DE69418241T2 - Spannungsdetektionsapparat - Google Patents

Spannungsdetektionsapparat

Info

Publication number
DE69418241T2
DE69418241T2 DE69418241T DE69418241T DE69418241T2 DE 69418241 T2 DE69418241 T2 DE 69418241T2 DE 69418241 T DE69418241 T DE 69418241T DE 69418241 T DE69418241 T DE 69418241T DE 69418241 T2 DE69418241 T2 DE 69418241T2
Authority
DE
Germany
Prior art keywords
voltage detection
detection apparatus
voltage
detection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69418241T
Other languages
English (en)
Other versions
DE69418241D1 (de
Inventor
Takuya Nakamura
Isuke Hirano
Shinichiro Aoshima
Hironori Takahashi
Tsuneyuki Urakami
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hamamatsu Photonics KK
Original Assignee
Hamamatsu Photonics KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hamamatsu Photonics KK filed Critical Hamamatsu Photonics KK
Application granted granted Critical
Publication of DE69418241D1 publication Critical patent/DE69418241D1/de
Publication of DE69418241T2 publication Critical patent/DE69418241T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/07—Non contact-making probes
    • G01R1/071—Non contact-making probes containing electro-optic elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/312—Contactless testing by capacitive methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/22—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-emitting devices, e.g. LED, optocouplers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/24—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices
    • G01R15/241—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using electro-optical modulators, e.g. electro-absorption

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
DE69418241T 1993-01-27 1994-01-26 Spannungsdetektionsapparat Expired - Fee Related DE69418241T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5011835A JPH06222087A (ja) 1993-01-27 1993-01-27 電圧検出装置

Publications (2)

Publication Number Publication Date
DE69418241D1 DE69418241D1 (de) 1999-06-10
DE69418241T2 true DE69418241T2 (de) 1999-10-14

Family

ID=11788803

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69418241T Expired - Fee Related DE69418241T2 (de) 1993-01-27 1994-01-26 Spannungsdetektionsapparat

Country Status (4)

Country Link
US (2) US5583444A (de)
EP (1) EP0613016B1 (de)
JP (1) JPH06222087A (de)
DE (1) DE69418241T2 (de)

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JP3317801B2 (ja) * 1994-01-12 2002-08-26 浜松ホトニクス株式会社 ２次元電圧検出装置
JPH08160080A (ja) * 1994-12-07 1996-06-21 Nec Corp 非接触型信号測定プローブ
US6028423A (en) * 1997-12-11 2000-02-22 Sanchez; Jorge Isolation instrument for electrical testing
DE19634251A1 (de) * 1996-08-26 1998-03-05 Abb Patent Gmbh Spannungswandler
US6172413B1 (en) * 1997-10-09 2001-01-09 Micron Technology, Inc. Chip leads constrained in dielectric media
JP3437751B2 (ja) * 1997-11-11 2003-08-18 安藤電気株式会社 終端装置
DE19938660A1 (de) 1998-08-19 2000-03-23 Ando Electric Elektrooptische Sonde
JP2002529742A (ja) 1998-11-06 2002-09-10 オンガード システムズ，インク． 電子回路
US6414318B1 (en) 1998-11-06 2002-07-02 Bridge Semiconductor Corporation Electronic circuit
US6574257B1 (en) * 2000-02-01 2003-06-03 Siros Technologies, Inc. Near-field laser and detector apparatus and method
DE20010959U1 (de) * 2000-06-20 2000-09-28 Schumann Mathias Optoelektronischer Oszilloskoptastkopf zur potentialfreien Erfassung elektrischer Größen
USRE43685E1 (en) 2002-01-08 2012-09-25 Tecey Software Development Kg, Llc Apparatus and method for measurement for dynamic laser signals
US7049843B2 (en) * 2004-03-10 2006-05-23 Tektronix, Inc. Signal acquisition probing system using a micro-cavity laser capable of sensing DC voltages
JP2010261761A (ja) * 2009-04-30 2010-11-18 Japan Radio Co Ltd 出力電圧測定装置
US8993191B2 (en) * 2011-07-25 2015-03-31 Bloom Energy Corporation Measurement device for measuring voltages along a linear array of voltage sources
US10119998B2 (en) 2016-11-07 2018-11-06 Fluke Corporation Variable capacitance non-contact AC voltage measurement system
US10359494B2 (en) 2016-11-11 2019-07-23 Fluke Corporation Proving unit for non-contact voltage measurement systems
US10352967B2 (en) 2016-11-11 2019-07-16 Fluke Corporation Non-contact electrical parameter measurement systems
US10254375B2 (en) 2016-11-11 2019-04-09 Fluke Corporation Proving unit for voltage measurement systems
US10139435B2 (en) 2016-11-11 2018-11-27 Fluke Corporation Non-contact voltage measurement system using reference signal
US10605832B2 (en) 2016-11-11 2020-03-31 Fluke Corporation Sensor subsystems for non-contact voltage measurement devices
US10281503B2 (en) 2016-11-11 2019-05-07 Fluke Corporation Non-contact voltage measurement system using multiple capacitors
US10591515B2 (en) 2016-11-11 2020-03-17 Fluke Corporation Non-contact current measurement system
US9933459B1 (en) 2016-11-11 2018-04-03 Fluke Corporation Magnetically coupled ground reference probe
CN106885935A (zh) * 2017-04-19 2017-06-23 中国电子产品可靠性与环境试验研究所 时域电压测量方法、测量校准方法及测量校准验证方法
CN106990277A (zh) * 2017-04-19 2017-07-28 中国电子产品可靠性与环境试验研究所 时域电压测量装置、测量校准装置及测量校准验证装置
US10120021B1 (en) 2017-06-16 2018-11-06 Fluke Corporation Thermal non-contact voltage and non-contact current devices
US10539643B2 (en) 2017-09-01 2020-01-21 Fluke Corporation Proving unit for use with electrical test tools
US10502807B2 (en) 2017-09-05 2019-12-10 Fluke Corporation Calibration system for voltage measurement devices
US10509063B2 (en) 2017-11-28 2019-12-17 Fluke Corporation Electrical signal measurement device using reference signal
US10677876B2 (en) 2018-05-09 2020-06-09 Fluke Corporation Position dependent non-contact voltage and current measurement
US10557875B2 (en) 2018-05-09 2020-02-11 Fluke Corporation Multi-sensor scanner configuration for non-contact voltage measurement devices
US10775409B2 (en) 2018-05-09 2020-09-15 Fluke Corporation Clamp probe for non-contact electrical parameter measurement
US10551416B2 (en) 2018-05-09 2020-02-04 Fluke Corporation Multi-sensor configuration for non-contact voltage measurement devices
US10746767B2 (en) 2018-05-09 2020-08-18 Fluke Corporation Adjustable length Rogowski coil measurement device with non-contact voltage measurement
US10908188B2 (en) 2018-05-11 2021-02-02 Fluke Corporation Flexible jaw probe for non-contact electrical parameter measurement
US10802072B2 (en) 2018-05-11 2020-10-13 Fluke Corporation Non-contact DC voltage measurement device with oscillating sensor
CN108802469B (zh) * 2018-05-25 2020-12-18 北京航天时代光电科技有限公司 一种新型低压光学电压传感装置

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US3102201A (en) * 1958-12-15 1963-08-27 Rca Corp Semiconductor device for generating modulated radiation
US3327243A (en) * 1963-06-03 1967-06-20 Carlisle M Stickley Laser tuning and modulating system having an external feedback path
US3305685A (en) * 1963-11-07 1967-02-21 Univ California Semiconductor laser and method
US3518574A (en) * 1964-05-01 1970-06-30 Ibm Injection laser device
GB1102749A (en) * 1964-07-29 1968-02-07 Hitachi Ltd A light modulator arrangement
US3488586A (en) * 1965-06-02 1970-01-06 Gen Electric Frequency modulated light coupled data link
DE1264606B (de) * 1966-01-31 1968-03-28 Siemens Ag Anordnung zur UEbertragung einer von einem auf der Hochspannungsseite fliessenden Strom gebildeten Messgroesse von der Hochspannungs-auf die Niederspannungsseite
US3477041A (en) * 1968-06-05 1969-11-04 Rca Corp Production of amplitude modulated light by a solid state oscillator
US3614447A (en) * 1969-06-16 1971-10-19 Bell Telephone Labor Inc Method for modulating semiconductor lasers
US3680001A (en) * 1971-05-13 1972-07-25 Bell Telephone Labor Inc Dynamic am control of the transverse modes of a self-pulsing semiconductor laser
DE2718131A1 (de) * 1977-04-23 1978-11-02 Felten & Guilleaume Carlswerk Zweipoliger hochspannungs-phasenpruefer
US4229829A (en) * 1978-03-16 1980-10-21 Grunwald Peter H Apparatus for wireless transmission of a teaching program in a classroom
GB8704539D0 (en) * 1987-02-26 1987-04-01 Bicc Plc Electrical current measurement
EP0293841B1 (de) * 1987-05-31 1993-01-20 Hamamatsu Photonics K.K. Spannungsdetektor
US5126661A (en) * 1990-10-18 1992-06-30 At&T Bell Laboratories Optical probing method and apparatus
JPH05156379A (ja) * 1991-12-06 1993-06-22 Hitachi Metals Ltd エレクトロスラグ再溶解装置
US5357585A (en) * 1993-07-09 1994-10-18 Khyber Technologies Corporation Headphone assembly

Also Published As

Publication number Publication date
US5703491A (en) 1997-12-30
EP0613016B1 (de) 1999-05-06
DE69418241D1 (de) 1999-06-10
US5583444A (en) 1996-12-10
EP0613016A1 (de) 1994-08-31
JPH06222087A (ja) 1994-08-12

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee