DE69625489T2 - Method and device for monitoring an extensive radiation source with single element detector measurement by means of spatial filtering and using the chromatic aberration of the imaging optics - Google Patents

Method and device for monitoring an extensive radiation source with single element detector measurement by means of spatial filtering and using the chromatic aberration of the imaging optics

Info

Publication number
DE69625489T2
DE69625489T2 DE1996625489 DE69625489T DE69625489T2 DE 69625489 T2 DE69625489 T2 DE 69625489T2 DE 1996625489 DE1996625489 DE 1996625489 DE 69625489 T DE69625489 T DE 69625489T DE 69625489 T2 DE69625489 T2 DE 69625489T2
Authority
DE
Germany
Prior art keywords
monitoring
radiation source
chromatic aberration
single element
imaging optics
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE1996625489
Other languages
German (de)
Other versions
DE69625489D1 (en
Inventor
Cheol-Jung Kim
Kwang-Suk Kim
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Korea Atomic Energy Research Institute KAERI
Original Assignee
Korea Atomic Energy Research Institute KAERI
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Korea Atomic Energy Research Institute KAERI filed Critical Korea Atomic Energy Research Institute KAERI
Priority claimed from EP96402542A external-priority patent/EP0844465B1/en
Application granted granted Critical
Publication of DE69625489D1 publication Critical patent/DE69625489D1/en
Publication of DE69625489T2 publication Critical patent/DE69625489T2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

DE1996625489 1996-11-26 1996-11-26 Method and device for monitoring an extensive radiation source with single element detector measurement by means of spatial filtering and using the chromatic aberration of the imaging optics Expired - Fee Related DE69625489T2 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP96402542A EP0844465B1 (en) 1996-11-26 1996-11-26 Method and system for spatial filtering of an extended radiation source with chromatic aberration of imaging optics in single-element detector measurement for monitoring of the extended radiation source

Publications (2)

Publication Number Publication Date
DE69625489D1 DE69625489D1 (en) 2003-01-30
DE69625489T2 true DE69625489T2 (en) 2003-10-30

Family

ID=8225322

Family Applications (1)

Application Number Title Priority Date Filing Date
DE1996625489 Expired - Fee Related DE69625489T2 (en) 1996-11-26 1996-11-26 Method and device for monitoring an extensive radiation source with single element detector measurement by means of spatial filtering and using the chromatic aberration of the imaging optics

Country Status (2)

Country Link
AT (1) ATE230105T1 (en)
DE (1) DE69625489T2 (en)

Also Published As

Publication number Publication date
ATE230105T1 (en) 2003-01-15
DE69625489D1 (en) 2003-01-30

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee