DE69417262T2 - Konturmesssystem - Google Patents

Konturmesssystem

Info

Publication number
DE69417262T2
DE69417262T2 DE69417262T DE69417262T DE69417262T2 DE 69417262 T2 DE69417262 T2 DE 69417262T2 DE 69417262 T DE69417262 T DE 69417262T DE 69417262 T DE69417262 T DE 69417262T DE 69417262 T2 DE69417262 T2 DE 69417262T2
Authority
DE
Germany
Prior art keywords
measuring system
contour measuring
contour
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69417262T
Other languages
English (en)
Other versions
DE69417262D1 (de
Inventor
Gregory Hull-Allen
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Raytheon Technologies Corp
Original Assignee
United Technologies Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by United Technologies Corp filed Critical United Technologies Corp
Publication of DE69417262D1 publication Critical patent/DE69417262D1/de
Application granted granted Critical
Publication of DE69417262T2 publication Critical patent/DE69417262T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2536—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object using several gratings with variable grating pitch, projected on the object with the same angle of incidence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/20—Measuring arrangements characterised by the use of mechanical techniques for measuring contours or curvatures
    • G01B5/205—Measuring arrangements characterised by the use of mechanical techniques for measuring contours or curvatures of turbine blades or propellers
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/50—Depth or shape recovery
    • G06T7/521—Depth or shape recovery from laser ranging, e.g. using interferometry; from the projection of structured light

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Optics & Photonics (AREA)
  • Theoretical Computer Science (AREA)
  • Length Measuring Devices By Optical Means (AREA)
DE69417262T 1993-12-21 1994-12-21 Konturmesssystem Expired - Fee Related DE69417262T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/171,559 US5436462A (en) 1993-12-21 1993-12-21 Video contour measurement system employing moire interferometry having a beat frequency pattern
PCT/US1994/014602 WO1995017644A1 (en) 1993-12-21 1994-12-21 Contour measurement system

Publications (2)

Publication Number Publication Date
DE69417262D1 DE69417262D1 (de) 1999-04-22
DE69417262T2 true DE69417262T2 (de) 1999-07-08

Family

ID=22624205

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69417262T Expired - Fee Related DE69417262T2 (de) 1993-12-21 1994-12-21 Konturmesssystem

Country Status (5)

Country Link
US (1) US5436462A (de)
EP (1) EP0736167B1 (de)
JP (1) JPH09507293A (de)
DE (1) DE69417262T2 (de)
WO (1) WO1995017644A1 (de)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5701179A (en) * 1995-09-29 1997-12-23 Medar, Inc. Method and system for measuring dimensions of an edge of a part
DE29515738U1 (de) * 1995-10-04 1995-11-30 Vosseler Hans Guenther Meßvorrichtung zur kontaktlosen Meßanalyse von Körpern oder Oberflächen
US5659389A (en) * 1996-12-12 1997-08-19 Ford Global Tech Inc Non-intrusive throttle body calibration
US5991461A (en) * 1996-12-20 1999-11-23 Veeco Corporation Selection process for sequentially combining multiple sets of overlapping surface-profile interferometric data to produce a continuous composite map
GB9828474D0 (en) 1998-12-24 1999-02-17 British Aerospace Surface topology inspection
GB9903638D0 (en) * 1999-02-17 1999-04-07 European Community A measurement method and measurement apparatus
US6122062A (en) * 1999-05-03 2000-09-19 Fanuc Robotics North America, Inc. 3-D camera
US6711279B1 (en) * 2000-11-17 2004-03-23 Honeywell International Inc. Object detection
US6841780B2 (en) * 2001-01-19 2005-01-11 Honeywell International Inc. Method and apparatus for detecting objects
US7176440B2 (en) * 2001-01-19 2007-02-13 Honeywell International Inc. Method and apparatus for detecting objects using structured light patterns
US20020163573A1 (en) * 2001-04-11 2002-11-07 Bieman Leonard H. Imaging system
US7881896B2 (en) 2002-02-14 2011-02-01 Faro Technologies, Inc. Portable coordinate measurement machine with integrated line laser scanner
JP2003258245A (ja) * 2002-03-01 2003-09-12 Mitsubishi Electric Corp 半導体装置およびその製造方法
US7099017B2 (en) * 2003-05-28 2006-08-29 General Electric Company Methods and apparatus for measuring flow opening areas
US20050219553A1 (en) * 2003-07-31 2005-10-06 Kelly Patrick V Monitoring apparatus
US20090155082A1 (en) * 2007-12-18 2009-06-18 Loc Duong Method to maximize resonance-free running range for a turbine blade
ATE520958T1 (de) * 2009-08-19 2011-09-15 Pepperl & Fuchs Verfahren zum messen von objekten
WO2014043587A1 (en) * 2012-09-13 2014-03-20 California Institute Of Technology Coherent camera
US9207154B2 (en) 2013-10-22 2015-12-08 General Electric Company Method and system for creep measurement
CN114658493B (zh) * 2022-03-18 2022-12-23 北京航空航天大学 适用于旋转的无扭转涡轮叶片的表面图像展平方法及应用

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3614237A (en) * 1969-01-21 1971-10-19 Lockheed Aircraft Corp Method and apparatus for contour measurement
US4212073A (en) * 1978-12-13 1980-07-08 Balasubramanian N Method and system for surface contouring
US4657394A (en) * 1984-09-14 1987-04-14 New York Institute Of Technology Apparatus and method for obtaining three dimensional surface contours
US4794550A (en) * 1986-10-15 1988-12-27 Eastman Kodak Company Extended-range moire contouring
US5243542A (en) * 1987-12-29 1993-09-07 Asahi Kogaku Kogyo Kabushiki Kaisha Interferometer employing reference images
CA1313040C (en) * 1988-03-31 1993-01-26 Mitsuaki Uesugi Method and apparatus for measuring a three-dimensional curved surface shape
DE3817559C1 (de) * 1988-05-24 1989-12-07 Fraunhofer-Gesellschaft Zur Foerderung Der Angewandten Forschung Ev, 8000 Muenchen, De
DE3941725A1 (de) * 1989-12-18 1991-06-20 Krupp Atlas Elektronik Gmbh Vorrichtung zum erkennen von deformationen auf pressteilen
US5075560A (en) * 1990-09-20 1991-12-24 Eastman Kodak Company Moire distance measurements using a grating printed on or attached to a surface
US5075562A (en) * 1990-09-20 1991-12-24 Eastman Kodak Company Method and apparatus for absolute Moire distance measurements using a grating printed on or attached to a surface

Also Published As

Publication number Publication date
DE69417262D1 (de) 1999-04-22
WO1995017644A1 (en) 1995-06-29
JPH09507293A (ja) 1997-07-22
US5436462A (en) 1995-07-25
EP0736167A1 (de) 1996-10-09
EP0736167B1 (de) 1999-03-17

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Legal Events

Date Code Title Description
8339 Ceased/non-payment of the annual fee