DE69323753T2 - Diagnoseeinrichtung - Google Patents

Diagnoseeinrichtung

Info

Publication number
DE69323753T2
DE69323753T2 DE1993623753 DE69323753T DE69323753T2 DE 69323753 T2 DE69323753 T2 DE 69323753T2 DE 1993623753 DE1993623753 DE 1993623753 DE 69323753 T DE69323753 T DE 69323753T DE 69323753 T2 DE69323753 T2 DE 69323753T2
Authority
DE
Germany
Prior art keywords
diagnostic device
under test
system under
diagnostic system
tests
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE1993623753
Other languages
English (en)
Other versions
DE69323753D1 (de
Inventor
Christopher William Preist
David Allport
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Hewlett Packard Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=8214612&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=DE69323753(T2) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Hewlett Packard Co filed Critical Hewlett Packard Co
Publication of DE69323753D1 publication Critical patent/DE69323753D1/de
Application granted granted Critical
Publication of DE69323753T2 publication Critical patent/DE69323753T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31912—Tester/user interface

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Devices For Executing Special Programs (AREA)
  • Facsimiles In General (AREA)
  • Control Or Security For Electrophotography (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Tests Of Electronic Circuits (AREA)
DE1993623753 1993-11-23 1993-11-23 Diagnoseeinrichtung Expired - Fee Related DE69323753T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP19930309329 EP0654738B1 (de) 1993-11-23 1993-11-23 Diagnoseeinrichtung

Publications (2)

Publication Number Publication Date
DE69323753D1 DE69323753D1 (de) 1999-04-08
DE69323753T2 true DE69323753T2 (de) 1999-07-01

Family

ID=8214612

Family Applications (1)

Application Number Title Priority Date Filing Date
DE1993623753 Expired - Fee Related DE69323753T2 (de) 1993-11-23 1993-11-23 Diagnoseeinrichtung

Country Status (3)

Country Link
EP (1) EP0654738B1 (de)
JP (1) JPH07200341A (de)
DE (1) DE69323753T2 (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0794495A3 (de) * 1996-03-08 1998-07-22 Hewlett-Packard Company Automatisierte Analyse eines modellbasierten Diagnosesystems
US7246271B2 (en) * 2003-10-23 2007-07-17 Agilent Technologies, Inc. Method for diagnosing complex system faults
JP2006252422A (ja) * 2005-03-14 2006-09-21 Kawasaki Heavy Ind Ltd 故障診断方法及び装置
US20070061110A1 (en) * 2005-09-09 2007-03-15 Canadian Space Agency System and method for diagnosis based on set operations
JP4752755B2 (ja) * 2006-12-20 2011-08-17 富士ゼロックス株式会社 故障診断装置、故障診断システム、及び故障診断プログラム
US8458525B2 (en) * 2010-03-19 2013-06-04 Hamilton Sundstrand Space Systems International, Inc. Bayesian approach to identifying sub-module failure
JP5669630B2 (ja) * 2011-03-04 2015-02-12 インターナショナル・ビジネス・マシーンズ・コーポレーションＩｎｔｅｒｎａｔｉｏｎａｌ Ｂｕｓｉｎｅｓｓ Ｍａｃｈｉｎｅｓ Ｃｏｒｐｏｒａｔｉｏｎ テスト・ケース生成方法、プログラム及びシステム
DE112016007535T5 (de) * 2016-12-21 2019-09-26 Mitsubishi Electric Corporation Steuereinrichtung und verarbeitungsverfahren im falle einer fehlfunktion der steuereinrichtung

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0296884A3 (de) * 1987-06-24 1991-01-16 Schlumberger Technologies, Inc. Methode zur In-Circuit-Prüfung von elektronischen Geräten
US5272704A (en) * 1989-08-18 1993-12-21 General Electric Company Method and apparatus for generation of multi-branched diagnostic trees
US5001714A (en) * 1989-11-07 1991-03-19 Array Analysis, Inc. Unpredictable fault detection using adaptive inference testing techniques

Also Published As

Publication number Publication date
JPH07200341A (ja) 1995-08-04
DE69323753D1 (de) 1999-04-08
EP0654738A1 (de) 1995-05-24
EP0654738B1 (de) 1999-03-03

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Legal Events

Date Code Title Description
8363 Opposition against the patent
8327 Change in the person/name/address of the patent owner

Owner name: AGILENT TECHNOLOGIES, INC. (N.D.GES.D.STAATES DELA

8327 Change in the person/name/address of the patent owner

Owner name: AGILENT TECHNOLOGIES, INC. (N.D.GES.D. STAATES, US

8365 Fully valid after opposition proceedings
8339 Ceased/non-payment of the annual fee