DE2852886A1 - Probe contact assembly for printed circuit boards - includes tubular housing with spring-loaded check pin terminating with serrated contact head - Google Patents
Probe contact assembly for printed circuit boards - includes tubular housing with spring-loaded check pin terminating with serrated contact headInfo
- Publication number
- DE2852886A1 DE2852886A1 DE19782852886 DE2852886A DE2852886A1 DE 2852886 A1 DE2852886 A1 DE 2852886A1 DE 19782852886 DE19782852886 DE 19782852886 DE 2852886 A DE2852886 A DE 2852886A DE 2852886 A1 DE2852886 A1 DE 2852886A1
- Authority
- DE
- Germany
- Prior art keywords
- contact
- contact head
- module according
- head
- circuit boards
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06716—Elastic
- G01R1/06722—Spring-loaded
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06733—Geometry aspects
- G01R1/06738—Geometry aspects related to tip portion
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R11/00—Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts
- H01R11/11—End pieces or tapping pieces for wires, supported by the wire and for facilitating electrical connection to some other wire, terminal or conductive member
- H01R11/18—End pieces terminating in a probe
Abstract
Description
Kontaktblustein Contact bloom
Aktenzeichen: P ! Die Erfindung betrifft einen Kontaktbaustein einer im Oberbegriff des Anspruches 1 bezeichneten Bauart.Case number: P! The invention relates to a contact module a type designated in the preamble of claim 1.
Solche Kontaktbausteine werden bisher hauptsächlich zur Prüfung ebener elektrischer Leiterplatten verwendet, wobei die aus der Hülse vorstehende kegelige Spitze des Kontaktkolbens durch senkrechtes Andrücken einen in der Regel ausreichend guten Kontakt zu der Leiterplatte vermittelt. Nun kommen aber in zunehmendem Maße gebogene oder räumlich gewölbte Leiterplatten zur Anwendung, die ebenfalls vor dem Einbau auf ihre Funktionsfähigkeit überprüft werden müssen. Da hierbei die Kontaktkolben schräg zu der Leiterplattenfläche stehen, werden die Kontaktkolben beim Andrücken seitlich weggeschoben mit dem Ergebnis, daß die Führung des Kontaktkolbens vorzeitig verschleißt und die Kontaktierung beeinträchtigt ist.So far, such contact modules have mainly been leveled for testing electrical circuit boards are used, the conical protruding from the sleeve Tip of the contact piston by pressing it vertically is usually sufficient conveyed good contact with the circuit board. But now come more and more curved or spatially curved circuit boards for use, which are also in front of the Installation must be checked for functionality. Since this is the contact piston are inclined to the PCB surface, the contact pistons are when pressed pushed away to the side with the result that the guidance of the contact piston prematurely wears out and the contact is impaired.
Die Aufgabe der Erfindung besteht also darin, durch eine diesem Verwendungszweck angepaßte besondere Gestaltung des Kontaktkolbens dessen Haften an gewölbten Leiterplatten und damit die Kontaktierung zu verbessern.The object of the invention is therefore to use one of these purposes Adapted special design of the contact piston, its adherence to curved circuit boards and thus improve the contact.
Zur Lösung dieser Aufgabe schlägt die Erfindung die im Kennzeichen des Anspruchs 1 genannten Merkmale vor. Ein so gestalteter Kontaktkopf arbeitet sich beim Andrücken gewissermaßen in die Oberfläche der gewölbten Leiterplatte ein, kann daher nicht von ihr abrutschen und bewirkt einen überraschend guten Kontakt. Da der Kontaktkopf im Durchmesser größer als der Schaft ist, liegt der Schaft immer gegenüber der Leiterplatte frei, auch dann, wenn er nahezu parallel zu ihr liegt und kann das Eingraben des Kontaktkopfes in die Leiterplatte nicht behindern.To solve this problem, the invention proposes that in the characteristic of claim 1 mentioned features. A contact head designed in this way works when pressed into the surface of the curved circuit board, therefore cannot slip off it and creates a surprisingly good contact. Since the contact head is larger in diameter than the shaft, the shaft always lies relative to the printed circuit board, even if it is almost parallel to it and cannot prevent the contact head from digging into the circuit board.
Im einfachsten Fall ist die griffige Profilierung als Rändelung ausgeführt.In the simplest case, the non-slip profiling is designed as knurling.
In bevorzugter Ausgestaltung der Erfindung ist nach den AnsprUchen 3, 4 und 5 der Kontaktkopf als Zylinder mit kegeliger Anfasung und stirnseitiger zentrischer Vertiefung gestaltet. Der Kegelmantel ist mit Schneidkanten versehen, die entweder nach Anspruch 7 längs der Kegelmantellinien in Richtung zur Kegelspitze verlaufen oder nach Anspruch 8 annähernd tangential zur kegeligen Vertiefung liegen.In a preferred embodiment of the invention is according to the claims 3, 4 and 5 the contact head as a cylinder with a conical chamfer and an end face centric recess designed. The surface of the cone is provided with cutting edges, either according to claim 7 along the surface lines of the cone in the direction of the tip of the cone run or lie approximately tangential to the conical recess according to claim 8.
Im letzteren Falle wird der Kontaktkolben beim Andrücken an die Leiterplatte etwas gedreht und bohrt sich somit wie ein Wendelbohrer in sie ein.In the latter case, the contact piston is pressed against the circuit board when it is pressed slightly rotated and thus drills itself into it like a twist drill.
In der Zeichnung ist der erfindungsgemäße Kontaktbaustein dargestellt.The contact module according to the invention is shown in the drawing.
Es zeigen: Fig. 1 Längsschnitt des Kontaktbausteins Fig. 2 Längsschnitt durch den Kontaktkopf in größerem Maßstab Fig. 3 Frontansicht des Kontaktkopfes Fig. 4 Frontansicht einer zweiten Ausführungsform des Kontaktkopfes.They show: FIG. 1 a longitudinal section of the contact module; FIG. 2 a longitudinal section through the contact head on a larger scale Fig. 3 front view of the contact head 4 front view of a second embodiment of the contact head.
In einer zylindrischen Hülse 1 ist ein Kontaktkolben 2 längs- und drehbeweglich geführt. Er wird an einer Umbördelung 3 der Hülse durch eine Schraubenfeder 4 angedrückt, die sich an einem Anschlußstift 5 abstützt, der mittels einer Einbördelung 6 in der Hülse 1 formschlüssig gehalten ist und zur Weiterleitung des Prüfstromes dient.In a cylindrical sleeve 1, a contact piston 2 is longitudinal and rotatably guided. It is attached to a flange 3 of the sleeve by a helical spring 4 pressed, which is supported on a pin 5, which by means of a bead 6 is held positively in the sleeve 1 and for forwarding the test current serves.
Das aus der Hülse herausragende Teilstück des Kontaktkolbens 2 besteht aus einem Schaft 7, der in einer Rundung 8 in einen im Durchmesser größeren, zylindrischen Kontaktkopf 9 übergeht. Der Kontaktkopf 9 ist kegelig angefast mit einem Winkel von ca. 120 °. An dem Kegelmantel 10 sind ringsum in symmetrischer Anordnung dreieckförmige Schneidkanten 11 eingeschliffen, die in einer kegeligen, zentrischen Vertiefung 12 auslaufen und,wie Fig. 3 erkennen läßt, auf die Kegelspitze zu gerichtet sind.The section of the contact piston 2 protruding from the sleeve consists from a shaft 7, which is in a rounding 8 in a larger diameter, cylindrical Contact head 9 passes. The contact head 9 is beveled conically at an angle of approx. 120 °. On the cone jacket 10 are triangular all around in a symmetrical arrangement Cutting edges 11 ground in, in a conical, central recess 12 run out and, as shown in FIG. 3, are directed towards the apex of the cone.
In einer weiteren Ausführungsform nach Fig. 4 verlaufen die Schneidkanten 13 des Kontaktkopfes 14 schräg zu den Kegelmantellinien und annähernd tangential zu der kegeligen Vertiefung 15.In a further embodiment according to FIG. 4, the cutting edges run 13 of the contact head 14 obliquely to the surface lines of the cone and approximately tangential to the conical recess 15.
Claims (8)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19782852886 DE2852886A1 (en) | 1978-12-07 | 1978-12-07 | Probe contact assembly for printed circuit boards - includes tubular housing with spring-loaded check pin terminating with serrated contact head |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19782852886 DE2852886A1 (en) | 1978-12-07 | 1978-12-07 | Probe contact assembly for printed circuit boards - includes tubular housing with spring-loaded check pin terminating with serrated contact head |
Publications (2)
Publication Number | Publication Date |
---|---|
DE2852886A1 true DE2852886A1 (en) | 1980-06-19 |
DE2852886C2 DE2852886C2 (en) | 1989-04-27 |
Family
ID=6056539
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE19782852886 Granted DE2852886A1 (en) | 1978-12-07 | 1978-12-07 | Probe contact assembly for printed circuit boards - includes tubular housing with spring-loaded check pin terminating with serrated contact head |
Country Status (1)
Country | Link |
---|---|
DE (1) | DE2852886A1 (en) |
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3231772A1 (en) * | 1982-08-26 | 1984-03-01 | Feinmetall Gmbh, 7033 Herrenberg | Method for producing a test contact element, and the structural design of the contact element |
DE3441480A1 (en) * | 1984-11-13 | 1986-05-15 | MANIA Elektronik Automatisation Entwicklung und Gerätebau GmbH, 6384 Schmitten | CONTACT PEN |
DE3716205A1 (en) * | 1986-05-21 | 1987-11-26 | Feinmetall Gmbh | Spring contact pin for test devices |
EP0292590A1 (en) * | 1987-05-26 | 1988-11-30 | Feinmetall Gesellschaft mit beschrÀ¤nkter Haftung | Contact device for testing equipment |
DE3717782A1 (en) * | 1987-05-26 | 1988-12-08 | Feinmetall Gmbh | Contact-making device for test devices |
DE8806162U1 (en) * | 1988-05-09 | 1989-09-07 | Nixdorf Computer Ag, 4790 Paderborn, De | |
EP0432870A2 (en) * | 1989-12-04 | 1991-06-19 | Everett/Charles Contact Products Inc. | Electrical test probe |
WO1999005308A2 (en) * | 1997-07-22 | 1999-02-04 | Rapigene, Inc. | Apparatus and methods for arraying solution onto a solid support |
EP1006363A2 (en) * | 1998-12-01 | 2000-06-07 | Hitachi Software Engineering Co., Ltd. | Biochip and method for producing the same |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE1765461B2 (en) * | 1968-05-22 | 1976-12-16 | Bossert, Anneliese, 7530 Pforzheim | SPRING CONTACT |
DE2717420A1 (en) * | 1977-04-20 | 1978-10-26 | Ingun Pruefmittelbau | Contact pin for machining or testing device for electronic components - has sensing rod with transversal pins entering in curved slot in hollow shaft |
-
1978
- 1978-12-07 DE DE19782852886 patent/DE2852886A1/en active Granted
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE1765461B2 (en) * | 1968-05-22 | 1976-12-16 | Bossert, Anneliese, 7530 Pforzheim | SPRING CONTACT |
DE2717420A1 (en) * | 1977-04-20 | 1978-10-26 | Ingun Pruefmittelbau | Contact pin for machining or testing device for electronic components - has sensing rod with transversal pins entering in curved slot in hollow shaft |
Non-Patent Citations (1)
Title |
---|
Firmenschrift der Amphenol-Tuchel Electronics GmbH "Federkontakte für optimalen Prüfmittelbau" vom November 1973 * |
Cited By (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3231772A1 (en) * | 1982-08-26 | 1984-03-01 | Feinmetall Gmbh, 7033 Herrenberg | Method for producing a test contact element, and the structural design of the contact element |
DE3441480A1 (en) * | 1984-11-13 | 1986-05-15 | MANIA Elektronik Automatisation Entwicklung und Gerätebau GmbH, 6384 Schmitten | CONTACT PEN |
EP0181429A1 (en) * | 1984-11-13 | 1986-05-21 | MANIA Elektronik Automatisation Entwicklung und Gerätebau GmbH | Contact probe |
DE3716205A1 (en) * | 1986-05-21 | 1987-11-26 | Feinmetall Gmbh | Spring contact pin for test devices |
EP0292590A1 (en) * | 1987-05-26 | 1988-11-30 | Feinmetall Gesellschaft mit beschrÀ¤nkter Haftung | Contact device for testing equipment |
DE3717782A1 (en) * | 1987-05-26 | 1988-12-08 | Feinmetall Gmbh | Contact-making device for test devices |
DE8806162U1 (en) * | 1988-05-09 | 1989-09-07 | Nixdorf Computer Ag, 4790 Paderborn, De | |
EP0432870A2 (en) * | 1989-12-04 | 1991-06-19 | Everett/Charles Contact Products Inc. | Electrical test probe |
EP0432870A3 (en) * | 1989-12-04 | 1992-04-08 | Everett/Charles Contact Products Inc. | Electrical test probe |
WO1999005308A2 (en) * | 1997-07-22 | 1999-02-04 | Rapigene, Inc. | Apparatus and methods for arraying solution onto a solid support |
WO1999005308A3 (en) * | 1997-07-22 | 1999-05-27 | Rapigene Inc | Apparatus and methods for arraying solution onto a solid support |
US6365349B1 (en) | 1997-07-22 | 2002-04-02 | Qiagen Genomics, Inc. | Apparatus and methods for arraying solution onto a solid support |
EP1006363A2 (en) * | 1998-12-01 | 2000-06-07 | Hitachi Software Engineering Co., Ltd. | Biochip and method for producing the same |
EP1006363A3 (en) * | 1998-12-01 | 2000-08-16 | Hitachi Software Engineering Co., Ltd. | Biochip and method for producing the same |
Also Published As
Publication number | Publication date |
---|---|
DE2852886C2 (en) | 1989-04-27 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
OAM | Search report available | ||
OC | Search report available | ||
8110 | Request for examination paragraph 44 | ||
D2 | Grant after examination | ||
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |