DK114259B - Forstøvningsapparat. - Google Patents

Forstøvningsapparat.

Info

Publication number
DK114259B
DK114259B DK187865A DK187865A DK114259B DK 114259 B DK114259 B DK 114259B DK 187865 A DK187865 A DK 187865A DK 187865 A DK187865 A DK 187865A DK 114259 B DK114259 B DK 114259B
Authority
DK
Denmark
Prior art keywords
atomizer
Prior art date
Application number
DK187865A
Other languages
Danish (da)
English (en)
Inventor
M Boris
Original Assignee
Step Soc Tech Pulverisation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Step Soc Tech Pulverisation filed Critical Step Soc Tech Pulverisation
Publication of DK114259B publication Critical patent/DK114259B/da

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20025Sample holders or supports therefor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/24Earth materials
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/05Investigating materials by wave or particle radiation by diffraction, scatter or reflection
    • G01N2223/056Investigating materials by wave or particle radiation by diffraction, scatter or reflection diffraction
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/10Different kinds of radiation or particles
    • G01N2223/101Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016X-ray
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/30Accessories, mechanical or electrical features
    • G01N2223/307Accessories, mechanical or electrical features cuvettes-sample holders

Landscapes

  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Geology (AREA)
  • Remote Sensing (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
DK187865A 1965-01-25 1965-04-13 Forstøvningsapparat. DK114259B (da)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR3122A FR1430993A (fr) 1965-01-25 1965-01-25 Procédé de préparation d'un échantillon rocheux destiné à l'analyse diffractométrique et dispositif permettant la réalisation du procédé

Publications (1)

Publication Number Publication Date
DK114259B true DK114259B (da) 1969-06-09

Family

ID=8569111

Family Applications (1)

Application Number Title Priority Date Filing Date
DK187865A DK114259B (da) 1965-01-25 1965-04-13 Forstøvningsapparat.

Country Status (5)

Country Link
BE (1) BE674720A (xx)
DK (1) DK114259B (xx)
FR (1) FR1430993A (xx)
LU (1) LU50206A1 (xx)
NL (1) NL6600865A (xx)

Also Published As

Publication number Publication date
NL6600865A (xx) 1966-07-26
BE674720A (xx) 1966-05-03
LU50206A1 (xx) 1966-03-07
FR1430993A (fr) 1966-03-11

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