DE602004003382D1 - Unterstromsensoranordnung und verfahren - Google Patents

Unterstromsensoranordnung und verfahren

Info

Publication number
DE602004003382D1
DE602004003382D1 DE602004003382T DE602004003382T DE602004003382D1 DE 602004003382 D1 DE602004003382 D1 DE 602004003382D1 DE 602004003382 T DE602004003382 T DE 602004003382T DE 602004003382 T DE602004003382 T DE 602004003382T DE 602004003382 D1 DE602004003382 D1 DE 602004003382D1
Authority
DE
Germany
Prior art keywords
cells
main
sensor arrangement
low current
voltage value
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE602004003382T
Other languages
English (en)
Other versions
DE602004003382T2 (de
Inventor
P Kelly
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NXP BV
Original Assignee
Koninklijke Philips Electronics NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninklijke Philips Electronics NV filed Critical Koninklijke Philips Electronics NV
Publication of DE602004003382D1 publication Critical patent/DE602004003382D1/de
Application granted granted Critical
Publication of DE602004003382T2 publication Critical patent/DE602004003382T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G01R19/16566—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533
    • G01R19/16571—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533 comparing AC or DC current with one threshold, e.g. load current, over-current, surge current or fault current
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G01R19/16504—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the components employed
    • G01R19/16519—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the components employed using FET's
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G01R19/16533—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application
    • G01R19/16538—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Measuring Or Testing Involving Enzymes Or Micro-Organisms (AREA)
  • Transition And Organic Metals Composition Catalysts For Addition Polymerization (AREA)
  • Geophysics And Detection Of Objects (AREA)
  • Electronic Switches (AREA)
DE602004003382T 2003-05-29 2004-05-14 Unterstromsensoranordnung und verfahren Expired - Lifetime DE602004003382T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GB0312237 2003-05-29
GBGB0312237.1A GB0312237D0 (en) 2003-05-29 2003-05-29 Undercurrent sense arrangement and method
PCT/IB2004/001726 WO2004106951A1 (en) 2003-05-29 2004-05-14 Undercurrent sense arrangement and method

Publications (2)

Publication Number Publication Date
DE602004003382D1 true DE602004003382D1 (de) 2007-01-04
DE602004003382T2 DE602004003382T2 (de) 2007-09-13

Family

ID=9958889

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602004003382T Expired - Lifetime DE602004003382T2 (de) 2003-05-29 2004-05-14 Unterstromsensoranordnung und verfahren

Country Status (8)

Country Link
US (1) US7605598B2 (de)
EP (1) EP1636600B1 (de)
JP (1) JP2007503590A (de)
CN (1) CN100422751C (de)
AT (1) ATE346308T1 (de)
DE (1) DE602004003382T2 (de)
GB (1) GB0312237D0 (de)
WO (1) WO2004106951A1 (de)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7576528B2 (en) * 2006-10-04 2009-08-18 Power Integrations, Inc. Control circuit responsive to an impedance
WO2008050265A2 (en) * 2006-10-23 2008-05-02 Nxp B.V. High impedance load detection
US7808265B2 (en) * 2006-11-01 2010-10-05 Synopsys, Inc. Differential voltage defectivity monitoring circuit
EP1936390A1 (de) * 2006-12-20 2008-06-25 Ecole Polytechnique Federale De Lausanne Epfl - Sti - Imm - Lmis3 Halbleiterbauteil zum Messen von ultra kleinen elektrischen Strömen und kleinen Spannungen
US7893699B2 (en) * 2007-12-03 2011-02-22 Infineon Technologies Ag Method for identifying electronic circuits and identification device
US7868643B2 (en) * 2008-10-29 2011-01-11 Infineon Technologies Ag Proportional regulation for optimized current sensor performance
US8717051B2 (en) * 2009-10-22 2014-05-06 Intersil Americas Inc. Method and apparatus for accurately measuring currents using on chip sense resistors
US8314606B2 (en) * 2009-11-17 2012-11-20 Renesas Electronics America Inc. Current sensing and measuring method and apparatus
CN101871962A (zh) * 2010-05-27 2010-10-27 上海北京大学微电子研究院 电流检测方法及电路
US9812942B2 (en) 2012-01-10 2017-11-07 Renesas Electronics America Inc. Distributed driving system
US9870011B2 (en) 2015-01-30 2018-01-16 Infineon Technologies Ag Circuit arrangement and a method for operating a circuit arrangement
US20160261255A1 (en) * 2015-03-05 2016-09-08 Linear Technology Corporation Accurately detecting low current threshold
US9970979B2 (en) * 2015-07-06 2018-05-15 Dialog Semiconductor (Uk) Limited MOS transistor saturation region detector
US9678111B2 (en) 2015-10-07 2017-06-13 Nxp B.V. Current sensing with compensation for component variations
US9742398B2 (en) 2016-01-13 2017-08-22 Texas Instruments Incorporated Methods and apparatus for sensing current through power semiconductor devices with reduced sensitivity to temperature and process variations
DE102021132537B3 (de) 2021-12-09 2023-05-17 Infineon Technologies Ag Strommessschaltung

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4743779A (en) * 1984-05-23 1988-05-10 Unitrode Corporation Adjustable threshold window circuit
US5018041A (en) * 1989-06-16 1991-05-21 National Semiconductor Corp. Circuit for internal current limiting in a fast high side power switch
EP0743529B1 (de) * 1995-05-16 2004-07-28 STMicroelectronics S.r.l. Verfahren und zugehöriger Schaltkreis zur Feststellung einer Schaltungsunterbrechung
DE19520735C2 (de) * 1995-06-07 1999-07-01 Siemens Ag Schaltungsanordnung zum Erfassen des Laststroms eines Leistungs-Halbleiterbauelementes mit sourceseitiger Last
DE19918042C2 (de) * 1999-04-21 2001-05-31 Siemens Ag Schaltungsanordnung zur Unterstromerkennung an einem MOS-Leistungstransistor
DE10042585C1 (de) * 2000-08-30 2002-11-14 Infineon Technologies Ag Schaltungsanordnung zur Erfassung des Stromes in einem Lasttransistor
US6624994B1 (en) * 2001-11-09 2003-09-23 National Semiconductor Corporation Apparatus and method for over-current protection of an analog switch

Also Published As

Publication number Publication date
JP2007503590A (ja) 2007-02-22
EP1636600A1 (de) 2006-03-22
CN100422751C (zh) 2008-10-01
CN1795392A (zh) 2006-06-28
EP1636600B1 (de) 2006-11-22
US7605598B2 (en) 2009-10-20
WO2004106951A1 (en) 2004-12-09
US20060232266A1 (en) 2006-10-19
GB0312237D0 (en) 2003-07-02
ATE346308T1 (de) 2006-12-15
DE602004003382T2 (de) 2007-09-13

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: NXP B.V., EINDHOVEN, NL

8328 Change in the person/name/address of the agent

Representative=s name: EISENFUEHR, SPEISER & PARTNER, 10178 BERLIN