DE8435891U1 - - Google Patents

Info

Publication number
DE8435891U1
DE8435891U1 DE19848435891 DE8435891U DE8435891U1 DE 8435891 U1 DE8435891 U1 DE 8435891U1 DE 19848435891 DE19848435891 DE 19848435891 DE 8435891 U DE8435891 U DE 8435891U DE 8435891 U1 DE8435891 U1 DE 8435891U1
Authority
DE
Germany
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE19848435891
Other languages
German (de)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Luther Erich Ing(grad) 3050 Wunstorf De
Maelzer Martin Dipl-Kaufm
Original Assignee
Luther Erich Ing(grad) 3050 Wunstorf De
Maelzer Martin Dipl-Kaufm
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Luther Erich Ing(grad) 3050 Wunstorf De, Maelzer Martin Dipl-Kaufm filed Critical Luther Erich Ing(grad) 3050 Wunstorf De
Priority to DE19848435891 priority Critical patent/DE8435891U1/de
Publication of DE8435891U1 publication Critical patent/DE8435891U1/de
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07371—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate card or back card with apertures through which the probes pass
DE19848435891 1984-12-07 1984-12-07 Expired DE8435891U1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE19848435891 DE8435891U1 (en) 1984-12-07 1984-12-07

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19848435891 DE8435891U1 (en) 1984-12-07 1984-12-07

Publications (1)

Publication Number Publication Date
DE8435891U1 true DE8435891U1 (en) 1987-10-22

Family

ID=6773515

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19848435891 Expired DE8435891U1 (en) 1984-12-07 1984-12-07

Country Status (1)

Country Link
DE (1) DE8435891U1 (en)

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