DE69804772D1 - ELEMENT-SELECTIVE DETECTION METHOD, MICRO-PLASMA MASS SPECTROMETER AND MICRO-PLASMA ION SOURCE FOR IT AND ITS APPLICATIONS - Google Patents

ELEMENT-SELECTIVE DETECTION METHOD, MICRO-PLASMA MASS SPECTROMETER AND MICRO-PLASMA ION SOURCE FOR IT AND ITS APPLICATIONS

Info

Publication number
DE69804772D1
DE69804772D1 DE69804772T DE69804772T DE69804772D1 DE 69804772 D1 DE69804772 D1 DE 69804772D1 DE 69804772 T DE69804772 T DE 69804772T DE 69804772 T DE69804772 T DE 69804772T DE 69804772 D1 DE69804772 D1 DE 69804772D1
Authority
DE
Germany
Prior art keywords
micro
plasma
applications
detection method
mass spectrometer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69804772T
Other languages
German (de)
Other versions
DE69804772T2 (en
Inventor
Cato Brede
Stig Pedersen-Bjergaard
Tyge Greibrokk
Elsa Lundanes
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
PEDERSEN BJERGAARD STIG
Original Assignee
PEDERSEN BJERGAARD STIG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by PEDERSEN BJERGAARD STIG filed Critical PEDERSEN BJERGAARD STIG
Application granted granted Critical
Publication of DE69804772D1 publication Critical patent/DE69804772D1/en
Publication of DE69804772T2 publication Critical patent/DE69804772T2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/105—Ion sources; Ion guns using high-frequency excitation, e.g. microwave excitation, Inductively Coupled Plasma [ICP]

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
DE69804772T 1997-02-14 1998-02-12 ELEMENT-SELECTIVE DETECTION METHOD, MICRO-PLASMA MASS SPECTROMETER AND MICRO-PLASMA ION SOURCE FOR IT AND ITS APPLICATIONS Expired - Fee Related DE69804772T2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
NO970707A NO304861B1 (en) 1997-02-14 1997-02-14 Method of Element Selective Detection, Microplasma Mass Spectrometer for Use in the Method and Plasma Ion Source, and Applications of These
PCT/NO1998/000048 WO1998036440A1 (en) 1997-02-14 1998-02-12 A method for element-selective detection, a micro plasma mass spectrometer for use in the method and a plasma ion source, together with applications thereof

Publications (2)

Publication Number Publication Date
DE69804772D1 true DE69804772D1 (en) 2002-05-16
DE69804772T2 DE69804772T2 (en) 2002-11-28

Family

ID=19900391

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69804772T Expired - Fee Related DE69804772T2 (en) 1997-02-14 1998-02-12 ELEMENT-SELECTIVE DETECTION METHOD, MICRO-PLASMA MASS SPECTROMETER AND MICRO-PLASMA ION SOURCE FOR IT AND ITS APPLICATIONS

Country Status (7)

Country Link
EP (1) EP0960431B1 (en)
JP (1) JP2001512617A (en)
AU (1) AU719247B2 (en)
CA (1) CA2278807A1 (en)
DE (1) DE69804772T2 (en)
NO (1) NO304861B1 (en)
WO (1) WO1998036440A1 (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7274015B2 (en) * 2001-08-08 2007-09-25 Sionex Corporation Capacitive discharge plasma ion source
DE10248055B4 (en) * 2002-10-11 2012-02-23 Spectro Analytical Instruments Gmbh & Co. Kg Method for excitation of optical atomic emission and apparatus for spectrochemical analysis
US7460225B2 (en) 2004-03-05 2008-12-02 Vassili Karanassios Miniaturized source devices for optical and mass spectrometry
GB2432711B (en) * 2005-10-11 2008-04-02 Gv Instr Ion source preparation system
DE102009046504B4 (en) * 2009-11-06 2016-06-09 Westfälische Wilhelms-Universität Münster Method and device for analyzing a substance mixture
JP5784825B2 (en) * 2011-05-20 2015-09-24 パーデュー・リサーチ・ファウンデーションＰｕｒｄｕｅ Ｒｅｓｅａｒｃｈ Ｆｏｕｎｄａｔｉｏｎ System and method for analyzing a sample

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3215487B2 (en) * 1992-04-13 2001-10-09 セイコーインスツルメンツ株式会社 Inductively coupled plasma mass spectrometer
CA2116821C (en) * 1993-03-05 2003-12-23 Stephen Esler Anderson Improvements in plasma mass spectrometry
JPH07272671A (en) * 1994-03-29 1995-10-20 Ulvac Japan Ltd Method and device for gas analysis
WO1997020620A1 (en) * 1995-12-07 1997-06-12 The Regents Of The University Of California Improvements in method and apparatus for isotope enhancement in a plasma apparatus
EP0792091B1 (en) * 1995-12-27 2002-03-13 Nippon Telegraph And Telephone Corporation Elemental analysis method

Also Published As

Publication number Publication date
NO970707L (en) 1998-08-17
NO304861B1 (en) 1999-02-22
AU719247B2 (en) 2000-05-04
AU6231498A (en) 1998-09-08
EP0960431B1 (en) 2002-04-10
NO970707D0 (en) 1997-02-14
DE69804772T2 (en) 2002-11-28
JP2001512617A (en) 2001-08-21
WO1998036440A1 (en) 1998-08-20
CA2278807A1 (en) 1998-08-20
EP0960431A1 (en) 1999-12-01

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DE69804772D1 (en) ELEMENT-SELECTIVE DETECTION METHOD, MICRO-PLASMA MASS SPECTROMETER AND MICRO-PLASMA ION SOURCE FOR IT AND ITS APPLICATIONS

Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee