DE9117188U1 - Scanner für Prüfobjekte - Google Patents
Scanner für PrüfobjekteInfo
- Publication number
- DE9117188U1 DE9117188U1 DE9117188U DE9117188U DE9117188U1 DE 9117188 U1 DE9117188 U1 DE 9117188U1 DE 9117188 U DE9117188 U DE 9117188U DE 9117188 U DE9117188 U DE 9117188U DE 9117188 U1 DE9117188 U1 DE 9117188U1
- Authority
- DE
- Germany
- Prior art keywords
- scanners
- test objects
- objects
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G01V5/22—
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by using a combination of at least two measurements at least one being a transmission measurement and one a scatter measurement
Landscapes
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE9117188U DE9117188U1 (de) | 1991-11-13 | 1991-11-13 | Scanner für Prüfobjekte |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE9117188U DE9117188U1 (de) | 1991-11-13 | 1991-11-13 | Scanner für Prüfobjekte |
DE4137372A DE4137372A1 (de) | 1991-11-13 | 1991-11-13 | Scanner fuer pruefobjekte |
Publications (1)
Publication Number | Publication Date |
---|---|
DE9117188U1 true DE9117188U1 (de) | 1996-11-07 |
Family
ID=25909106
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE9117188U Expired - Lifetime DE9117188U1 (de) | 1991-11-13 | 1991-11-13 | Scanner für Prüfobjekte |
Country Status (1)
Country | Link |
---|---|
DE (1) | DE9117188U1 (de) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2007079675A1 (fr) * | 2006-01-11 | 2007-07-19 | Tsinghua University | Système d'inspection pour inspecter une cargaison au moyen de rayonnements |
-
1991
- 1991-11-13 DE DE9117188U patent/DE9117188U1/de not_active Expired - Lifetime
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2007079675A1 (fr) * | 2006-01-11 | 2007-07-19 | Tsinghua University | Système d'inspection pour inspecter une cargaison au moyen de rayonnements |
GB2448011A (en) * | 2006-01-11 | 2008-10-01 | Univ Tsinghua | An inspection system for inspecting cargo using radiation |
US7817775B2 (en) | 2006-01-11 | 2010-10-19 | Tsinghua University | Radiation inspection system |
GB2448011B (en) * | 2006-01-11 | 2010-11-17 | Univ Tsinghua | An inspection system for inspecting cargo using radiation |
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