DE60225626D1 - altung mit die Versorgungsspannung überschreitenden Auslösepunkten - Google Patents

altung mit die Versorgungsspannung überschreitenden Auslösepunkten

Info

Publication number
DE60225626D1
DE60225626D1 DE60225626T DE60225626T DE60225626D1 DE 60225626 D1 DE60225626 D1 DE 60225626D1 DE 60225626 T DE60225626 T DE 60225626T DE 60225626 T DE60225626 T DE 60225626T DE 60225626 D1 DE60225626 D1 DE 60225626D1
Authority
DE
Germany
Prior art keywords
tion
supply voltage
voltage exceeding
tripping points
tripping
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60225626T
Other languages
English (en)
Other versions
DE60225626T2 (de
Inventor
Gabriel Rincon-Mora
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Texas Instruments Inc
Original Assignee
Texas Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Texas Instruments Inc filed Critical Texas Instruments Inc
Application granted granted Critical
Publication of DE60225626D1 publication Critical patent/DE60225626D1/de
Publication of DE60225626T2 publication Critical patent/DE60225626T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/14—Modifications for compensating variations of physical values, e.g. of temperature
    • H03K17/145—Modifications for compensating variations of physical values, e.g. of temperature in field-effect transistor switches
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/30—Modifications for providing a predetermined threshold before switching
    • H03K17/302—Modifications for providing a predetermined threshold before switching in field-effect transistor switches
DE60225626T 2001-04-06 2002-04-08 Einstellbare temperaturkompensierte Schwellwertschaltung mit die Versorgungsspannung überschreitenden Auslösepunkten Expired - Lifetime DE60225626T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US28197201P 2001-04-06 2001-04-06
US281972 2001-04-06

Publications (2)

Publication Number Publication Date
DE60225626D1 true DE60225626D1 (de) 2008-04-30
DE60225626T2 DE60225626T2 (de) 2009-04-16

Family

ID=23079545

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60225626T Expired - Lifetime DE60225626T2 (de) 2001-04-06 2002-04-08 Einstellbare temperaturkompensierte Schwellwertschaltung mit die Versorgungsspannung überschreitenden Auslösepunkten

Country Status (4)

Country Link
US (1) US6545511B2 (de)
EP (1) EP1265363B1 (de)
JP (1) JP2002368587A (de)
DE (1) DE60225626T2 (de)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6957910B1 (en) * 2004-01-05 2005-10-25 National Semiconductor Corporation Synchronized delta-VBE measurement system
US7780346B2 (en) * 2007-10-31 2010-08-24 Texas Instruments Incorporated Methods and apparatus for a fully isolated NPN based temperature detector
CN109799876B (zh) * 2018-12-29 2020-11-20 联想(北京)有限公司 终端设备和控制该终端设备的方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57197622A (en) * 1981-05-29 1982-12-03 Canon Inc Circuit for driving coil current
US5111071A (en) * 1989-10-19 1992-05-05 Texas Instruments Incorporated Threshold detection circuit
US6157245A (en) * 1999-03-29 2000-12-05 Texas Instruments Incorporated Exact curvature-correcting method for bandgap circuits

Also Published As

Publication number Publication date
US20020167349A1 (en) 2002-11-14
US6545511B2 (en) 2003-04-08
DE60225626T2 (de) 2009-04-16
EP1265363A3 (de) 2006-07-05
EP1265363A2 (de) 2002-12-11
JP2002368587A (ja) 2002-12-20
EP1265363B1 (de) 2008-03-19

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition