DE69907485D1 - Direkter bildsensor für röntgenstrahlung mit einer dielektrischen schicht, die eine angepasste zeitkonstante aufweist - Google Patents

Direkter bildsensor für röntgenstrahlung mit einer dielektrischen schicht, die eine angepasste zeitkonstante aufweist

Info

Publication number
DE69907485D1
DE69907485D1 DE69907485T DE69907485T DE69907485D1 DE 69907485 D1 DE69907485 D1 DE 69907485D1 DE 69907485 T DE69907485 T DE 69907485T DE 69907485 T DE69907485 T DE 69907485T DE 69907485 D1 DE69907485 D1 DE 69907485D1
Authority
DE
Germany
Prior art keywords
direct
dielectric layer
image sensor
time constant
ray image
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69907485T
Other languages
English (en)
Other versions
DE69907485T2 (de
Inventor
L Lee
E Davis
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Direct Radiography Corp
Original Assignee
Direct Radiography Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Direct Radiography Corp filed Critical Direct Radiography Corp
Application granted granted Critical
Publication of DE69907485D1 publication Critical patent/DE69907485D1/de
Publication of DE69907485T2 publication Critical patent/DE69907485T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14665—Imagers using a photoconductor layer
    • H01L27/14676—X-ray, gamma-ray or corpuscular radiation imagers

Landscapes

  • Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Computer Hardware Design (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electromagnetism (AREA)
  • Toxicology (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Measurement Of Radiation (AREA)
DE69907485T 1998-07-06 1999-06-24 Direkter bildsensor für röntgenstrahlung mit einer dielektrischen schicht, die eine angepasste zeitkonstante aufweist Expired - Fee Related DE69907485T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US110549 1998-07-06
US09/110,549 US6194727B1 (en) 1998-07-06 1998-07-06 Direct radiographic imaging panel having a dielectric layer with an adjusted time constant
PCT/US1999/014579 WO2000002255A1 (en) 1998-07-06 1999-06-24 Direct radiographic imaging panel having a dielectric layer with an adjusted time constant

Publications (2)

Publication Number Publication Date
DE69907485D1 true DE69907485D1 (de) 2003-06-05
DE69907485T2 DE69907485T2 (de) 2004-05-19

Family

ID=22333627

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69907485T Expired - Fee Related DE69907485T2 (de) 1998-07-06 1999-06-24 Direkter bildsensor für röntgenstrahlung mit einer dielektrischen schicht, die eine angepasste zeitkonstante aufweist

Country Status (7)

Country Link
US (1) US6194727B1 (de)
EP (1) EP1114468B1 (de)
JP (1) JP2002520576A (de)
KR (1) KR20010090708A (de)
CA (1) CA2336333A1 (de)
DE (1) DE69907485T2 (de)
WO (1) WO2000002255A1 (de)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19926582A1 (de) * 1999-06-11 2000-12-14 Philips Corp Intellectual Pty Sensor
EP1077493A3 (de) * 1999-08-19 2005-08-10 Fuji Photo Film Co., Ltd. Bildaufnahmevorrichtung, deren Herstellungsverfahren, und Bildaufzeichnungsvorrichtung und Bildlesevorrichtung mit einer solchen Bildaufnahmevorrichtung
EP1342105A4 (de) * 2000-11-10 2005-09-07 Hologic Inc Direkt-röntgenabbildungstafel mit einer abbildungseigenschaft, die umkehrbar mit einer externen energiequelle bei der klinischen benutzung der tafel einstellbar ist
DE10132924A1 (de) * 2001-07-06 2003-01-16 Philips Corp Intellectual Pty Flacher dynamischer Strahlungsdetektor
US6821881B2 (en) 2001-07-25 2004-11-23 Applied Materials, Inc. Method for chemical mechanical polishing of semiconductor substrates
JP4211435B2 (ja) * 2002-08-30 2009-01-21 株式会社島津製作所 放射線検出器
US7449693B2 (en) * 2006-06-12 2008-11-11 Texas Instruments Incorporated System and method for radiation detection and imaging
US8436289B1 (en) 2008-06-09 2013-05-07 Spansion Llc System and method for detecting particles with a semiconductor device
US8232515B2 (en) 2008-06-09 2012-07-31 Spansion Llc Imaging device having a radiation detecting structure disposed at a semiconductor substrate with a thermalizing material and a first radiation-reactive material sensitive to neutron radiation
TWI535289B (zh) * 2013-11-22 2016-05-21 財團法人工業技術研究院 Ｘ光平板感測器之殘留電荷消除方法及裝置

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2753278A (en) 1951-04-14 1956-07-03 Haloid Co Method for the production of a xerographic plate
US5262649A (en) 1989-09-06 1993-11-16 The Regents Of The University Of Michigan Thin-film, flat panel, pixelated detector array for real-time digital imaging and dosimetry of ionizing radiation
US5319206A (en) 1992-12-16 1994-06-07 E. I. Du Pont De Nemours And Company Method and apparatus for acquiring an X-ray image using a solid state device
US5661309A (en) 1992-12-23 1997-08-26 Sterling Diagnostic Imaging, Inc. Electronic cassette for recording X-ray images
US5381014B1 (en) 1993-12-29 1997-06-10 Du Pont Large area x-ray imager and method of fabrication
US6372534B1 (en) 1995-06-06 2002-04-16 Lg. Philips Lcd Co., Ltd Method of making a TFT array with photo-imageable insulating layer over address lines
US5563421A (en) 1995-06-07 1996-10-08 Sterling Diagnostic Imaging, Inc. Apparatus and method for eliminating residual charges in an image capture panel
WO1997010616A1 (en) 1995-09-12 1997-03-20 Philips Electronics N.V. X-ray image sensor
US5648660A (en) 1996-01-05 1997-07-15 Sterling Diagnostic Imaging, Inc. Method and apparatus for reducing noise in a radiation capture device

Also Published As

Publication number Publication date
EP1114468B1 (de) 2003-05-02
DE69907485T2 (de) 2004-05-19
JP2002520576A (ja) 2002-07-09
WO2000002255A1 (en) 2000-01-13
EP1114468A1 (de) 2001-07-11
EP1114468A4 (de) 2001-09-12
KR20010090708A (ko) 2001-10-19
CA2336333A1 (en) 2000-01-13
US6194727B1 (en) 2001-02-27

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee