DE2850207C2 - - Google Patents
Info
- Publication number
- DE2850207C2 DE2850207C2 DE19782850207 DE2850207A DE2850207C2 DE 2850207 C2 DE2850207 C2 DE 2850207C2 DE 19782850207 DE19782850207 DE 19782850207 DE 2850207 A DE2850207 A DE 2850207A DE 2850207 C2 DE2850207 C2 DE 2850207C2
- Authority
- DE
- Germany
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
- 
        - H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
- H03K5/15—Arrangements in which pulses are delivered at different times at several outputs, i.e. pulse distributors
- H03K5/15013—Arrangements in which pulses are delivered at different times at several outputs, i.e. pulse distributors with more than two outputs
- H03K5/1502—Arrangements in which pulses are delivered at different times at several outputs, i.e. pulse distributors with more than two outputs programmable
 
- 
        - G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31919—Storing and outputting test patterns
 
- 
        - G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C19/00—Digital stores in which the information is moved stepwise, e.g. shift registers
 
- 
        - G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31922—Timing generation or clock distribution
 
Landscapes
- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title | 
|---|---|---|---|
| DE19782850207 DE2850207B1 (de) | 1978-11-20 | 1978-11-20 | Schaltungsanordnung zur Koinzidenzpruefung von digitalen Signalen | 
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title | 
|---|---|---|---|
| DE19782850207 DE2850207B1 (de) | 1978-11-20 | 1978-11-20 | Schaltungsanordnung zur Koinzidenzpruefung von digitalen Signalen | 
Publications (2)
| Publication Number | Publication Date | 
|---|---|
| DE2850207B1 DE2850207B1 (de) | 1980-02-28 | 
| DE2850207C2 true DE2850207C2 (enrdf_load_html_response) | 1980-10-16 | 
Family
ID=6055102
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date | 
|---|---|---|---|
| DE19782850207 Granted DE2850207B1 (de) | 1978-11-20 | 1978-11-20 | Schaltungsanordnung zur Koinzidenzpruefung von digitalen Signalen | 
Country Status (1)
| Country | Link | 
|---|---|
| DE (1) | DE2850207B1 (enrdf_load_html_response) | 
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title | 
|---|---|---|---|---|
| US5159337A (en) * | 1990-05-01 | 1992-10-27 | U.S. Philips Corp. | Self-aligning sampling system and logic analyzer comprising a number of such sampling systems | 
- 
        1978
        - 1978-11-20 DE DE19782850207 patent/DE2850207B1/de active Granted
 
Also Published As
| Publication number | Publication date | 
|---|---|
| DE2850207B1 (de) | 1980-02-28 | 
Similar Documents
Legal Events
| Date | Code | Title | Description | 
|---|---|---|---|
| 8320 | Willingness to grant licences declared (paragraph 23) | ||
| 8339 | Ceased/non-payment of the annual fee |