EA033993B1 - Calibration system and method - Google Patents

Abstract

The present invention relates to a calibration system, the calibration system comprising a reference measuring device for obtaining reference responses by making measurements on a plurality of standard samples; a target measuring device for obtaining target responses by making measurements on a subset of the plurality of standard samples and obtaining field responses by making measurements on a plurality of field samples; a computing device connected to the reference measuring device to receive the reference responses and to the target measuring device to receive the target responses and the field responses; wherein the computing device: decomposes the received reference responses according to the latent variable decomposition (LVD) procedure to obtain a reference score matrix and a reference loading matrix, modifies the obtained reference score matrix by removing rows corresponding to standards samples of the plurality of standard samples which do not match the subset of standard samples, determines a target loading matrix for the target measuring device according to the LVD procedure by using the obtained target responses and the modified reference score matrix, determines a field score matrix according to the LVD procedure by using the obtained field responses and the determined target loading matrix, and determines corrected field responses according to the reverse LVD procedure by using the determined field score matrix and the obtained reference loading matrix.

Description

Technical field

The invention generally relates to systems and methods for calibration, in particular to systems and methods for calibrating a measuring device using the decomposition method using hidden variables (LVD method).

State of the art

In the prior art, various types of measuring devices are usually used to analyze samples in order to determine their one or more parameters. However, the responses of the measuring devices can only be signals (for example, voltages or currents) as output, and not reports with the parameters of the analyzed samples. Thus, it is necessary to establish an interdependence that connects the responses of the measuring devices with the determined parameters before one of the measuring devices can be used for the actual analysis of the samples. The process of constructing a model for predicting sample parameters based on the responses of a measuring device is called calibration. An example of a calibration model is a conventional calibration curve. Typically, to calibrate a measuring device, the response of the measuring device should be obtained for each sample from a set of standard samples characterized by one or more known parameters. After creating a calibration model of the measuring device, the parameters of an unknown sample (i.e., a sample whose parameters are not known in advance) can be estimated using the obtained calibration model using the response of the measuring device obtained when measuring with a measuring device in relation to an unknown sample. Meanwhile, it should be noted that the calibration process takes a lot of time and is expensive because of the high cost of the standard samples used for calibration.

Thus, if one measuring device was calibrated to determine a certain parameter of the samples, this means that there is a mathematical relationship between the measured analytical signal generated by the measuring device for the sample and the value of a certain parameter (for example, the concentration of a specific chemical compound) for the specified sample. As a rule, this mathematical dependence cannot be used directly in relation to another measuring device or other measuring devices due to the difference in their analytical signals, i.e. for the same sample, the second measuring device will produce a different analytical signal, and the mathematical relationship between the analytical signal of the second measuring device and the desired parameters will be slightly different for the second measuring device. To use this second measuring device to analyze the same parameter, it will be necessary to re-carry out the calibration process and, therefore, find a new mathematical relationship.

Significant efforts in the field of technology have been aimed at ensuring the possibility of transferring the resulting calibration model between measuring devices, as evidenced by the following description of the prior art.

In particular, US Pat. No. 5,459,677 discloses a method for constructing a multidimensional prediction model for predicting a sample property using a target spectrometer based in part on data measured by a reference spectrometer, this method including obtaining property data by measuring said property for each of a plurality of calibration samples ; obtaining the response of a reference spectrometer for each calibration sample by performing multiple measurements using a reference spectrometer; obtaining the response of the target spectrometer for each transfer sample in a subset of these calibration samples by performing multiple measurements using the target spectrometer; obtaining estimates of the responses of the target spectrometer for calibration samples using the responses of reference spectrometers for calibration samples, the responses of target spectrometers for portable samples and property data; and constructing a multidimensional prediction model for the target spectrometer by combining estimates of the responses of the target spectrometer for calibration samples with property data.

In addition, US Pat. No. 4,866,644 discloses an optical measuring system comprising an optical measuring instrument containing optical measurement means for test samples for different wavelengths throughout the spectrum, a field optical device containing optical measuring means for test samples in the entire spectrum, a computer connected to a field device for receiving measured values obtained using a field device, and containing means for arithmetic operations with respect to the measured values received from the field device for a given test sample, for converting the indicated values into a set of calibration values that are essentially identical to the measured values that could be obtained for this test sample using a measuring instrument while optical instruments are indexed to perform optical measurements for various wavelengths at index points distributed with a given step throughout the spectrum, Ep contains a tool for setting index locations on the field device, one-to-one correspondence with the index points on the monitoring device, the field device provides output data for each of the index locations for the same wavelength to which the control tool responds in the corresponding index point, and the computer contains means for storing a plurality of correction coefficients, one-to-one corresponding to index locations, and further comprises means for corre quoting the photometric value determined for each of the indicated index locations in accordance with the correction factors stored in the computer for the corresponding index location.

As follows from the above description of technical solutions disclosed in US patent No. 4866644 and 4866444, they can be used exclusively to transfer the calibration model between two measuring devices having the same type or the same model (for example, both measuring devices represent UV spectrometers, near infrared spectrometers (NIR spectrometers) or some optical measuring instruments). It should be noted that measurements using each of the two measuring devices should be carried out with respect to the same set of reference materials.

Thus, each of the above technical solutions from the prior art has significant drawbacks, namely, none of them can be used to transfer calibration models between measuring devices of various types, i.e. regardless of the nature of the analytical signals issued by the measuring devices, and the number of variables in the received data sets. In addition, both measuring devices are calibrated using the same set of standard samples (this is important in cases where the standard samples used for calibration are unique, expensive and difficult to access for a limited period of time during which the calibration is performed )

Thus, in view of the above-described shortcomings of the known calibration systems, the technical problem that must be solved in the prior art is the objective need to transfer the calibration model obtained for the first measuring device to a second measuring device having a model different from the model of the first measuring device ( for example, a different number of measuring channels (variable, wavelengths), and in the absence of the need to calibrate the second measuring device using zovaniem entire set of standard samples, calibration involved first measuring device.

SUMMARY OF THE INVENTION

The objective of the invention is to create improved methods and systems for calibration, which allow to solve the above objective technical problem of known calibration systems.

To solve the problem, which is outlined and outlined in this document, in one aspect of the present invention, a calibration system is provided, comprising: a reference measuring device for obtaining reference responses (X1) by taking measurements with respect to a plurality of standard samples; a target measuring device for obtaining target responses (X ₂ ) by taking measurements with respect to a subset of the specified plurality of reference samples and for obtaining field responses (X _field ) by taking measurements with respect to the plurality of field samples; a computing device connected to a reference measuring device for receiving reference responses (X1) and to a target measuring device for receiving target responses (X ₂ ) and field responses (X _fieid ); wherein the computing device is configured to: decompose the received reference responses (X1) in accordance with the decomposition method using hidden variables (LVD method) to obtain a reference matrix (T1) of accounts and a reference matrix (P1) of loads, changing the resulting reference matrix (T1) accounts by removing rows corresponding to standard samples from the specified set of standard samples that do not correspond to the specified subset of standard samples, determining the target matrix (P ₂ ) of loads for the target measuring device in accordance with the LVD method using the received target responses (X ₂ ) and a modified reference matrix (T1 ^mod ) of accounts, determining the field matrix (Tfield) of accounts in accordance with the LVD method using the received field responses (Xfieid) and a specific target matrix (P2) of loads and determining the corrected field responses (Xfleld ^corr ) in accordance with the inverse LVD method using a specific field matrix (Tfield) of counts and the resulting reference matrix (P1) of loads.

In yet another aspect of the present invention, there is provided a calibration system comprising: a reference measuring device for obtaining reference responses (X1) by taking measurements on a plurality of reference samples; a target measuring device for obtaining target responses (X2) by taking measurements with respect to a subset of the specified plurality of reference samples and for obtaining field responses (Xfield) by taking measurements with respect to the plurality of field samples; a computing device connected to a reference measuring device for receiving reference responses and to a target measuring device for receiving target responses; wherein the computing device is configured to: decompose the received reference responses (X1) in accordance with the decomposition method using hidden

- 2,033,993 variables (LVD method) to obtain the reference matrix (T1) of accounts and the reference matrix (P1) of loads, modify the obtained reference matrix (T1) of accounts by deleting rows corresponding to standard samples from the specified set of standard samples that do not correspond the specified subset of standard samples, determining the target matrix (P ₂ ) of the loads for the target measuring device in accordance with the LVD method using the received target responses (X ₂ ) and a modified reference matrix (T _l ^mod ) of accounts; the computing device is also configured to transmit a specific target load matrix (P2) and the resulting load reference matrix (P1) to the target measurement device; the target measuring device is also configured to: determine the field matrix (Tfield) of the accounts in accordance with the LVD method using the transmitted field responses (Xfield) and the obtained target matrix (P2) of loads and determine the adjusted field responses (Xfleld ^corr ) in accordance with the inverse LVD method with using a specific field matrix (Tfield) of accounts and the transmitted reference matrix (P1) of loads.

In yet another aspect of the present invention, there is provided a calibration system comprising: a reference measuring device for obtaining reference responses (X1) by taking measurements on a plurality of reference samples; a target measuring device for obtaining target responses (X ₂ ) by taking measurements with respect to a subset of the specified plurality of reference samples and for obtaining field responses (X _field ) by taking measurements with respect to the plurality of field samples; a computing device connected to a reference measuring device for receiving reference responses (X1) and to a target measuring device for receiving target responses (X2); wherein the computing device is configured to decompose the received reference responses (X1) in accordance with the decomposition method using hidden variables (LVD method) to obtain a reference matrix (T1) of accounts and a reference matrix (P1) of loads, changing the resulting reference matrix ( T1) accounts by removing rows corresponding to standard samples from the specified set of standard samples that do not correspond to the specified subset of standard samples, determining the target matrix (P ₂ ) of loads for the target measuring device in accordance with the LVD method using the received target responses (X ₂ ) and a modified reference matrix (T1 ^mod ) of accounts; the computing device is also configured to transmit a specific target matrix (P2) of loads and the resulting reference matrix (P1) of loads to the reference measuring device; the target measuring device is also configured to transmit the received field responses (Xfield) to the reference measuring device; the reference measuring device is also configured to: determine the field matrix (Tfield) of accounts in accordance with the LVD method using the transmitted field responses (Xfield) and the transmitted target matrix (P2) of loads and determine the corrected field responses (Xfield ^corr ) in accordance with the inverse The LVD method using a specific field matrix (Tfield) of accounts and a transmitted reference matrix (P1) of loads.

To solve the problem, which is outlined and broadly described in this document, in one aspect of the present invention, a calibration method is provided, which includes obtaining, using a reference measuring device, reference responses (X1) by taking measurements with respect to a plurality of standard samples; obtaining, by means of a target measuring device, target responses (X ₂ ) by taking measurements with respect to a subset of the plurality of standard samples and field responses (X _field ) by taking measurements with respect to the plurality of field samples; transmitting the received reference responses (X1) through the reference measuring device and transmitting the received target responses (X2) and the received field responses (Xfield) to the computing device through the target measuring device; decomposition by means of a computing device of the transmitted reference responses (X1) in accordance with the decomposition method using hidden variables (LVD method) to obtain a reference matrix (T1) of accounts and a reference matrix (P1) of loads; changing, by means of a computing device, the obtained reference matrix (T1) of accounts by deleting rows corresponding to standard samples from the specified set of standard samples that do not correspond to the specified subset of standard samples; determination by the computing device of the target matrix (P ₂ ) of the loads for the target measuring device in accordance with the LVD method using the transmitted target responses (X ₂ ) and a modified reference matrix (T1 ^mod ) of accounts; determination by means of a computing device of a field matrix (Tfield) of accounts in accordance with the LVD method using transmitted field responses and a specific target matrix (P2) of loads; determination by the computing device of the corrected field responses (Xfield ^corr ) in accordance with the inverse LVD method using the determined field matrix (Tfield) of the counts and the resulting reference matrix (P1) of the loads.

In addition, to solve the problem, which is outlined and outlined in this document, in one aspect of the present invention provide a short-term computer-readable medium on which fragments of computer-readable program code are stored, the execution of which by the processing device causes the device to execute at least 3 033993 at least the steps of the above calibration method.

In yet another aspect of the present invention, there is provided a calibration method, which comprises obtaining, by a reference measuring device, reference responses (X1) by taking measurements on a plurality of reference samples; obtaining, by means of a target measuring device, target responses (X ₂ ) by taking measurements with respect to a subset of the plurality of standard samples and field responses (X _field ) by taking measurements with respect to the plurality of field samples; transmitting the received reference responses (X1) by means of a reference measuring device and transmitting the received target responses (X2) by means of a target measuring device to a computing device; decomposition by means of a computing device of the transmitted reference responses (Xi) in accordance with the decomposition method using hidden variables (LVD method) to obtain a reference matrix (T1) of accounts and a reference matrix (P1) of loads; changing by means of a computing device of the obtained reference matrix (T1) of accounts by deleting rows corresponding to standard samples from the specified set of standard samples that do not correspond to the specified subset of standard samples; determination by the computing device of the target matrix (P ₂ ) of the loads for the target measuring device in accordance with the LVD method using the transmitted target responses (X ₂ ) and a modified reference matrix (T1 ^mod ) of accounts; transfer by means of a computing device of a specific target matrix (P ₂ ) of the loads and the resulting reference matrix (P1) of the loads on the target measuring device; determining, by the target measuring device, a field matrix (T _field ) of accounts in accordance with the LVD method using the received field responses (Xfieid) and the transmitted target matrix (P2) of the loads; and determining, by the target measuring device, the corrected field responses (X _fleld ^corr ) in accordance with the inverse LVD method using the determined field matrix (Tfield) of the counts and the transmitted reference matrix (P1) of the loads.

In addition, to solve the problem, which is outlined and outlined in this document, in one aspect of the present invention provide a short-term computer-readable medium on which fragments of computer-readable program code are stored, the execution of which by the processing device causes the device to perform at least the steps the above calibration method.

In yet another aspect of the present invention, there is provided a calibration method, which comprises obtaining, by a reference measuring device, reference responses (X1) by taking measurements on a plurality of reference samples; obtaining target responses (X2) by means of a target measuring device by taking measurements with respect to a subset of the plurality of standard samples and field responses (Xfield) by taking measurements with respect to the plurality of field samples; the transmission, through the reference measuring device, of the received reference responses (X1) and the transmission by the target measuring device of the received target responses (X2) to the computing device; decomposition by means of a computing device of the transmitted reference responses (X _i ) in accordance with the decomposition method using hidden variables (LVD method) to obtain a reference matrix (T1) of accounts and a reference matrix (P1) of loads; changing by means of a computing device of the obtained reference matrix (T1) of accounts by deleting rows corresponding to standard samples from the specified set of standard samples that do not correspond to the specified subset of standard samples; determination by the computing device of the target matrix (P2) of the loads for the target measuring device in accordance with the LVD method using the transmitted target responses (X ₂ ) and a modified reference matrix (T1 ^mod ) of accounts; transfer by means of a computing device of a specific target matrix (P2) of the loads and the resulting reference matrix (P1) of the loads on the reference measuring device; transmitting the received field responses (Xfield) to the reference measuring device by means of the target measuring device; determination, by means of a reference measuring device, of a field matrix (Tfield) of accounts in accordance with the LVD method using transmitted field responses (Xfield) and transmitted target matrix (P2) of loads; and determining, by the reference measuring device, the corrected field responses (Xfield ^corr ) in accordance with the inverse LVD method using the determined field matrix (Tfield) of the counts and the transmitted reference matrix (P1) of the loads.

In addition, to solve the problem, which is outlined and outlined in this document, in one aspect of the present invention provide a short-term computer-readable medium on which fragments of computer-readable program code are stored, the execution of which by the processing device causes the device to perform at least the steps the above calibration method.

Thus, the proposed variants of calibration methods, calibration systems based on the calibration method, and a short-term computer-readable medium based on the calibration methods described in detail above are intended to solve at least the aforementioned technical problem of known calibration systems.

- 4,033,993

The specific calibration methods and systems described above can minimize the labor required to calibrate any measuring device, namely, they can completely transfer the calibration model created for the first measuring device to the second measuring device, characterized by other analytical signals and a different number of variables in the analytical signals or etc. (for example, the calibration model of an X-ray fluorescence spectrometer can be transferred to an ultraviolet (UV) spectrometer and visible spectral regions) by performing a decomposition method using hidden variables (LVD method) to set the analytical signal of the first measuring device to the format of the second measuring device, thus providing the use of a calibration model of the first measuring device with the responses received by the second measuring device by measuring with respect to a plurality of unknown samples in order to predict the parameters of said unknown samples.

In addition, the proposed technical solutions allow the use of a smaller calibration set of standard samples (compared with the set of standard samples used to calibrate the first measuring device), and the reduced calibration set for calibrating the second measuring device is part of a complete set of standard samples of the first measuring device, which leads to reducing the number of measurements that need to be taken with respect to calibration samples using a second a measuring device for calibration. In addition, the use of a reduced calibration set of reference materials for calibrating the second measuring device also reduces the use of resources of the second measuring device, for example, the processing device of the second measuring device, resources of RAM and / or ROM and other resources of the second measuring device, since the second measuring device requires fewer measurements with respect to the calibration set of reference materials to obtain its responses and, therefore, extend the operating period of the corresponding elements of the second measuring device.

In one embodiment of the present invention, the calibration system further comprises an electronic device connected to a reference measuring device and configured to store parameter data corresponding to the parameters of the standard samples, and transmitting the stored parameter data to the reference measuring device; wherein the computing device is also configured to transmit certain corrected field responses (X _field ^con ) to a reference measuring device; and the reference measurement device is also configured to create a calibration model for the reference measurement device based on transmitted parameter data and transmitted corrected field responses (X _field ^corr ).

In another embodiment of the present invention, the reference measuring device is also configured to obtain current responses (X _routine ) by taking measurements on a plurality of samples and the ability to determine the corrected current responses (X _rout m _e ^corr ) based on the created calibration model and the received current responses ( X _routine ).

According to another embodiment of the present invention, the calibration system further comprises an electronic device connected to a computing device and configured to store parameter data corresponding to parameters of standard samples; wherein the computing device is also configured to transmit certain corrected field responses (Xfield ^corr ) to the electronic device; and the electronic device is also configured to create a calibration model for a reference measuring device based on transmitted corrected field responses (Xfield ^corr ) and stored parameter data.

According to yet another embodiment of the present invention, the reference measuring device is also configured to receive current responses (Xroutine) by taking measurements on a plurality of samples and transmitting the received current responses (X _routine ) to an electronic device; and the electronic device is also ^configured to determine the corrected reference responses (X _routine ^corr ) based on the created calibration model and the transmitted current responses (X _routine ).

According to one embodiment of the present invention, the calibration system further comprises an electronic device connected to a reference measuring device and configured to store parameter data corresponding to the parameters of the standard samples, and transmitting the stored parameter data to the reference measuring device; however, the target measuring device is also configured to transmit certain corrected field responses (Xfield ^corr ) to the reference measuring device; and the reference measurement device is also configured to create a calibration model for the reference measurement device based on transmitted parameter data and transmitted corrected field responses (X _field ^corr ).

According to some embodiments of the present invention, a reference measurement

- 5,033,993 the device is also made with the possibility of obtaining current responses (X _routine ) by taking measurements with respect to a plurality of samples and the ability to determine the adjusted current responses (X _routme ^corr ) based on the created calibration model and the received current responses ^(X routine) ·

According to another embodiment of the present invention, the calibration system further comprises an electronic device connected to the target measuring device and configured to store data about parameters corresponding to parameters of standard samples; however, the target measuring device is also _configured to transmit certain corrected field responses (X _iield ^corr ) to the electronic device; and the electronic device is also _configured to create a calibration model for a reference measuring device based on transmitted corrected field responses (X _iield ^corr ) and stored parameter data.

According to yet another embodiment of the present invention, the reference measuring device is also configured to receive current responses (Xroutine) by taking measurements on a plurality of samples and to transmit received current responses (Xroutine) to an electronic device; the electronic device is also ^configured to determine the adjusted reference responses (X _routine ^corr ) based on the created calibration model and the transmitted current responses (X _routine ).

According to another embodiment of the present invention, the calibration system further comprises an electronic device connected to the target measuring device and configured to store parameter data corresponding to the parameters of the standard samples, and the ability to transmit stored parameter data; however, the target measuring device is also configured to receive transmitted parameter data and the ability to create a calibration model for the reference measuring device based on the received parameter data and certain corrected field responses (X _iield ^corr ).

According to one embodiment of the present invention, the reference measurement device is also configured to receive current responses (X _routine ) by taking measurements on a plurality of samples and the possibility of transmitting the received current responses (X _routine ) to the target measurement device; and the target measuring device is also ^configured to determine the adjusted reference responses (X _routine ^corr ) based on the created calibration model and the transmitted current responses (X _routine ).

According to one embodiment of the present invention, the calibration system further comprises an electronic device connected to a reference measuring device and configured to store parameter data corresponding to the parameters of the standard samples, and transmitting the stored parameter data to the reference measuring device; however, the reference measuring device is also configured to create a calibration model for the reference measuring device based on the transmitted parameter data and certain corrected field responses (X _iield ^corr ).

In yet another embodiment of the present invention, the reference measuring device is also configured to obtain current responses (X _routine ) by taking measurements on a plurality of samples and the ability to determine the adjusted current responses (X _routine ^corr ) based on the generated calibration model and the received current responses (X _routine ).

According to another embodiment of the present invention, the calibration system further comprises an electronic device connected to a reference measuring device and configured to store parameter data corresponding to parameters of standard samples; however, the reference measuring device is also _configured to transmit certain corrected field responses (X _iield ^corr ) to the electronic device; and the electronic device is also ^configured to create a calibration model for a reference measuring device based on transmitted corrected field responses (X _field ^corr ) and stored parameter data.

According to yet another embodiment of the present invention, the reference measuring device is also configured to receive current responses (X _routine ) by taking measurements on a plurality of samples and transmitting the received current responses (Xroutine) to an electronic device; and the electronic device is also configured to determine the corrected current responses (Xroutine ^corr ) based on the created calibration model and the transmitted current responses (Xroutine).

According to another embodiment of the present invention, the calibration system further comprises an electronic device connected to the target measuring device and configured to store data about the parameters corresponding to the parameters of the standard samples, and the possibility of transmitting the stored parameter data to the target measuring device; however, the reference measuring device is also ^configured to transmit certain corrected field responses (X _field ^corr ) to the target measuring device; a

- 6,033,993 the target measurement device is also configured to create a calibration model for the reference measurement device based on transmitted parameter data and transmitted corrected field responses (X _field ^corr ).

According to another embodiment of the present invention, the reference measurement device is also configured to receive current responses (X _routine ) by taking measurements on a plurality of samples and the ability to transmit the received current responses (X _routine ) to the target measurement device; and the target measuring device is also _configured to determine the corrected current responses (X _routme ^corr ) based on the created calibration model and the transmitted current responses (X _routine ).

Additional features and advantages of the invention will be set forth in part in the following description and, in addition, will become apparent from the present description or may be revealed by the practical implementation of the present invention. The above objectives and other advantages of the present invention can be realized and achieved using the above systems and calibration methods specifically specified in the description and claims of the present invention, as well as shown in the accompanying drawings

In addition, it should be understood that both the foregoing general description and the following detailed description are merely illustrative and explanatory and are not intended to limit the described invention. The present invention is defined by the attached claims. In addition to the features and / or variations set forth herein, further features and / or variations may be proposed. For example, the present invention may relate to various combinations and subcombinations of the disclosed features and / or combinations and subcombinations of several additional features disclosed in the detailed description below.

Brief Description of the Drawings

The accompanying drawings, which are incorporated in and constitute a part of this application, illustrate various embodiments and aspects of the present invention and, together with the description, serve to explain the principles of the present invention. In the drawings of FIG. 1 is a block diagram of one embodiment of a calibration system implemented in accordance with the principles of the present invention and implementing them;

in FIG. 2 is a block diagram illustrating another embodiment of the calibration system of FIG. 1, made in accordance with the principles of the present invention and implementing them;

in FIG. 3 is a block diagram illustrating another embodiment of the calibration system of FIG. 2, made in accordance with the principles of the present invention and implementing them;

in FIG. 4 is a block diagram illustrating another embodiment of the calibration system of FIG. 1, made in accordance with the principles of the present invention and implementing them;

in FIG. 5 is a block diagram illustrating another embodiment of the calibration system of FIG. 4, made in accordance with the principles of the present invention and implementing them;

in FIG. 6 is a block diagram of another embodiment of a calibration system made in accordance with the principles of the present invention and implementing them;

in FIG. 7 is a block diagram illustrating one embodiment of the calibration system of FIG.

6, made in accordance with the principles of the present invention and implementing them;

in FIG. 8 is a block diagram illustrating one embodiment of the calibration system of FIG.

7, made in accordance with the principles of the present invention and implementing them;

in FIG. 9 is a block diagram illustrating another embodiment of the calibration system of FIG. 6, made in accordance with the principles of the present invention and implementing them;

in FIG. 10 is a block diagram illustrating one embodiment of the calibration system of FIG. 9, made in accordance with the principles of the present invention and implementing them;

in FIG. 11 is a block diagram illustrating another embodiment of the calibration system of FIG. 6, made in accordance with the principles of the present invention and implementing them;

in FIG. 12 is a block diagram illustrating one embodiment of the calibration system of FIG. 11, made in accordance with the principles of the present invention and implementing them;

in FIG. 13 is a block diagram of another embodiment of a calibration system made in accordance with the principles of the present invention and implementing them;

in FIG. 14 is a block diagram illustrating one embodiment of the calibration system of FIG. 13, made in accordance with the principles of the present invention and implementing them;

in FIG. 15 is a block diagram illustrating one embodiment of the calibration system of FIG. 14, made in accordance with the principles of the present invention and implementing them;

in FIG. 16 is a block diagram illustrating another embodiment of the calibration system of FIG. 13, made in accordance with the principles of the present invention and implementing them;

in FIG. 17 is a block diagram illustrating one embodiment of the calibration system of FIG. 16, made in accordance with the principles of the present invention and implementing them;

in FIG. 18 is a block diagram illustrating another embodiment of the calibration system of FIG. 13, made in accordance with the principles of the present invention and implementing them;

- 7 033993 in FIG. 19 is a block diagram illustrating one embodiment of the calibration system of FIG. 18, made in accordance with the principles of the present invention and implementing them;

in FIG. 20 is a flowchart depicting the operations of one embodiment of a calibration method performed in accordance with the principles of the present invention and implementing them;

in FIG. 21 is a flowchart depicting the operations of another embodiment of a calibration method performed in accordance with the principles of the present invention and implementing them;

in FIG. 22 is a flowchart depicting the operations of yet another embodiment of a calibration method performed in accordance with the principles of the present invention and implementing them.

The implementation of the invention

The following is a detailed description of embodiments of the present invention, examples of which are illustrated in the accompanying drawings. Wherever possible, the same reference numerals will be used throughout the specification to refer to the same or similar details.

In the context of this document, the term reference refers to a measuring device, the calibration model of which is intended to be transferred to another measuring device or other measuring devices (i.e., the specified measuring device is hereinafter referred to as the reference measuring device), its structural elements, the calibration set of standard samples, used to obtain a calibration model of a reference measuring device, or to the responses (analytical signals) obtained by this onnym measuring device during the measurements carried out in relation to the calibration set.

In this document, the term target refers to a measuring device for which it is necessary to create a calibration model obtained for another measuring device and actually transferred from it to this measuring device (i.e., the specified measuring device is hereinafter referred to as the target measuring device), its structural elements , a calibration set of standard samples used to obtain responses (analytical signals) during measurements carried out by the target measuring device m in relation to the calibration kit, or to the indicated responses.

In the document, the term field refers to samples characterized by one or more unknown parameters to be estimated or predicted by the target measuring device based on a calibration model transmitted from a reference measuring device (i.e., these samples are hereinafter referred to as field samples), or to responses, obtained by the target measuring device by taking measurements in relation to field samples and corrected on the basis of the calibration model transmitted from the reference measuring devices.

In this document, the term current refers to responses received by a reference measuring device by taking measurements with respect to samples characterized by one or more unknown parameters.

In FIG. 1 shows a calibration system according to one embodiment of the invention. The calibration system shown in FIG. 1 comprises a reference measuring device (1), a target measuring device (2) and a computing device (3) connected to a reference measuring device (1) and a target measuring device (2). Using the reference measuring device (1), measurements are taken with respect to a plurality of reference samples characterized by one or more known parameters (reference calibration set of reference samples) to obtain reference responses. Using the target measuring device (2), measurements are taken with respect to a subset of the specified set of standard samples characterized by one or more known parameters (target calibration set of standard samples) used in the reference measuring device (1) to obtain target responses. Meanwhile, it should also be noted that the target calibration set of standard samples is part of the standard calibration set of standard samples, while the standard samples from the target calibration set coincide with some standard samples from the standard calibration set.

It should be noted that the reference measuring device (1) and the target measuring device (2) are different from each other, for example, they can be implemented respectively in the form of an X-ray fluorescence spectrometer, the operation of which is based on the dependence of the radiation intensity at a given wavelength on the concentration of elements in the sample and an ultraviolet (UV) spectrometer and visible spectral regions, the operation of which is based on the dependence of the light intensity at a given wavelength on the concentration of elements in the sample And may contain a different number of measurement channels (variables in analytical signals, or wavelengths in the spectra).

The reference measuring device (1) contains a reference transceiver unit (not shown) containing at least one reference transmitter for transmitting the received reference responses and at least one reference receiver for receiving data from other devices connected to the reference measuring device (1), and the target measuring device (2) comprises a target transceiver unit (not shown) comprising at least one target transmitter for transmitting the received target responses and at least one target riemnik for receiving data from other devices connected to the target measuring apparatus (1).

- 8 033993

The computing device (3) in the calibration system shown in FIG. 1, comprises a transceiver unit of a computing device (not shown) comprising at least one computing device receiver for receiving transmitted reference responses and transmitted target responses from a reference measuring device (1) and a target measuring device (2), respectively, and at least one transmitter computing device for transferring data from it to other devices connected to the computing device (3).

The computing device (3) in the calibration system of FIG. 1 further comprises a processing unit of a computing device (not shown) that contains at least one processor of the computing device and which is connected to a transceiver unit of the computing device (not shown) to receive received reference responses and received target responses. The processing unit of the computing device creates a matrix (X ₁ ) of reference data based on the received reference responses, and the number of rows in the matrix (X ₁ ) of the reference data corresponds to the number of standard samples in the reference calibration set, and the number of columns in the matrix (X ₁ ) of the reference data the number of measuring channels, the number of variables in the analytical signal, wavelengths in the spectra, etc. in the reference measuring device (1). The processing unit of the computing device creates a matrix (X ₂ ) of target data based on the received target responses, and the number of rows in the matrix (X ₂ ) of the target data corresponds to the number of standard samples in the target calibration set, and the number of columns in the matrix (X ₂ ) of the target data the number of measuring channels, the number of variables in the analytical signal, wavelengths in the spectra, etc. in the target measuring device (2). As a rule, the number of rows in the matrix (X2) of the target data is less than the number of rows in the matrix (X1) of the reference data due to the above differences in the number of standard samples from which the corresponding calibration sets are formed, and some rows in the matrices (X1 and X2) of the data create for the same reference materials. In addition, due to differences in characteristics between the reference measuring device (1) and the target measuring device (2) described above, the number of columns in the matrix (X ₁ ) of the reference data does not correspond to the number of columns in the matrix (X ₂ ) of the target data .

The main idea of the embodiments of the present invention is that it is possible to process the measured analytical signals generated by the reference measuring device (1) and the target measuring device (2) in the space of hidden variables obtained by using the decomposition method using hidden variables (LVD- method) in relation to the obtained matrixes (X1 and X2) of data, which allows you to remove restrictions regarding the same dimension of analytical signals for different measuring devices, and, after ovatelno now need not provide the same number of variables (measuring channels, wavelengths in the spectra, or the like) for transmitting a calibration model between measuring devices belonging to different models and / or characterized by different characteristics.

The hidden variable decomposition method (LVD method) is the common name for a group of mathematical and statistical methods such as principal component analysis (PCA method), latent structure projection method (PLS method), etc., which can be used to create prediction models. The PCA method is most preferred for implementing the basic idea of the embodiments of the present invention and is used to explain the basic principles of the calibration system of FIG. 1 as described below. It should be noted that a complete description of the PCA method, as well as the PLS method and other methods forming a group of methods known as the decomposition method using hidden variables (LVD method), is widely available and can be found in various public sources from the prior art and thus, for brevity, will not be given below.

As a rule, the PCA method is a statistical method in which an orthogonal transformation is used to convert a set of observation results of possible correlated variables into a set of values of linearly uncorrelated variables, which are called the main components. The number of main components is less than or equal to the number of source variables. This transformation is determined in such a way that the first main component has the largest possible variance (i.e., takes into account the maximum possible variability of the data), and each subsequent component, in turn, has the largest variance possible if it is orthogonal (i.e., uncorrelated ) relative to previous components. The main components are orthogonal, since they are eigenvectors of the covariance matrix, which is symmetric. Thus, the PCA method can be performed by expanding the eigenvalues of the covariance (or correlation) data matrix or expanding it by singular values of the data matrix, usually after mid-centering (and normalizing or using Z-indicators) the data matrix for each attribute. The results of the PCA method are usually presented in the form of indicators of components called factor indicators (values of the transformed variable corresponding to a particular data point) and loads (the weight by which each standardized source variable must be multiplied to obtain an indicator

- 9,033,993 components).

After performing the PCA method, the processing unit of the computing device (3) converts the format of the measurement data issued by the reference measuring device (1) into the format of the measurement data obtained by the target measuring device (2), as follows.

The processing unit (not shown) of the computing device (3) decomposes the created reference matrix (X ₁ ) of data in accordance with the principal component method (PCA method) to obtain a reference matrix (T ₁ ) of accounts and a reference matrix (P ₁ ) of loads, t .e. the reference matrix (X ₁ ) data can be expressed as

X1 = T1-P1 ¹ (i.e., the matrix X ₁ is the product of the matrix T ₁ and the transposed matrix P ₁ ), where the reference matrix (T1) of accounts represents standard samples from the standard calibration set, in particular, it is the projection of standard samples from the standard calibration set into the subspace of the main components, and the reference matrix (P1) of loads represents the received reference responses, in particular, it is the transition matrix from the original space, transformed into the space of the main components.

In addition, the processing unit of the computing device (3) modifies the resulting reference matrix (T ₁ ) of accounts by removing from it rows corresponding to standard samples from the reference calibration set that do not correspond to standard samples from the target calibration set, which ensures the creation of a modified reference matrix ( T ₁ ^mod) accounts, in which the total number of rows is reduced to the correct number of standard samples in the target set for the reference calibration measurement ustro -OPERATION (1).

In addition, the processing unit of the computing device (3) determines the target load matrix (P ₂ ) for the target measuring device in accordance with the PCA method using the received target responses (X ₂ ) and a modified reference matrix (T ₁ ^mod ) of accounts. Thus, a specific target matrix (P ₂ ) of loads can be expressed as follows:

P ₂ = HAL ™ ' ¹ ) ^-1 (i.e., the matrix P ₂ is equal to the product of the matrix X ₂ and the inverse matrix T ₁ ^mod ), while the target load matrix (P2) expresses the received target responses, in particular, it is a matrix transition from the source space of variables to the space of the main components for the target measuring device (2).

As follows from the above, we found the load of the target measuring device (2), in which its indicator matrix is identical to the indicator matrix of the reference measuring device. These coefficients can be used to convert analytical signals between measuring devices. Since the transformation is performed in the space of hidden variables (from decomposition in accordance with the PCA method or PLS method), these measuring devices can have a different number of variables, a different shape of the spectra with a different number of bands, etc.

In addition, using the target measuring device (2) in the calibration system of FIG. 1 additionally measure against a plurality of unknown samples (field samples) to obtain field responses from them. Meanwhile, it should also be noted that field samples are characterized by unknown parameters that need to be predicted or evaluated using the calibration model of the reference measuring device (1). In addition, the target transceiver unit (not shown) of the target measurement device (2) transmits the received field responses, the transceiver unit of the computing device (3) also receives the transmitted field responses from the target measurement device (2), and the processing unit of the computing device of the target measurement device ( 2) also obtains the received feedback field and creates a matrix (X _field) field data based on the received field response, the number of rows in the matrix (X _field) field data Correspondingly uet number field samples and the number of columns in the matrix (Xfieid) field data corresponds to the number of measuring channels, the number of variables in the analytical signal wavelengths in the spectra etc or in the target measuring device (2).

In addition, the processing unit of the computing device (3) determines the field matrix (T _field ) of accounts in accordance with the PCA method using the created matrix (X _field ) of field data and a specific target matrix (P ₂ ) of loads. Thus, a certain field matrix (Tfieid) of accounts can be expressed as ^T field = ^X field * ^(P 2 ^{) 1} (i.e., the T _field matrix is the product of the X _field matrix and the inverse matrix P ₂ ), and T _field expresses field samples, in particular, expresses projections of field samples into the subspace of the main components.

In addition, the processing unit of the computing device (3) determines the corrected matrix (X _field ^corr ) of the field data in accordance with the inverse PCA method using the determined field matrix (T _field ) of the counts and the obtained reference matrix of loads (P ₁ ). Certain

- 10 033993 corrected matrix (X _field ^corr ) of field data can be expressed as

Xcorr _ gr T) t field = ^T field ' ^P 1 (i.e., the matrix X _field ^corr is the product of the matrix T _field and the transposed matrix P ₁ ). Thus, the calibration system shown in FIG. 1 allows one to actually transfer the calibration model created for the reference measuring device (1) to the target measuring device (2), thus, evaluating or predicting one or more parameters of field samples with the corresponding accuracy comparable to the accuracy provided in the case of forecasting or Estimating these parameters based on a normal calibration curve.

According to another embodiment of the present invention shown in FIG. 2, the calibration system of FIG. 1 may further comprise an electronic device (4) that is connected to a reference measuring device (1) and which contains a storage device of an electronic device (not shown) for storing data on parameters corresponding to one or more parameters of standard samples measured by a reference measuring device (1 ) and the target measuring device (2), as well as the transceiver unit (not shown) of the electronic device, which is connected to the storage device of the electronic device and which the first comprises at least one electronic device transmitter for transmitting the stored data on the parameters and at least one electronic device receiver for receiving data from other devices attached to it.

The transceiver unit (not shown) of the computing device (3) also transmits a certain corrected matrix (X _field ^corr ) of field data, and the reference transceiver unit of the reference measuring device (1) also receives the transmitted corrected matrix (X _field ^corr ) of field data from the computing device ( 3) and transmitted parameter data from the electronic device (4), and the reference processing unit of the reference measuring device (1) contains at least one reference processor and is connected to the reference transceiver unit to obtain the received corrected matrix (Xfield ^corr ) of the field data and the received parameter data, and also creates a calibration model for the reference measuring device (1) based on the received data. The created calibration model of the reference measuring device (1) can also be used to predict or evaluate the parameters of various unknown samples by measuring the reference measuring device (1) with respect to unknown samples.

According to FIG. 3, in yet another embodiment of the present invention, a reference measuring device (1) in the calibration system of FIG. 2 is also capable of taking measurements on a plurality of unknown samples (samples characterized by one or more unknown parameters) to obtain current responses from them (X _routine ). The reference processing unit of the reference measuring device (1) also receives the measured current responses (X _routine ) and then determines the adjusted current responses (Xroutine ^corr ) based on the created calibration model of the reference measuring device (1), as described above, and the received current responses (Xroutine )

According to FIG. 4, in accordance with yet another embodiment of the present invention, the calibration system of FIG. 1 may further comprise an electronic device (4) that is connected to a computing device (3) and which contains a storage device of an electronic device (not shown) for storing data on parameters corresponding to one or more parameters of standard samples measured by a reference measuring device (1) and target measuring device (2).

The transceiver unit of the computing device (3) also transmits a certain corrected matrix (Xfield ^corr ) of field data. The electronic device (4) further comprises a transceiver unit of an electronic device (not shown) comprising at least one transmitter of an electronic device for transmitting data from it to other devices connected to the electronic device (4), and at least one receiver of the electronic device for receiving a corrected matrix (Xfield ^corr ) of field data transmitted from a computing device (3), as well as a processing unit of an electronic device that contains at least one electron processor device and which is connected to the transceiver unit of the electronic device to receive from it the received corrected matrix (X _field ^corr ) of the field data and connected to the storage device of the electronic device to receive stored parameter data from it. The processing unit of the electronic device (4) also creates a calibration model for the reference measuring device (1) based on the received corrected matrix (Xfield ^corr ) of the field data and the obtained parameter data.

According to other embodiments of the present invention, as shown in FIG. 5 using a reference measuring device (1) in the calibration system shown in FIG. 4 can also take measurements with respect to a plurality of unknown samples (samples characterized by one or more unknown parameters) to receive current responses from them (Xroutine), and the reference transceiver unit of the reference measuring device (1) also transmits the received current responses (X _routine ) .

- 11 033993

The transmitting and receiving unit of the electronic device also receives the transmitted current responses (Xroutme), and the processing unit of the electronic device also receives the received current responses (Xroutme) from the transmitting and receiving unit of the electronic device and determines the adjusted reference responses (X _routme ^corr ) based on the created calibration model of the reference measuring device ( 1) and received current responses (X _routine ).

In FIG. 6 shows a calibration system according to another embodiment of the present invention. The calibration system of FIG. 6 contains the same functional elements as the calibration system shown in FIG. 1 and described in detail above, and thus, for brevity, a detailed description thereof is omitted. In addition, it should be noted that the calibration system of FIG. 6 operates in the same manner and in accordance with the same principles in a part identical to the calibration system of FIG. 1, except for some differences that are described below. Thus, in the present embodiment, the calibration system, in contrast to the calibration system of FIG. 1 the target load matrix (P ₂ ) determined by the processing unit of the computing device (not shown) in accordance with the PCA method, and the reference load matrix (P ₁ ) obtained by the processing unit of the computing device (not shown) as a result of the decomposition of the received reference responses ( X ₁ ) in accordance with the PCA method, transmit using a transceiver unit of a computing device (not shown).

The target processing unit (not shown) of the target measurement device (2) in the calibration system of FIG. 6 creates a matrix (X _field ) of field data based on the received field responses, the number of rows in the matrix (X _field ) of field data corresponds to the number of field samples, and the number of columns in the matrix (X _field ) of field data corresponds to the number of measuring channels, the number of variables in analytical signal, wavelengths in the spectra, etc. in the target measuring device (2).

The target transceiver unit of the target measuring device (2) also receives data transmitted by the computing device (3). The target processing unit of the target measuring device (2), containing at least one target processor and connected to the target transceiver unit, receives received data from the target transceiver unit and performs 1) determination of the field matrix (T _field ) of accounts in accordance with the PCA method with using the obtained field matrix (X _field ) of the data and the obtained target matrix (P ₂ ) of loads; and 2) determination of the adjusted field matrix (X _field ^corr ) of the data in accordance with the inverse PCA method using the determined field matrix (T _field ) of the counts and the resulting reference matrix of loads (P ₁ ). Thus, a certain field matrix (T _field ) of accounts can be expressed as ^T field = Xfield '^) ¹ (i.e., the matrix T _field is equal to the product of the matrix X _field and the inverse matrix Pr), and Tfieid expresses the field samples, in in particular, expresses the projection of field samples into the subspace of the main components; and a certain corrected matrix (Xfield ^corr ) of field data can be expressed as

Xcorr _ gr T) t field = ^T field ' ^P 1 (i.e., the Xfield ^corr matrix is the product of the Tfield matrix and the transposed matrix P1). Thus, the calibration system shown in FIG. 6 is an embodiment of the calibration system of FIG. 1 as well as the calibration system of FIG. 1 allows you to actually transfer the calibration model created for the reference measuring device (1) to the target measuring device (2), thus evaluating or predicting one or more parameters of field samples with the corresponding accuracy comparable to the accuracy provided in the case of forecasting or assessment the specified parameters based on a normal calibration curve.

According to yet another embodiment of the present invention shown in FIG. 7, the calibration system of FIG. 6 may further comprise an electronic device (4) that is connected to a reference measuring device and which contains a storage device of an electronic device (not shown) for storing data on parameters corresponding to one or more parameters of standard samples measured by a reference measuring device (1) and a target measuring device (2), as well as a transceiver unit (not shown) of an electronic device that is connected to a storage device of the electronic device and which contains at least one transmitter of an electronic device for transmitting stored parameter data, and at least one receiver of an electronic device for receiving data from other devices connected to it.

The target transceiver unit (not shown) of the target measurement device (2) also transmits a certain corrected field data matrix (Xfield ^corr ), and the reference transceiver unit of the reference measurement device (1) also receives the transmitted field corrected matrix (Xfield ^corr ) from the target measurement device (2) and transmitted parameter data from the electronic device (4). The reference processing unit of the reference measuring device (12 033993) contains at least one reference processor and is connected to the reference transceiver unit to obtain the received corrected matrix (X _field ^corr ) of the field data and the received parameter data, and also creates a calibration model for reference measuring device (1) based on the obtained data. The created calibration model of the reference measuring device (1) can also be used to predict or evaluate the parameters of various unknown samples by measuring the reference measuring device (1) with respect to unknown samples.

According to FIG. 8 in yet another embodiment of the present invention using the reference measuring device (1) in the calibration system of FIG. 7, it is also possible to measure a plurality of unknown samples (samples characterized by one or more unknown parameters) to obtain current responses from them (X _routine ). The reference processing unit of the reference measuring device (1) also receives the provided current responses (X _routine ) and then determines the adjusted current responses (X _routme ^coiT ) based on the created calibration model of the reference measuring device (1), as described above with respect to the calibration system of FIG. . 7, and received current responses (X _routine ).

According to FIG. 9, in accordance with yet another embodiment of the present invention, the calibration system of FIG. 6 may further comprise an electronic device (4) that is connected to a target measuring device (2) and which contains a storage device of an electronic device (not shown) for storing data on parameters corresponding to one or more parameters of standard samples measured by a reference measuring device (1 ) and the target measuring device (2).

The target transceiver unit of the target measurement device (2) also transmits a certain corrected matrix (Xfieid ^corr ) of field data. The electronic device (4) further comprises a transceiver unit of an electronic device (not shown) comprising at least one transmitter of an electronic device for transmitting data from it to other devices connected to the electronic device, and at least one receiver of an electronic device for receiving the adjusted matrix (Xfieid ^corr) field data transmitted from the target measurement device (2) and the processing unit of the electronic device, which comprises at least one processor e ktronnogo device and which is connected to the transceiver unit of the electronic device to receive from it the received corrected matrix (Xfieid ^corr) and field data to a storage device of the electronic device to receive from it data stored on the parameters. The processing unit of the electronic device (4) also creates a calibration model for the reference measuring device (1) based on the received adjusted matrix (Xfieid ^corr ) of the field data and the received parameter data.

According to other embodiments of the present invention, as shown in FIG. 10, using the reference measuring device (1) in the calibration system of FIG. 9 may also take measurements with respect to a plurality of unknown samples (samples characterized by one or more unknown parameters) to receive current responses from them (X _routine ), and the reference transceiver unit of the reference measuring device (1) also transmits the received current responses (Xroutine).

The transmitting and receiving unit of the electronic device also receives the transmitted current responses (X _routine ), and the processing unit of the electronic device also receives the received current responses (Xroutine) from the transmitting and receiving unit of the electronic device and determines the corrected reference responses (Xroutine ^corr ) based on the created calibration model of the reference measuring device ( 1) and received current responses (Xroutine).

According to yet another embodiment of the present invention, as shown in FIG. 11, the calibration system of FIG. 6 may further comprise an electronic device (4) that is connected to a target measuring device (2) and which contains a storage device of an electronic device (not shown) for storing data on parameters corresponding to one or more parameters of standard samples measured by a reference measuring device (1 ) and the target measuring device (2).

The electronic device (4) further comprises a transceiver unit (not shown) of the electronic device, which is connected to a storage device (not shown) of the electronic device and which contains at least one transmitter of the electronic device for transmitting the stored parameter data and at least one electronic receiver devices for receiving data transmitted from other devices connected to an electronic device (4).

The target transceiver unit (not shown) of the target measuring device (2) also receives the parameter data transmitted by the electronic device (4), the target processing unit of the target measuring device (2) also receives the received parameter data and creates a calibration model for the reference measuring device ( 1) on the basis of a certain adjusted matrix (X _fieid ^corr ) of field data and the obtained parameter data.

According to other embodiments of the present invention, as shown in FIG. 12, with the help of the reference measuring device (1) in the calibration system of FIG. 11 may also take measurements with respect to a plurality of unknown samples (samples characterized by one or more unknown parameters) to receive current responses from them (X _routine ), and the reference transceiver unit of the reference measuring device (1) also transmits the received current XRoutme (Xroutme).

The target transceiver unit of the target measuring device (2) also receives the transmitted current responses (X _routine ) from the reference measuring device (1), and the target processing unit of the target measuring device (2) also receives the received current responses (X _routine ) from the target transceiver unit and determines the adjusted reference responses (X _routine ^corr ) based on the created calibration model of the reference measuring device (1) and the received current responses (Xroutine).

In FIG. 13 shows a calibration system according to another embodiment of the present invention. The calibration system of FIG. 13 contains the same functional elements as the calibration system shown in FIG. 1 and described in detail above, and thus, for brevity, a detailed description thereof is omitted. In addition, it should be noted that the calibration system of FIG. 13 operates in the same manner and in accordance with the same principles in a part identical to the calibration system of FIG. 1, except for some differences that are described below. Thus, in the present embodiment, the calibration system shown in FIG. 13, in contrast to the calibration system of FIG. 1, the target load matrix (P ₂ ) determined by the processing unit of the computing device (not shown) in accordance with the PCA method, and the reference load matrix (P ₁ ) obtained by the processing unit of the computing device (not shown) as a result of the decomposition of the received reference responses (X ₁ ) in accordance with the PCA method, transmit using a transceiver unit of a computing device (not shown). The target transceiver unit of the target measurement device (2) also transmits the received field responses. In some other embodiments of the calibration system of FIG. 13, the target processing unit (not shown) of the target measuring device (2) is able to create a matrix (Xf _ie id) of field data based on the received field responses, and the number of rows in the matrix (X _field ) of field data corresponds to the number of field samples, and the number of columns in matrix (X _field ) of field data corresponds to the number of measuring channels, the number of variables in the analytical signal, wavelengths in the spectra, etc. in the target measuring device (2), and the target transceiver unit of the target measuring device (2) can transmit the generated matrix (X _field ) of field data.

The reference transceiver unit of the reference measuring device (1) also receives the reference load matrix (P ₁ ) and the target load matrix (P ₂ ) transmitted by the computing device (3), as well as the transmitted field responses or the received _{field field} matrix (X _field ) depending from an embodiment of the present invention as described above. The reference processing unit of the reference measuring device (1) contains at least one reference processor and, being connected to the reference transceiver unit, receives received data from the reference transceiver unit. In one embodiment of the calibration system of FIG. 13 in the event that the reference processing unit of the reference measuring device (1) receives the received field responses, it creates a field data matrix (X _fieid ) based on the received field responses, as described above. Then, the reference processing unit performs 1) determination of the field matrix (T _field ) of the accounts in accordance with the PCA method using the obtained field matrix (X _field ) of the data and the obtained target matrix (P ₂ ) of loads; and 2) determination of the adjusted field matrix (Xfieid ^corr ) of the data in accordance with the inverse PCA method using a specific field matrix (T _field ) of the counts and the resulting reference matrix of loads (P ₁ ). Thus, a certain field matrix (T _field ) of accounts can be expressed as follows:

^T field = ^X field'CP2 ^{) 1} (i.e., the matrix T _field is equal to the product of the matrix X _field and the inverse matrix P ₂ ), and T _field expresses field samples, in particular, expresses projections of field samples into the subspace of the main components; and a certain corrected matrix (Xfieid ^corr ) of field data can be expressed as

Xcorr _ gr T) t field = ^T field ' ^P 1 (i.e., the matrix X _fieid ^corr is the product of the matrix T _fieid and the transposed matrix P ₁ ). Thus, the calibration system shown in FIG. 13 is a variation of the calibration system of FIG. 1 as well as the calibration system of FIG. 1 allows you to actually transfer the calibration model created for the reference measuring device (1) to the target measuring device (2), thus evaluating or predicting one or more parameters of field samples with the corresponding accuracy comparable to the accuracy provided in the case of forecasting or assessment the specified parameters based on a normal calibration curve.

According to yet another embodiment of the present invention shown in FIG. 14, the calibration system of FIG. 13 may further comprise an electronic device (4) which

- 14 033993 is connected to a reference measuring device (1) and which contains a storage device of an electronic device (not shown) for storing data on parameters corresponding to one or more parameters of standard samples measured by a reference measuring device (1) and a target measuring device (2) as well as a transceiver unit (not shown) of the electronic device, which is connected to the storage device of the electronic device and which contains at least one transmitter of the electronic device devices for transmitting stored parameter data and at least one receiver of an electronic device for receiving data from other devices connected to it.

The reference transceiver unit (not shown) of the reference measuring device (1) also receives the parameter data transmitted by the electronic device (4), and the reference processing unit of the reference measuring device (1) also receives the received parameter data and creates a calibration model for the reference measuring device (1) based on the obtained parameter data and a certain corrected matrix (X _field ^corr ) of field data. The created calibration model of the reference measuring device (1) can also be used to predict or evaluate the parameters of various unknown samples by measuring the reference measuring device (1) with respect to unknown samples.

According to FIG. 15 in yet another embodiment of the present invention using the reference measuring device (1) in the calibration system of FIG. 14, it is also possible to measure a plurality of unknown samples (samples characterized by one or more unknown parameters) to obtain current responses from them. The reference processing unit of the reference measuring device (1) also creates a matrix (X _routine ) of current data based on the received current responses (X _routine ) and then determines the adjusted matrix (X _routine ^corr ) of current data based on the created calibration model of the reference measuring device (1) as described above with reference to the calibration system of FIG. 14, and the resulting matrix (X _routine ) of the current data.

According to FIG. 16, in accordance with yet another embodiment of the present invention, the calibration system of FIG. 13 may further comprise an electronic device (4) that is connected to a reference measuring device (1) and which contains a storage device of an electronic device (not shown) for storing data on parameters corresponding to one or more parameters of standard samples measured by a reference measuring device (1 ) and the target measuring device (2).

The reference transceiver unit of the reference measuring device (1) also transmits a certain corrected matrix (Xfieid ^corr ) of field data. The electronic device (4) further comprises a transceiver unit (not shown) of the electronic device, comprising at least one transmitter of the electronic device for transmitting data from it to other devices connected to the electronic device (4), and at least one receiver of the electronic device for receiving the corrected matrix (Xfieid ^corr ) of the field data transmitted from the reference measuring device (1), as well as the processing unit of the electronic device, which contains at least one processor p of the electronic device and which is connected to the transceiver unit of the electronic device to receive from it the received corrected matrix (X _fieid ^corr ) of field data and to the storage device of the electronic device to receive stored parameter data from it. The processing unit of the electronic device (4) also creates a calibration model for the reference measuring device (1) based on the received adjusted matrix (Xfieid ^corr ) of the field data and the received parameter data.

According to other embodiments of the present invention, as shown in FIG. 17, using the reference measuring device (1) in the calibration system of FIG. 16, it is also possible to measure a plurality of unknown samples (samples characterized by one or more unknown parameters) to obtain current responses from them, and the reference transceiver unit of the reference measuring device (1) also transmits the received current responses.

In some other embodiments of the calibration system of FIG. 17 reference processing unit (not shown) of the reference measuring device (1) is able to create a matrix (X _routine ) of current data based on the received current responses, and the number of rows in the matrix (X _routine ) of the current data corresponds to the number of unknown samples, and the number of columns in the matrix (X _routine ) of the current data corresponds to the number of measuring channels, the number of variables in the analytical signal, wavelengths in the spectra, etc. in the reference measuring device (1), and the reference transceiver unit of the reference measuring device (1) can transmit the created matrix (Xroutine) of the current data.

The transmitter / receiver unit of the electronic device also receives transmitted current responses or a transmitted matrix (Xroutine) of current data depending on the embodiment of the calibration system of FIG. 17, and the processing unit of the electronic device also receives, respectively, the current responses or matrix (X _routine ) of the current data received from the transceiver unit of the electronic device. In one embodiment of the calibration system of FIG. 17 in the case

- 15 033993 if the processing unit of the electronic device (4) receives the received current responses, it creates a matrix (Xroutme) of current data based on the received current responses, as described above.

Then, the processing unit of the electronic device (4) determines the adjusted matrix (X _routme ^corr ) of the data based on the created calibration model of the reference measuring device (1) and the received or created matrix (X _routine ) of the current data.

According to yet another embodiment of the present invention, as shown in FIG. 18, the calibration system of FIG. 13 may further comprise an electronic device (4) that is connected to a target measuring device (2) and which contains a storage device of an electronic device (not shown) for storing data on parameters corresponding to one or more parameters of standard samples measured by a reference measuring device (1 ) and the target measuring device (2).

The electronic device (4) further comprises a transceiver unit (not shown) of the electronic device, which is connected to a storage device (not shown) of the electronic device and which contains at least one transmitter of the electronic device for transmitting the stored parameter data and at least one electronic receiver devices for receiving data transmitted from other devices connected to an electronic device (4).

The reference transceiver unit (not shown) of the reference measuring device (2) also transmits a certain corrected matrix (X _field ^corr ) of field data.

The target transceiver unit (not shown) of the target measurement device (2) also receives parameter data transmitted by the electronic device (4) and the transmitted corrected _field matrix (X _field ^corr ), the target processing unit of the target measurement device (2) also receives the received data and creates a calibration model for the reference measuring device (1) based on the received corrected matrix (X _field ^corr ) of the field data and the received parameter data.

According to other embodiments of the present invention, as shown in FIG. 19, using the reference measuring device (1) in the calibration system of FIG. 18, it is also possible to take measurements with respect to a plurality of unknown samples (samples characterized by one or more unknown parameters) to obtain current responses from them, and the reference transceiver unit of the reference measuring device (1) also transmits the received current responses.

In some other embodiments of the calibration system of FIG. 19 reference processing unit (not shown) of reference measuring device (1) is able to create a matrix (X _routine ) of current data based on the received current responses, and the number of rows in the matrix (X _routine ) of current data corresponds to the number of unknown samples, and the number of columns in the matrix (Xroutine) of the current data corresponds to the number of measuring channels, the number of variables in the analytical signal, wavelengths in the spectra, etc. in the reference measuring device (1), and the reference transceiver unit of the reference measuring device (1) can transmit the created matrix (Xroutine) of the current data.

The target transceiver unit of the target measurement device (2) also receives transmitted current responses or a transmitted matrix (X _routine ) of current data depending on the embodiment of the calibration system of FIG. 19, and the target processing unit also receives, respectively, received current responses or a received matrix (X _routine ) of current data. In one embodiment of the calibration system of FIG. 19, if the target processing unit of the target measuring device (2) receives the received current responses, it creates a matrix (Xroutine) of current data based on the received current responses, as described above.

Then, the target processing unit of the target measuring device (2) determines the adjusted matrix (Xroutine ^corr ) of the data based on the created calibration model of the reference measuring device (1) and the obtained or created matrix (Xroutine) of the current data.

According to another aspect of the present invention, the embodiment shown in FIG. 20 is a calibration method that includes obtaining, by means of a reference measuring device, reference responses (X ₁ ) by taking measurements with respect to a plurality of reference samples; obtaining, by means of a target measuring device, target responses (X ₂ ) by taking measurements with respect to a subset of the plurality of standard samples and field responses (X _field ) by taking measurements with respect to the plurality of field samples; transmitting the received reference responses (X ₁ ) and the received target responses (X ₂ ) to a computing device that is connected to the reference measuring device and to the target measuring device; decomposition by means of a computing device of the accepted reference responses (X1) in accordance with the decomposition method using hidden variables (LVD method) to obtain a reference matrix (T ₁ ) of accounts and a reference matrix (P ₁ ) of loads; changing, by means of a computing device, the obtained reference matrix (T ₁ ) of accounts by deleting rows corresponding to standard samples from the specified set of standard samples that do not correspond to the specified subset of standard samples; determination by the computing device of the target matrix (P ₂ ) of the loads for the target measuring device in accordance with the LVD method using

- 16 033993 received target responses (X ₂ ) and a modified reference matrix (T ₁ ^mod ) of accounts; determination by means of a computing device of a field matrix (Tfield) of accounts in accordance with the LVD method using the received field responses and a specific target matrix (P2) of loads; determination by a computing device of the corrected field responses (Xfield ^corr ) in accordance with the inverse LVD method using a specific field matrix (Tfield) of the counts and the resulting reference matrix (P _d ) of the loads.

According to another aspect of the present invention, the embodiment shown in FIG. 21 a calibration method, which includes obtaining, by means of a reference measuring device, reference responses (X ₁ ) by taking measurements with respect to a plurality of standard samples; obtaining target responses (X2) by means of a target measuring device by taking measurements with respect to a subset of the plurality of standard samples and field responses (Xfield) by taking measurements with respect to the plurality of field samples; transmitting the received reference responses (X ₁ ) and the received target responses (X ₂ ) to a computing device that is connected to the reference measuring device and to the target measuring device; decomposition by means of a computing device of the accepted reference responses (X ₁ ) in accordance with the decomposition method using hidden variables (LVD method) to obtain a reference matrix (T ₁ ) of accounts and a reference matrix (P ₁ ) of loads; changing, by means of a computing device, the obtained reference matrix (T ₁ ) of accounts by deleting rows corresponding to standard samples from the specified set of standard samples that do not correspond to the specified subset of standard samples; determination by a computing device of the target matrix (P ₂ ) of the loads for the target measuring device in accordance with the LVD method using the received target responses (X ₂ ) and a modified reference matrix (T ₁ ^mod ) of accounts; transfer by means of a computing device of a specific target matrix (P2) of the loads and the resulting reference matrix (P1) of the loads on the target measuring device; determination by accounts of the field matrix (Tfield) of the accounts in accordance with the LVD method using the received field responses (Xfield) and the transmitted target matrix (P2) of the loads; and determining, by the target measurement device, the corrected field responses (Xfield ^corr ) in accordance with the inverse LVD method using the determined field matrix (Tfield) of the counts and the transmitted reference matrix (P ₁ ) of the loads.

According to another aspect of the present invention, the embodiment shown in FIG. 22 a calibration method that includes obtaining, by means of a reference measuring device, reference responses (X1) by taking measurements with respect to a plurality of reference samples; obtaining target responses (X2) by means of a target measuring device by taking measurements with respect to a subset of the plurality of standard samples and field responses (Xfield) by taking measurements with respect to the plurality of field samples; transmitting the received reference responses (X ₁ ) and the received target responses (X ₂ ) to a computing device that is connected to the reference measuring device and to the target measuring device; decomposition by means of a computing device of the accepted reference responses (X ₁ ) in accordance with the decomposition method using hidden variables (LVD method) to obtain a reference matrix (T ₁ ) of accounts and a reference matrix (P ₁ ) of loads; changing, by means of a computing device, the obtained reference matrix (T ₁ ) of accounts by deleting rows corresponding to standard samples from the specified set of standard samples that do not correspond to the specified subset of standard samples; determination by a computing device of the target matrix (P ₂ ) of the loads for the target measuring device in accordance with the LVD method using the received target responses (X ₂ ) and a modified reference matrix (T ₁ ^mod ) of accounts; transfer by means of a computing device of a specific target matrix (P2) of the loads and the resulting reference matrix (P1) of the loads on the reference measuring device; transmitting the received field responses (Xfield) to the reference measuring device by means of the target measuring device; determination, by means of a reference measuring device, of a field matrix (Tfield) of accounts in accordance with the LVD method using transmitted field responses (Xfield) and transmitted target matrix (P2) of loads; and determining, by the reference measuring device, the corrected field responses (Xfield ^corr ) in accordance with the inverse LVD method using the determined field matrix (Tfield) of the counts and the transmitted reference matrix (P ₁ ) of the loads.

At least some of the embodiments described herein may be implemented in digital electronic circuits, in computer software, firmware, hardware, or combinations thereof. Some of the embodiments described herein may be implemented as one or more computer software products, i.e. one or more pieces of computer-readable program code stored on a computer-readable non-short-term medium, for example, a computer-readable information storage device, to operate or control the operation of a data processing device, such as a programmable processor, computer, or multiple computers. A computer program (also called a program, software 17 033993, software application or code) can be written in any programming language.

A computer program does not necessarily correspond to a single file. A computer program may be executed on one or more computers or processing devices in one place or distributed in a plurality of places, and such execution may cause the device to perform at least the operations or steps of the calibration methods described herein.

Although the above-described embodiments of calibration systems and methods are generally intended to calibrate a measuring device of any model using the hidden variable decomposition method (LVD method), if necessary, they can be used to obtain qualitative and quantitative estimates of sample parameters using measuring devices of various models.

The above description of specific embodiments of calibration systems and methods will thus fully disclose the general nature of the embodiments of the present invention, while other specialists, using current knowledge, can easily modify and / or adapt such specific embodiments for various applications without departing from the general concepts and, therefore, such adaptations and changes should encompass the meaning and range of equivalents of the disclosed embodiments. It should be understood that the phraseology or terminology used herein is for description and not limitation. Thus, although embodiments of the present invention have been described in terms of preferred embodiments, it will be apparent to those skilled in the art that embodiments of the present invention may be practiced with changes within the spirit and scope of the appended claims.

Claims (25)

1. A calibration system comprising a reference measuring device for obtaining reference responses (X ₁ ) by taking measurements with respect to a plurality of reference samples; a target measuring device for obtaining target responses (X ₂ ) by taking measurements with respect to a subset of the specified plurality of reference samples and for obtaining field responses (X _field ) by taking measurements with respect to the plurality of field samples; a computing device connected to a reference measuring device for receiving reference responses (X ₁ ) and to a target measuring device for receiving target responses (X ₂ ) and field responses (Xfieid), while the computing device is configured to decompose the received reference responses (X ₁ ) in accordance with the decomposition method using hidden variables (LVD-method) to obtain a reference matrix (T ₁ ) of accounts and a reference matrix (P ₁ ) of loads, change the resulting reference matrix (T ₁ ) of accounts by removing rows corresponding to standard samples from the specified set of standard samples that do not correspond to the specified subset of standard samples, determining the target matrix (P ₂ ) of the loads for the target measuring device in accordance with the LVD method using the received target responses (X ₂ ) and a modified reference matrix (T ₁ ^mod ) of accounts, determination of the field matrix (T _field ) of accounts in accordance with the LVD method using the received field responses (Xfieid) and a specific target matrix (P2) of loads and determining the corrected field responses (X _field ^corr ) according to the inverse LVD method using the determined field matrix (T _field ) of the counts and the resulting reference matrix of loads (P ₁ ). 2. The calibration system according to claim 1, additionally containing an electronic device connected to a reference measuring device and configured to store data about the parameters corresponding to the parameters of the standard samples, and the ability to transfer the saved data about the parameters to the reference measuring device, while the computing device also ^configured to transmit certain corrected field responses (X _field ^corr ) to a reference measurement device; and the reference measurement device is also configured to create a calibration model of the reference measurement device based on transmitted parameter data and transmitted corrected field responses (Xfield ^corr ). 3. The calibration system according to claim 2, in which the reference measuring device is also configured to obtain current responses (X _routine ) by taking measurements with respect to a plurality of samples and the ability to determine the corrected current responses (X _routine ^corr ) based on the created calibration model and received current responses (X _routme ). 4. The calibration system according to claim 1, additionally containing an electronic device connected - 18 033993 to a computing device and configured to save data about the parameters corresponding to the parameters of standard samples; wherein the computing device is also ^configured to transmit certain corrected field responses (X _field ^corr ) to the electronic device; and the electronic device is also ^configured to create a calibration model of a reference measuring device based on transmitted corrected field responses (X _field ^corr ) and stored parameter data. 5. The calibration system according to claim 4, in which the reference measuring device is also configured to receive current responses (X _routine ) by taking measurements with respect to a plurality of samples and the possibility of transmitting the received current responses (X _routine ) to an electronic device; and the electronic device is also configured to determine the corrected reference responses (Xroutine ^corr ) based on the created calibration model and the transmitted current responses ^(X routine ^). 6. A calibration system comprising a reference measuring device for obtaining reference responses (X _d ) by taking measurements on a plurality of reference materials; a target measuring device for obtaining target responses (X ₂ ) by taking measurements with respect to a subset of the specified plurality of reference samples and for obtaining field responses (X _field ) by taking measurements with respect to the plurality of field samples; a computing device connected to a reference measuring device for receiving reference responses (X _d ) and to a target measuring device for receiving target responses (X ₂ ), while the computing device is configured to decompose the received reference responses (X _d ) in accordance with the method decomposition using hidden variables (LVD method) to obtain a reference matrix (T ₁ ) of accounts and a reference matrix (Pi) of loads, change the resulting reference matrix (T ₁ ) of accounts by deleting rows, respectively creating standard samples from the specified set of standard samples that do not correspond to the specified subset of standard samples, determining the target matrix (P ₂ ) of the loads for the target measuring device in accordance with the LVD method using the obtained target responses (X ₂ ) and a modified reference matrix (T ₁ ^mod) accounts, wherein the computing device further configured to transmit the determined target matrix (F2) and loads the received reference matrix (Pi) loads on the measuring target stroystvo; and the target measuring device is also configured to determine the field matrix (T _field ) of the accounts in accordance with the LVD method using the received field responses (X _field ) and the transmitted target matrix (P ₂ ) of loads and determine the corrected field responses (X _field ^corr ) in accordance with the inverse LVD method using a specific field matrix (T _field ) of the accounts and the transmitted reference matrix (P _i ) of the loads. 7. The calibration system according to claim 6, additionally containing an electronic device connected to a reference measuring device and configured to save data about the parameters corresponding to the parameters of the standard samples, and the ability to transfer the saved data about the parameters to the reference measuring device, while the target measuring device also configured to transmit certain corrected field responses (Xfield ^corr ) to a reference measurement device; and the reference measuring device is also configured to create a calibration model of the reference measuring device based on transmitted parameter data and transmitted corrected field responses (X _field ^corr ). 8. The calibration system according to claim 7, in which the reference measuring device is also configured to obtain current responses (X _routine ) by taking measurements with respect to a plurality of samples and the ability to determine the adjusted current responses (X _routine ^corr ) based on the created calibration model and received current responses (X _routme ). 9. The calibration system according to claim 6, further comprising an electronic device connected to the target measuring device and configured to store data on parameters corresponding to the parameters of the standard samples, while the target measuring device is also configured to transmit certain corrected field responses (Xfield ^corr ) to an electronic device; and the electronic device is also ^configured to create a calibration model of a reference measuring device based on transmitted corrected field responses (X _field ^corr ) and stored parameter data. - 19 033993 10. The calibration system according to claim 9, in which the reference measuring device is also configured to receive current responses (Xpoutme) by taking measurements on a plurality of samples and the ability to transmit the received current responses (X _routine ) to an electronic device; and the electronic device is ^configured to determine the corrected reference responses (X _routine ^corr ) based on the created calibration model and the transmitted current responses ^(X routine). 11. The calibration system according to claim 6, additionally containing an electronic device connected to the target measuring device and configured to save data about the parameters corresponding to the parameters of the standard samples, and the ability to transfer the saved data about the parameters to the target measuring device; however, the target measuring device is also configured to create a calibration model of the reference measuring device based on the transmitted parameter data and certain corrected field responses corr ^(X field). 12. The calibration system according to claim 11, in which the reference measuring device is also configured to receive current responses (X _routine ) by taking measurements with respect to a plurality of samples and the ability to transmit the received current responses (X _routine ) to the target measuring device; and the target measuring device is also _configured to determine the corrected current responses (X _routme ^corr ) based on the created calibration model and the transmitted current responses (Xroutine). 13. A calibration system comprising a reference measuring device for obtaining reference responses (X ₁ ) by taking measurements on a plurality of reference samples; a target measuring device for obtaining target responses (X ₂ ) by taking measurements with respect to a subset of the specified plurality of reference samples and for obtaining field responses (X _field ) by taking measurements with respect to the plurality of field samples; a computing device connected to a reference measuring device for receiving reference responses (X ₁ ) and to a target measuring device for receiving target responses (X ₂ ), while the computing device is configured to decompose the received reference responses (X ₁ ) in accordance with the method decomposition using hidden variables (LVD-method) to obtain a reference matrix (T ₁ ) of accounts and a reference matrix (P ₁ ) of loads, change the resulting reference matrix (T1) of accounts by deleting rows, respectively creating standard samples from the specified set of standard samples that do not correspond to the specified subset of standard samples, determining the target matrix (P ₂ ) of the loads for the target measuring device in accordance with the LVD method using the obtained target responses (X ₂ ) and a modified reference matrix (T ₁ ^mod ) of accounts, while the computing device is also configured to transmit a specific target matrix (P ₂ ) of loads and the resulting reference matrix (P ₁ ) of loads to the reference meter new device; the target measuring device is also configured to transmit the received field responses (Xfield) to the reference measuring device; and the reference measuring device is also configured to determine the field matrix (T _field ) of the accounts in accordance with the LVD method using the transmitted field responses (Xfield) and the transmitted target matrix (P2) of loads and determine the corrected field responses (Xfield ^corr ) in accordance with by the inverse LVD method using a specific field matrix (T _field ) of the counts and the transmitted reference matrix (P ₁ ) of the loads. 14. The calibration system according to item 13, further comprising an electronic device connected to a reference measuring device and configured to save data about the parameters corresponding to the parameters of the standard samples, and the ability to transfer the saved data about the parameters to the reference measuring device; however, the reference measuring device is also configured to create a calibration model of the reference measuring device based on the transmitted parameter data and certain corrected field responses (Xfield ^corr ). 15. The calibration system according to 14, in which the reference measuring device is also configured to obtain current responses (Xroutine) by taking measurements on multiple samples and the ability to determine the adjusted current responses (Xroutine ^corr ) based on the created calibration model and the received current responses (X _routine ). 16. The calibration system according to item 13, further comprising an electronic device, is connected - - 20 033993 to the reference measuring device and configured to save data on parameters corresponding to the parameters of standard samples, while the reference measuring device is also configured to transmit certain corrected field responses (X _field ^corr ) to the electronic device; and the electronic device is also ^configured to create a calibration model of a reference measuring device based on transmitted corrected field responses (X _field ^corr ) and stored parameter data. 17. The calibration system according to claim 16, in which the reference measuring device is also configured to receive current responses (X _routine ) by taking measurements with respect to a plurality of samples and the ability to transmit received current responses (X _routine ) to an electronic device; and the electronic device is also configured to determine the corrected current responses (Xroutine ^corr ) based on the created calibration model and the transmitted current responses ^(X routine ^). 18. The calibration system according to item 13, further comprising an electronic device connected to the target measuring device and configured to save data about the parameters corresponding to the parameters of the standard samples, and the ability to transfer the saved data about the parameters to the target measuring device, while the reference measuring device also ^configured to transmit certain corrected field responses (X _field ^corr ) to the target measurement device; and the target measurement device is also configured to create a calibration model of a reference measurement device based on transmitted parameter data and transmitted corrected field responses (Xfield ^corr ). 19. The calibration system of claim 18, wherein the reference measurement device is also configured to receive current responses (X _routine ) by taking measurements on a plurality of samples and the ability to transmit the received current responses (X _routine ) to the target measurement device; and the target measuring device is also _configured to determine the corrected current responses (X _routme ^corr ) based on the created calibration model and the transmitted current responses (Xroutine). 20. A calibration method, comprising obtaining, by means of a reference measuring device, reference responses (X ₁ ) by taking measurements with respect to a plurality of standard samples; obtaining target responses (X ₂ ) by means of a target measuring device by taking measurements with respect to a subset of the plurality of standard samples and field responses (Xfield) by taking measurements with respect to the plurality of field samples; transmitting the received reference responses (X1) through the reference measuring device and transmitting the received target responses (X ₂ ) and the received field responses (X _field ) to the computing device through the target measuring device; decomposition by means of a computing device of the transmitted reference responses (X ₁ ) in accordance with the decomposition method using hidden variables (LVD method) to obtain a reference matrix (T ₁ ) of accounts and a reference matrix (P ₁ ) of loads; changing, by means of a computing device, the obtained reference matrix (T ₁ ) of accounts by deleting rows corresponding to standard samples from the specified set of standard samples that do not correspond to the specified subset of standard samples; determination by the computing device of the target matrix (P ₂ ) of the loads for the target measuring device in accordance with the LVD method using the transmitted target responses (X ₂ ) and a modified reference matrix (T ₁ ^mod ) accounts; determination by means of a computing device of a field matrix (T _field ) of accounts in accordance with the LVD method using transmitted field responses and a specific target matrix (P ₂ ) of loads; determination by a computing device of the corrected field responses (X _field ^corr ) in accordance with the inverse LVD method using a specific field matrix (T _field ) of the counts and the resulting reference matrix (P ₁ ) of the loads. 21. A computer-readable storage medium on which fragments of computer-readable program code are stored, the execution of which by the processing device causes the device to execute the method according to claim 20. 22. A calibration method, comprising obtaining, using a reference measuring device, reference responses (X ₁ ) by taking measurements with respect to a plurality of reference materials; obtaining the target responses (X ₂ ) by means of the target measuring device by taking measurements with respect to a subset of the specified set of standard samples and field - 21,033,993 responses (Xfieid) by taking measurements on multiple field samples; transmitting the received reference responses (Xi) through the reference measuring device and transmitting the received target responses (X ₂ ) through the target measuring device to the computing device; decomposition by means of a computing device of the transmitted reference responses (X1) in accordance with the decomposition method using hidden variables (LVD method) to obtain a reference matrix (T1) of accounts and a reference matrix (P1) of loads; changing by means of a computing device of the obtained reference matrix (T1) of accounts by deleting rows corresponding to standard samples from the specified set of standard samples that do not correspond to the specified subset of standard samples; determination by the computing device of the target matrix (P ₂ ) of the loads for the target measuring device in accordance with the LVD method using the transmitted target responses (X ₂ ) and a modified reference matrix (T1 ^mod ) of accounts; transfer by means of a computing device of a specific target matrix (P2) of the loads and the resulting reference matrix (P1) of the loads on the target measuring device; determination by means of the target measuring device of the field matrix (T _fieid ) of accounts in accordance with the LVD method using the received field responses (X _field ) and the transmitted target matrix (P ₂ ) of the loads; and determining, by the target measuring device, the corrected field responses (X _fleld ^corr ) in accordance with the inverse LVD method using the determined field matrix (T _field ) of the counts and the transmitted reference matrix (P1) of the loads. 23. A computer-readable storage medium on which fragments of computer-readable program code are stored, the execution of which by the processing device causes the device to execute the method according to claim 22. 24. A calibration method, comprising obtaining, by means of a reference measuring device, reference responses (X1) by taking measurements with respect to a plurality of reference samples; obtaining, by means of a target measuring device, target responses (X ₂ ) by taking measurements with respect to a subset of the plurality of standard samples and field responses (X _field ) by taking measurements with respect to the plurality of field samples; transmitting the received reference responses (X _i ) through the reference measuring device and transmitting the received target responses (X2) via the target measuring device to the computing device; decomposition by means of a computing device of the transmitted reference responses (X1) in accordance with the decomposition method using hidden variables (LVD method) to obtain a reference matrix (T1) of accounts and a reference matrix (P1) of loads; changing by means of a computing device of the obtained reference matrix (T1) of accounts by deleting rows corresponding to standard samples from the specified set of standard samples that do not correspond to the specified subset of standard samples; determination by the computing device of the target matrix (P ₂ ) of the loads for the target measuring device in accordance with the LVD method using the transmitted target responses (X ₂ ) and a modified reference matrix (T1 ^mod ) of accounts; transfer by means of a computing device of a specific target matrix (P2) of the loads and the resulting reference matrix (P1) of the loads on the reference measuring device; transmitting the received field responses (Xfield) to the reference measuring device by means of the target measuring device; determination by accounts of the field matrix (Tfield) of accounts in accordance with the LVD method using the transmitted field responses (X _field ) and the transmitted target matrix (P ₂ ) of the loads; and determining, by the reference measuring device, the corrected field responses (X _field ^corr ) in accordance with the inverse LVD method using the determined field matrix (T _field ) of the counts and the transmitted reference matrix (P1) of the loads. 25. A computer-readable storage medium on which fragments of computer-readable program code are stored, the execution of which by the processing device causes the device to execute the method according to paragraph 24.