DE2813906C2 - - Google Patents

Info

Publication number
DE2813906C2
DE2813906C2 DE19782813906 DE2813906A DE2813906C2 DE 2813906 C2 DE2813906 C2 DE 2813906C2 DE 19782813906 DE19782813906 DE 19782813906 DE 2813906 A DE2813906 A DE 2813906A DE 2813906 C2 DE2813906 C2 DE 2813906C2
Authority
DE
Germany
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE19782813906
Other languages
German (de)
Other versions
DE2813906A1 (de
Inventor
Manfred 8000 Muenchen De Kreutzmann
Walter 8021 Neuried De Bredl
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens AG
Original Assignee
Siemens AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens AG filed Critical Siemens AG
Priority to DE19782813906 priority Critical patent/DE2813906A1/de
Publication of DE2813906A1 publication Critical patent/DE2813906A1/de
Application granted granted Critical
Publication of DE2813906C2 publication Critical patent/DE2813906C2/de
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
    • H01R12/70—Coupling devices
    • H01R12/7005—Guiding, mounting, polarizing or locking means; Extractors
DE19782813906 1978-03-31 1978-03-31 Vorrichtung zur halterung und kontaktierung von zu pruefenden flachbaugruppen, insbesondere von gedruckten leiterplatten Granted DE2813906A1 (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE19782813906 DE2813906A1 (de) 1978-03-31 1978-03-31 Vorrichtung zur halterung und kontaktierung von zu pruefenden flachbaugruppen, insbesondere von gedruckten leiterplatten

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19782813906 DE2813906A1 (de) 1978-03-31 1978-03-31 Vorrichtung zur halterung und kontaktierung von zu pruefenden flachbaugruppen, insbesondere von gedruckten leiterplatten

Publications (2)

Publication Number Publication Date
DE2813906A1 DE2813906A1 (de) 1979-10-04
DE2813906C2 true DE2813906C2 (xx) 1987-02-26

Family

ID=6035840

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19782813906 Granted DE2813906A1 (de) 1978-03-31 1978-03-31 Vorrichtung zur halterung und kontaktierung von zu pruefenden flachbaugruppen, insbesondere von gedruckten leiterplatten

Country Status (1)

Country Link
DE (1) DE2813906A1 (xx)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5003156A (en) * 1989-03-14 1991-03-26 Time Temperature, Inc. Dual configuration connector port for burn-in systems

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1263644A (en) * 1969-08-07 1972-02-16 Olivetti & Co Spa Apparatus for automatically testing electronic circuits

Also Published As

Publication number Publication date
DE2813906A1 (de) 1979-10-04

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Legal Events

Date Code Title Description
8110 Request for examination paragraph 44
D2 Grant after examination
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee