DE69432637D1 - Test procedure for integrated power elements - Google Patents

Test procedure for integrated power elements

Info

Publication number
DE69432637D1
DE69432637D1 DE69432637T DE69432637T DE69432637D1 DE 69432637 D1 DE69432637 D1 DE 69432637D1 DE 69432637 T DE69432637 T DE 69432637T DE 69432637 T DE69432637 T DE 69432637T DE 69432637 D1 DE69432637 D1 DE 69432637D1
Authority
DE
Germany
Prior art keywords
test procedure
integrated power
power elements
elements
integrated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69432637T
Other languages
German (de)
Inventor
Davide Brambilla
Giovanni Capodivacca
Fabrizio Stefani
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics SRL
Original Assignee
STMicroelectronics SRL
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by STMicroelectronics SRL filed Critical STMicroelectronics SRL
Priority claimed from EP94830592A external-priority patent/EP0720023B1/en
Application granted granted Critical
Publication of DE69432637D1 publication Critical patent/DE69432637D1/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

DE69432637T 1994-12-30 1994-12-30 Test procedure for integrated power elements Expired - Lifetime DE69432637D1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP94830592A EP0720023B1 (en) 1994-12-30 1994-12-30 Test method for power integrated devices

Publications (1)

Publication Number Publication Date
DE69432637D1 true DE69432637D1 (en) 2003-06-12

Family

ID=8218603

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69432637T Expired - Lifetime DE69432637D1 (en) 1994-12-30 1994-12-30 Test procedure for integrated power elements

Country Status (1)

Country Link
DE (1) DE69432637D1 (en)

Similar Documents

Publication Publication Date Title
DE69530103D1 (en) CONNECTING ELEMENTS FOR MICROELECTRONIC COMPONENTS
DE69523860D1 (en) Test card for high temperature use
DE59510271D1 (en) PROBE
DE69830854D1 (en) MULTIPLE TEST PROCEDURE
DE69533078D1 (en) Interface for automatic test setup
DE69513460D1 (en) Weight tester for molded parts
NO970726D0 (en) Test method
DE59510521D1 (en) ELECTROCHEMICAL PROBE
DE69934457D1 (en) Analyzer for test strips
DE69500017D1 (en) Connector for integrated circuit pack
DE69800343D1 (en) Certification procedure for integrated circuit
DE69312263D1 (en) Test procedure and arrangement for integrated power circuits
DE69941322D1 (en) RELATED TEST PROCEDURE
FI964657A (en) Gene testing procedure
DE69517758D1 (en) Testing an integrated circuit arrangement
DE59611168D1 (en) Noise-ray reducing connection configuration for an integrated circuit
DE59700327D1 (en) Connection device for profile parts
DE69432637D1 (en) Test procedure for integrated power elements
DE69529386D1 (en) Improvements for semiconductor devices
DE69514003D1 (en) TEST PROCEDURE FOR CATHETER SEPSIS
KR960014159U (en) Jig for motor test
DE69901299D1 (en) TEST BENCH
DE69512231D1 (en) TEST SYSTEM FOR ASSEMBLED AND UNBUILDED BOARDS
DE59501667D1 (en) Test procedure for semiconductor circuit levels
KR960015317U (en) Relay tester

Legal Events

Date Code Title Description
8332 No legal effect for de