DE9002130U1 - - Google Patents

Info

Publication number
DE9002130U1
DE9002130U1 DE9002130U DE9002130U DE9002130U1 DE 9002130 U1 DE9002130 U1 DE 9002130U1 DE 9002130 U DE9002130 U DE 9002130U DE 9002130 U DE9002130 U DE 9002130U DE 9002130 U1 DE9002130 U1 DE 9002130U1
Authority
DE
Germany
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE9002130U
Other languages
German (de)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens AG
Original Assignee
Siemens AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens AG filed Critical Siemens AG
Priority to DE9002130U priority Critical patent/DE9002130U1/de
Publication of DE9002130U1 publication Critical patent/DE9002130U1/de
Priority to PCT/DE1991/000138 priority patent/WO1991013344A1/de
Priority to EP19910904466 priority patent/EP0516677A1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
DE9002130U 1990-02-22 1990-02-22 Expired - Lifetime DE9002130U1 (sv)

Priority Applications (3)

Application Number Priority Date Filing Date Title
DE9002130U DE9002130U1 (sv) 1990-02-22 1990-02-22
PCT/DE1991/000138 WO1991013344A1 (de) 1990-02-22 1991-02-21 Röntgendiffraktometer
EP19910904466 EP0516677A1 (de) 1990-02-22 1991-02-21 Röntgendiffraktometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE9002130U DE9002130U1 (sv) 1990-02-22 1990-02-22

Publications (1)

Publication Number Publication Date
DE9002130U1 true DE9002130U1 (sv) 1990-04-26

Family

ID=6851295

Family Applications (1)

Application Number Title Priority Date Filing Date
DE9002130U Expired - Lifetime DE9002130U1 (sv) 1990-02-22 1990-02-22

Country Status (3)

Country Link
EP (1) EP0516677A1 (sv)
DE (1) DE9002130U1 (sv)
WO (1) WO1991013344A1 (sv)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4137673A1 (de) * 1991-11-15 1993-05-19 Siemens Ag Reflektometer

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE69119904T2 (de) * 1991-10-30 1996-11-28 Philips Electronics Nv Röntgenuntersuchungsgerät
GB9123072D0 (en) * 1991-10-30 1991-12-18 Sandoz Ltd Apparatus
DE102016224940B3 (de) 2016-12-14 2017-08-24 Bruker Axs Gmbh Röntgenvorrichtung mit motorischer Drehmomentkompensation am Detektorkreis des Goniometers und Verfahren zum Betrieb einer Röntgenvorrichtung

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1572719B2 (de) * 1967-08-05 1972-02-10 Lücke, Kurt, Prof Dr , 5100 Aachen Roentgenstrahlengoniometer zur schnellen ermittlung der textur kristalliner proben im rueck und durchstrahlbereich
DE1950152C3 (de) * 1969-10-04 1978-08-10 Institut Max Von Laue - Paul Langevin, Grenoble (Frankreich), Niederlassung Institut Max Von Laue - Paul Langevin, Aussenstelle Garching, 8046 Garching Vorrichtung zur gleichzeitigen Intensitätsmessung von mehreren Neutronen-Einkristallinterferenzen
FR2379294A1 (fr) * 1977-02-08 1978-09-01 Cgr Mev Dispositif de radiotherapie neutronique utilisant un accelerateur lineaire de particules
DD149420A1 (de) * 1980-03-03 1981-07-08 Reinhard Arnhold Roentgendiffraktometer

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4137673A1 (de) * 1991-11-15 1993-05-19 Siemens Ag Reflektometer
DE4137673C2 (de) * 1991-11-15 2001-08-02 Bruker Axs Analytical X Ray Sy Röntgenreflektometer

Also Published As

Publication number Publication date
EP0516677A1 (de) 1992-12-09
WO1991013344A1 (de) 1991-09-05

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