DE69910489D1 - Rasterregelmethode - Google Patents

Rasterregelmethode

Info

Publication number
DE69910489D1
DE69910489D1 DE69910489T DE69910489T DE69910489D1 DE 69910489 D1 DE69910489 D1 DE 69910489D1 DE 69910489 T DE69910489 T DE 69910489T DE 69910489 T DE69910489 T DE 69910489T DE 69910489 D1 DE69910489 D1 DE 69910489D1
Authority
DE
Germany
Prior art keywords
control method
grid control
grid
control
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69910489T
Other languages
English (en)
Other versions
DE69910489T2 (de
Inventor
Kenneth P Dobyns
Robert A Nishida
George S Walker
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tektronix Inc
Original Assignee
Tektronix Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tektronix Inc filed Critical Tektronix Inc
Publication of DE69910489D1 publication Critical patent/DE69910489D1/de
Application granted granted Critical
Publication of DE69910489T2 publication Critical patent/DE69910489T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/20—Cathode-ray oscilloscopes
    • G01R13/22—Circuits therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/20—Cathode-ray oscilloscopes
    • G01R13/22—Circuits therefor
    • G01R13/34—Circuits for representing a single waveform by sampling, e.g. for very high frequencies
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G1/00—Control arrangements or circuits, of interest only in connection with cathode-ray tube indicators; General aspects or details, e.g. selection emphasis on particular characters, dashed line or dotted line generation; Preprocessing of data
    • G09G1/06—Control arrangements or circuits, of interest only in connection with cathode-ray tube indicators; General aspects or details, e.g. selection emphasis on particular characters, dashed line or dotted line generation; Preprocessing of data using single beam tubes, e.g. three-dimensional or perspective representation, rotation or translation of display pattern, hidden lines, shadows
    • G09G1/14—Control arrangements or circuits, of interest only in connection with cathode-ray tube indicators; General aspects or details, e.g. selection emphasis on particular characters, dashed line or dotted line generation; Preprocessing of data using single beam tubes, e.g. three-dimensional or perspective representation, rotation or translation of display pattern, hidden lines, shadows the beam tracing a pattern independent of the information to be displayed, this latter determining the parts of the pattern rendered respectively visible and invisible

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Controls And Circuits For Display Device (AREA)
  • Image Generation (AREA)
DE69910489T 1998-02-19 1999-02-09 Rasterregelmethode Expired - Lifetime DE69910489T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/026,186 US5995117A (en) 1998-02-19 1998-02-19 Rasterization control method
US26186 1998-02-19

Publications (2)

Publication Number Publication Date
DE69910489D1 true DE69910489D1 (de) 2003-09-25
DE69910489T2 DE69910489T2 (de) 2004-06-24

Family

ID=21830369

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69910489T Expired - Lifetime DE69910489T2 (de) 1998-02-19 1999-02-09 Rasterregelmethode

Country Status (7)

Country Link
US (1) US5995117A (de)
EP (1) EP0959360B1 (de)
JP (1) JP3263783B2 (de)
KR (1) KR100552409B1 (de)
CN (1) CN1145032C (de)
DE (1) DE69910489T2 (de)
TW (1) TW417018B (de)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6104374A (en) * 1998-02-19 2000-08-15 Tektronix, Inc. Sparse vector rasterization
US6195080B1 (en) * 1998-04-03 2001-02-27 Tektronix, Inc. High probability capture of slow trigger rate acquisitions in a digital oscilloscope with variable intensity rasterization
US6188384B1 (en) * 1998-06-05 2001-02-13 Tektronix, Inc. Reacting to unusual waveforms
US6473701B1 (en) * 1999-11-22 2002-10-29 Tektronix, Inc. Alternate triggering in digital oscilloscopes
US8102396B2 (en) * 2006-07-17 2012-01-24 Tektronix, Inc. Apparatus and method for improved measurement speed in test and measurement instruments
US8046183B2 (en) * 2008-03-04 2011-10-25 Tektronix, Inc. Pre-trigger and post-trigger acquisition for no dead time acquisition system
US8330758B2 (en) * 2008-05-08 2012-12-11 Teledyne Lecroy, Inc. Statistically-based display processing
CN102109540B (zh) * 2009-12-25 2015-05-20 北京普源精电科技有限公司 一种可以在光栅显示器中显示等效采样波形的数字示波器及其等效采样点的设置方法
CN112578490A (zh) * 2019-09-30 2021-03-30 南开大学 一种3d打印的低折射率大角度偏折稀疏光栅

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4816813A (en) * 1986-09-19 1989-03-28 Nicolet Instrument Corporation Raster scan emulation of conventional analog CRT displays
US5602564A (en) * 1991-11-14 1997-02-11 Hitachi, Ltd. Graphic data processing system
US5412579A (en) * 1993-04-05 1995-05-02 Tektronix, Inc. Slow display method for digital oscilloscope with fast acquisition system
KR950012931A (ko) * 1993-10-27 1995-05-17 김광호 레이저 다이오드 및 그의 제조방법
TW276317B (de) * 1993-12-17 1996-05-21 Hitachi Seisakusyo Kk
US5530454A (en) * 1994-04-13 1996-06-25 Tektronix, Inc. Digital oscilloscope architecture for signal monitoring with enhanced duty cycle
JP3139671B2 (ja) * 1995-04-04 2001-03-05 横河電機株式会社 波形観測装置
JP3753263B2 (ja) * 1995-08-23 2006-03-08 ヒューレット・パッカード・カンパニー 画像を処理する方法
US5838973A (en) * 1996-05-03 1998-11-17 Andersen Consulting Llp System and method for interactively transforming a system or process into a visual representation

Also Published As

Publication number Publication date
CN1145032C (zh) 2004-04-07
JP3263783B2 (ja) 2002-03-11
TW417018B (en) 2001-01-01
KR19990072768A (ko) 1999-09-27
EP0959360A3 (de) 2000-02-23
EP0959360B1 (de) 2003-08-20
DE69910489T2 (de) 2004-06-24
JPH11281676A (ja) 1999-10-15
EP0959360A2 (de) 1999-11-24
CN1236104A (zh) 1999-11-24
KR100552409B1 (ko) 2006-02-16
US5995117A (en) 1999-11-30

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition