals from a plurality of elements
DE10106221A1 (en) * 2001-02-10 2002-08-14 Philips Corp Intellectual Pty X-ray detector with a large dynamic range
DE10142531A1 (en) 2001-08-30 2003-03-20 Philips Corp Intellectual Pty Sensor arrangement of light and / or X-ray sensitive sensors
DE10219927A1 (en) * 2002-05-03 2003-11-20 Philips Intellectual Property X-ray examination device with a dose measuring device
JP2004312072A (en) * 2003-04-02 2004-11-04 Matsushita Electric Ind Co Ltd Image processing device, camera, and image processing method
US7196334B2 (en) 2003-04-24 2007-03-27 Koninklijke Philips Electronics N.V. X-ray detector element
KR100523233B1 (en) * 2003-08-23 2005-10-24 삼성전자주식회사 CMOS image sensor and Method of sensing image using the same
US7095028B2 (en) * 2003-10-15 2006-08-22 Varian Medical Systems Multi-slice flat panel computed tomography
US7589326B2 (en) * 2003-10-15 2009-09-15 Varian Medical Systems Technologies, Inc. Systems and methods for image acquisition
KR101160828B1 (en) * 2004-12-23 2012-06-29 삼성전자주식회사 Display device, driving method thereof, and driving apparatus for display device
US7304308B2 (en) * 2005-02-16 2007-12-04 Hologic, Inc. Amorphous selenium flat panel x-ray imager for tomosynthesis and static imaging
US7122803B2 (en) * 2005-02-16 2006-10-17 Hologic, Inc. Amorphous selenium flat panel x-ray imager for tomosynthesis and static imaging
US7233005B2 (en) * 2005-02-16 2007-06-19 Hologic, Inc. Amorphous selenium flat panel x-ray imager for tomosynthesis and static imaging
KR101331982B1 (en) * 2005-06-03 2013-11-25 우니페르지타에트 취리히 Photoarray for detecting time­dependent image data
JP4773768B2 (en) * 2005-08-16 2011-09-14 キヤノン株式会社 Radiation imaging apparatus, control method therefor, and radiation imaging system
JP4898522B2 (en) * 2006-04-21 2012-03-14 キヤノン株式会社 Imaging apparatus, radiation imaging system, and imaging apparatus control method
JP2010088460A (en) * 2007-01-22 2010-04-22 Shimadzu Corp Data processing method, radiation data processing method using the same and radiation imaging device
DE102007050253A1 (en) * 2007-10-20 2009-04-23 Dr. Johannes Heidenhain Gmbh Detector element array for an optical position-measuring device
US8552358B2 (en) * 2007-12-18 2013-10-08 Marek T. Michalewicz Quantum tunneling photodetector array including electrode nano wires
CN105706439B (en) 2013-09-16 2019-06-28 超龙凯姆公司 Dynamically, individually photodiode pixel circuit and its operating method
JP6054859B2 (en) * 2013-12-27 2016-12-27 ミハレヴィチュ, マレク ティ.MICHALEWICZ, Marek, T. Quantum tunneling photodetector array
FR3119707A1 (en) 2021-02-08 2022-08-12 Trixell Digital detector with digital integration of charges

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2151878A (en) * 1983-12-19 1985-07-24 Rca Corp Charged coupled device imagers with partitioned registers
DE3531448A1 (en) * 1984-09-03 1986-03-13 Kabushiki Kaisha Toshiba, Kawasaki, Kanagawa ROENTGEN IMAGE DETECTION DEVICE
EP0237365A1 (en) * 1986-01-24 1987-09-16 Thomson-Csf Photo-sensitive device

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR332486A (en) * 1903-05-06 1903-10-29 Cie Internationale De L Electr Apparatus for obtaining a varied composition in machines controlled by perforated bands
US3660667A (en) * 1970-06-22 1972-05-02 Rca Corp Image sensor array in which each element employs two phototransistors one of which stores charge
GB1469814A (en) * 1973-04-26 1977-04-06 Energy Conversion Devices Inc Solid state electronic device and circuit therefor
FR2469805A1 (en) * 1979-11-09 1981-05-22 Thomson Csf MATRIX FOR DETECTION OF ELECTROMAGNETIC RADIATION AND RADIOLOGICAL IMAGE ENHANCER COMPRISING SUCH A MATRIX
US4383327A (en) * 1980-12-01 1983-05-10 University Of Utah Radiographic systems employing multi-linear arrays of electronic radiation detectors
FR2627923B1 (en) * 1988-02-26 1990-06-22 Thomson Csf MATRIX OF PHOTOSENSITIVE ELEMENTS AND RADIATION DETECTOR COMPRISING SUCH A MATRIX, IN PARTICULAR A DOUBLE ENERGY X-RAY DETECTOR

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2151878A (en) * 1983-12-19 1985-07-24 Rca Corp Charged coupled device imagers with partitioned registers
DE3531448A1 (en) * 1984-09-03 1986-03-13 Kabushiki Kaisha Toshiba, Kawasaki, Kanagawa ROENTGEN IMAGE DETECTION DEVICE
EP0237365A1 (en) * 1986-01-24 1987-09-16 Thomson-Csf Photo-sensitive device

Also Published As

Publication number Publication date
EP0440282B1 (en) 1996-04-17
EP0440282A2 (en) 1991-08-07
DE4002431A1 (en) 1991-08-01
DE59107674D1 (en) 1996-05-23
JPH04212456A (en) 1992-08-04
JP3141033B2 (en) 2001-03-05
US5184018A (en) 1993-02-02

Similar Documents

Publication Publication Date Title
DE4190756D2 (en) Mikrotom
DE69125252D1 (en) Röntgentherapie-simulatormachine
DE69126781D1 (en) Fabry-perot-modulator
EP0463302A3 (en) Pinchcock
DE69116171D1 (en) Photo- und biologisch-abbaubare polyethen-copolymere
DE69127252D1 (en) Linearlager
EP0465262A3 (en) Polysilethylenesiloxane
DE4092449D2 (en) Taschenfederkernmatratze
AU111085S (en) Sunlounger
EP0465263A3 (en) Polysilethylenesiloxane
EP0473003A3 (en) Solidformulations
EP0442596A3 (en) Echelle-polychromator
DE4191708D2 (en) Festkoerperlaser
EP0467207A3 (en) Purinderivate
EP0458340A3 (en) Slitterscorer
EP0444458A3 (en) Pulsdopplerradar
EP0442511A3 (en) Allen-key
EP0441276A3 (en) Electrophotoreceptor
DE4092685D2 (en) Mehrkomponenten-kleb- und -werkstoffverarbeitungssystem
EP0447954A3 (en) Spray-station
EP0464900A3 (en) 2-biphenyl-carbapenems
EP0439820A3 (en) Vacuumswitch
EP0442371A3 (en) Bisglycosides
EP0445577A3 (en) Polyperylenes
AU110900S (en) Facsimilie

Legal Events

Date Code Title Description
PUAI Public reference made under article 153(3) epc to a published international application that has entered the european phase

Free format text: ORIGINAL CODE: 0009012

AK Designated contracting states

Kind code of ref document: A2

Designated state(s): DE FR GB IT

PUAL Search report despatched

Free format text: ORIGINAL CODE: 0009013

AK Designated contracting states

Kind code of ref document: A3

Designated state(s): DE FR GB IT

17P Request for examination filed

Effective date: 19921029

17Q First examination report despatched

Effective date: 19940905

GRAA (expected) grant

Free format text: ORIGINAL CODE: 0009210

AK Designated contracting states

Kind code of ref document: B1

Designated state(s): DE FR GB IT

REF Corresponds to:

Ref document number: 59107674

Country of ref document: DE

Date of ref document: 19960523

ITF It: translation for a ep patent filed
ET Fr: translation filed
GBT Gb: translation of ep patent filed (gb section 77(6)(a)/1977)

Effective date: 19960621

PLBQ Unpublished change to opponent data

Free format text: ORIGINAL CODE: EPIDOS OPPO

PLBI Opposition filed

Free format text: ORIGINAL CODE: 0009260

PLBF Reply of patent proprietor to notice(s) of opposition

Free format text: ORIGINAL CODE: EPIDOS OBSO

26 Opposition filed

Opponent name: CANON KABUSHIKI KAISHA

Effective date: 19970117

PLBF Reply of patent proprietor to notice(s) of opposition

Free format text: ORIGINAL CODE: EPIDOS OBSO

PLBF Reply of patent proprietor to notice(s) of opposition

Free format text: ORIGINAL CODE: EPIDOS OBSO

RAP4 Party data changed (patent owner data changed or rights of a patent transferred)

Owner name: KONINKLIJKE PHILIPS ELECTRONICS N.V.

Owner name: PHILIPS PATENTVERWALTUNG GMBH

REG Reference to a national code

Ref country code: FR

Ref legal event code: CD

PLAW Interlocutory decision in opposition

Free format text: ORIGINAL CODE: EPIDOS IDOP

APAC Appeal dossier modified

Free format text: ORIGINAL CODE: EPIDOS NOAPO

APAE Appeal reference modified

Free format text: ORIGINAL CODE: EPIDOS REFNO

APAC Appeal dossier modified

Free format text: ORIGINAL CODE: EPIDOS NOAPO

RAP4 Party data changed (patent owner data changed or rights of a patent transferred)

Owner name: PHILIPS CORPORATE INTELLECTUAL PROPERTY GMBH

Owner name: KONINKLIJKE PHILIPS ELECTRONICS N.V.

APAC Appeal dossier modified

Free format text: ORIGINAL CODE: EPIDOS NOAPO

REG Reference to a national code

Ref country code: GB

Ref legal event code: IF02

RAP2 Party data changed (patent owner data changed or rights of a patent transferred)

Owner name: PHILIPS CORPORATE INTELLECTUAL PROPERTY GMBH

Owner name: KONINKLIJKE PHILIPS ELECTRONICS N.V.

RAP2 Party data changed (patent owner data changed or rights of a patent transferred)

Owner name: KONINKLIJKE PHILIPS ELECTRONICS N.V.

Owner name: PHILIPS INTELLECTUAL PROPERTY & STANDARDS GMBH

RDAF Communication despatched that patent is revoked

Free format text: ORIGINAL CODE: EPIDOSNREV1

APBP Date of receipt of notice of appeal recorded

Free format text: ORIGINAL CODE: EPIDOSNNOA2O

APBQ Date of receipt of statement of grounds of appeal recorded

Free format text: ORIGINAL CODE: EPIDOSNNOA3O

APBY Invitation to file observations in appeal sent

Free format text: ORIGINAL CODE: EPIDOSNOBA2O

APCA Receipt of observations in appeal recorded

Free format text: ORIGINAL CODE: EPIDOSNOBA4O

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: IT

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES;WARNING: LAPSES OF ITALIAN PATENTS WITH EFFECTIVE DATE BEFORE 2007 MAY HAVE OCCURRED AT ANY TIME BEFORE 2007. THE CORRECT EFFECTIVE DATE MAY BE DIFFERENT FROM THE ONE RECORDED.

Effective date: 20050121

APAH Appeal reference modified

Free format text: ORIGINAL CODE: EPIDOSCREFNO

APBU Appeal procedure closed

Free format text: ORIGINAL CODE: EPIDOSNNOA9O

RDAG Patent revoked

Free format text: ORIGINAL CODE: 0009271

STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: PATENT REVOKED

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: DE

Payment date: 20080312

Year of fee payment: 18

Ref country code: GB

Payment date: 20080227

Year of fee payment: 18

27W Patent revoked

Effective date: 20071213

GBPR Gb: patent revoked under art. 102 of the ep convention designating the uk as contracting state

Effective date: 20071213

PLAB Opposition data, opponent's data or that of the opponent's representative modified

Free format text: ORIGINAL CODE: 0009299OPPO

R26 Opposition filed (corrected)

Opponent name: CANON KABUSHIKI KAISHA

Effective date: 19970117

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: FR

Payment date: 20080129

Year of fee payment: 18