DE3309881C2 - - Google Patents
Info
- Publication number
- DE3309881C2 DE3309881C2 DE3309881A DE3309881A DE3309881C2 DE 3309881 C2 DE3309881 C2 DE 3309881C2 DE 3309881 A DE3309881 A DE 3309881A DE 3309881 A DE3309881 A DE 3309881A DE 3309881 C2 DE3309881 C2 DE 3309881C2
- Authority
- DE
- Germany
- Prior art keywords
- test
- signals
- central unit
- units
- test system
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000012360 testing method Methods 0.000 claims description 32
- 238000011156 evaluation Methods 0.000 claims description 4
- 239000000523 sample Substances 0.000 claims description 4
- 238000002604 ultrasonography Methods 0.000 claims description 4
- 230000001066 destructive effect Effects 0.000 claims description 2
- 238000004154 testing of material Methods 0.000 claims description 2
- 230000004907 flux Effects 0.000 claims 1
- 238000000034 method Methods 0.000 description 2
- 238000001228 spectrum Methods 0.000 description 2
- 238000012937 correction Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- VJYFKVYYMZPMAB-UHFFFAOYSA-N ethoprophos Chemical compound CCCSP(=O)(OCC)SCCC VJYFKVYYMZPMAB-UHFFFAOYSA-N 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000011835 investigation Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
- 238000012797 qualification Methods 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
- 238000012549 training Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D18/00—Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
- G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
- G01B7/10—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
- G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
- G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
- G01N27/9073—Recording measured data
- G01N27/9086—Calibrating of recording device
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/22—Details, e.g. general constructional or apparatus details
- G01N29/30—Arrangements for calibrating or comparing, e.g. with standard objects
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Electrochemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
Description
Die Erfindung betrifft eine Einrichtung zur Funktionskontrolle von Prüfanlagen und -geräten zur zerstörungsfreien Werkstoffprüfung mittels Ultraschall-, Wirbelstrom- oder Streuflußverfahren.The invention relates to a device for Functional control of test systems and devices for non-destructive material testing by means of Ultrasonic, eddy current or leakage flow processes.
Die Überprüfung derartiger Anlagen bzw. Geräte erfolgt heute üblicherweise mittels Testkörpern anhand der sichtbaren Funktionen wie Leuchtschirmsignale oder Diskriminatorausgangslampen.Such systems or devices are checked today usually using test specimens based on the visible functions such as fluorescent screen signals or Discriminator output lamps.
Überprüfungen der verdeckt arbeitenden Funktionen sind nur unter großem Zeit- und Meßgeräteaufwand möglich und erfordern einen hohen Ausbildungsstand des Überprüfungspersonals. Eine periodische Kontrolle der Prüfanlagen bzw. -geräte ist somit nicht im erforderlichen Maß durchführbar.Checks of the hidden functions are only possible with great expenditure of time and measuring equipment and require a high level of training in Inspection personnel. A periodic check of the Test systems and equipment is therefore not in the required measure feasible.
Aus "Balzers-Katalog" (1983, Quadrupol-Massenspektrometer QMG 511, Seite N 13 bis N16) ist ein Blockschaubild für eine Kontrolleinrichtung bekannt, mit der überprüft werden kann, ob bestimmte Bausteine ein- oder ausgeschaltet sind. Außerdem können auch in einzelnen Kanälen gepeicherte Werte überprüft werden.From "Balzers Catalog" (1983, Quadrupole mass spectrometer QMG 511, page N 13 to N16) is a block diagram for one Control device known to be checked can, whether certain blocks on or off are. It can also be used in individual channels stored values are checked.
Die Überprüfung und ggf. Korrektur von Meßsignalen ist auch aus der "Industriellen Meßtechnik" (Prof. Dr. P. Profos, Vulkan Verlag Essen, 1978 Seiten 221-229) bekannt. Hierbei werden allerdings vorher festgelegte Grenz- bzw. Modellwerte für den Vergleich mit gemessenen Werten benutzt.The checking and, if necessary, correction of measurement signals is also from "Industrial Metrology" (Prof. Dr. P. Profos, Vulkan Verlag Essen, 1978 pages 221-229) known. Here, however, are determined beforehand Limit or model values for comparison with measured values used.
Aufgabe der Erfindung ist es, umfassende Funktionskontrollen leicht anpaßbar an jede Prüfanlage bzw. an jedes Prüfgerät objektiv und reproduzierbar unter deutlicher Verringerung der Aufwandzeit und der Personalqualifikation durchzuführen. The object of the invention is comprehensive Functional controls can be easily adapted to any test system or on any test device objectively and reproducibly while significantly reducing the time and effort To carry out personnel qualifications.
Die Aufgabe löst eine Einrichtung mit den kennzeichnenden Merkmalen des Anspruchs.The task is solved by a facility with the characteristic features of the claim.
Der grundsätzliche Unterschied der erfindungsgemäßen Einrichtung zum Stand der Technik besteht darin, daß den eigentlichen z. B. während der Untersuchung eines Prüf- oder Eichkörpers der Prüfanlage zugeführten Signalen nachgebildete zusätzliche Signale in einer besonderen Einrichtung erzeugt und die simulierten Signale und die Prüfungssignale gemeinsam bewertet werden. Damit läßt sich dann ermitteln, ob die Prüfanlage auf die Prüfsignale reagiert und ob sie diese Signale richtig auswertet.The fundamental difference between the invention Prior art device is that the actual z. B. during the investigation of a Test or calibration body fed to the test system Signals simulated additional signals in one generated special facility and the simulated Signals and the test signals evaluated together will. This can then be used to determine whether the Test system reacts to the test signals and whether they evaluates these signals correctly.
Ein Ausführungsbeispiel der Erfindung wird anhand der Fig. 1 ausführlich beschrieben. An embodiment of the invention is described in detail with reference to FIG. 1.
Die Zentraleinheit (1) enthält einen frei programmier baren Rechner mit Programm- und Datenspeicher der alle für eine Anlagen- bzw. Geräteüberprüfung notwendigen Schritte steuert.The central unit ( 1 ) contains a freely programmable computer with program and data memory which controls all the steps necessary for a system or device check.
In der Einheit 2 a werden alle notwendigen digitalen Signale erzeugt, die zur Herstellung der Prüfbereit schaft der Prüfanlage 4 notwendig sind.In unit 2 a , all the necessary digital signals are generated, which are necessary for the production of the test system 4 .
Einheit 3 a bereitet die von der Prüfanlage kommenden digitalen bzw. analogen Reaktionssignale auf.Unit 3 a processes the digital or analog reaction signals coming from the test system.
Innerhalb der Einheit 3 b erfolgt die Synchronisation der Testeinrichtung mit der Prüfanlage bzw. dem Prüf gerät 4.Within the unit 3 b , the test device is synchronized with the test system or the test device 4 .
Programmgesteuert wird nun von der Zentraleinheit 1 synchron mit der Prüfanlage bzw. dem Prüfgerät 4 in der Einheit 2 b ein für das jeweilige Prüfverfahren mög liches Prüfsignal erzeugt. Diese Prüfsignale können z. B. für eine Ultraschall-Prüfanlage variiert werden in der Amplitude, der Frequenz, der zeitlichen Lage bezüglich des Synchronimpulses, der zeitlichen Länge und der Häufigkeit ihres Auftretens.Is programmatically now from the central unit 1 in synchronization with the test system and the tester 4 in the unit 2 a b mög pending for the respective test methods test signal generated. These test signals can e.g. B. for an ultrasound test system can be varied in the amplitude, the frequency, the time position with respect to the synchronizing pulse, the time length and the frequency of their occurrence.
Die Reaktionssignale der Prüfanlage bzw. des Prüfgerätes 4 werden von der Zentraleinheit 1 bewertet. Das Ergebnis wird dem Bediener der Testeinrichtung auf einem Schreib- und Protokolliergerät 5 mitgeteilt. The reaction signals of the test system or the test device 4 are evaluated by the central unit 1 . The result is communicated to the operator of the test device on a writing and logging device 5 .
Bewertungskriterien werden zum Teil von der Testein richtung selbst ermittelt. Für die Daten der Analogver stärker in einer Ultraschall-Prüfanlage ist z. B. das Frequenzspektrum eines Ultraschall-Prüfkopfes 6 not wendig. Dazu wird von der Testeinrichtung das Hoch frequenzsignal des Ultraschall-Prüfkopfes 6 an der Anschlußklemme 7 abgenommen, digitalisiert und das Frequenzspektrum ermittelt. Daraus wird als Bewertungs kriterium die Minimalforderung an die Bandbreite der Analogverstärker einer Ultraschall-Prüfanlage abgeleitet.Evaluation criteria are determined in part by the test facility itself. For the data of the Analogver stronger in an ultrasound test system, for. B. the frequency spectrum of an ultrasonic probe 6 not agile. For this purpose, the high-frequency signal of the ultrasonic probe 6 is removed from the test device at the terminal 7 , digitized and the frequency spectrum is determined. From this, the minimum requirement for the bandwidth of the analog amplifiers of an ultrasound test system is derived as an evaluation criterion.
Claims (1)
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE3309881A DE3309881A1 (en) | 1983-03-16 | 1983-03-16 | DEVICE FOR FUNCTIONAL CONTROL OF TEST SYSTEMS AND DEVICES |
IT19505/84A IT1175319B (en) | 1983-03-16 | 1984-02-08 | PROVISION FOR THE FUNCTIONAL TESTING OF PLANTS AND TEST APPARATUS |
JP59024202A JPS59182359A (en) | 1983-03-16 | 1984-02-10 | Device for controlling function of testing facility or testing device used for nondestructive test for material |
FR8403216A FR2544082B1 (en) | 1983-03-16 | 1984-03-01 | DEVICE FOR MONITORING THE OPERATION OF TEST FACILITIES AND APPARATUS |
GB08406793A GB2137751B (en) | 1983-03-16 | 1984-03-15 | Testing non-destructive test equipment |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE3309881A DE3309881A1 (en) | 1983-03-16 | 1983-03-16 | DEVICE FOR FUNCTIONAL CONTROL OF TEST SYSTEMS AND DEVICES |
Publications (2)
Publication Number | Publication Date |
---|---|
DE3309881A1 DE3309881A1 (en) | 1984-09-20 |
DE3309881C2 true DE3309881C2 (en) | 1988-10-13 |
Family
ID=6193945
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE3309881A Granted DE3309881A1 (en) | 1983-03-16 | 1983-03-16 | DEVICE FOR FUNCTIONAL CONTROL OF TEST SYSTEMS AND DEVICES |
Country Status (5)
Country | Link |
---|---|
JP (1) | JPS59182359A (en) |
DE (1) | DE3309881A1 (en) |
FR (1) | FR2544082B1 (en) |
GB (1) | GB2137751B (en) |
IT (1) | IT1175319B (en) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB8605280D0 (en) * | 1986-03-04 | 1986-04-09 | Atomic Energy Authority Uk | Magnetic particle inspection techniques |
US5076276A (en) * | 1989-11-01 | 1991-12-31 | Olympus Optical Co., Ltd. | Ultrasound type treatment apparatus |
GB9003569D0 (en) * | 1990-02-16 | 1990-04-11 | Rolls Royce Plc | A method and apparatus for testing the response of a stress wave sensor |
WO2006103483A2 (en) * | 2005-04-01 | 2006-10-05 | Antal Gasparics | Magnetic imaging equipment for non-destructive testing of magnetic and/or electrically conductive materials |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2632674B2 (en) * | 1976-07-16 | 1978-06-08 | Karl Deutsch Pruef- Und Messgeraetebau, 5600 Wuppertal | Electronic device for cyclic acquisition, evaluation and evaluation of impulses in non-destructive ultrasonic material testing |
DE2632680A1 (en) * | 1976-07-16 | 1978-01-19 | Deutsch Pruef Messgeraete | PROCEDURE FOR THE AUTOMATIC ADJUSTMENT AND CYCLING FEEDBACK OF MEASUREMENT RESULTS TO THE ADJUSTMENT OF TESTING SYSTEMS FOR NON-DESTRUCTIVE MATERIAL TESTING |
DE2753472A1 (en) * | 1977-11-28 | 1979-05-31 | Mannesmann Ag | PROCEDURE FOR AUTOMATIC SELF-MONITORING OF NON-DESTRUCTION-FREE TESTING SYSTEMS |
US4233677A (en) * | 1978-02-21 | 1980-11-11 | Chevron Research Company | Automatic system and method for testing marine streamers of seismic exploration systems |
US4495587A (en) * | 1981-12-08 | 1985-01-22 | Bethlehem Steel Corporation | Automatic nondestructive roll defect inspection system |
-
1983
- 1983-03-16 DE DE3309881A patent/DE3309881A1/en active Granted
-
1984
- 1984-02-08 IT IT19505/84A patent/IT1175319B/en active
- 1984-02-10 JP JP59024202A patent/JPS59182359A/en active Pending
- 1984-03-01 FR FR8403216A patent/FR2544082B1/en not_active Expired
- 1984-03-15 GB GB08406793A patent/GB2137751B/en not_active Expired
Also Published As
Publication number | Publication date |
---|---|
IT8419505A0 (en) | 1984-02-08 |
IT1175319B (en) | 1987-07-01 |
FR2544082B1 (en) | 1988-09-30 |
DE3309881A1 (en) | 1984-09-20 |
GB2137751B (en) | 1987-02-04 |
JPS59182359A (en) | 1984-10-17 |
FR2544082A1 (en) | 1984-10-12 |
GB2137751A (en) | 1984-10-10 |
GB8406793D0 (en) | 1984-04-18 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
OP8 | Request for examination as to paragraph 44 patent law | ||
D2 | Grant after examination | ||
8363 | Opposition against the patent | ||
8365 | Fully valid after opposition proceedings | ||
8327 | Change in the person/name/address of the patent owner |
Owner name: SCHNEIDER, HEINZ, DR.-ING., 4000 DUESSELDORF, DE |
|
8327 | Change in the person/name/address of the patent owner |
Owner name: KRAUTKRAEMER GMBH & CO, 50354 HUERTH, DE |
|
8339 | Ceased/non-payment of the annual fee |