DE8435549U1 - - Google Patents

Info

Publication number
DE8435549U1
DE8435549U1 DE19848435549 DE8435549U DE8435549U1 DE 8435549 U1 DE8435549 U1 DE 8435549U1 DE 19848435549 DE19848435549 DE 19848435549 DE 8435549 U DE8435549 U DE 8435549U DE 8435549 U1 DE8435549 U1 DE 8435549U1
Authority
DE
Germany
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE19848435549
Other languages
German (de)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Helmut Fischer & Co Institut fur Elektronik und Messtechnik 7032 Sindelfingen De GmbH
Original Assignee
Helmut Fischer & Co Institut fur Elektronik und Messtechnik 7032 Sindelfingen De GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Helmut Fischer & Co Institut fur Elektronik und Messtechnik 7032 Sindelfingen De GmbH filed Critical Helmut Fischer & Co Institut fur Elektronik und Messtechnik 7032 Sindelfingen De GmbH
Priority to DE19848435549 priority Critical patent/DE8435549U1/de
Publication of DE8435549U1 publication Critical patent/DE8435549U1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
DE19848435549 1984-12-05 1984-12-05 Expired - Lifetime DE8435549U1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE19848435549 DE8435549U1 (en) 1984-12-05 1984-12-05

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19848435549 DE8435549U1 (en) 1984-12-05 1984-12-05

Publications (1)

Publication Number Publication Date
DE8435549U1 true DE8435549U1 (en) 1992-09-10

Family

ID=6773404

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19848435549 Expired - Lifetime DE8435549U1 (en) 1984-12-05 1984-12-05

Country Status (1)

Country Link
DE (1) DE8435549U1 (en)

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