DE69625489T2 -
Method and device for monitoring an extensive radiation source with single element detector measurement by means of spatial filtering and using the chromatic aberration of the imaging optics
- Google Patents
Method and device for monitoring an extensive radiation source with single element detector measurement by means of spatial filtering and using the chromatic aberration of the imaging optics
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Korea Atomic Energy Research Institute KAERI
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Korea Atomic Energy Research Institute KAERI
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Priority claimed from EP96402542Aexternal-prioritypatent/EP0844465B1/en
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Publication of DE69625489T2publicationCriticalpatent/DE69625489T2/en
DE19966254891996-11-261996-11-26
Method and device for monitoring an extensive radiation source with single element detector measurement by means of spatial filtering and using the chromatic aberration of the imaging optics
Expired - Fee RelatedDE69625489T2
(en)
Method and system for spatial filtering of an extended radiation source with chromatic aberration of imaging optics in single-element detector measurement for monitoring of the extended radiation source
Method and device for monitoring an extensive radiation source with single element detector measurement by means of spatial filtering and using the chromatic aberration of the imaging optics
Method and device for monitoring an extensive radiation source with single element detector measurement by means of spatial filtering and using the chromatic aberration of the imaging optics