DE602004011481D1 - Kombinierung von mehreren unabhängigen Informationenquellen für die Klassifizierung von Prüflingen - Google Patents

Kombinierung von mehreren unabhängigen Informationenquellen für die Klassifizierung von Prüflingen

Info

Publication number
DE602004011481D1
DE602004011481D1 DE602004011481T DE602004011481T DE602004011481D1 DE 602004011481 D1 DE602004011481 D1 DE 602004011481D1 DE 602004011481 T DE602004011481 T DE 602004011481T DE 602004011481 T DE602004011481 T DE 602004011481T DE 602004011481 D1 DE602004011481 D1 DE 602004011481D1
Authority
DE
Germany
Prior art keywords
candidates
classification
combination
information
several independent
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE602004011481T
Other languages
English (en)
Other versions
DE602004011481T2 (de
Inventor
Jonathan Quiang Li
Daniel A Usikov
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Publication of DE602004011481D1 publication Critical patent/DE602004011481D1/de
Application granted granted Critical
Publication of DE602004011481T2 publication Critical patent/DE602004011481T2/de
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31707—Test strategies
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318342—Generation of test inputs, e.g. test vectors, patterns or sequences by preliminary fault modelling, e.g. analysis, simulation
    • G01R31/31835—Analysis of test coverage or failure detectability

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • General Factory Administration (AREA)
DE602004011481T 2004-05-10 2004-10-13 Kombinierung von mehreren unabhängigen Informationsquellen für die Klassifizierung von Prüflingen Expired - Fee Related DE602004011481T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US842290 2004-05-10
US10/842,290 US7440862B2 (en) 2004-05-10 2004-05-10 Combining multiple independent sources of information for classification of devices under test

Publications (2)

Publication Number Publication Date
DE602004011481D1 true DE602004011481D1 (de) 2008-03-13
DE602004011481T2 DE602004011481T2 (de) 2009-02-19

Family

ID=34926983

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602004011481T Expired - Fee Related DE602004011481T2 (de) 2004-05-10 2004-10-13 Kombinierung von mehreren unabhängigen Informationsquellen für die Klassifizierung von Prüflingen

Country Status (5)

Country Link
US (1) US7440862B2 (de)
EP (1) EP1596211B1 (de)
CN (1) CN100489553C (de)
DE (1) DE602004011481T2 (de)
TW (1) TW200537347A (de)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6505123B1 (en) 2000-07-24 2003-01-07 Weatherbank, Inc. Interactive weather advisory system
US20030204507A1 (en) * 2002-04-25 2003-10-30 Li Jonathan Qiang Classification of rare events with high reliability
US20060161469A1 (en) 2005-01-14 2006-07-20 Weatherbank, Inc. Interactive advisory system
US8832121B2 (en) * 2005-02-02 2014-09-09 Accuweather, Inc. Location-based data communications system and method
US8229467B2 (en) 2006-01-19 2012-07-24 Locator IP, L.P. Interactive advisory system
US8634814B2 (en) 2007-02-23 2014-01-21 Locator IP, L.P. Interactive advisory system for prioritizing content
US9606167B2 (en) * 2011-08-03 2017-03-28 President And Fellows Of Harvard College System and method for detecting integrated circuit anomalies
US10782348B2 (en) * 2017-03-10 2020-09-22 Keithley Instruments, Llc Automatic device detection and connection verification
US10558778B2 (en) * 2018-04-03 2020-02-11 International Business Machines Corporation Document implementation tool for PCB refinement
US10546088B2 (en) * 2018-04-03 2020-01-28 International Business Machines Corporation Document implementation tool for PCB refinement
CN108763092B (zh) * 2018-05-31 2020-12-01 北京理工大学 一种基于交叉验证的代码缺陷检测方法及装置
CN109035232A (zh) * 2018-07-24 2018-12-18 桂林电子科技大学 一种基于深度学习和机器视觉融合的夹片缺陷检测方法
US11651492B2 (en) * 2019-07-12 2023-05-16 Bruker Nano, Inc. Methods and systems for manufacturing printed circuit board based on x-ray inspection

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5130936A (en) * 1990-09-14 1992-07-14 Arinc Research Corporation Method and apparatus for diagnostic testing including a neural network for determining testing sufficiency
US5293323A (en) * 1991-10-24 1994-03-08 General Electric Company Method for fault diagnosis by assessment of confidence measure
US5550751A (en) * 1993-10-15 1996-08-27 The Texas A & M University System Expert system for detecting high impedance faults
US5704018A (en) * 1994-05-09 1997-12-30 Microsoft Corporation Generating improved belief networks
US5631857A (en) 1994-06-15 1997-05-20 International Business Machines Corporation Measuring test tool effectiveness
EP0794495A3 (de) 1996-03-08 1998-07-22 Hewlett-Packard Company Automatisierte Analyse eines modellbasierten Diagnosesystems
US5950147A (en) * 1997-06-05 1999-09-07 Caterpillar Inc. Method and apparatus for predicting a fault condition
CA2242069A1 (en) * 1998-06-25 1999-12-25 Postlinear Management Inc. Possibilistic expert systems and process control utilizing fuzzy logic
US6785636B1 (en) * 1999-05-14 2004-08-31 Siemens Corporate Research, Inc. Fault diagnosis in a complex system, such as a nuclear plant, using probabilistic reasoning
US6535865B1 (en) * 1999-07-14 2003-03-18 Hewlett Packard Company Automated diagnosis of printer systems using Bayesian networks
CA2425903C (en) * 2000-06-16 2012-11-27 Lockheed Martin Mission Systems Scaleable object recognition with a belief model
US7609908B2 (en) * 2003-04-30 2009-10-27 Eastman Kodak Company Method for adjusting the brightness of a digital image utilizing belief values
US20050071432A1 (en) * 2003-09-29 2005-03-31 Royston Clifton W. Probabilistic email intrusion identification methods and systems

Also Published As

Publication number Publication date
US20050251370A1 (en) 2005-11-10
EP1596211A1 (de) 2005-11-16
CN100489553C (zh) 2009-05-20
EP1596211B1 (de) 2008-01-23
TW200537347A (en) 2005-11-16
DE602004011481T2 (de) 2009-02-19
US7440862B2 (en) 2008-10-21
CN1696721A (zh) 2005-11-16

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee