DE69215090D1 - Verfahren und System zum Testen eines integrierten Schaltkreises mit Abfragedesign - Google Patents
Verfahren und System zum Testen eines integrierten Schaltkreises mit AbfragedesignInfo
- Publication number
- DE69215090D1 DE69215090D1 DE69215090T DE69215090T DE69215090D1 DE 69215090 D1 DE69215090 D1 DE 69215090D1 DE 69215090 T DE69215090 T DE 69215090T DE 69215090 T DE69215090 T DE 69215090T DE 69215090 D1 DE69215090 D1 DE 69215090D1
- Authority
- DE
- Germany
- Prior art keywords
- testing
- integrated circuit
- query design
- query
- design
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318544—Scanning methods, algorithms and patterns
- G01R31/318547—Data generators or compressors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/302—Contactless testing
- G01R31/305—Contactless testing using electron beams
- G01R31/307—Contactless testing using electron beams of integrated circuits
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP92114431A EP0584385B1 (de) | 1992-08-25 | 1992-08-25 | Verfahren und System zum Testen eines integrierten Schaltkreises mit Abfragedesign |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69215090D1 true DE69215090D1 (de) | 1996-12-12 |
DE69215090T2 DE69215090T2 (de) | 1997-04-30 |
Family
ID=8209937
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69215090T Expired - Fee Related DE69215090T2 (de) | 1992-08-25 | 1992-08-25 | Verfahren und System zum Testen eines integrierten Schaltkreises mit Abfragedesign |
Country Status (4)
Country | Link |
---|---|
US (1) | US5485473A (de) |
EP (1) | EP0584385B1 (de) |
JP (1) | JP2823489B2 (de) |
DE (1) | DE69215090T2 (de) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7137048B2 (en) * | 2001-02-02 | 2006-11-14 | Rambus Inc. | Method and apparatus for evaluating and optimizing a signaling system |
US5574853A (en) * | 1994-01-03 | 1996-11-12 | Texas Instruments Incorporated | Testing integrated circuit designs on a computer simulation using modified serialized scan patterns |
US5726995A (en) * | 1994-12-15 | 1998-03-10 | Intel Corporation | Method and apparatus for selecting modes of an intergrated circuit |
FR2764991B1 (fr) * | 1997-06-24 | 1999-09-03 | Sgs Thomson Microelectronics | Procede de test fonctionnel et circuit comprenant des moyens de mise en oeuvre du procede |
US6484294B1 (en) * | 1999-04-23 | 2002-11-19 | Hitachi, Ltd. | Semiconductor integrated circuit and method of designing the same |
US7490275B2 (en) | 2001-02-02 | 2009-02-10 | Rambus Inc. | Method and apparatus for evaluating and optimizing a signaling system |
US6873939B1 (en) * | 2001-02-02 | 2005-03-29 | Rambus Inc. | Method and apparatus for evaluating and calibrating a signaling system |
US7234092B2 (en) * | 2002-06-11 | 2007-06-19 | On-Chip Technologies, Inc. | Variable clocked scan test circuitry and method |
US7076377B2 (en) * | 2003-02-11 | 2006-07-11 | Rambus Inc. | Circuit, apparatus and method for capturing a representation of a waveform from a clock-data recovery (CDR) unit |
US7009625B2 (en) * | 2003-03-11 | 2006-03-07 | Sun Microsystems, Inc. | Method of displaying an image of device test data |
US9075110B2 (en) * | 2010-10-05 | 2015-07-07 | Kyushu Institute Of Technology | Fault detection system, acquisition apparatus, fault detection method, program, and non-transitory computer-readable medium |
US9465071B2 (en) | 2014-03-04 | 2016-10-11 | Mediatek Inc. | Method and apparatus for generating featured scan pattern |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4441075A (en) * | 1981-07-02 | 1984-04-03 | International Business Machines Corporation | Circuit arrangement which permits the testing of each individual chip and interchip connection in a high density packaging structure having a plurality of interconnected chips, without any physical disconnection |
US4703260A (en) * | 1985-09-23 | 1987-10-27 | International Business Machines Corporation | Full chip integrated circuit tester |
US4716564A (en) * | 1985-11-15 | 1987-12-29 | Tektronix, Inc. | Method for test generation |
US4745603A (en) * | 1986-05-27 | 1988-05-17 | American Telephone And Telegraph Company, At&T Bell Laboratories | Code sequence generator for a digital transmission line fault location system |
US4996659A (en) * | 1986-08-20 | 1991-02-26 | Hitachi, Ltd. | Method of diagnosing integrated logic circuit |
US4853928A (en) * | 1987-08-28 | 1989-08-01 | Hewlett-Packard Company | Automatic test generator for logic devices |
US5321701A (en) * | 1990-12-06 | 1994-06-14 | Teradyne, Inc. | Method and apparatus for a minimal memory in-circuit digital tester |
US5331570A (en) * | 1992-03-27 | 1994-07-19 | Mitsubishi Electric Research Laboratories, Inc. | Method for generating test access procedures |
-
1992
- 1992-08-25 EP EP92114431A patent/EP0584385B1/de not_active Expired - Lifetime
- 1992-08-25 DE DE69215090T patent/DE69215090T2/de not_active Expired - Fee Related
-
1993
- 1993-08-20 JP JP5206122A patent/JP2823489B2/ja not_active Expired - Lifetime
- 1993-08-20 US US08/109,794 patent/US5485473A/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JPH06160484A (ja) | 1994-06-07 |
EP0584385A1 (de) | 1994-03-02 |
US5485473A (en) | 1996-01-16 |
DE69215090T2 (de) | 1997-04-30 |
JP2823489B2 (ja) | 1998-11-11 |
EP0584385B1 (de) | 1996-11-06 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |