EP0229076A1 - Process to measure in particular rotationally symmetric workpieces - Google Patents
Process to measure in particular rotationally symmetric workpiecesInfo
- Publication number
- EP0229076A1 EP0229076A1 EP19860902810 EP86902810A EP0229076A1 EP 0229076 A1 EP0229076 A1 EP 0229076A1 EP 19860902810 EP19860902810 EP 19860902810 EP 86902810 A EP86902810 A EP 86902810A EP 0229076 A1 EP0229076 A1 EP 0229076A1
- Authority
- EP
- European Patent Office
- Prior art keywords
- optoelectronic
- workpiece
- transducers
- output signals
- workpieces
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
Definitions
- the invention relates to a method for measuring, in particular, rotationally symmetrical workpieces.
- This method is preferably used in production measurement technology to check mass-produced workpieces, such as crankshafts and / or axes.
- Pneumatic methods are also known for measuring workpieces of this type, which, however, disadvantageously have to be brought into the immediate vicinity of the workpiece in order to admit nozzle elements for applying air to the workpiece surface to be measured. In addition, a comparatively high effort is required to generate the compressed air.
- the invention is based on the object of specifying a considerably simplified method for measuring workpieces and a suitable device for carrying out this method.
- a method for solving this problem emerges from claim 1.
- Devices for carrying out the method are mentioned in the subclaims.
- FIG. 3 an enlarged view of parts of the device according to FIG. 1 to explain the measuring method.
- a workpiece 1 to be measured e.g.
- a shaft 1 equipped with different diameters D 1, D 2 along the axis 30 is arranged in a holder (not shown) for the measuring operation.
- a linear dimension is also provided running parallel to the preferred axis 30 of the workpiece 1.
- the measuring method is intended to check the diameter values of the workpiece and their position along the preferred axis, that is to say also in relation to the linear scale 3.
- optical cuts are made perpendicular to a preferred workpiece axis, for example to the axis 30 or perpendicular to an upper or lower edge of the workpiece 1 on at least two optoelectronic transducers 2, 2 'are shown, which are arranged to be movable along the linear scale 3.
- optoelectronic transducers semi-lead detection cameras are expediently used, whose essentially linearly extending light-receiving surfaces are arranged in the cutting plane.
- the diameter value of the workpiece 1 at the respective measuring position of the optoelectronic transducers is directly proportional, the diameter values determined from the output signals of the optoelectronic transducers 2, 2 'can be clearly determined by means of the linear scale 3 of the respective position of the Assign optoelectronic transducers 2, 2 ', so that ultimately, because of the fixed arrangement of the workpiece 1 to be measured in the measuring arrangement, there is a clear connection between a measured diameter value and the distance of this diameter range of the workpiece 1 from the beginning of the workpiece 1.
- a diffusely scattering or reflecting optical element e.g. B. a focusing screen 4, which can be illuminated from the rear by a light source 8 if necessary.
- the output signals 20, 20 'of the optoelectronic converters 2, 2' are preferably fed to a subtractor 7 which forms the difference between the two output signals 20, 20 '.
- the difference signal formed is fed to a computing unit 6, to which the linear values 3 also supply the positive values of the optoelectronic transducers 2, 2 ', which are in the form of electrical signals.
- the arithmetic unit 6 assigns these position values to the respectively determined diameter values and, if necessary, leaves them on an output device, e.g. B. log a printer or a plotter.
- FIG. 3 shows only a part of the workpiece 1 with different graded diameter values D 1, D 2, D 3.
- the photosensitive surfaces of the optoelectronic transducers 2, 2 ′ are indicated schematically in a first position in the sectional plane 31 and in a second position in the sectional plane 32.
- sectional plane 31 which, like the second sectional plane 32, is also perpendicular to the preferred axis 30 of the workpiece 1, a larger area of the light-sensitive surfaces of the optoelectronic transducers 2, 2 'is shaded than in the sectional plane 32, since in the cutting plane 31 of the workpiece 1 has a larger diameter D 1.
- the linear scale 3, which serves to determine the respective position of the optoelectronic transducers 2, 2 ', is also only indicated schematically in the figure.
- the respective diameter value D 1 or D 2 of the workpiece 1 is determined by forming the difference from the output signals of the optoelectronic converters 2, 2 'and assigned to the position X 1 or X 2.
- the measuring process can be accelerated further in that a larger number of optoelectronic transducers 2, 2 'are arranged along the linear scale 3 in a stationary manner, which at the same time are located at preferred, prominent locations on the workpiece 1, e.g. B. in the range of diameter jumps, determine the diameter values and simultaneously forward a corresponding number of measured values to the computing unit 6.
- a particular advantage of this non-contact measurement method is its high flexibility compared to different workpiece geometries. Similar workpieces can be measured by slightly changing the holding device, which is not shown in the figure, without major mechanical obstacles in the same device, a remarkably high level of precision still being achieved
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
Un procédé et un dispositif sont utilisés pour mesurer des pièces à usiner, en particulier des pièces à usiner à rotation symétrique. Des sections optiques perpendiculaires à un axe (30) préféré de la pièce à usiner (1) sont formées sur les surfaces photosensibles d'au moins deux convertisseurs optoélectroniques (2, 2'). Un signal de sortie correspondant au diamètre de la pièce à usiner (1) est obtenu dans un organe de soustraction (7) qui calcule la différence entre les signaux de sortie (20, 20') de ces convertisseurs optoélectroniques. Le signal de sortie ainsi obtenu est fourni à une unité de calcul (6), qui reçoit également un signal de sortie correspondant à la position des convertisseurs optoélectroniques (2, 2') produit par un système linéaire de mesure (3). Des pièces à usiner (1) défectueuses peuvent ainsi être éliminées par comparaison avec des valeurs de consigne enregistrées au préalable.A method and a device are used to measure workpieces, in particular workpieces with symmetrical rotation. Optical sections perpendicular to a preferred axis (30) of the workpiece (1) are formed on the photosensitive surfaces of at least two optoelectronic converters (2, 2 '). An output signal corresponding to the diameter of the workpiece (1) is obtained in a subtraction member (7) which calculates the difference between the output signals (20, 20 ') of these optoelectronic converters. The output signal thus obtained is supplied to a calculation unit (6), which also receives an output signal corresponding to the position of the optoelectronic converters (2, 2 ') produced by a linear measurement system (3). Defective workpieces (1) can thus be eliminated by comparison with previously recorded setpoints.
Description
Verfahren zur Vermessung von insbesondere rotationssymme rischen Werkstücken Method for measuring in particular rotationally symmetrical workpieces
Die Erfindung betrifft ein Verfahren zur Vermessung von insbesondere rotationssymmetrischen Werkstücken.The invention relates to a method for measuring, in particular, rotationally symmetrical workpieces.
Dieses Verfahren wird bevorzugt in der Fertigungsme߬ technik zur Überprüfung von in Serie hergestell en Werkstücken, wie beispielsweise Kurbelwellen und/oder Achsen eingesetzt.This method is preferably used in production measurement technology to check mass-produced workpieces, such as crankshafts and / or axes.
Zur Vermessung derartiger Werkstücke sind bereits ebenfalls berührungslos arbeitende pneumatische Ver- fahren bekannt, bei denen jedoch in nachteiliger Weise Düsenelemente zur Beaufschlagung der zu messenden Werk¬ stückoberfläche mit Luft in unmittelbare Nachbarschaft des Werkstücks gebracht werden müssen. Zudem ist ein vergleichsweise hoher Aufwand zur Erzeugung der Druckluft erforderlich.Pneumatic methods are also known for measuring workpieces of this type, which, however, disadvantageously have to be brought into the immediate vicinity of the workpiece in order to admit nozzle elements for applying air to the workpiece surface to be measured. In addition, a comparatively high effort is required to generate the compressed air.
Der Erfindung liegt die Aufgabe zugrunde, ein wesent¬ lich vereinfachtes Verfahren zur Vermessung von Werk¬ stücken und eine geeignete Vorrichtung zur Durchfüh- rung dieses Verfahrens anzugeben.
Ein Verfahren zur Lösung dieser Aufgabe geht aus Anspruch 1 hervor. Vorrichtungen zur Durchführung des Verfahrens sind in den Unteransprüchen genannt.The invention is based on the object of specifying a considerably simplified method for measuring workpieces and a suitable device for carrying out this method. A method for solving this problem emerges from claim 1. Devices for carrying out the method are mentioned in the subclaims.
Die Erfindung wird nachfolgend unter Bezug auf die Zeichnungen näher erläutert. Dabei zeigt:The invention is explained in more detail below with reference to the drawings. It shows:
Fig. 1: eine Aufsicht auf eine Vorrichtung zur Durchführung des Verfahrens;1: a top view of a device for carrying out the method;
Fig. 2: eine Seitenansicht der Vorrichtung;2: a side view of the device;
Fig. 3: eine vergrößerte Darstellung von Teilen der Vorrichtung nach Fig. 1 zur Erläute- rung des Meßverfahrens.3: an enlarged view of parts of the device according to FIG. 1 to explain the measuring method.
In einer schematischen Darstellung zeigt Fig. 1 eine Vorrichtung zur Durchführu-ng des erfindungsgemäßen Ver¬ fahrens. Ein zu vermessendes Werkstück 1, z. B. eine entlang der Achse 30 mit unterschiedlichen Durchmes¬ sern D 1, D 2 ausgestattete Welle l.ist für den Meßvor¬ gang ortsfest in einer nicht dargestell en Halterung angeordnet. Parallel zur bevorzugten Achse 30 des Werkstücks 1 verlaufend ist weiter ein Linearmaßs ab vorgesehen. Mit dem Meßverfahren sollen die Durchmes¬ serwerte des Werkstücks und deren Lage entlang der bevorzugten Achse, also auch in Bezug auf den Linar- maßstab 3 überprüft werden. Zu diesem Zweck werden optische Schnitte senkrecht zu einer bevorzugten Werkstückachse, beispielsweise zur Achse 30 oder auch senkrecht zu einer Ober- bzw. Unterkante des Werk¬ stücks 1 auf mindestens zwei
optoelektronische Wandler 2, 2' abgebildet, die ent¬ lang des Linearmaßstabs 3 bewegbar angeordnet sind. Als optoelektronische Wandler werden zweckmäßig Halblei erkameras verwendet, deren im wesentlichen sich linear erstreckende Lichtaufnahmeflächen in der Schnittebene angeordnet sind. Abhängig von der Ab¬ schattung der lichtempfind"lichen Flächen der optoelek¬ tronischen Wandler 2, 2' durch die Konturen des zu vermessenden Werkstücks 1 liefern die optoelektroni- sehen Wandler 2, 2' elektrische Ausgangssignale, die nach geeigneter Verknüpfung, z. B. nach Differenzbil¬ dung, unmittelbar dem Durchmesserwert des Werkstücks 1 an der jeweiligen Meßposition der optoelek roni¬ schen Wandler proportional sind. Die aus den Ausgang- ssignalen der optoelektronischen Wandler 2, 2' ermittelten Durchmesserwerte lassen sich vermittels des Linearmaßstabs 3 eindeutig der jeweiligen Lage der optoelektronischen Wandler 2, 2' zuordnen, so daß letztlich wegen der ortsfesten Anordnung des zu vermessenden Werkstücks 1 in der Meßanordnung ein eindeutiger Zusammenhang zwischen einem gemessenen Dur'chmesserwert und dem Abstand dieses Durchmesser¬ bereichs des Werkstücks 1 vom Anfang des Werkstücks 1 besteht .1 shows a device for performing the method according to the invention. A workpiece 1 to be measured, e.g. For example, a shaft 1 equipped with different diameters D 1, D 2 along the axis 30 is arranged in a holder (not shown) for the measuring operation. A linear dimension is also provided running parallel to the preferred axis 30 of the workpiece 1. The measuring method is intended to check the diameter values of the workpiece and their position along the preferred axis, that is to say also in relation to the linear scale 3. For this purpose, optical cuts are made perpendicular to a preferred workpiece axis, for example to the axis 30 or perpendicular to an upper or lower edge of the workpiece 1 on at least two optoelectronic transducers 2, 2 'are shown, which are arranged to be movable along the linear scale 3. As optoelectronic transducers, semi-lead detection cameras are expediently used, whose essentially linearly extending light-receiving surfaces are arranged in the cutting plane. Depending on the Ab¬ shading of lichtempfind "lichen surfaces of optoelek¬ tronic converter 2, 2 'by the contours of the workpiece to be measured 1 provide the optoelectronic see transducers 2, 2' electrical output signals by a suitable linkage, for. B. after difference formation, the diameter value of the workpiece 1 at the respective measuring position of the optoelectronic transducers is directly proportional, the diameter values determined from the output signals of the optoelectronic transducers 2, 2 'can be clearly determined by means of the linear scale 3 of the respective position of the Assign optoelectronic transducers 2, 2 ', so that ultimately, because of the fixed arrangement of the workpiece 1 to be measured in the measuring arrangement, there is a clear connection between a measured diameter value and the distance of this diameter range of the workpiece 1 from the beginning of the workpiece 1.
Zwecks Optimierung der optischen Abbildungsverhält¬ nisse ist hinter dem zu vermessenden Werkstück 1 ein diffus streuendes bzw. reflektierendes optisches Element, z. B. eine Mattscheibe 4, angeordnet, die im Bedarfsfall von der Rückseite her durch eine Lichtquelle 8 beleuchtbar ist.In order to optimize the optical imaging conditions, a diffusely scattering or reflecting optical element, e.g. B. a focusing screen 4, which can be illuminated from the rear by a light source 8 if necessary.
Um ein dem Durchmesser des Werkstücks 1 an der Me߬ stelle entsprechendes elektrisches Signal zu gewinnen,
werden die Ausgangssignale 20, 20' der optoelektro¬ nischen Wandler 2, 2' bevorzugt einem Subtrahierglied 7 zugeleitet, das die Differenz der beiden Ausgangs¬ signale 20, 20' bildet. Das gebildete Differenzsignal wird einer Recheneinheit 6 zugeleitet, der ebenfalls vom Linearmaßstab 3 die in Form von elektrischen Sig¬ nalen vorliegenden Positiόnswerte der optoelektroni¬ schen Wandler 2, 2' zugeführt werden. Die Rechenein¬ heit 6 ordnet diese Posi ionswerte den jeweils ermit- telten Durchmesserwerten zu und läßt diese ggf. auf einer Ausgabeeinrichtung, z. B. einem Drucker oder einem Plotter, protokollieren.In order to obtain an electrical signal corresponding to the diameter of the workpiece 1 at the measuring point, the output signals 20, 20 'of the optoelectronic converters 2, 2' are preferably fed to a subtractor 7 which forms the difference between the two output signals 20, 20 '. The difference signal formed is fed to a computing unit 6, to which the linear values 3 also supply the positive values of the optoelectronic transducers 2, 2 ', which are in the form of electrical signals. The arithmetic unit 6 assigns these position values to the respectively determined diameter values and, if necessary, leaves them on an output device, e.g. B. log a printer or a plotter.
In der Fertigungsmeßtechnik wird zweckmäßig so ver- fahren, daß bestimmte Sollwerte und Toleranzen eines bestimmten Werkstücks vorgegeben und in der Rechen¬ einheit 6 abgespeichert werden. Nach Abschluß des Meßvorgangs kann dann ohne weiteres festgestellt werden, ob das vermessene Werkstück diesen Werten voll entspricht, oder als Ausschuß ausgesondert werden muß. Besonders bei hochwertigen Werkstücken dient das während des Meßvorgangs automatisch er¬ stellte Meßprotokoll als Nachweis für die Fertigungs¬ qualität .In production measurement technology, it is expedient to proceed in such a way that specific setpoints and tolerances of a specific workpiece are specified and stored in the computing unit 6. After completing the measuring process, it can then be readily determined whether the workpiece measured corresponds fully to these values or whether it must be rejected as a reject. In the case of high-quality workpieces in particular, the measurement protocol which is automatically generated during the measurement process serves as proof of the production quality.
Anhand der vergrößerten Detaildarstellung der Fig. 3 wird noch deutlicher erkennbar, auf welche Weise die Ausgangssignale der optoelektronischen Wandler 2, 2' gewonnen und dem jeweiligen Durchmesserwert des Werk- Stücks 1 zugeordnet werden. In der Fig. 3 ist nur ein Teil des Werkstücks 1 mit unterschiedlichen abge¬ stuften Durchmesserwerten D 1, D 2, D 3 dargestellt.
Schematisch angedeutet sind die lichtempfindlichen Flächen der optoelektronischen Wandler 2, 2' in einer ersten Position in der Schnittebene 31 und in einer zweiten Position in der Schnittebene 32 liegend. In der Schnittebene 31, die ebenfalls wie die zweite Schnitt¬ ebene 32 senkrecht zur bevorzugten Achse 30 des Werk¬ stücks 1 geführt ist, wird ein größerer Bereich der lichtempfindlichen Flächen der optoelektronischen Wandler 2, 2' abgeschattet als in der Schnittebene 32, da in der Schnittebene 31 des Werkstücks 1 einen größeren Durchmesser D 1 aufweist . - Der Linearmaβstab 3, der zur Feststellung der jeweiligen Position der optoelektronischen Wandler 2, 2' dient, ist in der Fig. ebenfalls nur schematisch angedeutet.On the basis of the enlarged detailed illustration in FIG. 3, it can be seen even more clearly how the output signals of the optoelectronic transducers 2, 2 'are obtained and assigned to the respective diameter value of the workpiece 1. FIG. 3 shows only a part of the workpiece 1 with different graded diameter values D 1, D 2, D 3. The photosensitive surfaces of the optoelectronic transducers 2, 2 ′ are indicated schematically in a first position in the sectional plane 31 and in a second position in the sectional plane 32. In the sectional plane 31, which, like the second sectional plane 32, is also perpendicular to the preferred axis 30 of the workpiece 1, a larger area of the light-sensitive surfaces of the optoelectronic transducers 2, 2 'is shaded than in the sectional plane 32, since in the cutting plane 31 of the workpiece 1 has a larger diameter D 1. - The linear scale 3, which serves to determine the respective position of the optoelectronic transducers 2, 2 ', is also only indicated schematically in the figure.
Wie zuvor bereits beschrieben, wird durch Differenz¬ bildung aus den Ausgangssignalen der optoelektro¬ nischen Wandler 2, 2' der jeweilige Durchmesserwert D 1 bzw. D 2 des Werkstücks 1 ermittelt und der Position X 1 bzw. X 2 zugeordnet.As already described above, the respective diameter value D 1 or D 2 of the workpiece 1 is determined by forming the difference from the output signals of the optoelectronic converters 2, 2 'and assigned to the position X 1 or X 2.
In einer vorteilhaften Weiterbildung der Erfindung kann der Meßvorgang, noch dadurch beschleunigt werden, daß entlang des Linearmaßstabs 3 ortsfest eine größere Vielzahl von optoelektronischen Wandlern 2, 2' ange¬ ordnet sind, die gleichzeitig an bevorzugten markanten Stellen des Werkstücks 1, z. B. im Bereich von Durch¬ messersprüngen, die Durchmesserwerte ermitteln und entsprechend viele Meßwerte gleichzeitig an die Recheneinheit 6 weiterleiten.In an advantageous development of the invention, the measuring process can be accelerated further in that a larger number of optoelectronic transducers 2, 2 'are arranged along the linear scale 3 in a stationary manner, which at the same time are located at preferred, prominent locations on the workpiece 1, e.g. B. in the range of diameter jumps, determine the diameter values and simultaneously forward a corresponding number of measured values to the computing unit 6.
Ein besonderer Vorteil dieses berührungslosen Meßver¬ fahrens besteht in seiner hohen Flexibilität gegenüber
unterschiedlichen Werkstückgeometrien. Ähnliche Werkstücke lassen sich durch geringfügige Änderung der in der Fig. nicht dargestellten Haltevorrichtung ohne größere mecha¬ nische Hinderungen in der gleichen Vorrichtung vermessen, wobei noch eine bemerkenswert hohe Präzision erreicht wird
A particular advantage of this non-contact measurement method is its high flexibility compared to different workpiece geometries. Similar workpieces can be measured by slightly changing the holding device, which is not shown in the figure, without major mechanical obstacles in the same device, a remarkably high level of precision still being achieved
Claims
1. Verfahren zur Vermessung von insbesondere rota¬ tionssymmetrischen Werkstücken, d a d u r c h g e k e n n z e i c h n e t, daß optische Schnitte senkrecht zu einer bevorzugten Werkstück¬ achse (30) auf mindestens zwei jeweils in der Schnittebene (31, 32) angeordnete optoelektronische Wandler (2, 2*) abgebildet werden, und daß die Aus¬ gangssignale der optoelektronischen Wandler (2,' 2') der jeweiligen Position der parallel zur Achse (30) verschiebbar angeordneten optischen Wandler (2, 2') zugeordnet werden.1. A method for measuring in particular rotationally symmetrical workpieces, characterized in that optical cuts perpendicular to a preferred workpiece axis (30) are mapped onto at least two optoelectronic transducers (2, 2 * ) arranged in the cutting plane (31, 32) , and that the output signals of the optoelectronic transducers (2, '2') are assigned to the respective position of the optical transducers (2, 2 ') which are displaceable parallel to the axis (30).
2. Verfahren nach Anspruch 1, d a d u r c h g e ¬ k e n n z e i c h n e t, daß die Ausgangssignale (20, 20') der optoelektronischen Wandler (2, 2') und die diesen Signalen zugeordnete Position (X 1, X 2) der Wandler (2, 2') in einem Meßprotokoll er¬ faßt werden.2. The method according to claim 1, dadurchge ¬ indicates that the output signals (20, 20 ') of the optoelectronic converter (2, 2') and the position (X 1, X 2) of the transducers (2, 2 ') assigned to these signals are recorded in a measurement protocol.
3. Vorrichtung zur Durchführung des Verfahrens nach den Ansprüchen 1 und 2, g e k e n n z e i c h e t d u r c h mindestens zwei in einer Ebene senkrecht übereinander angeordnete, entlang eines Linearma߬ stabs (3) verschiebbare optoelektronische Wandler (2, 2') mit im wesentlichen linienartigen, licht¬ empfindlichen Flächen, die ein Lichtsignal in ein elektrisches Signal umwandeln, und Auswertemittel (6, 7, 9) zur Verarbeitung der Ausg.angssignale der optoelektronischen Wandler (2, 2').3. Device for carrying out the method according to claims 1 and 2, characterized by at least two optoelectronic transducers (2, 2 ') which are arranged vertically one above the other in a plane and can be displaced along a linear scale (3, 2) and have essentially line-like, light-sensitive surfaces , which convert a light signal into an electrical signal, and evaluation means (6, 7, 9) for processing the output signals of the optoelectronic converters (2, 2 ').
4. Vorrichtung nach Anspruch 3, d a d u r c h g e k e n n z e i c h n e t, daß auf der den optoelektronischen Wandlern (2, 2') abgewandten Seite des Werkstücks (1) ein Licht diffus streuendes bzw. reflektierendes optisches Element, z. B. eine Mattscheibe (4), angeordnet ist.4. The apparatus of claim 3, d a d u r c h g e k e n n z e i c h n e t that on the optoelectronic transducers (2, 2 ') facing away from the workpiece (1) a light diffusely scattering or reflecting optical element, for. B. a focusing screen (4) is arranged.
5. Vorrichtung nach einem der Ansprüche 3 und 4, d a d u r c h g e k e n n z e i c h n e t, daß die Auswertemittel (6, 7, 9,) aus einem5. Device according to one of claims 3 and 4, d a d u r c h g e k e n n z e i c h n e t that the evaluation means (6, 7, 9,) from one
Subtrahierglied (7), einer Recheneinheit (6) und einer Protokolliereinheit (9) bestehen. Subtractor (7), a computing unit (6) and a logging unit (9).
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE3510644 | 1985-03-23 | ||
| DE19853510644 DE3510644A1 (en) | 1985-03-23 | 1985-03-23 | METHOD FOR MEASURING PARTICULAR ROTATION-SYMMETRICAL WORKPIECES |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| EP0229076A1 true EP0229076A1 (en) | 1987-07-22 |
Family
ID=6266173
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| EP19860902810 Withdrawn EP0229076A1 (en) | 1985-03-23 | 1986-03-22 | Process to measure in particular rotationally symmetric workpieces |
Country Status (3)
| Country | Link |
|---|---|
| EP (1) | EP0229076A1 (en) |
| DE (1) | DE3510644A1 (en) |
| WO (1) | WO1986005583A1 (en) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3817387A1 (en) * | 1988-05-19 | 1989-11-30 | Mannesmann Ag | METHOD AND DEVICE FOR DETECTING THE EXTERNAL DESIGN OF A LONG STRETCHED, CROSS-SECTION PRISMATIC BODY |
| JPH0312106U (en) * | 1989-06-21 | 1991-02-07 | ||
| DE4037934C2 (en) * | 1990-11-23 | 1993-11-25 | Mannesmann Ag | Method and device for measuring deformations on test specimens in testing machines |
| DE4143187A1 (en) * | 1991-12-30 | 1993-07-01 | Vma Ges Fuer Visuelle Messtech | Contactless outer dia. measurement appts. for glass tubes,eg quartz glass tubes during heat processing - contains selectively radiating light source on opposite side of tube from interference filters and line cameras |
| IT1281546B1 (en) * | 1995-04-13 | 1998-02-18 | Marposs Spa | OPTOELECTRONIC MEASURING DEVICE FOR THE CONTROL OF LINEAR DIMENSIONS |
| DE19625055B4 (en) * | 1995-09-28 | 2004-11-18 | Hans-Hermann Trautwein Sb-Technik Gmbh | Device and method for measuring the diameter of objects |
| DE102004046752B4 (en) * | 2004-09-24 | 2010-10-21 | GOM, Gesellschaft für optische Meßtechnik mit beschränkter Haftung | Method for the three-dimensional detection of measurement objects |
| DE102010007509A1 (en) * | 2010-02-11 | 2011-08-11 | Aktiebolaget Skf | Bearing component measuring method, involves determining correction value based on misorientation of bearing component relative to reference direction, where dimension of component is determined from measurement value and correction value |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3604940A (en) * | 1969-08-04 | 1971-09-14 | Laser Systems Corp | Radiant energy inspection system for rotating objects |
| US3749500A (en) * | 1970-12-23 | 1973-07-31 | Gen Electric | Optical caliper and edge detector-follower for automatic gaging |
| US4192613A (en) * | 1976-01-08 | 1980-03-11 | Martin Hammar | Contour detecting and dimension measuring apparatus |
| DE3314686C2 (en) * | 1983-04-22 | 1985-02-07 | Daimler-Benz Ag, 7000 Stuttgart | Device for measuring the area of the projection of a test object onto a plane |
-
1985
- 1985-03-23 DE DE19853510644 patent/DE3510644A1/en not_active Withdrawn
-
1986
- 1986-03-22 EP EP19860902810 patent/EP0229076A1/en not_active Withdrawn
- 1986-03-22 WO PCT/EP1986/000174 patent/WO1986005583A1/en unknown
Non-Patent Citations (1)
| Title |
|---|
| See references of WO8605583A1 * |
Also Published As
| Publication number | Publication date |
|---|---|
| DE3510644A1 (en) | 1986-10-02 |
| WO1986005583A1 (en) | 1986-09-25 |
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