DE3029945C2 - - Google Patents

Info

Publication number
DE3029945C2
DE3029945C2 DE3029945A DE3029945A DE3029945C2 DE 3029945 C2 DE3029945 C2 DE 3029945C2 DE 3029945 A DE3029945 A DE 3029945A DE 3029945 A DE3029945 A DE 3029945A DE 3029945 C2 DE3029945 C2 DE 3029945C2
Authority
DE
Germany
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE3029945A
Other languages
German (de)
Other versions
DE3029945A1 (de
Inventor
Gerhard 8200 Rosenheim De Krause
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Erwin Sick Optik-Elektronik 7808 Waldkirch De GmbH
Original Assignee
Erwin Sick Optik-Elektronik 7808 Waldkirch De GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Erwin Sick Optik-Elektronik 7808 Waldkirch De GmbH filed Critical Erwin Sick Optik-Elektronik 7808 Waldkirch De GmbH
Priority to DE19803029945 priority Critical patent/DE3029945A1/de
Priority to US06/288,280 priority patent/US4449819A/en
Publication of DE3029945A1 publication Critical patent/DE3029945A1/de
Application granted granted Critical
Publication of DE3029945C2 publication Critical patent/DE3029945C2/de
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
    • G01J3/433—Modulation spectrometry; Derivative spectrometry

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
DE19803029945 1980-08-07 1980-08-07 Anordnung zur ermittlung der konzentration eines stoffes in einem stoffgemisch Granted DE3029945A1 (de)

Priority Applications (2)

Application Number Priority Date Filing Date Title
DE19803029945 DE3029945A1 (de) 1980-08-07 1980-08-07 Anordnung zur ermittlung der konzentration eines stoffes in einem stoffgemisch
US06/288,280 US4449819A (en) 1980-08-07 1981-07-30 Arrangement for determining the concentration of a substance in a mixture of substances

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19803029945 DE3029945A1 (de) 1980-08-07 1980-08-07 Anordnung zur ermittlung der konzentration eines stoffes in einem stoffgemisch

Publications (2)

Publication Number Publication Date
DE3029945A1 DE3029945A1 (de) 1982-02-18
DE3029945C2 true DE3029945C2 (en17) 1982-12-02

Family

ID=6109115

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19803029945 Granted DE3029945A1 (de) 1980-08-07 1980-08-07 Anordnung zur ermittlung der konzentration eines stoffes in einem stoffgemisch

Country Status (2)

Country Link
US (1) US4449819A (en17)
DE (1) DE3029945A1 (en17)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1991001488A1 (en) * 1989-07-21 1991-02-07 Massachusetts Institute Of Technology Measurement of solid particle concentration in presence of a second particle type

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4590574A (en) * 1983-04-29 1986-05-20 International Business Machines Corp. Method for determining oxygen and carbon in silicon semiconductor wafer having rough surface
US4971077A (en) * 1989-08-02 1990-11-20 R. J. Reynolds Tobacco Company On-line tobacco evaluation system and method
US5301125A (en) * 1990-09-26 1994-04-05 Exxon Research & Engineering Company Spectroscopic determination of amount of one constituent of a fluid mixture in another constituent or in the fluid mixture itself, following separation of the mixture into its constituents
US5679954A (en) * 1994-11-14 1997-10-21 Soloman; Sabrie Non-destructive identification of tablet and tablet dissolution by means of infared spectroscopy
DE19744061C2 (de) * 1996-10-07 2000-01-05 Nippon Soken Vorrichtung und Verfahren zum Bestimmen von Arten von Adsorbaten

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4945788A (en17) * 1972-09-05 1974-05-01 Hitachi Ltd
DE2646580A1 (de) * 1976-10-15 1978-04-20 Hartmann & Braun Ag Photometer fuer die stoffanalyse

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1991001488A1 (en) * 1989-07-21 1991-02-07 Massachusetts Institute Of Technology Measurement of solid particle concentration in presence of a second particle type

Also Published As

Publication number Publication date
US4449819A (en) 1984-05-22
DE3029945A1 (de) 1982-02-18

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Legal Events

Date Code Title Description
OM8 Search report available as to paragraph 43 lit. 1 sentence 1 patent law
8110 Request for examination paragraph 44
D2 Grant after examination
8339 Ceased/non-payment of the annual fee