DE602005002702D1 - Abstimmbares Polyphasenfilter und Verfahren zu dessen Kalibrierung - Google Patents
Abstimmbares Polyphasenfilter und Verfahren zu dessen KalibrierungInfo
- Publication number
- DE602005002702D1 DE602005002702D1 DE602005002702T DE602005002702T DE602005002702D1 DE 602005002702 D1 DE602005002702 D1 DE 602005002702D1 DE 602005002702 T DE602005002702 T DE 602005002702T DE 602005002702 T DE602005002702 T DE 602005002702T DE 602005002702 D1 DE602005002702 D1 DE 602005002702D1
- Authority
- DE
- Germany
- Prior art keywords
- calibration
- polyphase filter
- tunable
- tunable polyphase
- filter
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H11/00—Networks using active elements
- H03H11/02—Multiple-port networks
- H03H11/04—Frequency selective two-port networks
- H03H11/0422—Frequency selective two-port networks using transconductance amplifiers, e.g. gmC filters
- H03H11/0472—Current or voltage controlled filters
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H11/00—Networks using active elements
- H03H11/02—Multiple-port networks
- H03H11/04—Frequency selective two-port networks
- H03H11/0422—Frequency selective two-port networks using transconductance amplifiers, e.g. gmC filters
- H03H11/0444—Simulation of ladder networks
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H11/00—Networks using active elements
- H03H11/02—Multiple-port networks
- H03H11/04—Frequency selective two-port networks
- H03H2011/0494—Complex filters
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H2210/00—Indexing scheme relating to details of tunable filters
- H03H2210/01—Tuned parameter of filter characteristics
- H03H2210/012—Centre frequency; Cut-off frequency
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H2210/00—Indexing scheme relating to details of tunable filters
- H03H2210/01—Tuned parameter of filter characteristics
- H03H2210/015—Quality factor or bandwidth
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H2210/00—Indexing scheme relating to details of tunable filters
- H03H2210/01—Tuned parameter of filter characteristics
- H03H2210/017—Amplitude, gain or attenuation
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H2210/00—Indexing scheme relating to details of tunable filters
- H03H2210/02—Variable filter component
- H03H2210/021—Amplifier, e.g. transconductance amplifier
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H2210/00—Indexing scheme relating to details of tunable filters
- H03H2210/04—Filter calibration method
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US60603704P | 2004-08-31 | 2004-08-31 | |
US606037P | 2004-08-31 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE602005002702D1 true DE602005002702D1 (de) | 2007-11-15 |
DE602005002702T2 DE602005002702T2 (de) | 2008-02-07 |
Family
ID=35431806
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE602005002702T Active DE602005002702T2 (de) | 2004-08-31 | 2005-08-30 | Abstimmbares Polyphasenfilter und Verfahren zu dessen Kalibrierung |
Country Status (3)
Country | Link |
---|---|
US (1) | US7292092B2 (de) |
EP (1) | EP1630957B1 (de) |
DE (1) | DE602005002702T2 (de) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7689189B2 (en) * | 2005-04-06 | 2010-03-30 | Silicon Laboratories Inc. | Circuit and method for signal reception using a low intermediate frequency reception |
TWI331851B (en) * | 2007-02-12 | 2010-10-11 | Ind Tech Res Inst | Calibration apparatus and method for programmable response frequency selecting elements |
JP5390168B2 (ja) * | 2008-11-10 | 2014-01-15 | ルネサスエレクトロニクス株式会社 | 配線のレイアウト方法及びプログラム |
KR101661917B1 (ko) * | 2012-05-30 | 2016-10-05 | 니폰 덴신 덴와 가부시끼가이샤 | 부호화 방법, 부호화 장치, 프로그램 및 기록 매체 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1990013175A1 (en) * | 1989-04-21 | 1990-11-01 | N.V. Philips' Gloeilampenfabrieken | Tunable resonance amplifier |
US6778594B1 (en) * | 2000-06-12 | 2004-08-17 | Broadcom Corporation | Receiver architecture employing low intermediate frequency and complex filtering |
US20030128068A1 (en) * | 2001-08-16 | 2003-07-10 | Farbod Behbahani | Low noise image-reject gm-c filter |
GB0200094D0 (en) * | 2002-01-04 | 2002-02-20 | Koninkl Philips Electronics Nv | Balanced gyrator and devices including the balanced gyrator |
US7002403B2 (en) * | 2002-09-13 | 2006-02-21 | Broadcom Corporation | Transconductance/C complex band-pass filter |
US7196574B1 (en) * | 2005-06-22 | 2007-03-27 | Vishinsky Adam S | Active polyphase ladder filters with transmission zeros and their synthesis method |
-
2005
- 2005-08-25 US US11/211,262 patent/US7292092B2/en not_active Expired - Fee Related
- 2005-08-30 DE DE602005002702T patent/DE602005002702T2/de active Active
- 2005-08-30 EP EP05255301A patent/EP1630957B1/de not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
US7292092B2 (en) | 2007-11-06 |
EP1630957A1 (de) | 2006-03-01 |
EP1630957B1 (de) | 2007-10-03 |
DE602005002702T2 (de) | 2008-02-07 |
US20060049899A1 (en) | 2006-03-09 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8327 | Change in the person/name/address of the patent owner |
Owner name: SILICON LABORATORIES, INC., AUSTIN, TEX., US |