DE9421054U1 - Shearing-Interferenzmikroskop - Google Patents

Shearing-Interferenzmikroskop

Info

Publication number
DE9421054U1
DE9421054U1 DE9421054U DE9421054U DE9421054U1 DE 9421054 U1 DE9421054 U1 DE 9421054U1 DE 9421054 U DE9421054 U DE 9421054U DE 9421054 U DE9421054 U DE 9421054U DE 9421054 U1 DE9421054 U1 DE 9421054U1
Authority
DE
Germany
Prior art keywords
interference microscope
shearing interference
shearing
microscope
interference
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE9421054U
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jenoptik AG
Original Assignee
Carl Zeiss Jena GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Carl Zeiss Jena GmbH filed Critical Carl Zeiss Jena GmbH
Priority to DE9421054U priority Critical patent/DE9421054U1/de
Priority claimed from DE19944401145 external-priority patent/DE4401145C1/de
Publication of DE9421054U1 publication Critical patent/DE9421054U1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/45Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02Testing optical properties
    • G01M11/0285Testing optical properties by measuring material or chromatic transmission properties
DE9421054U 1994-01-17 1994-01-17 Shearing-Interferenzmikroskop Expired - Lifetime DE9421054U1 (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE9421054U DE9421054U1 (de) 1994-01-17 1994-01-17 Shearing-Interferenzmikroskop

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE9421054U DE9421054U1 (de) 1994-01-17 1994-01-17 Shearing-Interferenzmikroskop
DE19944401145 DE4401145C1 (de) 1994-01-17 1994-01-17 Verfahren zur Messung des Brechungsindexverlaufes

Publications (1)

Publication Number Publication Date
DE9421054U1 true DE9421054U1 (de) 1995-04-27

Family

ID=25933061

Family Applications (1)

Application Number Title Priority Date Filing Date
DE9421054U Expired - Lifetime DE9421054U1 (de) 1994-01-17 1994-01-17 Shearing-Interferenzmikroskop

Country Status (1)

Country Link
DE (1) DE9421054U1 (de)

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