DK114259B - Forstøvningsapparat. - Google Patents

Forstøvningsapparat.

Info

Publication number
DK114259B
DK114259B DK187865A DK187865A DK114259B DK 114259 B DK114259 B DK 114259B DK 187865 A DK187865 A DK 187865A DK 187865 A DK187865 A DK 187865A DK 114259 B DK114259 B DK 114259B
Authority
DK
Denmark
Prior art keywords
atomizer
Prior art date
Application number
DK187865A
Other languages
Danish (da)
English (en)
Inventor
M Boris
Original Assignee
Step Soc Tech Pulverisation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Step Soc Tech Pulverisation filed Critical Step Soc Tech Pulverisation
Publication of DK114259B publication Critical patent/DK114259B/da

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20025—Sample holders or supports therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/24—Earth materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/05—Investigating materials by wave or particle radiation by diffraction, scatter or reflection
    • G01N2223/056—Investigating materials by wave or particle radiation by diffraction, scatter or reflection diffraction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/10—Different kinds of radiation or particles
    • G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016—X-ray
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/307—Accessories, mechanical or electrical features cuvettes-sample holders

Landscapes

  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Geology (AREA)
  • Medicinal Chemistry (AREA)
  • Food Science & Technology (AREA)
  • Remote Sensing (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Environmental & Geological Engineering (AREA)
DK187865A 1965-01-25 1965-04-13 Forstøvningsapparat. DK114259B (da)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR3122A FR1430993A (fr) 1965-01-25 1965-01-25 Procédé de préparation d'un échantillon rocheux destiné à l'analyse diffractométrique et dispositif permettant la réalisation du procédé

Publications (1)

Publication Number Publication Date
DK114259B true DK114259B (da) 1969-06-09

Family

ID=8569111

Family Applications (1)

Application Number Title Priority Date Filing Date
DK187865A DK114259B (da) 1965-01-25 1965-04-13 Forstøvningsapparat.

Country Status (5)

Country Link
BE (1) BE674720A (en:Method)
DK (1) DK114259B (en:Method)
FR (1) FR1430993A (en:Method)
LU (1) LU50206A1 (en:Method)
NL (1) NL6600865A (en:Method)

Also Published As

Publication number Publication date
BE674720A (en:Method) 1966-05-03
NL6600865A (en:Method) 1966-07-26
FR1430993A (fr) 1966-03-11
LU50206A1 (en:Method) 1966-03-07

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