DE8701592U1 - - Google Patents
Info
- Publication number
- DE8701592U1 DE8701592U1 DE8701592U DE8701592U DE8701592U1 DE 8701592 U1 DE8701592 U1 DE 8701592U1 DE 8701592 U DE8701592 U DE 8701592U DE 8701592 U DE8701592 U DE 8701592U DE 8701592 U1 DE8701592 U1 DE 8701592U1
- Authority
- DE
- Germany
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
- G01N21/45—Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE8701592U DE8701592U1 (no) | 1987-02-03 | 1987-02-03 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE8701592U DE8701592U1 (no) | 1987-02-03 | 1987-02-03 |
Publications (1)
Publication Number | Publication Date |
---|---|
DE8701592U1 true DE8701592U1 (no) | 1987-05-21 |
Family
ID=6804262
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE8701592U Expired DE8701592U1 (no) | 1987-02-03 | 1987-02-03 |
Country Status (1)
Country | Link |
---|---|
DE (1) | DE8701592U1 (no) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0277496A2 (de) * | 1987-02-03 | 1988-08-10 | Spindler & Hoyer GmbH & Co.KG. | Laserinterferometer-Refraktometer |
-
1987
- 1987-02-03 DE DE8701592U patent/DE8701592U1/de not_active Expired
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0277496A2 (de) * | 1987-02-03 | 1988-08-10 | Spindler & Hoyer GmbH & Co.KG. | Laserinterferometer-Refraktometer |
EP0277496A3 (en) * | 1987-02-03 | 1989-05-03 | Spindler & Hoyer Gmbh & Co.Kg. | Laser interferometer-refractometer |