DE8701195U1 - - Google Patents

Info

Publication number
DE8701195U1
DE8701195U1 DE8701195U DE8701195U DE8701195U1 DE 8701195 U1 DE8701195 U1 DE 8701195U1 DE 8701195 U DE8701195 U DE 8701195U DE 8701195 U DE8701195 U DE 8701195U DE 8701195 U1 DE8701195 U1 DE 8701195U1
Authority
DE
Germany
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE8701195U
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Feinmetall 7033 Herrenberg De GmbH
Original Assignee
Feinmetall 7033 Herrenberg De GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Feinmetall 7033 Herrenberg De GmbH filed Critical Feinmetall 7033 Herrenberg De GmbH
Priority to DE8701195U priority Critical patent/DE8701195U1/de
Publication of DE8701195U1 publication Critical patent/DE8701195U1/de
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07342—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being at an angle other than perpendicular to test object, e.g. probe card

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
DE8701195U 1986-01-27 1987-01-26 Expired DE8701195U1 (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE8701195U DE8701195U1 (de) 1986-01-27 1987-01-26

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE8601975 1986-01-27
DE8701195U DE8701195U1 (de) 1986-01-27 1987-01-26

Publications (1)

Publication Number Publication Date
DE8701195U1 true DE8701195U1 (de) 1987-05-21

Family

ID=25950664

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8701195U Expired DE8701195U1 (de) 1986-01-27 1987-01-26

Country Status (1)

Country Link
DE (1) DE8701195U1 (de)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0446067A2 (de) * 1990-03-08 1991-09-11 KABUSHIKI KAISHA KOBE SEIKO SHO also known as Kobe Steel Ltd. Prüfsonde
EP0922960A1 (de) * 1997-12-12 1999-06-16 Padar Tecnologie di Riccioni Roberto S.a.s. Prüfgerät für Mikroschaltungen

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0446067A2 (de) * 1990-03-08 1991-09-11 KABUSHIKI KAISHA KOBE SEIKO SHO also known as Kobe Steel Ltd. Prüfsonde
EP0446067A3 (en) * 1990-03-08 1992-08-05 Kabushiki Kaisha Kobe Seiko Sho Also Known As Kobe Steel Ltd. Inspection probe
EP0922960A1 (de) * 1997-12-12 1999-06-16 Padar Tecnologie di Riccioni Roberto S.a.s. Prüfgerät für Mikroschaltungen
US6198297B1 (en) 1997-12-12 2001-03-06 Padar Technologie Di Riccioni Roberto S.A.S. Microcircuit testing device

Similar Documents

Publication Publication Date Title
BE905135A (de)
AU4910985A (de)
AU5130285A (de)
AU5329886A (de)
AU5442686A (de)
AU5444986A (de)
AU5558386A (de)
AU5597686A (de)
AU5655786A (de)
AU5703286A (de)
AU5724586A (de)
AU5745586A (de)
AU5878886A (de)
AU5940986A (de)
AU6019186A (de)
DE8621270U1 (de)
BE905521A (de)
BE905236A (de)
BE905178A (de)
BE905321A (de)
BG44958A1 (de)
BE904467A (de)
BG45111A1 (de)
BG45087A1 (de)
BE904422A (de)