DE8123157U1 - Test device for printed circuits - Google Patents

Description

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SIEMENS AKTIENGESELLSCHAFT Our mark Berlin and Munich VPA 81 G 6504 DE

File number G 81 23 157.1

Test device for printed circuits

The innovation relates to a test device for printed circuits, consisting of spring-loaded test pins, in a version resting on the circuit to be tested, for example a layer circuit of the High frequency technology to be pressed.

There are test devices known in which resilient Contacts connected to test leads are pressed onto circuit boards.

The innovation is based on the task of specifying a simplified arrangement that allows manual with easy possibility of exchangeability of the test displays to create safe test facilities.

In a test device of the type mentioned at the outset, this object is achieved according to the innovation in that that a base bridging the actual circuit engages in the circuit arrangement by means of dowel pins and can be connected to it via resiliently held screws and that there is a vertical on this base An arrangement that can be moved via an eccentric gear is located on which contact pins are insulated, whose supply lines are made via plugs attached to it and that a ground contact bolt is provided, the front is also provided with a contact spring

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is, which is initially dragging on the contacting surface during the downward movement against the printed circuit moved and then pressed into place as a stop by the bolt itself.

Further refinements of the subject of the innovation can be found in the subclaims.

The arrangement is described below with reference to the sections shown in the figures.

The test device shown in Figure 1 enables a quick and safe connection to the test object. It consists of an L-shaped base 1, which by means of its finder pins (alignment pins) 2 on the test object 3 is attached and thus adjusted to its test points. The base is attached to the Test item attached. In the unscrewed state press springs 5, which are located between the base 1 and screw bolts 4 are located, this up. This creates a form-fitting support of the base on the test item ensured. With an eccentric 7 rotatably mounted in the base wall 6 and the lever 8 with a ball handle a carrier 10 guided over columns 9 is moved towards the test specimen 3 or away from it. One on the carrier 10 Mounted angle 11, which acts as an insulator, carries a bridge 12 with test pins 13 and contact springs 14, Ground contact bolts 15 and / or pressure pins 17 (Figure 2). Contact shortly before the end of the contacting stroke the contact springs 14 with the test object 3 are then further compressed to produce a scraping effect to generate, so to clean the contact until the ground contact spring on the ground bolt 15 comes to rest and the ground bolt forms the stop. The bridge 12 with its contact elements and coaxial lines 13

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interchangeable. The Koaxialleitvmgen are provided at their end with coaxial sockets, which are attached in the web 16 and form the transition point for connection to an automatic testing machine.
5

After screwing on the bolt 4, the lever 8 is pivoted (arrow) until it rests on the bolt 4 rests. Thus access for loosening the bolt 4 is prevented in this position, and you have to to the Remove the device after the measurement, first turn the lever to the open position and make the contact solve, whereby the contact springs 14 are inevitably lifted. When placing on another test item the test probes cannot be damaged as a result.

15th

By the same process, resilient pressure pins 17 (FIG. 2), for example the connecting pins of components on conductor tracks, any circuits. Another benefit of this type of contact is that components connected between two contact springs can be connected to a circuit. If a unit is formed from contact spring 18, component 19 and receiving part 20 according to FIG the bridge 12 can be replaced like a cartridge. A groove 21 takes over the correct position guidance and a Locking bolt 22 the lock.

3 figures

5 claims for protection

Claims (5)

- 4 - VPA 81 G 65OA DE claims for protection 1. Test device for printed circuits, consisting of resilient test pins that rest in a socket . 5 to the circuit to be tested, for example a layer circuit the high-frequency technology, are pressed, characterized in that a the actual circuit bridging base engages in the circuit arrangement by means of dowel pins (2) and can be connected to it via resiliently held screws (4) and that there is a vertically above this base an eccentric gear (7, 8) movable arrangement (11, 16) is located on which contact pins (14, 15, 17, 18) are isolated are attached, the leads are made via attached to her plug and that a ground contact bolt (15) is provided, which is also provided with a contact spring at the front, which is moved downwards first moved against the printed circuit and then dragged on the contacting surface is firmly pressed as a stop by the bolt (15) itself. 2. Test device according to claim 1, characterized in that the vertically movable, The arrangement guided via columns (9) and the base wall (6) is held resiliently in the lifting direction and can be moved by the eccentric (7) against the circuit to be tested, a lever with a ball handle for the end stop (8) strikes at the upper end of one of the screw bolts for fastening the test device on the test object. 3. Test device according to one of the preceding claims, characterized in that the contact pins are designed as vertically sprung, front-tapered pressure pins (17). se son β «« * - 5 - VPA 81 G 6504 DE 4, test device according to one of the preceding claims, characterized in that that the contact pins are held on an L-shaped bracket (11) which is exchangeable. 5. Test device according to one of the preceding claims, characterized in that that the contact pins are connected to one another via additional components (Figure 3).