DE602005009473D1 - Elektrooptische Sonde zur Messung elektrischer oder elektromagnetischer Felder mit einer Steuerung der Wellenlänge des Betriebspunkts - Google Patents

Elektrooptische Sonde zur Messung elektrischer oder elektromagnetischer Felder mit einer Steuerung der Wellenlänge des Betriebspunkts

Info

Publication number
DE602005009473D1
DE602005009473D1 DE200560009473 DE602005009473T DE602005009473D1 DE 602005009473 D1 DE602005009473 D1 DE 602005009473D1 DE 200560009473 DE200560009473 DE 200560009473 DE 602005009473 T DE602005009473 T DE 602005009473T DE 602005009473 D1 DE602005009473 D1 DE 602005009473D1
Authority
DE
Germany
Prior art keywords
electro
wavelength
control
operating point
optical probe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE200560009473
Other languages
English (en)
Inventor
Nicolas Breuil
Lionel Duvillaret
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Thales SA
Original Assignee
Thales SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Thales SA filed Critical Thales SA
Publication of DE602005009473D1 publication Critical patent/DE602005009473D1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/24—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices
    • G01R15/241—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using electro-optical modulators, e.g. electro-absorption
    • G01R15/242—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using electro-optical modulators, e.g. electro-absorption based on the Pockels effect, i.e. linear electro-optic effect
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/24—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices
    • G01R15/241—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using electro-optical modulators, e.g. electro-absorption
    • G01R15/243—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using electro-optical modulators, e.g. electro-absorption based on the Kerr effect, i.e. quadratic electro-optic effect
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/0864—Measuring electromagnetic field characteristics characterised by constructional or functional features
    • G01R29/0878—Sensors; antennas; probes; detectors
    • G01R29/0885—Sensors; antennas; probes; detectors using optical probes, e.g. electro-optical, luminiscent, glow discharge, or optical interferometers
DE200560009473 2004-12-22 2005-11-28 Elektrooptische Sonde zur Messung elektrischer oder elektromagnetischer Felder mit einer Steuerung der Wellenlänge des Betriebspunkts Active DE602005009473D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR0413733A FR2879752B1 (fr) 2004-12-22 2004-12-22 Sonde electro-optique de mesure de champs electriques ou electromagnetiques a asservissement optique par la longueur d'onde du point de fonctionnement

Publications (1)

Publication Number Publication Date
DE602005009473D1 true DE602005009473D1 (de) 2008-10-16

Family

ID=34954115

Family Applications (1)

Application Number Title Priority Date Filing Date
DE200560009473 Active DE602005009473D1 (de) 2004-12-22 2005-11-28 Elektrooptische Sonde zur Messung elektrischer oder elektromagnetischer Felder mit einer Steuerung der Wellenlänge des Betriebspunkts

Country Status (3)

Country Link
EP (1) EP1674878B1 (de)
DE (1) DE602005009473D1 (de)
FR (1) FR2879752B1 (de)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2902522B1 (fr) * 2006-06-16 2008-09-05 Inst Nat Polytech Grenoble Sonde electro-optique de mesure de temperature et de champ electromagnetique
FR2902523B1 (fr) * 2006-06-16 2008-09-05 Inst Nat Polytech Grenoble Sonde electro-optique de mesure vectorielle d'un champ electromagnetique
FR2943426B1 (fr) * 2009-03-20 2012-04-27 Thales Sa Dispositif electro-optique integre de mesure de champ electromagnetique
US20130307763A1 (en) * 2012-05-21 2013-11-21 Amplifier Research Corporation Field analyzer

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5272434A (en) * 1987-06-20 1993-12-21 Schlumberger Technologies, Inc. Method and apparatus for electro-optically testing circuits
DE4446425A1 (de) * 1994-12-23 1996-06-27 Siemens Ag Verfahren und Anordnung zum Messen eines Magnetfeldes unter Ausnutzung des Faraday-Effekts mit Kompensation von Intensitätsänderungen und Temperatureinflüssen

Also Published As

Publication number Publication date
FR2879752B1 (fr) 2007-01-26
EP1674878B1 (de) 2008-09-03
FR2879752A1 (fr) 2006-06-23
EP1674878A1 (de) 2006-06-28

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition