DE68924639D1 - Matrix memory, which includes standard blocks, standard sub-blocks, a redundant block and redundant sub-blocks, and integrated circuit, which contains a plurality of such matrix memories. - Google Patents

Matrix memory, which includes standard blocks, standard sub-blocks, a redundant block and redundant sub-blocks, and integrated circuit, which contains a plurality of such matrix memories.

Info

Publication number
DE68924639D1
DE68924639D1 DE68924639T DE68924639T DE68924639D1 DE 68924639 D1 DE68924639 D1 DE 68924639D1 DE 68924639 T DE68924639 T DE 68924639T DE 68924639 T DE68924639 T DE 68924639T DE 68924639 D1 DE68924639 D1 DE 68924639D1
Authority
DE
Germany
Prior art keywords
blocks
sub
redundant
standard
matrix
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE68924639T
Other languages
German (de)
Other versions
DE68924639T2 (en
Inventor
Cormac Michael O'connell
Leonardus Chritien M Pfennings
Peter Hermann Voss
Thomas James Davies
Hans Ontrop
Cathal Gerard Phelan
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NXP BV
Original Assignee
Philips Electronics NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Electronics NV filed Critical Philips Electronics NV
Publication of DE68924639D1 publication Critical patent/DE68924639D1/en
Application granted granted Critical
Publication of DE68924639T2 publication Critical patent/DE68924639T2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/16—Error detection or correction of the data by redundancy in hardware
    • G06F11/20—Error detection or correction of the data by redundancy in hardware using active fault-masking, e.g. by switching out faulty elements or by switching in spare elements
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
    • G11C29/84—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved access time or stability
    • G11C29/846—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved access time or stability by choosing redundant lines at an output stage
DE68924639T 1989-01-06 1989-12-21 Matrix memory, which includes standard blocks, standard sub-blocks, a redundant block and redundant sub-blocks, and integrated circuit, which contains a plurality of such matrix memories. Expired - Lifetime DE68924639T2 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NL8900026A NL8900026A (en) 1989-01-06 1989-01-06 MATRIX MEMORY, CONTAINING STANDARD BLOCKS, STANDARD SUBBLOCKS, A REDUNDANT BLOCK, AND REDUNDANT SUBBLOCKS, AND AN INTEGRATED CIRCUIT CONTAINING MULTIPLE OF SUCH MATRIX MEMORIES.

Publications (2)

Publication Number Publication Date
DE68924639D1 true DE68924639D1 (en) 1995-11-30
DE68924639T2 DE68924639T2 (en) 1996-05-30

Family

ID=19853911

Family Applications (1)

Application Number Title Priority Date Filing Date
DE68924639T Expired - Lifetime DE68924639T2 (en) 1989-01-06 1989-12-21 Matrix memory, which includes standard blocks, standard sub-blocks, a redundant block and redundant sub-blocks, and integrated circuit, which contains a plurality of such matrix memories.

Country Status (6)

Country Link
US (1) US5033024A (en)
EP (1) EP0377249B1 (en)
JP (1) JP2852319B2 (en)
KR (1) KR0170766B1 (en)
DE (1) DE68924639T2 (en)
NL (1) NL8900026A (en)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0748320B2 (en) * 1989-07-24 1995-05-24 セイコー電子工業株式会社 Semiconductor non-volatile memory
JPH03235290A (en) * 1990-02-09 1991-10-21 Mitsubishi Electric Corp Semiconductor memory device having hierarchical row select line
GB9007796D0 (en) * 1990-04-06 1990-06-06 Foss Richard C Dynamic memory row/column redundancy scheme
JPH04103099A (en) * 1990-08-23 1992-04-06 Toshiba Corp Semiconductor memory
JP3019869B2 (en) * 1990-10-16 2000-03-13 富士通株式会社 Semiconductor memory
EP0543656B1 (en) * 1991-11-20 1998-09-16 Fujitsu Limited Flash-erasable semiconductor memory device having an improved reliability
JP2738195B2 (en) * 1991-12-27 1998-04-08 日本電気株式会社 Nonvolatile semiconductor memory device
US5295101A (en) * 1992-01-31 1994-03-15 Texas Instruments Incorporated Array block level redundancy with steering logic
EP0567707A1 (en) * 1992-04-30 1993-11-03 International Business Machines Corporation Implementation of column redundancy in a cache memory architecture
KR950000275B1 (en) * 1992-05-06 1995-01-12 삼성전자 주식회사 Column redundancy of semiconductor memory device
US5317535A (en) * 1992-06-19 1994-05-31 Intel Corporation Gate/source disturb protection for sixteen-bit flash EEPROM memory arrays
SE502777C2 (en) * 1993-04-29 1996-01-08 Ellemtel Utvecklings Ab Fault isolation of parts of a telephone and data communication system
JP3212421B2 (en) * 1993-09-20 2001-09-25 富士通株式会社 Nonvolatile semiconductor memory device
JP3351595B2 (en) * 1993-12-22 2002-11-25 株式会社日立製作所 Semiconductor memory device
JP2751821B2 (en) * 1994-02-16 1998-05-18 日本電気株式会社 Nonvolatile semiconductor memory device
US5805512A (en) * 1995-02-09 1998-09-08 Kabushiki Kaisha Toshiba Semiconductor memory device
WO1996038845A1 (en) * 1995-05-31 1996-12-05 Macronix International Co., Ltd. Technique for reconfiguring a high density memory
US5999463A (en) * 1997-07-21 1999-12-07 Samsung Electronics Co., Ltd. Redundancy fuse box and semiconductor device including column redundancy fuse box shared by a plurality of memory blocks
JPH11317091A (en) * 1998-04-30 1999-11-16 Nec Corp Semiconductor storage device
US7403417B2 (en) * 2005-11-23 2008-07-22 Infineon Technologies Flash Gmbh & Co. Kg Non-volatile semiconductor memory device and method for operating a non-volatile memory device
US9795329B2 (en) 2014-01-10 2017-10-24 Glucovista Inc. Non-invasive device and method for measuring a substance concentration
KR20190060527A (en) * 2017-11-24 2019-06-03 삼성전자주식회사 Semiconductor memory device and method of operating the same
CN115855226B (en) * 2023-02-24 2023-05-30 青岛科技大学 Multi-AUV cooperative underwater data acquisition method based on DQN and matrix completion

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6031038A (en) * 1983-07-29 1985-02-16 Shimadzu Corp Structure testing machine
US4599709A (en) * 1984-02-17 1986-07-08 At&T Bell Laboratories Byte organized static memory
KR890003691B1 (en) * 1986-08-22 1989-09-30 삼성전자 주식회사 Cmos column address redundaney

Also Published As

Publication number Publication date
EP0377249A1 (en) 1990-07-11
KR0170766B1 (en) 1999-03-30
DE68924639T2 (en) 1996-05-30
KR900012161A (en) 1990-08-03
NL8900026A (en) 1990-08-01
JP2852319B2 (en) 1999-02-03
EP0377249B1 (en) 1995-10-25
US5033024A (en) 1991-07-16
JPH02246100A (en) 1990-10-01

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: KONINKLIJKE PHILIPS ELECTRONICS N.V., EINDHOVEN, N

8327 Change in the person/name/address of the patent owner

Owner name: NXP B.V., EINDHOVEN, NL

8328 Change in the person/name/address of the agent

Representative=s name: EISENFUEHR, SPEISER & PARTNER, 10178 BERLIN