DE414760C - Method for microscopic examination in particular of dust u. like - Google Patents

Method for microscopic examination in particular of dust u. like

Info

Publication number
DE414760C
DE414760C DED45975D DED0045975D DE414760C DE 414760 C DE414760 C DE 414760C DE D45975 D DED45975 D DE D45975D DE D0045975 D DED0045975 D DE D0045975D DE 414760 C DE414760 C DE 414760C
Authority
DE
Germany
Prior art keywords
dust
microscopic examination
objects
microscope
optical axis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DED45975D
Other languages
German (de)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
KURT STOECKICHT DIPL ING
Original Assignee
KURT STOECKICHT DIPL ING
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by KURT STOECKICHT DIPL ING filed Critical KURT STOECKICHT DIPL ING
Priority to DED45975D priority Critical patent/DE414760C/en
Application granted granted Critical
Publication of DE414760C publication Critical patent/DE414760C/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/24—Base structure
    • G02B21/241—Devices for focusing

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Microscoopes, Condenser (AREA)

Description

Verfahren zur mikroskopischen Untersuchung insbesondere von Staub u. dgl. Bei der mikroskopischen Untersuchung von Objekten, die eine verschiedene Tiefeneinstellung erfordern, wie dies z. B. bei den für die Industrie wichtigen Stauben der Fall ist, macht es Schwierigkeiten, im Gesichtsfeld und auch auf der photographischen Platte ein umfassendes, scharfes Bild zu erhalten.Method for the microscopic examination of dust in particular and the like. In microscopic examination of objects which have a different Require depth adjustment, as z. B. in the important for the industry Dusting is the case, it makes difficulties in the field of vision and also on the photographic plate to obtain a comprehensive, sharp image.

Nach der Erfindung wird diesem übelstand dadurch abgeholfen, daß die Mikrometerschraube des Mikroskopes, welche zur Feineinstellung dient, mit einer mechanisch, z. B. durch ein Uhrwerk, betriebenen Vorrichtung versehen wird, die in kleinen Zeiträumen periodisch die Einstellung innerhalb des Bereiches der Ausdehnung der zu untersuchenden Objekte in Richtung der optischen Achse ändert. Dieser Bereich läßt sich durch vorherige Beobachtung ohne weiteres ermitteln. Die Zeitdauer einer Einstellperiode ist zweckmäßig so zu wählen, daß sie von dem menschlichen Auge nicht mehr wahrgenommen werden kann, so daß dieses nur ein stehendes, aber scharfes Bild sieht.According to the invention this evil is remedied in that the Micrometer screw of the microscope, which is used for fine adjustment, with a mechanical, e.g. B. is provided by a clockwork operated device that in short periods of time periodically the setting within the range of expansion of the objects to be examined changes in the direction of the optical axis. This area can easily be determined by previous observation. The duration of a Adjustment period is expedient to choose so that it is not visible to the human eye more can be perceived, so that this is only a stationary, but sharp image sees.

Claims (1)

PATENTANSPRUCH: Verfahren zur mikroskopischen Untersuchung, insbesondere von Staub u. dgl., dadurch gekennzeichnet, daß die Feineinstellung des Mikroskops durch an sich bekannte mechanische Mittel in steter periodischer Wiederholung innerhalb des Bereiches der Ausdehnung der zu untersuchenden Objekte in Richtung der optischen Achse geändert wird. Claim: Method for microscopic examination, in particular of dust and the like, characterized in that the fine adjustment of the microscope is changed by mechanical means known per se in constant periodic repetition within the range of the extent of the objects to be examined in the direction of the optical axis.
DED45975D 1924-08-10 1924-08-10 Method for microscopic examination in particular of dust u. like Expired DE414760C (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DED45975D DE414760C (en) 1924-08-10 1924-08-10 Method for microscopic examination in particular of dust u. like

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DED45975D DE414760C (en) 1924-08-10 1924-08-10 Method for microscopic examination in particular of dust u. like

Publications (1)

Publication Number Publication Date
DE414760C true DE414760C (en) 1925-06-06

Family

ID=7049394

Family Applications (1)

Application Number Title Priority Date Filing Date
DED45975D Expired DE414760C (en) 1924-08-10 1924-08-10 Method for microscopic examination in particular of dust u. like

Country Status (1)

Country Link
DE (1) DE414760C (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1029592B (en) * 1954-12-17 1958-05-08 Rhein Optik G M B H Adjustment device for microscopes

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1029592B (en) * 1954-12-17 1958-05-08 Rhein Optik G M B H Adjustment device for microscopes

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