DK3324173T3 - Et lysinspektions system af overfladen og det indre af en prøve - Google Patents

Et lysinspektions system af overfladen og det indre af en prøve

Info

Publication number
DK3324173T3
DK3324173T3 DK17382427.7T DK17382427T DK3324173T3 DK 3324173 T3 DK3324173 T3 DK 3324173T3 DK 17382427 T DK17382427 T DK 17382427T DK 3324173 T3 DK3324173 T3 DK 3324173T3
Authority
DK
Denmark
Prior art keywords
sample
interior
inspection system
light inspection
light
Prior art date
Application number
DK17382427.7T
Other languages
English (en)
Inventor
Millán Pere Pérez
Peiró Salvador Torres
Marco Héctor Muñoz
Viorel Otgon
Afonso Javier Abreu
Original Assignee
Fyla Laser S L
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fyla Laser S L filed Critical Fyla Laser S L
Application granted granted Critical
Publication of DK3324173T3 publication Critical patent/DK3324173T3/da

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G01N21/474—Details of optical heads therefor, e.g. using optical fibres
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G01N21/474—Details of optical heads therefor, e.g. using optical fibres
    • G01N2021/4742—Details of optical heads therefor, e.g. using optical fibres comprising optical fibres
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G01N21/474—Details of optical heads therefor, e.g. using optical fibres
    • G01N2021/4742—Details of optical heads therefor, e.g. using optical fibres comprising optical fibres
    • G01N2021/4747—Concentric bundles
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G01N21/474—Details of optical heads therefor, e.g. using optical fibres
    • G01N2021/4742—Details of optical heads therefor, e.g. using optical fibres comprising optical fibres
    • G01N2021/475—Bifurcated bundle
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G01N2021/4764—Special kinds of physical applications
    • G01N2021/4773—Partly or totally translucent samples
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/10—Scanning
    • G01N2201/105—Purely optical scan
DK17382427.7T 2017-07-03 2017-07-03 Et lysinspektions system af overfladen og det indre af en prøve DK3324173T3 (da)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP17382427.7A EP3324173B1 (en) 2017-07-03 2017-07-03 Light inspection system and method of the surface and inside of a sample

Publications (1)

Publication Number Publication Date
DK3324173T3 true DK3324173T3 (da) 2019-05-13

Family

ID=59295142

Family Applications (1)

Application Number Title Priority Date Filing Date
DK17382427.7T DK3324173T3 (da) 2017-07-03 2017-07-03 Et lysinspektions system af overfladen og det indre af en prøve

Country Status (5)

Country Link
US (1) US11099130B1 (da)
EP (1) EP3324173B1 (da)
DK (1) DK3324173T3 (da)
ES (1) ES2725482T3 (da)
WO (1) WO2019008486A1 (da)

Family Cites Families (23)

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WO1992001923A1 (en) * 1990-07-17 1992-02-06 Tencor Instruments Optical scatter imaging
US5293872A (en) * 1991-04-03 1994-03-15 Alfano Robert R Method for distinguishing between calcified atherosclerotic tissue and fibrous atherosclerotic tissue or normal cardiovascular tissue using Raman spectroscopy
US6038067A (en) * 1996-05-23 2000-03-14 The Regents Of The University Of California Scanning computed confocal imager
EP0822394B1 (en) 1996-08-02 2004-09-29 ARKRAY, Inc. Optical measuring device with wavelength-selective light source
US6241663B1 (en) * 1998-05-18 2001-06-05 Abbott Laboratories Method for improving non-invasive determination of the concentration of analytes in a biological sample
US6353226B1 (en) * 1998-11-23 2002-03-05 Abbott Laboratories Non-invasive sensor capable of determining optical parameters in a sample having multiple layers
DE60137599D1 (de) 2000-03-10 2009-03-19 Textron Systems Corp Optische sonden und verfahren zur spektralanalyse
US7016087B2 (en) * 2001-08-08 2006-03-21 Becton Dickinson And Company Photon efficient scanner
US8238993B2 (en) * 2002-04-04 2012-08-07 Veralight, Inc. Determination of a measure of a glycation end-product or disease state using tissue fluorescence lifetime
EP1746409A4 (en) 2004-05-10 2008-10-01 Kajitsu Hihakai Hinshitsu Kenk INTERNAL ON-LINE QUALITY ASSAY PROCESS AND DEVICE
US7324202B2 (en) * 2004-12-07 2008-01-29 Novx Systems Inc. Optical system
GB2428868B (en) * 2005-10-28 2008-11-19 Thermo Electron Corp Spectrometer for surface analysis and method therefor
EP1959250A4 (en) 2006-01-20 2011-10-12 Sumitomo Electric Industries ANALYZER, DEVICE AND METHOD FOR ASSESSING THE AUTHENTICITY AND UNDERGROUND SEARCH PROCESS
US7830519B2 (en) 2006-02-22 2010-11-09 Vivum Nexus Llc Method and device for analyte measurement
EP1962050B1 (de) * 2007-02-21 2015-12-23 Agfa HealthCare N.V. System und Verfahren zur optischen Kohärenztomographie sowie Verfahren zur Kalibrierung eines solchen Systems
CN101827662B (zh) 2007-09-03 2014-12-31 比利时电子分拣技术股份有限公司 有宽光谱光源的分拣装置及相应方法
US9163987B2 (en) * 2010-08-24 2015-10-20 Kla-Tencor Corporation Defect inspection and photoluminescence measurement system
JP2013076618A (ja) * 2011-09-30 2013-04-25 Sony Corp 光伝導素子、レンズ、テラヘルツ放射顕微鏡及びデバイスの製造方法
US20150157199A1 (en) * 2012-12-06 2015-06-11 Noam Sapiens Method and apparatus for scatterometric measurement of human tissue
US9952100B2 (en) * 2013-01-21 2018-04-24 Sciaps, Inc. Handheld LIBS spectrometer
US9983127B2 (en) * 2013-09-03 2018-05-29 Nanyang Technological University Optical detection device and optical detection method
US9729854B2 (en) * 2015-03-22 2017-08-08 Innova Plex, Inc. System and method for scanning a specimen to create a multidimensional scan

Also Published As

Publication number Publication date
EP3324173A1 (en) 2018-05-23
US20210278341A1 (en) 2021-09-09
EP3324173B1 (en) 2019-04-17
WO2019008486A1 (en) 2019-01-10
US11099130B1 (en) 2021-08-24
ES2725482T3 (es) 2019-09-24

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