DK2264993T3 - Bredbånds-bromodul med høj impedans - Google Patents

Bredbånds-bromodul med høj impedans

Info

Publication number
DK2264993T3
DK2264993T3 DK10164086.0T DK10164086T DK2264993T3 DK 2264993 T3 DK2264993 T3 DK 2264993T3 DK 10164086 T DK10164086 T DK 10164086T DK 2264993 T3 DK2264993 T3 DK 2264993T3
Authority
DK
Denmark
Prior art keywords
bridge module
dsl
module provides
high impedance
active
Prior art date
Application number
DK10164086.0T
Other languages
English (en)
Inventor
Thomas W Durston
Original Assignee
Textron Innovations Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Textron Innovations Inc filed Critical Textron Innovations Inc
Application granted granted Critical
Publication of DK2264993T3 publication Critical patent/DK2264993T3/da

Links

Classifications

    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04MTELEPHONIC COMMUNICATION
    • H04M3/00Automatic or semi-automatic exchanges
    • H04M3/22Arrangements for supervision, monitoring or testing
    • H04M3/26Arrangements for supervision, monitoring or testing with means for applying test signals or for measuring
    • H04M3/28Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor
    • H04M3/30Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor for subscriber's lines, for the local loop
    • H04M3/305Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor for subscriber's lines, for the local loop testing of physical copper line parameters, e.g. capacitance or resistance
    • H04M3/306Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor for subscriber's lines, for the local loop testing of physical copper line parameters, e.g. capacitance or resistance for frequencies above the voice frequency, e.g. xDSL line qualification

Landscapes

  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Arrangements For Transmission Of Measured Signals (AREA)
  • Monitoring And Testing Of Exchanges (AREA)
  • Control Of Motors That Do Not Use Commutators (AREA)
DK10164086.0T 2009-06-16 2010-05-27 Bredbånds-bromodul med høj impedans DK2264993T3 (da)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US12/485,383 US8237427B2 (en) 2009-06-16 2009-06-16 Wideband high impedance bridging module

Publications (1)

Publication Number Publication Date
DK2264993T3 true DK2264993T3 (da) 2012-05-14

Family

ID=42668263

Family Applications (1)

Application Number Title Priority Date Filing Date
DK10164086.0T DK2264993T3 (da) 2009-06-16 2010-05-27 Bredbånds-bromodul med høj impedans

Country Status (6)

Country Link
US (1) US8237427B2 (da)
EP (1) EP2264993B1 (da)
AT (1) ATE542362T1 (da)
CA (1) CA2704103C (da)
DK (1) DK2264993T3 (da)
ES (1) ES2381222T3 (da)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20160216317A1 (en) * 2015-01-22 2016-07-28 Qualcomm, Incorporated Built-in test structure for a receiver
CN109073704A (zh) 2017-03-02 2018-12-21 罗斯蒙特公司 用于局部放电的趋势函数
US11181570B2 (en) 2018-06-15 2021-11-23 Rosemount Inc. Partial discharge synthesizer
US10823787B2 (en) * 2018-06-15 2020-11-03 Nxp B.V. Apparatuses and methods involving self-testing voltage regulation circuits
US11313895B2 (en) * 2019-09-24 2022-04-26 Rosemount Inc. Antenna connectivity with shielded twisted pair cable
CN113311230B (zh) * 2020-02-27 2022-12-06 成都纳能微电子有限公司 终端阻抗检测电路

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4758792A (en) * 1985-09-13 1988-07-19 Southwest Research Institute Method for utilizing a spherical dipole probe for detecting faults in high voltage transmission line insulators
GB9900820D0 (en) 1999-01-14 1999-03-03 Bicc Plc Testing cables and their joints
US6255828B1 (en) * 1999-02-19 2001-07-03 Eubanks Engineering Co. Interface for cable testing
US6259256B1 (en) * 1999-03-01 2001-07-10 Nordx/Cdt, Inc. Cable testing apparatus
US6556661B1 (en) * 1999-11-16 2003-04-29 Independent Technologies, Inc. In-line telephony data protector with line condition announce
US6812712B2 (en) * 2000-05-02 2004-11-02 Lectromechanical Design Co. Wire test method and apparatus
EP1248444A1 (en) 2001-02-12 2002-10-09 Harris Corporation Analog telephone test set with low pass filter circuit and resistors coupled with the lead pair for preventing corruption of digital communication signals
CA2348799A1 (fr) * 2001-05-22 2002-11-22 Marcel Blais Appareil d'essai de composants electroniques
US6868357B2 (en) * 2001-07-07 2005-03-15 Cynthia M. Furse Frequency domain reflectometry system for testing wires and cables utilizing in-situ connectors, passive connectivity, cable fray detection, and live wire testing
US7149285B2 (en) 2002-10-02 2006-12-12 Fluke Corporation Dynamic, automated double-ended system and method for testing and qualifying metallic telecommunication loops
US7250772B2 (en) * 2002-11-19 2007-07-31 University Of Utah Research Foundation Method and apparatus for characterizing a signal path carrying an operational signal
GB0410682D0 (en) * 2004-05-12 2004-06-16 Dkr Electrical Services Lancas Non contact cable testing
US7548071B2 (en) * 2006-01-31 2009-06-16 University Of Utah Research Foundation Reflectometry test system using a sliding pseudo-noise reference
WO2008080036A2 (en) * 2006-12-21 2008-07-03 Draeger Medical Systems, Inc. A cable detection system
US20080303533A1 (en) * 2007-06-07 2008-12-11 Chih-Cheng Wu Cable testing device and testing method thereof
GB2452506B (en) 2007-09-05 2009-12-23 Tyco Electronics Xdsl bypass test facility

Also Published As

Publication number Publication date
US8237427B2 (en) 2012-08-07
CA2704103A1 (en) 2010-12-16
EP2264993B1 (en) 2012-01-18
CA2704103C (en) 2016-01-19
US20100315065A1 (en) 2010-12-16
EP2264993A1 (en) 2010-12-22
ATE542362T1 (de) 2012-02-15
ES2381222T3 (es) 2012-05-24

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