DE60237611D1 - Verfahren und vorrichtung zur verwendung der zweiwellenmischungs-ultraschalldetektion in schnellen scanning-anwendungen - Google Patents
Verfahren und vorrichtung zur verwendung der zweiwellenmischungs-ultraschalldetektion in schnellen scanning-anwendungenInfo
- Publication number
- DE60237611D1 DE60237611D1 DE60237611T DE60237611T DE60237611D1 DE 60237611 D1 DE60237611 D1 DE 60237611D1 DE 60237611 T DE60237611 T DE 60237611T DE 60237611 T DE60237611 T DE 60237611T DE 60237611 D1 DE60237611 D1 DE 60237611D1
- Authority
- DE
- Germany
- Prior art keywords
- twin
- ultrasound detection
- fast scanning
- scanning applications
- wheel mixing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000001514 detection method Methods 0.000 title 1
- 238000000034 method Methods 0.000 title 1
- 238000002604 ultrasonography Methods 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/22—Details, e.g. general constructional or apparatus details
- G01N29/24—Probes
- G01N29/2418—Probes using optoacoustic interaction with the material, e.g. laser radiation, photoacoustics
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
- G01B11/161—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means
- G01B11/164—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means by holographic interferometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02055—Reduction or prevention of errors; Testing; Calibration
- G01B9/02062—Active error reduction, i.e. varying with time
- G01B9/02064—Active error reduction, i.e. varying with time by particular adjustment of coherence gate, i.e. adjusting position of zero path difference in low coherence interferometry
- G01B9/02065—Active error reduction, i.e. varying with time by particular adjustment of coherence gate, i.e. adjusting position of zero path difference in low coherence interferometry using a second interferometer before or after measuring interferometer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02055—Reduction or prevention of errors; Testing; Calibration
- G01B9/02075—Reduction or prevention of errors; Testing; Calibration of particular errors
- G01B9/02078—Caused by ambiguity
- G01B9/02079—Quadrature detection, i.e. detecting relatively phase-shifted signals
- G01B9/02081—Quadrature detection, i.e. detecting relatively phase-shifted signals simultaneous quadrature detection, e.g. by spatial phase shifting
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
- G01D5/26—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light
- G01D5/266—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light by interferometric means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
- G01N21/45—Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods
- G01N21/453—Holographic interferometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
- G01B2290/70—Using polarization in the interferometer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/04—Wave modes and trajectories
- G01N2291/042—Wave modes
- G01N2291/0427—Flexural waves, plate waves, e.g. Lamb waves, tuning fork, cantilever
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/26—Scanned objects
- G01N2291/269—Various geometry objects
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Optics & Photonics (AREA)
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US30747801P | 2001-07-24 | 2001-07-24 | |
| US10/060,983 US7667851B2 (en) | 2001-07-24 | 2002-01-30 | Method and apparatus for using a two-wave mixing ultrasonic detection in rapid scanning applications |
| PCT/US2002/023316 WO2003010531A1 (en) | 2001-07-24 | 2002-07-23 | Method and apparatus for using a two-wave mixing ultrasonic detection in rapid scanning applications |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE60237611D1 true DE60237611D1 (de) | 2010-10-21 |
Family
ID=26740603
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE60237611T Expired - Lifetime DE60237611D1 (de) | 2001-07-24 | 2002-07-23 | Verfahren und vorrichtung zur verwendung der zweiwellenmischungs-ultraschalldetektion in schnellen scanning-anwendungen |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US7667851B2 (de) |
| EP (1) | EP1410008B1 (de) |
| DE (1) | DE60237611D1 (de) |
| WO (1) | WO2003010531A1 (de) |
Families Citing this family (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1742049B1 (de) * | 2005-07-07 | 2009-12-09 | Kabushiki Kaisha Toshiba | Laserbasiertes Wartungsgerät |
| DE102006033229B4 (de) * | 2006-07-18 | 2013-05-08 | Ezono Ag | Ultraschallsonde und Verfahren zur optischen Detektion von Ultraschallwellen |
| JP4917382B2 (ja) * | 2006-08-09 | 2012-04-18 | 株式会社ディスコ | レーザー光線照射装置およびレーザー加工機 |
| US8243280B2 (en) * | 2008-05-20 | 2012-08-14 | Iphoton Solutions, Llc | Laser ultrasonic measurement system with movable beam delivery |
| US8705028B2 (en) | 2010-08-06 | 2014-04-22 | Par Systems, Inc. | Containerized systems |
| US10292589B2 (en) * | 2010-09-20 | 2019-05-21 | California Institute Of Technology | Acoustic-assisted iterative wave form optimization for deep tissue focusing |
| CN102878944B (zh) * | 2012-09-26 | 2015-02-25 | 浙江大学 | 大型结构试验平台基础形变监测系统 |
| US10839509B2 (en) | 2015-07-10 | 2020-11-17 | 3Scan Inc. | Spatial multiplexing of histological stains |
| US10401704B2 (en) * | 2016-11-11 | 2019-09-03 | Asml Netherlands B.V. | Compensating for a physical effect in an optical system |
| US10429175B2 (en) * | 2016-12-02 | 2019-10-01 | Massachusetts Institute Of Technology | Frequency-based detection of chemical expansion dynamics in thin films |
| US10079465B1 (en) | 2017-08-03 | 2018-09-18 | The United States Of America As Represented By The Secretary Of The Air Force | Coherent amplification using phase modulation mediated two-beam coupling |
| CN107589674A (zh) * | 2017-08-08 | 2018-01-16 | 南京航空航天大学 | 基于耦合补偿与转换的高超声速飞行器纵向协调控制方法 |
| US11740071B2 (en) | 2018-12-21 | 2023-08-29 | Apple Inc. | Optical interferometry proximity sensor with temperature variation compensation |
| CN109990829B (zh) * | 2018-12-25 | 2021-07-27 | 华中科技大学 | 一种元素、缺陷与残余应力同时检测的方法及装置 |
| US11156456B2 (en) | 2019-05-21 | 2021-10-26 | Apple Inc. | Optical proximity sensor integrated into a camera module for an electronic device |
| US11473898B2 (en) | 2019-05-24 | 2022-10-18 | Apple Inc. | Wearable voice-induced vibration or silent gesture sensor |
| CN111521566B (zh) * | 2020-06-09 | 2022-11-15 | 中国计量科学研究院 | 基于双波混合的激光超声无损检测系统 |
| US11874110B2 (en) | 2020-09-25 | 2024-01-16 | Apple Inc. | Self-mixing interferometry device configured for non-reciprocal sensing |
| US11629948B2 (en) | 2021-02-04 | 2023-04-18 | Apple Inc. | Optical interferometry proximity sensor with optical path extender |
| CN116202968B (zh) * | 2023-03-13 | 2024-05-03 | 哈尔滨工业大学（威海） | 一种增材钛合金激光超声缺陷检测系统及激光超声相位相干成像检测方法 |
Family Cites Families (23)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE2457253C2 (de) | 1974-12-04 | 1982-09-02 | Krautkrämer, GmbH, 5000 Köln | Optisches interferometrisches Verfahren und Vorrichtung zur berührungslosen Messung der durch Ultraschallwellen verursachten Oberflächenauslenkung eines Prüflings |
| JPS57120857A (en) | 1981-01-19 | 1982-07-28 | Chugoku Electric Power Co Ltd:The | Method and device for identification of ultrasonic echo |
| US4530603A (en) | 1982-09-29 | 1985-07-23 | The Board Of Trustees Of Leland Stanford Jr. Univ. | Stabilized fiber optic sensor |
| FR2586883B1 (fr) | 1985-08-27 | 1994-04-01 | Nord Institut Superieur Electron | Procede et dispositif d'alimentation electrique d'un transducteur generateur de vibrations tant sonores qu'ultrasonores. |
| US4803638A (en) | 1986-06-26 | 1989-02-07 | Westinghouse Electric Corp. | Ultrasonic signal processing system including a flaw gate |
| EP0486689B1 (de) | 1989-08-07 | 1996-02-07 | Hitachi Construction Machinery Co., Ltd. | Ultraschall-prüfvorrichtung |
| US5018808A (en) | 1989-12-26 | 1991-05-28 | Eastman Kodak Company | Method and apparatus for beam displacement in a light beam scanner |
| US5146776A (en) | 1990-11-26 | 1992-09-15 | Westinghouse Electric Corp. | Method for continuously calibrating an optical vibration sensor |
| US5375470A (en) | 1990-12-20 | 1994-12-27 | Fujitsu Limited | Acoustic imaging system |
| JP2910253B2 (ja) | 1991-01-09 | 1999-06-23 | 住友電気工業株式会社 | レーザビーム走査装置 |
| US5131748A (en) | 1991-06-10 | 1992-07-21 | Monchalin Jean Pierre | Broadband optical detection of transient motion from a scattering surface by two-wave mixing in a photorefractive crystal |
| US5229832A (en) | 1991-07-08 | 1993-07-20 | Industrial Quality, Inc. | Optical ultrasonic material characterization apparatus and method |
| US5507185A (en) | 1993-03-16 | 1996-04-16 | Southwest Research Institute | Adaptive scanning technique for ultrasonic testing utilizing realtime lift-off detection |
| US5497662A (en) | 1993-09-07 | 1996-03-12 | General Electric Company | Method and apparatus for measuring and controlling refracted angle of ultrasonic waves |
| FR2716714B1 (fr) | 1994-02-25 | 1996-05-31 | Zircotube | Procédé et dispositif de contrôle par ultrasons de facettes sur la surface intérieure de la paroi d'une gaine. |
| US5680212A (en) * | 1996-04-15 | 1997-10-21 | National Research Council Of Canada | Sensitive and fast response optical detection of transient motion from a scattering surface by two-wave mixing |
| US5701003A (en) | 1996-10-22 | 1997-12-23 | Computer Identics Corporation | Intensity compensated scanning system |
| EP1571824B1 (de) | 1996-10-30 | 2012-10-24 | FUJIFILM Corporation | Gerät und Verfahren zum mehrstrahligem Abtasten einer Innenfläche |
| US6041020A (en) | 1997-04-21 | 2000-03-21 | University Of Delaware | Gas-coupled laser acoustic detection |
| US6075603A (en) | 1997-05-01 | 2000-06-13 | Hughes Electronics Corporation | Contactless acoustic sensing system with detector array scanning and self-calibrating |
| DE19742608C2 (de) | 1997-09-26 | 1999-09-09 | Jenoptik Jena Gmbh | Verfahren und Anordnung zur Auswertung von Laser-Doppler-Signalen |
| DE19806240B4 (de) | 1998-02-16 | 2004-07-08 | Polytec Gmbh | Verfahren und Vorrichtung zur flächenhaften Schwingungsanalyse |
| US6264607B1 (en) | 1998-11-17 | 2001-07-24 | Metra Biosystems, Inc. | Test object geometry for ultrasound transmission calibration |
-
2002
- 2002-01-30 US US10/060,983 patent/US7667851B2/en not_active Expired - Lifetime
- 2002-07-23 WO PCT/US2002/023316 patent/WO2003010531A1/en not_active Application Discontinuation
- 2002-07-23 DE DE60237611T patent/DE60237611D1/de not_active Expired - Lifetime
- 2002-07-23 EP EP02750244A patent/EP1410008B1/de not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| WO2003010531A1 (en) | 2003-02-06 |
| EP1410008B1 (de) | 2010-09-08 |
| US7667851B2 (en) | 2010-02-23 |
| EP1410008A1 (de) | 2004-04-21 |
| US20030020923A1 (en) | 2003-01-30 |
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