DE60334911D1 - Method for measuring optical nonlinearity space profiles of samples - Google Patents
Method for measuring optical nonlinearity space profiles of samplesInfo
- Publication number
- DE60334911D1 DE60334911D1 DE60334911T DE60334911T DE60334911D1 DE 60334911 D1 DE60334911 D1 DE 60334911D1 DE 60334911 T DE60334911 T DE 60334911T DE 60334911 T DE60334911 T DE 60334911T DE 60334911 D1 DE60334911 D1 DE 60334911D1
- Authority
- DE
- Germany
- Prior art keywords
- samples
- measuring optical
- optical nonlinearity
- space profiles
- profiles
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 230000003287 optical effect Effects 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J11/00—Measuring the characteristics of individual optical pulses or of optical pulse trains
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/636—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited using an arrangement of pump beam and probe beam; using the measurement of optical non-linear properties
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US40540502P | 2002-08-21 | 2002-08-21 | |
US10/357,275 US7133134B2 (en) | 2002-08-21 | 2003-01-31 | Method of measuring a physical function using a symmetric composite function |
US10/378,591 US6856393B2 (en) | 2002-08-21 | 2003-03-03 | Method of measuring a physical function using a composite function which includes the physical function and an arbitrary reference function |
PCT/US2003/026311 WO2004019018A2 (en) | 2002-08-21 | 2003-08-21 | Method of measuring nonlinearity spatial profiles of samples and temporal profiles of optical pulses |
Publications (1)
Publication Number | Publication Date |
---|---|
DE60334911D1 true DE60334911D1 (en) | 2010-12-23 |
Family
ID=31891076
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60334911T Expired - Lifetime DE60334911D1 (en) | 2002-08-21 | 2003-08-21 | Method for measuring optical nonlinearity space profiles of samples |
Country Status (1)
Country | Link |
---|---|
DE (1) | DE60334911D1 (en) |
-
2003
- 2003-08-21 DE DE60334911T patent/DE60334911D1/en not_active Expired - Lifetime
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