DE69119774D1 - Device and method for measuring the optical axis deflection - Google Patents

Device and method for measuring the optical axis deflection

Info

Publication number
DE69119774D1
DE69119774D1 DE69119774T DE69119774T DE69119774D1 DE 69119774 D1 DE69119774 D1 DE 69119774D1 DE 69119774 T DE69119774 T DE 69119774T DE 69119774 T DE69119774 T DE 69119774T DE 69119774 D1 DE69119774 D1 DE 69119774D1
Authority
DE
Germany
Prior art keywords
measuring
optical axis
axis deflection
deflection
optical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69119774T
Other languages
German (de)
Other versions
DE69119774T2 (en
Inventor
Toshiyuki Kaya
Osamu Takao
Nobuo Matsushita
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
CHUO ELECTRONIC MEASUREMENT CO., LTD., HIROSHIMA,
Original Assignee
CHUO ELECTRIC MEASUREMENT CO
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by CHUO ELECTRIC MEASUREMENT CO filed Critical CHUO ELECTRIC MEASUREMENT CO
Priority claimed from EP91121845A external-priority patent/EP0547269B1/en
Publication of DE69119774D1 publication Critical patent/DE69119774D1/en
Application granted granted Critical
Publication of DE69119774T2 publication Critical patent/DE69119774T2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

DE1991619774 1991-12-19 1991-12-19 Device and method for measuring the optical axis deflection Expired - Fee Related DE69119774T2 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP91121845A EP0547269B1 (en) 1991-12-16 1991-12-19 Apparatus and method for measuring optical axis deflection

Publications (2)

Publication Number Publication Date
DE69119774D1 true DE69119774D1 (en) 1996-06-27
DE69119774T2 DE69119774T2 (en) 1996-10-02

Family

ID=8207453

Family Applications (1)

Application Number Title Priority Date Filing Date
DE1991619774 Expired - Fee Related DE69119774T2 (en) 1991-12-19 1991-12-19 Device and method for measuring the optical axis deflection

Country Status (1)

Country Link
DE (1) DE69119774T2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102005048685A1 (en) * 2005-10-11 2007-04-26 Schuh & Co. Gmbh Measuring arrangement and method for measuring the far field of a light source

Also Published As

Publication number Publication date
DE69119774T2 (en) 1996-10-02

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: CHUO ELECTRONIC MEASUREMENT CO., LTD., HIROSHIMA,

8339 Ceased/non-payment of the annual fee