DE60316645D1 - Kalibrierungsmustereinheit - Google Patents

Kalibrierungsmustereinheit

Info

Publication number
DE60316645D1
DE60316645D1 DE60316645T DE60316645T DE60316645D1 DE 60316645 D1 DE60316645 D1 DE 60316645D1 DE 60316645 T DE60316645 T DE 60316645T DE 60316645 T DE60316645 T DE 60316645T DE 60316645 D1 DE60316645 D1 DE 60316645D1
Authority
DE
Germany
Prior art keywords
calibration pattern
pattern unit
calibration
unit
pattern
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE60316645T
Other languages
English (en)
Other versions
DE60316645T2 (de
Inventor
Kazuhiko Arai
Akio Kosaka
Takashi Miyoshi
Kazuhiko Takahahi
Hidekazu Iwaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Olympus Corp
Original Assignee
Olympus Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Corp filed Critical Olympus Corp
Application granted granted Critical
Publication of DE60316645D1 publication Critical patent/DE60316645D1/de
Publication of DE60316645T2 publication Critical patent/DE60316645T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2504Calibration devices
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/80Analysis of captured images to determine intrinsic or extrinsic camera parameters, i.e. camera calibration

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Studio Devices (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
DE60316645T 2002-08-29 2003-08-26 Kalibrierungsmustereinheit Expired - Fee Related DE60316645T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2002251634 2002-08-29
JP2002251634A JP3635539B2 (ja) 2002-08-29 2002-08-29 キャリブレーションパターンユニット

Publications (2)

Publication Number Publication Date
DE60316645D1 true DE60316645D1 (de) 2007-11-15
DE60316645T2 DE60316645T2 (de) 2008-01-31

Family

ID=31492613

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60316645T Expired - Fee Related DE60316645T2 (de) 2002-08-29 2003-08-26 Kalibrierungsmustereinheit

Country Status (4)

Country Link
US (1) US7286698B2 (de)
EP (1) EP1394501B1 (de)
JP (1) JP3635539B2 (de)
DE (1) DE60316645T2 (de)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3635539B2 (ja) * 2002-08-29 2005-04-06 オリンパス株式会社 キャリブレーションパターンユニット
DE102004021893B4 (de) * 2004-05-04 2009-06-04 Daimler Ag Verfahren zum Einmessen einer robotergeführten optischen Messanordnung
US20120032946A1 (en) * 2010-08-04 2012-02-09 Wei-Chung Wang New calibration procedures for three-dimensional digital image correlation
DE102010039246A1 (de) * 2010-08-12 2012-02-16 Robert Bosch Gmbh Verfahren zum Kalibrieren eines Messsystems und Vorrichtung zum Durchführen des Verfahrens
WO2012135014A2 (en) * 2011-03-25 2012-10-04 Tk Holdings Inc. Image sensor calibration system and method
DE102012200415A1 (de) * 2011-03-29 2012-10-04 Robert Bosch Gmbh System und Verfahren zum Kalibrieren eines Referenzsystems zur Fahrzeugvermessung
DE102011078631A1 (de) 2011-07-05 2013-01-10 Robert Bosch Gmbh Anordnung und Verfahren zum Bestimmen einer Abbildungsabweichung einer Kamera
US10445898B2 (en) * 2016-02-05 2019-10-15 Sony Corporation System and method for camera calibration by use of rotatable three-dimensional calibration object
WO2018195096A1 (en) * 2017-04-17 2018-10-25 Cognex Corporation High-accuracy calibration system and method
US10089753B1 (en) * 2017-07-05 2018-10-02 Almotive Kft. Method, system and computer-readable medium for camera calibration
US10650584B2 (en) 2018-03-30 2020-05-12 Konica Minolta Laboratory U.S.A., Inc. Three-dimensional modeling scanner
DE102018125422B4 (de) * 2018-10-15 2020-12-24 Karl Storz Se & Co. Kg Verfahren zum Prüfen oder Kalibrieren einer Stereo-Bilderfassungsvorrichtung
DE102018222796A1 (de) * 2018-12-21 2020-06-25 Conti Temic Microelectronic Gmbh Aufbau und Vermessung des Aufbaus zur Kalibrierung einer Kamera
US10488185B1 (en) * 2019-03-14 2019-11-26 The Boeing Company Methods and systems for characterizing a surface of a structural component

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05256627A (ja) * 1992-03-11 1993-10-05 Takaoka Electric Mfg Co Ltd 画像センサ調整装置
JP3869876B2 (ja) 1995-12-19 2007-01-17 キヤノン株式会社 画像計測方法及び画像計測装置
JPH11166818A (ja) 1997-12-04 1999-06-22 Suzuki Motor Corp 三次元形状計測装置の校正方法及び校正装置
US6341016B1 (en) * 1999-08-06 2002-01-22 Michael Malione Method and apparatus for measuring three-dimensional shape of object
JP2001082941A (ja) * 1999-09-16 2001-03-30 Gen Tec:Kk キャリブレーション用3次元パターン
US6511418B2 (en) * 2000-03-30 2003-01-28 The Board Of Trustees Of The Leland Stanford Junior University Apparatus and method for calibrating and endoscope
GB0023681D0 (en) * 2000-09-27 2000-11-08 Canon Kk Image processing apparatus
US7062861B2 (en) * 2001-06-28 2006-06-20 Snap-On Incorporated Self-calibrating position determination system and user interface
JP4877891B2 (ja) 2001-08-03 2012-02-15 株式会社トプコン 校正用被写体
FR2835603B1 (fr) * 2002-02-01 2004-11-12 Holo 3 Procede et dispositif de mesure optique du deplacement et/ou de la deformation d'un objet dans au moins une direction
US6917702B2 (en) * 2002-04-24 2005-07-12 Mitsubishi Electric Research Labs, Inc. Calibration of multiple cameras for a turntable-based 3D scanner
JP3635540B2 (ja) * 2002-08-29 2005-04-06 オリンパス株式会社 キャリブレーションパターンユニット
JP3635539B2 (ja) * 2002-08-29 2005-04-06 オリンパス株式会社 キャリブレーションパターンユニット

Also Published As

Publication number Publication date
US20040042649A1 (en) 2004-03-04
EP1394501A2 (de) 2004-03-03
US7286698B2 (en) 2007-10-23
JP3635539B2 (ja) 2005-04-06
EP1394501B1 (de) 2007-10-03
JP2004093216A (ja) 2004-03-25
EP1394501A3 (de) 2006-01-25
DE60316645T2 (de) 2008-01-31

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee