DE69333589D1 - Method of operating an ion trap mass spectrometer - Google Patents

Method of operating an ion trap mass spectrometer

Info

Publication number
DE69333589D1
DE69333589D1 DE69333589T DE69333589T DE69333589D1 DE 69333589 D1 DE69333589 D1 DE 69333589D1 DE 69333589 T DE69333589 T DE 69333589T DE 69333589 T DE69333589 T DE 69333589T DE 69333589 D1 DE69333589 D1 DE 69333589D1
Authority
DE
Germany
Prior art keywords
operating
mass spectrometer
ion trap
trap mass
ion
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69333589T
Other languages
German (de)
Other versions
DE69333589T2 (en
Inventor
Gregory J Wells
Mingda Wang
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Varian Inc
Original Assignee
Varian Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Varian Inc filed Critical Varian Inc
Publication of DE69333589D1 publication Critical patent/DE69333589D1/en
Application granted granted Critical
Publication of DE69333589T2 publication Critical patent/DE69333589T2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/145—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers using chemical ionisation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • H01J49/0045—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction
    • H01J49/005—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction by collision with gas, e.g. by introducing gas or by accelerating ions with an electric field
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/424—Three-dimensional ion traps, i.e. comprising end-cap and ring electrodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/426—Methods for controlling ions
    • H01J49/427—Ejection and selection methods

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electron Tubes For Measurement (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
DE1993633589 1992-05-29 1993-05-28 Method for operating an ion trap mass spectrometer Expired - Fee Related DE69333589T2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US890991 1986-07-25
US89099192A 1992-05-29 1992-05-29

Publications (2)

Publication Number Publication Date
DE69333589D1 true DE69333589D1 (en) 2004-09-16
DE69333589T2 DE69333589T2 (en) 2005-02-03

Family

ID=25397431

Family Applications (3)

Application Number Title Priority Date Filing Date
DE1993633589 Expired - Fee Related DE69333589T2 (en) 1992-05-29 1993-05-28 Method for operating an ion trap mass spectrometer
DE1993628979 Expired - Fee Related DE69328979T2 (en) 1992-05-29 1993-05-28 Method for operating ion trap mass spectrometers
DE1993621165 Expired - Fee Related DE69321165T2 (en) 1992-05-29 1993-05-28 Method of using a mass spectrometer

Family Applications After (2)

Application Number Title Priority Date Filing Date
DE1993628979 Expired - Fee Related DE69328979T2 (en) 1992-05-29 1993-05-28 Method for operating ion trap mass spectrometers
DE1993621165 Expired - Fee Related DE69321165T2 (en) 1992-05-29 1993-05-28 Method of using a mass spectrometer

Country Status (4)

Country Link
EP (1) EP0575777B1 (en)
JP (2) JP3444429B2 (en)
CA (1) CA2097211A1 (en)
DE (3) DE69333589T2 (en)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5448061A (en) * 1992-05-29 1995-09-05 Varian Associates, Inc. Method of space charge control for improved ion isolation in an ion trap mass spectrometer by dynamically adaptive sampling
US5291017A (en) * 1993-01-27 1994-03-01 Varian Associates, Inc. Ion trap mass spectrometer method and apparatus for improved sensitivity
US5396064A (en) * 1994-01-11 1995-03-07 Varian Associates, Inc. Quadrupole trap ion isolation method
DE4425384C1 (en) * 1994-07-19 1995-11-02 Bruker Franzen Analytik Gmbh Process for shock-induced fragmentation of ions in ion traps
US5714755A (en) * 1996-03-01 1998-02-03 Varian Associates, Inc. Mass scanning method using an ion trap mass spectrometer
DE19932839B4 (en) * 1999-07-14 2007-10-11 Bruker Daltonik Gmbh Fragmentation in quadrupole ion trap mass spectrometers
JP4384542B2 (en) 2004-05-24 2009-12-16 株式会社日立ハイテクノロジーズ Mass spectrometer
DE102005061425B4 (en) * 2005-12-22 2009-06-10 Bruker Daltonik Gmbh Restricted fragmentation in ion trap mass spectrometers
JP4996962B2 (en) 2007-04-04 2012-08-08 株式会社日立ハイテクノロジーズ Mass spectrometer
DE102013213501A1 (en) 2013-07-10 2015-01-15 Carl Zeiss Microscopy Gmbh Mass spectrometer, its use, and method for mass spectrometric analysis of a gas mixture
US10985002B2 (en) * 2019-06-11 2021-04-20 Perkinelmer Health Sciences, Inc. Ionization sources and methods and systems using them

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3688215T3 (en) * 1985-05-24 2005-08-25 Thermo Finnigan Llc, San Jose Control method for an ion trap.
US4686367A (en) * 1985-09-06 1987-08-11 Finnigan Corporation Method of operating quadrupole ion trap chemical ionization mass spectrometry
EP0336990B1 (en) * 1988-04-13 1994-01-05 Bruker Franzen Analytik GmbH Method of mass analyzing a sample by use of a quistor and a quistor designed for performing this method
EP0362432A1 (en) * 1988-10-07 1990-04-11 Bruker Franzen Analytik GmbH Improvement of a method of mass analyzing a sample
US5200613A (en) * 1991-02-28 1993-04-06 Teledyne Mec Mass spectrometry method using supplemental AC voltage signals

Also Published As

Publication number Publication date
EP0575777B1 (en) 1998-09-23
DE69328979D1 (en) 2000-08-10
DE69328979T2 (en) 2001-02-15
CA2097211A1 (en) 1993-11-30
EP0575777A3 (en) 1994-03-16
DE69321165D1 (en) 1998-10-29
EP0575777A2 (en) 1993-12-29
JPH0696727A (en) 1994-04-08
JP3444429B2 (en) 2003-09-08
DE69321165T2 (en) 1999-06-02
DE69333589T2 (en) 2005-02-03
JP2004004082A (en) 2004-01-08

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee