DE3436848A1 - Anordnung zur positionierung von messobjekten bei waagerecht antastenden einkoordinatenmessgeraeten - Google Patents

Anordnung zur positionierung von messobjekten bei waagerecht antastenden einkoordinatenmessgeraeten

Info

Publication number
DE3436848A1
DE3436848A1 DE19843436848 DE3436848A DE3436848A1 DE 3436848 A1 DE3436848 A1 DE 3436848A1 DE 19843436848 DE19843436848 DE 19843436848 DE 3436848 A DE3436848 A DE 3436848A DE 3436848 A1 DE3436848 A1 DE 3436848A1
Authority
DE
Germany
Prior art keywords
measuring
quill
counter
arrangement
probe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
DE19843436848
Other languages
German (de)
English (en)
Other versions
DE3436848C2 (enrdf_load_stackoverflow
Inventor
Horst Metzig
Heinz Dipl.-Ing. DDR 6902 Jena-Lobeda Priplata
Hans-Joachim DDR 6900 Jena Sommer
Wilfried Dipl.-Ing. DDR 6900 Jena Tänzer
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jenoptik AG
Original Assignee
Jenoptik Jena GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jenoptik Jena GmbH filed Critical Jenoptik Jena GmbH
Publication of DE3436848A1 publication Critical patent/DE3436848A1/de
Application granted granted Critical
Publication of DE3436848C2 publication Critical patent/DE3436848C2/de
Granted legal-status Critical Current

Links

Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y15/00—Nanotechnology for interacting, sensing or actuating, e.g. quantum dots as markers in protein assays or molecular motors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Nanotechnology (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Molecular Biology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
DE19843436848 1983-12-01 1984-10-08 Anordnung zur positionierung von messobjekten bei waagerecht antastenden einkoordinatenmessgeraeten Granted DE3436848A1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DD25735783A DD222105A1 (de) 1983-12-01 1983-12-01 Anordnung zur positionierung von messobjekten bei waagerecht antastenden einkoordinatenmessgeraeten

Publications (2)

Publication Number Publication Date
DE3436848A1 true DE3436848A1 (de) 1985-06-13
DE3436848C2 DE3436848C2 (enrdf_load_stackoverflow) 1993-04-01

Family

ID=5552460

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19843436848 Granted DE3436848A1 (de) 1983-12-01 1984-10-08 Anordnung zur positionierung von messobjekten bei waagerecht antastenden einkoordinatenmessgeraeten

Country Status (3)

Country Link
CH (1) CH665023A5 (enrdf_load_stackoverflow)
DD (1) DD222105A1 (enrdf_load_stackoverflow)
DE (1) DE3436848A1 (enrdf_load_stackoverflow)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0401018A3 (en) * 1989-05-31 1992-09-23 Research Development Corporation Of Japan Ultra-precise positioning system
DE4322975A1 (de) * 1993-07-09 1995-01-12 Bernd Wuertele Meßeinrichtung
DE4322978A1 (de) * 1993-07-09 1995-01-12 Bernd Wuertele Meßeinrichtung
EP0635697A3 (de) * 1993-07-20 1996-01-10 Helmut Raff Messeinrichtung.

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DD150111A1 (de) * 1980-04-08 1981-08-12 Steffen Klawun Einrichtung zur weg-kraft-koordinierung an antastsystemen
GB2112942A (en) * 1982-01-08 1983-07-27 Douglas Carver Finch Measuring instruments

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DD150111A1 (de) * 1980-04-08 1981-08-12 Steffen Klawun Einrichtung zur weg-kraft-koordinierung an antastsystemen
GB2112942A (en) * 1982-01-08 1983-07-27 Douglas Carver Finch Measuring instruments

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0401018A3 (en) * 1989-05-31 1992-09-23 Research Development Corporation Of Japan Ultra-precise positioning system
DE4322975A1 (de) * 1993-07-09 1995-01-12 Bernd Wuertele Meßeinrichtung
DE4322978A1 (de) * 1993-07-09 1995-01-12 Bernd Wuertele Meßeinrichtung
EP0635697A3 (de) * 1993-07-20 1996-01-10 Helmut Raff Messeinrichtung.

Also Published As

Publication number Publication date
DD222105A1 (de) 1985-05-08
CH665023A5 (de) 1988-04-15
DE3436848C2 (enrdf_load_stackoverflow) 1993-04-01

Similar Documents

Publication Publication Date Title
DE2934347C2 (de) Verfahren und Prüfgerät zum Prüfen des Zahnflankenprofils von Zahnrädern großen Durchmessers
DE3011003A1 (de) Verfahren und vorrichtung zur bestimmung von koordinatenmesswerten an einem werkstueck
DE102017107373B4 (de) Oberflächenmessgerät
DE2718506C2 (de) Mehrkoordinaten-Meßmaschine
DE3725207A1 (de) Tastkopf fuer koordinatenmessgeraete
EP2570791A2 (de) Vorrichtung zur Bestimmung der biaxialen Dehnungskennwerte einer Probe
DE102020216084A1 (de) Materialprüfvorrichtung für Biegeversuche und Verfahren zum Durchführen eines Biegeversuchs
DE69616925T2 (de) Manuelle 3D-Koordinatenmessmaschine
DE2228415A1 (de) Ritzharteprufer
EP0961118A2 (de) Pipettierautomat
DE1250135B (enrdf_load_stackoverflow)
DE3436848A1 (de) Anordnung zur positionierung von messobjekten bei waagerecht antastenden einkoordinatenmessgeraeten
DE19809589B4 (de) Verfahren zur Kalibrierung eines Tasters eines Koordinatenmeßgerätes
DE102021132660A1 (de) Koordinatenmessgerät
DE29810618U1 (de) Dämpfungsvorrichtung für Koordinatenmeßgeräte
DE10249767B4 (de) Probentisch für die Messung lateraler Kräfte und Verschiebungen
DE102016123122B3 (de) Haptic-Test-Messvorrichtung und Verfahren zur Ermittlung einer Kraft-Weg-Kurve bei einer Haptic-Test-Messung
DE4235366C2 (de) Längenmeßmaschine
DE19929648A1 (de) Antriebsanordnung für Meßinstrumente und Meßinstrument mit einer derartigen Antriebsanordnung
DD222391A1 (de) Verfahren und anordnung zur optischen kontrolle mechanischer messobjektabtastung
EP1738134B1 (de) Koordinatenmessgerät zum messtechnischen bestimmen einer koordinate an einem messobjekt
DD288872A5 (de) Einkoordinatenmessgeraet
DE1228070B (de) Geraet zum Messen von Bohrungs-Innendurchmessern
DE3109334A1 (de) Vorrichtung zum untersuchen und anzeigen der guete von verzahnungen
DE102010006505A1 (de) Koordinatenmessgerät mit passivem Dreh-Schwenk-Mechanismus

Legal Events

Date Code Title Description
8110 Request for examination paragraph 44
8127 New person/name/address of the applicant

Owner name: CARL ZEISS JENA GMBH, O-6900 JENA, DE

D2 Grant after examination
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee