DE29507614U1 - Microtribometer based on the pin-on-disk principle - Google Patents

Microtribometer based on the pin-on-disk principle

Info

Publication number
DE29507614U1
DE29507614U1 DE29507614U DE29507614U DE29507614U1 DE 29507614 U1 DE29507614 U1 DE 29507614U1 DE 29507614 U DE29507614 U DE 29507614U DE 29507614 U DE29507614 U DE 29507614U DE 29507614 U1 DE29507614 U1 DE 29507614U1
Authority
DE
Germany
Prior art keywords
microtribometer
pin
disk principle
disk
principle
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE29507614U
Other languages
German (de)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Forschungszentrum Karlsruhe GmbH
Original Assignee
Forschungszentrum Karlsruhe GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Forschungszentrum Karlsruhe GmbH filed Critical Forschungszentrum Karlsruhe GmbH
Priority to DE29507614U priority Critical patent/DE29507614U1/en
Publication of DE29507614U1 publication Critical patent/DE29507614U1/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/28—Measuring arrangements characterised by the use of mechanical techniques for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N19/00—Investigating materials by mechanical methods
    • G01N19/02—Measuring coefficient of friction between materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/56—Investigating resistance to wear or abrasion
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/20—Means for supporting or positioning the objects or the material; Means for adjusting diaphragms or lenses associated with the support
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02—Details not specific for a particular testing method
    • G01N2203/026—Specifications of the specimen
    • G01N2203/0286—Miniature specimen; Testing on microregions of a specimen
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/20—Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
    • H01J2237/206—Modifying objects while observing
    • H01J2237/2067—Surface alteration

Landscapes

  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Automation & Control Theory (AREA)
  • Engineering & Computer Science (AREA)
  • Supporting Of Heads In Record-Carrier Devices (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
DE29507614U 1995-05-08 1995-05-08 Microtribometer based on the pin-on-disk principle Expired - Lifetime DE29507614U1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE29507614U DE29507614U1 (en) 1995-05-08 1995-05-08 Microtribometer based on the pin-on-disk principle

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE29507614U DE29507614U1 (en) 1995-05-08 1995-05-08 Microtribometer based on the pin-on-disk principle

Publications (1)

Publication Number Publication Date
DE29507614U1 true DE29507614U1 (en) 1995-07-13

Family

ID=8007751

Family Applications (1)

Application Number Title Priority Date Filing Date
DE29507614U Expired - Lifetime DE29507614U1 (en) 1995-05-08 1995-05-08 Microtribometer based on the pin-on-disk principle

Country Status (1)

Country Link
DE (1) DE29507614U1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102005063101A1 (en) * 2005-12-30 2007-07-12 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Test stand for detecting particle emission from rubbed material pairing, has measuring probe for receiving air from laminar air flow adjacent to material pairing, and particle counter for detecting particles in air received by probe

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102005063101A1 (en) * 2005-12-30 2007-07-12 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Test stand for detecting particle emission from rubbed material pairing, has measuring probe for receiving air from laminar air flow adjacent to material pairing, and particle counter for detecting particles in air received by probe
DE102005063101B4 (en) * 2005-12-30 2009-04-16 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Test bench for the detection of particle emission

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Legal Events

Date Code Title Description
R207 Utility model specification

Effective date: 19950824

R150 Utility model maintained after payment of first maintenance fee after three years

Effective date: 19980212

R157 Lapse of ip right after 6 years

Effective date: 20020301