DK0563676T3 - Method for adjusting transmit and measuring circuits in a test apparatus - Google Patents

Method for adjusting transmit and measuring circuits in a test apparatus

Info

Publication number
DK0563676T3
DK0563676T3 DK93104255T DK93104255T DK0563676T3 DK 0563676 T3 DK0563676 T3 DK 0563676T3 DK 93104255 T DK93104255 T DK 93104255T DK 93104255 T DK93104255 T DK 93104255T DK 0563676 T3 DK0563676 T3 DK 0563676T3
Authority
DK
Denmark
Prior art keywords
test apparatus
measuring circuits
adjusting transmit
test
transmit
Prior art date
Application number
DK93104255T
Other languages
Danish (da)
Inventor
Guenther Dipl-Ing Gnan
Frank Dipl-Phys Preiss
Werner Schmutzler
Wolfgang Dipl-Ing Fh Kaiser
Original Assignee
Siemens Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens Ag filed Critical Siemens Ag
Application granted granted Critical
Publication of DK0563676T3 publication Critical patent/DK0563676T3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass

Abstract

Test devices for clearing faults in subscriber lines have previously been calibrated at the test station which was very costly. The method according to the invention now provides for independent in-service calibration of the test device. <IMAGE>
DK93104255T 1992-03-31 1993-03-16 Method for adjusting transmit and measuring circuits in a test apparatus DK0563676T3 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE4210620 1992-03-31

Publications (1)

Publication Number Publication Date
DK0563676T3 true DK0563676T3 (en) 2000-10-02

Family

ID=6455583

Family Applications (1)

Application Number Title Priority Date Filing Date
DK93104255T DK0563676T3 (en) 1992-03-31 1993-03-16 Method for adjusting transmit and measuring circuits in a test apparatus

Country Status (6)

Country Link
EP (1) EP0563676B1 (en)
AT (1) ATE193125T1 (en)
DE (1) DE59310043D1 (en)
DK (1) DK0563676T3 (en)
ES (1) ES2147186T3 (en)
GR (1) GR3033710T3 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5929628A (en) * 1996-12-05 1999-07-27 Teradyne, Inc. Apparatus and method for performing amplitude calibration in an electronic circuit tester
CN112098731A (en) * 2020-09-16 2020-12-18 江苏方天电力技术有限公司 Electromagnetic field probe with autonomous calibration function and calibration method thereof

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4404636A (en) * 1981-04-08 1983-09-13 Wilcom Products, Inc. Phasor impedance measuring test set
JPS62254076A (en) * 1986-01-21 1987-11-05 Mitsubishi Electric Corp Ac measuring display unit
JPH02203213A (en) * 1989-02-01 1990-08-13 Hitachi Ltd Analog signal measuring device

Also Published As

Publication number Publication date
ATE193125T1 (en) 2000-06-15
EP0563676A3 (en) 1994-08-03
EP0563676A2 (en) 1993-10-06
GR3033710T3 (en) 2000-10-31
DE59310043D1 (en) 2000-06-21
EP0563676B1 (en) 2000-05-17
ES2147186T3 (en) 2000-09-01

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