DE3467403D1 - Strip profile gauge - Google Patents

Strip profile gauge

Info

Publication number
DE3467403D1
DE3467403D1 DE8484301965T DE3467403T DE3467403D1 DE 3467403 D1 DE3467403 D1 DE 3467403D1 DE 8484301965 T DE8484301965 T DE 8484301965T DE 3467403 T DE3467403 T DE 3467403T DE 3467403 D1 DE3467403 D1 DE 3467403D1
Authority
DE
Germany
Prior art keywords
strip
scintillator
scan
belt
detectors
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE8484301965T
Other languages
English (en)
Inventor
Kenneth Browning Smith
Derek William Adams
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
IHO Holding GmbH and Co KG
Original Assignee
FAG Kugelfischer Georg Schaefer KGaA
Kugelfischer Georg Schaefer and Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by FAG Kugelfischer Georg Schaefer KGaA, Kugelfischer Georg Schaefer and Co filed Critical FAG Kugelfischer Georg Schaefer KGaA
Application granted granted Critical
Publication of DE3467403D1 publication Critical patent/DE3467403D1/de
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • G01B15/025—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness by measuring absorption

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Coating With Molten Metal (AREA)
  • Paper (AREA)
DE8484301965T 1983-04-21 1984-03-23 Strip profile gauge Expired DE3467403D1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB08310890A GB2138561B (en) 1983-04-21 1983-04-21 Strip profile gauge

Publications (1)

Publication Number Publication Date
DE3467403D1 true DE3467403D1 (en) 1987-12-17

Family

ID=10541473

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8484301965T Expired DE3467403D1 (en) 1983-04-21 1984-03-23 Strip profile gauge

Country Status (5)

Country Link
EP (1) EP0127279B1 (de)
JP (1) JPS59208411A (de)
AT (1) ATE30774T1 (de)
DE (1) DE3467403D1 (de)
GB (1) GB2138561B (de)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT1241132B (it) * 1990-04-20 1993-12-29 Electronic Systems Spa Metodo ed apparecchiatura a scansione incrociata, per misurare lo spessore di un rivestimento su un film
US5351203A (en) * 1992-08-03 1994-09-27 Bethlehem Steel Corporation Online tomographic gauging of sheet metal
JP2002296021A (ja) * 2001-04-03 2002-10-09 Futec Inc 厚さ測定装置
CN102200434B (zh) 2011-04-02 2012-10-10 清华大学 一种板带材的厚度凸度检测装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3435240A (en) * 1964-01-02 1969-03-25 Industrial Nucleonics Corp Radiation sensitive structure determining apparatus
GB1271438A (en) * 1969-01-17 1972-04-19 Measurex Corp Basis weight gauging method
US3715592A (en) * 1971-01-12 1973-02-06 Weston Instruments Inc Thickness change radiation gauge
GB1383160A (en) * 1973-04-10 1975-02-05 Alcan Res & Dev Method and apparatus for measurement of thickness of moving metal strip
GB1552224A (en) * 1975-05-10 1979-09-12 Heath Gloucester Ltd Strip profile gauge
GB2097915B (en) * 1981-04-27 1985-02-27 British Steel Corp Apparatus for measuring profile thickness of strip material

Also Published As

Publication number Publication date
JPS59208411A (ja) 1984-11-26
EP0127279A1 (de) 1984-12-05
GB2138561A (en) 1984-10-24
ATE30774T1 (de) 1987-11-15
GB8310890D0 (en) 1983-05-25
GB2138561B (en) 1987-03-18
EP0127279B1 (de) 1987-11-11

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: FAG KUGELFISCHER GEORG SCHAEFER AG, 97421 SCHWEINF

8339 Ceased/non-payment of the annual fee