DE4214585C2 - Manipulator for positioning test specimens in EMC measurements in 3 orthogonal directions - Google Patents
Manipulator for positioning test specimens in EMC measurements in 3 orthogonal directionsInfo
- Publication number
- DE4214585C2 DE4214585C2 DE19924214585 DE4214585A DE4214585C2 DE 4214585 C2 DE4214585 C2 DE 4214585C2 DE 19924214585 DE19924214585 DE 19924214585 DE 4214585 A DE4214585 A DE 4214585A DE 4214585 C2 DE4214585 C2 DE 4214585C2
- Authority
- DE
- Germany
- Prior art keywords
- manipulator
- orthogonal directions
- test
- manipulator according
- cube
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
- B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
- B25J9/00—Programme-controlled manipulators
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/0807—Measuring electromagnetic field characteristics characterised by the application
- G01R29/0814—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning
- G01R29/0821—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning rooms and test sites therefor, e.g. anechoic chambers, open field sites or TEM cells
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Robotics (AREA)
- Mechanical Engineering (AREA)
- Manipulator (AREA)
Description
Es ist bekannt, daß 3 senkrecht aufeinander stehende Seitenflächen eines Würfels über 3 Achsen, jeweils in eine vorher bestimmte Richtung zeigend, gedreht werden können. Diese Drehung erfolgt durch 3 voneinander getrennte Antriebe, die abhängig oder unabhängig voneinander arbeiten.It is known that 3 perpendicular side faces of a cube over 3 axes, each pointing in a predetermined direction can. This rotation is done by 3 separate drives that work independently or independently.
Der im Patentanspruch 1 angegebenen Erfindung liegt das Problem zugrunde, die Anzahl der Antriebe zu verringern und gleichzeitig die mechanische Kompliziertheit solcher Drehbewegungen zu vereinfachen.The invention specified in claim 1 is based on the problem that Reduce the number of drives while maintaining mechanical complexity to simplify such rotary movements.
Dieses Problem wird durch die im Patentanspruch 1 aufgeführten Merkmale gelöst. Vorteilhafte Weiterbildungen sind in den Unteransprüchen angegeben.This problem is solved by the features listed in claim 1. Advantageous further developments are specified in the subclaims.
Die erzielten Vorteile dieser Erfindung bestehen darin, daß für die vorgegebenen Drehrichtungen des Prüflings in einem Prüffeld nur ein Antrieb benötigt wird. Der mechanische Aufwand für einen solchen Manipulator wird dadurch stark reduziert. Es ergibt sich eine sowohl mechanisch als auch elektrisch einfache Lösung.The advantages achieved by this invention are that for the given Direction of rotation of the test object in one test field only one drive is required. Of the mechanical effort for such a manipulator is greatly reduced. The result is a solution that is both mechanically and electrically simple.
Ein Ausführungsbeispiel der Erfindung ist in den Zeichnungen Fig. 1 und Fig. 2 dargestellt und wird nachfolgend erläutert. An embodiment of the invention is shown in the drawings Fig. 1 and Fig. 2 and is explained below.
Fig. 1 zeigt die notwendigen Positionierungen des Prüflings während der EMV- Messung. Fig. 1 shows the necessary positions of the test specimen during the EMC measurement.
Fig. 2 zeigt die erfindungsgemäße Prinzipdarstellung des Manipulators. Fig. 2 shows the schematic diagram of the invention shows the manipulator.
Die Mitte des Prüflings wird in den Schnittpunkt der Raumdiagonalen des gedachten Würfels gebracht.The center of the test object is in the intersection of the room diagonals of the imaginary Brought cubes.
Die Anordnung von quaderförmigen Prüflingen hat so zu erfolgen, daß ihre Seitenflächen parallel zu den Seiten des gedachten Würfels stehen.The arrangement of cuboid test specimens must be such that their Side faces are parallel to the sides of the imaginary cube.
Eine der zu prüfenden Seiten, z. B. (Z) des Prüflings zeigt dann zur Prüfrichtung.One of the pages to be checked, e.g. B. (Z) of the test object then points to the test direction.
Durch Drehung des Rahmens in Pfeilrichtung werden die zwei weiteren Seiten des Prüflings (X und Y) in die Prüfrichtung gebracht. By turning the frame in the direction of the arrow, the two other sides of the DUT (X and Y) brought into the test direction.
X, Y, Z Anordnung der zu prüfenden Seiten des Prüflings
x, y, z orthogonale Richtungen
a gedachter Würfel
b Raumdiagonale des Würfels
c Prüflingsmitte (Schnittpunkt der Würfelraumdiagonalen)
d Prüfling
e Rahmen für Aufnahme des Prüflings
f Halterung und Aufnahme des Rahmens
g Kupplung
h Antrieb
← Drehrichtung
X, Y, Z arrangement of the sides of the test object to be tested
x, y, z orthogonal directions
a imaginary cube
b The diagonal of the cube
c center of the test specimen
d DUT
e Framework for admission of the examinee
f Bracket and mount of the frame
g clutch
h drive
← Direction of rotation
Claims (5)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19924214585 DE4214585C2 (en) | 1992-04-28 | 1992-04-28 | Manipulator for positioning test specimens in EMC measurements in 3 orthogonal directions |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19924214585 DE4214585C2 (en) | 1992-04-28 | 1992-04-28 | Manipulator for positioning test specimens in EMC measurements in 3 orthogonal directions |
Publications (2)
Publication Number | Publication Date |
---|---|
DE4214585A1 DE4214585A1 (en) | 1993-11-04 |
DE4214585C2 true DE4214585C2 (en) | 1998-07-23 |
Family
ID=6458043
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE19924214585 Expired - Fee Related DE4214585C2 (en) | 1992-04-28 | 1992-04-28 | Manipulator for positioning test specimens in EMC measurements in 3 orthogonal directions |
Country Status (1)
Country | Link |
---|---|
DE (1) | DE4214585C2 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE10056638C1 (en) * | 2000-11-15 | 2002-06-13 | Bernhard Voelcker | Electromagnetic screening chamber for testing electronic device e.g. mobile telephone, with mechanical transmission of operating force for operating elements of device within screening chamber |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE10007129A1 (en) * | 2000-02-17 | 2001-09-06 | Univ Hannover | Method and device for determining the vector of a quasi-stationary harmonic vector field |
EP1136831A1 (en) * | 2000-03-23 | 2001-09-26 | Siemens Building Technologies AG | Manipulator for devices under test in TEM cells |
RU2548163C1 (en) * | 2013-11-20 | 2015-04-20 | Федеральное государственное бюджетное образовательное учреждение высшего профессионального образования "Уфимский государственный авиационный технический университет" | Three-coordinate movement device |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0459111A1 (en) * | 1990-06-01 | 1991-12-04 | Peter Gerber | Adjustable suspension |
-
1992
- 1992-04-28 DE DE19924214585 patent/DE4214585C2/en not_active Expired - Fee Related
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0459111A1 (en) * | 1990-06-01 | 1991-12-04 | Peter Gerber | Adjustable suspension |
Non-Patent Citations (2)
Title |
---|
MÖHR,D.E.C.: Das Jahr 1992 und was bedeutet es für die EMV in Europa. In: Elektrie, Bd. 45, 1991, H. 4, S. 174-176 * |
VDI-Richtlinien VDI 2860, Mai 1990, Beuth Verlag Berlin * |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE10056638C1 (en) * | 2000-11-15 | 2002-06-13 | Bernhard Voelcker | Electromagnetic screening chamber for testing electronic device e.g. mobile telephone, with mechanical transmission of operating force for operating elements of device within screening chamber |
Also Published As
Publication number | Publication date |
---|---|
DE4214585A1 (en) | 1993-11-04 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
OM8 | Search report available as to paragraph 43 lit. 1 sentence 1 patent law | ||
8110 | Request for examination paragraph 44 | ||
8127 | New person/name/address of the applicant |
Owner name: KNORR-BREMSE ELECTRONIC GMBH, 80809 MUENCHEN, DE |
|
D2 | Grant after examination | ||
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |